| Patents for G01B 11 - Measuring arrangements characterised by the use of optical means (73,862) |
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| 11/27/2001 | US6323776 Method and apparatus of automatically identifying faults in a machine vision measuring system |
| 11/27/2001 | US6323502 Checking the accuracy of folding of parallelepiped boxes |
| 11/27/2001 | US6323483 High bandwidth recoiless microactuator |
| 11/27/2001 | US6321601 Optical method for the characterization of laterally-patterned samples in integrated circuits |
| 11/27/2001 | US6321594 System and method for performing bulge testing of films, coatings and/or layers |
| 11/22/2001 | WO2001088474A1 Interval measuring device and surface shape measuring device |
| 11/22/2001 | WO2001088473A1 Inspection of a three-dimensional surface structure and the calibration of its resolution (solder paste deposit) using a camera, an optical sensor and an independent calibration mark |
| 11/22/2001 | WO2001088471A1 Method and device for determining the 3d profile of an object |
| 11/22/2001 | WO2001088467A2 Data age adjustments |
| 11/22/2001 | WO2001088465A1 One-dimensional calibration standard |
| 11/22/2001 | WO2001088464A2 Adjusting device with an optical regulating device having a reflector |
| 11/22/2001 | WO2001088397A1 System and method for measuring dynamic loads in a magnetic bearing |
| 11/22/2001 | WO2000070304A9 Active target wheel aligner |
| 11/22/2001 | US20010044058 For patterns formed by lithography or etching to manufacturing semiconductor or optical devices. |
| 11/22/2001 | US20010043757 Method of measuring rotation of sphere |
| 11/22/2001 | US20010043736 Method and system for detecting a defect in projected portions of an object having the projected portions formed in the same shape with a predetermined pitch along an arc |
| 11/22/2001 | US20010043733 Device and method for the determination of diameters of crystals |
| 11/22/2001 | US20010043337 Position sensitive detectors and distance measuring apparatus using them |
| 11/22/2001 | US20010043336 Measuring apparatus |
| 11/22/2001 | US20010043335 Measuring system with improved method of reading image data of an object |
| 11/22/2001 | US20010043333 Optical systems for measuring form and geometric dimensions of precision engineered parts |
| 11/22/2001 | US20010043328 Optical device providing relative algnment |
| 11/22/2001 | US20010043326 Foreign substance inspecting method and apparatus, and exposure apparatus using this inspecting apparatus |
| 11/22/2001 | US20010042846 Tilt detector |
| 11/22/2001 | US20010042844 Smart optical microphone/sensor |
| 11/22/2001 | US20010042770 Offset measurement method, tool position detection method and bonding apparatus |
| 11/22/2001 | DE10024486A1 Device for measuring step responses of conveyor belt contactless thickness measurement device has plate with thickness step(s) that is passed through beam path of measurement device |
| 11/22/2001 | DE10023172A1 Optical measurement of diameter, thicknesses and eccentricity of elongated products, especially products moving on a roller path, to provide continuous monitoring ensuring products are within tolerance |
| 11/21/2001 | EP1156298A2 Method and apparatus for the detection of three-dimensional objects |
| 11/21/2001 | EP1155384A1 Method and apparatus of automatically identifying faults in a machine vision measuring system |
| 11/21/2001 | EP1155293A1 Method for producing time marks at any points on moving components |
| 11/21/2001 | EP1155284A1 Method of determining an illuminated surface |
| 11/21/2001 | EP1155283A1 Methods and apparatus for measuring and mapping ophthalmic elements |
| 11/21/2001 | EP1000330A4 Measurement of waveplate retardation using a photoelastic modulator |
| 11/21/2001 | EP0805948B1 Scanning arrangement and method |
| 11/21/2001 | CN1323407A Device and method for the optical inspection of concealed soldered connections |
| 11/20/2001 | US6321137 Method for calibration of a robot inspection system |
| 11/20/2001 | US6320666 Apparatus for evaluating metalized layers on semiconductors |
| 11/20/2001 | US6320665 Acousto optic scanning laser vibrometer for determining the dynamic properties of an object |
| 11/20/2001 | US6320659 Clearance measuring device and method for exposure |
| 11/20/2001 | US6320657 Broadband spectroscopic rotating compensator ellipsometer |
| 11/20/2001 | US6320654 Method for the automatic recognition of surface defects in body shells and device for carrying out said method |
| 11/20/2001 | US6320609 System using a polar coordinate stage and continuous image rotation to compensate for stage rotation |
| 11/20/2001 | US6320177 Method and apparatus for generating a control signal |
| 11/20/2001 | US6319736 Apparatus and method for determining porosity |
| 11/20/2001 | US6319735 Photoresist dispense method by compensation for substrate reflectivity |
| 11/20/2001 | US6319732 Method for controlling the temperature of a layer growing on a wafer |
| 11/20/2001 | US6317954 System and method for aligning aircraft coordinate systems |
| 11/20/2001 | US6317953 Vision target based assembly |
| 11/15/2001 | WO2001086228A1 A method to measure surface structure |
| 11/15/2001 | WO2001086227A1 Apparatus for monitoring the rails of a railway or tramway line |
| 11/15/2001 | WO2001031290A3 Method for determination of forest stand attributes and a computer program to perform the method |
| 11/15/2001 | US20010040995 Method and apparatus for generating part programs for use in image-measuring instruments, and image-measuring instrument and method of displaying measured results therefrom |
| 11/15/2001 | US20010040722 Broad band deep ultraviolet/vacuum ultraviolet catadioptric imaging system |
| 11/15/2001 | US20010040683 Apparatus for process for measuring the thickness and out-of-roundness of elongate workpieces |
| 11/15/2001 | US20010040682 Shearographic imaging machine |
| 11/15/2001 | US20010040225 Edge detecting method and edge detecting apparatus |
| 11/15/2001 | US20010040224 Positional deviation detecting method and device manufacturing method using the same |
| 11/15/2001 | DE10115524A1 Interferometrische Messvorrichtung Interferometric measurement device |
| 11/15/2001 | DE10023328A1 Adjustment device with optical adjustment jig equipped with reflector e.g. for motor vehicle proximity radar and headlights, has vertical adjustment device provided with masking unit between an optical adjuster and an emission device |
| 11/15/2001 | DE10023128A1 Abtastverfahren und Abtastvorrichtung zur optischen Dichtemessung Scanning and scanning for optical density measurement |
| 11/14/2001 | EP1154260A2 Scanning method and apparatus for optical density measurement |
| 11/14/2001 | EP1154229A2 Device for the quantitative alignment assessment of two machine parts,tools or similar |
| 11/14/2001 | EP1154228A1 Shock protecting adapter device for a laser gyro |
| 11/14/2001 | EP1154227A1 Edge detecting method and edge detecting apparatus |
| 11/14/2001 | EP1154226A2 Procedure and device for measuring of thickness and unroundness of elongated objects |
| 11/14/2001 | EP1153695A2 A laser welding head-controlling system, a laser welding head and a method for controlling a laser welding head |
| 11/14/2001 | EP1153638A1 3-d model providing device |
| 11/14/2001 | EP1153292A1 A hybrid 3-d probe tracked by multiple sensors |
| 11/14/2001 | EP1153274A1 Fibre optic grating sensor |
| 11/14/2001 | EP1153266A1 Measuring device |
| 11/14/2001 | EP1153265A1 Method and device for inspecting objects |
| 11/14/2001 | EP1153264A1 Active strain gages for earthquake damage assessment |
| 11/14/2001 | EP1153263A1 Combining interference fringe patterns to a moire fringe pattern |
| 11/14/2001 | EP1152915A1 Device for determining the pressure between a contact wire and a pantograph |
| 11/14/2001 | EP1152873A1 Method and device for separating disc-shaped bodies from an original body |
| 11/14/2001 | EP1152832A1 Sensor-measuring field for controlling functioning of a micropipette |
| 11/14/2001 | EP1102965A4 Apparatus and method for measurement of a liquid droplet |
| 11/14/2001 | EP1095257A4 System and method for image acquisition for inspection of articles on a moving conveyor |
| 11/14/2001 | EP1019567B1 Method and system for controlling growth of a silicon crystal |
| 11/14/2001 | EP1012838B1 Method for regulating a coating process |
| 11/14/2001 | EP0972220B1 Microscopy imaging apparatus and method |
| 11/14/2001 | EP0928240B1 System and method for controlling the size of material banks in calenders, mills, and feed mills |
| 11/14/2001 | EP0754290B1 Automated end tally system and method |
| 11/14/2001 | CN1322328A Improvements relating to pattern recognition |
| 11/14/2001 | CN1322155A Work inspection device |
| 11/14/2001 | CN1321887A Dynamic change detecting method and apparatus, and ultrasonic diagnosing apparatus |
| 11/14/2001 | CN1321872A Determination method of spherical tank volume |
| 11/14/2001 | CN1074831C Method and device for real-time correction of working/measuring error by multiple grating |
| 11/13/2001 | US6317213 Unbalanced fiber optic Michelson interferometer as an optical pick-off |
| 11/13/2001 | US6317211 Optical metrology tool and method of using same |
| 11/13/2001 | US6317210 Apparatus for recording fly height measurement |
| 11/13/2001 | US6317204 Surface inspecting device and surface inspecting method |
| 11/13/2001 | US6316765 Device for detecting the position of rotating objects |
| 11/13/2001 | US6314812 Apparatus and method for binocular measurement system |
| 11/13/2001 | US6314631 Vision target based assembly |
| 11/11/2001 | CA2347070A1 Scanning method and scanning apparatus for optical density measurement |
| 11/08/2001 | WO2001084620A1 Thickness measuring apparatus, thickness measuring method, and wet etching apparatus and wet etching method utilizing them |
| 11/08/2001 | WO2001084496A1 Apparatus for constituting three-dimensional model |
| 11/08/2001 | WO2001084479A1 Method and system for scanning a surface and generating a three-dimensional object |