| Patents for G01B 11 - Measuring arrangements characterised by the use of optical means (73,862) |
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| 08/22/2001 | EP0828991B1 Method and device for aligning the shaft of a rotating machine |
| 08/22/2001 | CN1309774A Method and apparatus for angle measurement or to define angular location of object |
| 08/22/2001 | CN1309759A Method and apparatus for confocal interference microscopy using wavenumber domain reflectometry and background amplitude reduction and compensation |
| 08/21/2001 | US6278847 Aperture coded camera for three dimensional imaging |
| 08/21/2001 | US6278809 Fiber optic reflectance apparatus for in situ characterization of thin films |
| 08/21/2001 | US6278797 Apparatus for inspecting land-attached circuit board |
| 08/21/2001 | US6278520 Method and device for measuring parts |
| 08/21/2001 | US6278519 Apparatus for analyzing multi-layer thin film stacks on semiconductors |
| 08/21/2001 | US6277637 Measuring turgor pressure in a cellular sample via contacting sample with a convex probe which measures area of contact |
| 08/21/2001 | US6276366 Rod-shaped test-piece testing apparatus |
| 08/16/2001 | WO2001059830A1 Thickness measuring apparatus, thickness measuring method, and wet etching apparatus and wet etching method utilizing them |
| 08/16/2001 | WO2001059510A1 Device for detecting the distance between the pupil plane and the frame plane |
| 08/16/2001 | WO2001059431A2 Method and device for producing height images of technical surfaces with microscopic resolution |
| 08/16/2001 | WO2001059426A1 Superfine indentation tester |
| 08/16/2001 | WO2001059404A1 Arrangement and method for measuring surface irregularities at an object |
| 08/16/2001 | WO2001059403A1 Method for quantitatively and/or qualitatively detecting layer thicknesses, a mircroreaction vessel and a titre plate |
| 08/16/2001 | WO2001059402A2 Optical systems for measuring form and geometric dimensions of precision engineered parts |
| 08/16/2001 | US20010014191 Interference measurement apparatus and probe used for interference measurement apparatus |
| 08/16/2001 | US20010014182 Image processing apparatus |
| 08/16/2001 | US20010013936 Detection system for nanometer scale topographic measurements of reflective surfaces |
| 08/16/2001 | US20010013935 Surface inspection using the ratio of intensities of s- and p-polarized light components of a laser beam reflected a rough surface |
| 08/16/2001 | EP1124112A2 Optical fiber sensor |
| 08/16/2001 | EP1123562A1 Layer processing |
| 08/16/2001 | EP1123525A1 Device and method for the optical inspection of concealed soldered connections |
| 08/16/2001 | EP1123483A1 Detection of irregularities in a convex surface, such as a tire sidewall, using band-pass filtering |
| 08/16/2001 | EP1123138A1 Method and system for physiological gating of radiation therapy |
| 08/16/2001 | EP1123137A1 Method and system for predictive physiological gating of radiation therapy |
| 08/16/2001 | EP1123059A1 Method and system for positioning patients |
| 08/16/2001 | DE10060900A1 Surface state measuring device for semiconductor substrate manufacture has control unit which controls position and angle of irradiation of infrared rays to semiconductor wafer |
| 08/16/2001 | DE10005203A1 Measurement arrangement for forming and recording image of 3-dimensional object derives measurement head unit position relative to object from distances between measurement points |
| 08/16/2001 | DE10004384A1 Arrangement for detecting expansions, temperatures and their variations of coating applied to bearer has optical fiber on bearer surface with Bragg grid used as sensor in defined fiber section |
| 08/14/2001 | US6275770 Method to remove station-induced error pattern from measured object characteristics and compensate the measured object characteristics with the error |
| 08/14/2001 | US6275742 Wafer aligner system |
| 08/14/2001 | US6275621 Moire overlay target |
| 08/14/2001 | US6275298 Method for measuring a physical distance in a camera between two reference surfaces |
| 08/14/2001 | US6275292 Reflectance method for evaluating the surface characteristics of opaque materials |
| 08/14/2001 | US6274864 Mechanical delimitation of the tolerances of an optical transmission section |
| 08/14/2001 | US6272912 Steering angle sensor unit |
| 08/14/2001 | CA2054705C Device and method for measuring angles of a workpiece |
| 08/10/2001 | CA2334333A1 Optical fiber sensor |
| 08/09/2001 | WO2001057503A1 Method and device for imaging liquid filling container |
| 08/09/2001 | WO2001057472A1 Key measurement apparatus and method |
| 08/09/2001 | WO2001057471A1 Visual displacement sensor |
| 08/09/2001 | WO2001009586A3 Improved optical method for measuring thin metal films |
| 08/09/2001 | US20010012393 Visual inspection apparatus |
| 08/09/2001 | US20010012388 Flatness measurement system for metal strip |
| 08/09/2001 | US20010012108 Methods and apparatus for the in-process measurement of thin film layers |
| 08/09/2001 | US20010012107 Method and apparatus for inspecting a printed circuit board assembly |
| 08/09/2001 | US20010012016 Three-dimensional shape measuring system |
| 08/09/2001 | US20010011712 Position detection system for use in lithographic apparatus |
| 08/09/2001 | US20010011704 Near-field optical probe and manufacturing method for same, and near-field optical apparatus using the near-field probe |
| 08/09/2001 | US20010011700 Method of forming a micro-aperture, projection having a micro-aperture, probe or multi-probe having such a projection and surface scanner, aligner or information processor comprising such a probe |
| 08/09/2001 | US20010011485 Gear-reduction device, particularly for measuring and transmitting rotary and swivel movements |
| 08/09/2001 | EP1144981A3 Improved optical method for measuring thin metal films |
| 08/09/2001 | DE10005395A1 Pedal crank checking device for bicycle, has optical device that receives light beam from measurement spot and provides measurement result on indicator |
| 08/09/2001 | DE10005327A1 Parallelism and track angle checking device used on wheels of two-wheeled vehicle, has firmly installed rear measuring unit with optical device emitting light representing plane of running wheel |
| 08/09/2001 | DE10005171A1 Curvature radii testing system for e.g. spherical lens has path length measuring equipment that measures gap of test item between optical component and vertex of surface to be tested of test item |
| 08/09/2001 | DE10005170A1 Interferometric testing system for spherical surfaces of optical components has diffractive optical component with high converging power to form test beam path with aplanatic output for testing lens |
| 08/09/2001 | DE10003738A1 Torque detection device for e.g. shaft control of vehicle has optical scanner which evaluates relative rotation of codings on concentric encoder disks so that torque on connecting bodies can be determined |
| 08/08/2001 | EP1122612A2 Position detection |
| 08/08/2001 | EP1122528A2 Arrangement and method for determining dilatations and temperature as well variations thereof of a covering layer applied on a support |
| 08/08/2001 | EP1122513A2 Measurement device for imaging and recording of a three dimensional object |
| 08/08/2001 | EP1122511A2 Displacement sensor having a display data output |
| 08/08/2001 | EP1121580A1 Apparatus for optically characterising thin layered material |
| 08/08/2001 | EP1121567A1 Luminescent brittle coating in strain analysis |
| 08/08/2001 | EP1121559A1 Light array system and method for illumination of objects imaged by imaging systems |
| 08/08/2001 | EP0840881B1 Wheel alignment with movable video camera |
| 08/08/2001 | EP0832418B1 Sensitive and fast response optical detection of transient motion from a scattering surface by two-wave mixing |
| 08/08/2001 | CN1307250A 照明装置 Lighting device |
| 08/08/2001 | CN1307247A Method and device for measuring thickness of liquid crystal layer |
| 08/08/2001 | CN1307227A Error correcting method in circular grating angle measurement |
| 08/08/2001 | CN1307226A Absolute encoding measuremnt method using circular grating |
| 08/08/2001 | CN1307225A Measurement method by outomatic laser legnth measuring instrument |
| 08/08/2001 | CN1307224A In-site width measurement method |
| 08/08/2001 | CN1069403C Three-dimensional measuring apparatus and method |
| 08/08/2001 | CN1069402C Apparatus for measuring dimension of article |
| 08/08/2001 | CN1069401C Method and system for measuring surface profile of object using large equivalent wavelength |
| 08/07/2001 | US6272246 Positioning device |
| 08/07/2001 | US6271925 Apparatus and method for measuring two opposite surfaces of a body |
| 08/07/2001 | US6271924 Noncontact acoustic optic scanning laser vibrometer for determining the difference between an object and a reference surface |
| 08/07/2001 | US6271923 Interferometry system having a dynamic beam steering assembly for measuring angle and distance |
| 08/07/2001 | US6271919 Semiconductor device and alignment apparatus and alignment method for same |
| 08/07/2001 | US6271878 Peeling detector for tunnel wall |
| 08/07/2001 | US6271535 Copy substrate edge electronic registration system for a reprographic system |
| 08/07/2001 | US6271515 Column switch for vehicles includes a flexible cable |
| 08/07/2001 | US6271047 Layer-thickness detection methods and apparatus for wafers and the like, and polishing apparatus comprising same |
| 08/07/2001 | US6270622 Method and apparatus for improving accuracy of plasma etching process |
| 08/07/2001 | US6270221 Apparatus and method for measuring vision defects of a human eye |
| 08/07/2001 | CA2178265C Laser-based dimensioning system |
| 08/03/2001 | CA2297879A1 Apparatus and method for determining the shape of a piece in movement |
| 08/02/2001 | WO2001056296A1 Method and apparatus for recording a three dimensional figure on a two dimensional surface allowing clothing patterns to be produced |
| 08/02/2001 | WO2001056142A1 Safety interlock for mechanically actuated closure device |
| 08/02/2001 | WO2001056068A1 Monitor, method of monitoring, polishing device, and method of manufacturing semiconductor wafer |
| 08/02/2001 | WO2001056007A1 Self-referenced tracking |
| 08/02/2001 | WO2001055763A2 Optical element |
| 08/02/2001 | WO2001055672A1 Fiber optic cable and method of measuring distortion |
| 08/02/2001 | WO2001055671A1 Fiber-filtered laser system for use in measuring thin film thicknesses |
| 08/02/2001 | WO2001055670A2 Position determining apparatus for coordinate positioning machine |
| 08/02/2001 | WO2001055669A1 Caching of intra-layer calculations for rapid rigorous coupled-wave analyses |
| 08/02/2001 | WO2001054955A1 Device for continuously measuring deformations in a tyre during the travel movement of a motor vehicle |