| Patents for G01B 11 - Measuring arrangements characterised by the use of optical means (73,862) |
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| 05/17/2001 | DE19950559A1 Verfahren zum Bestimmen von geometrischen Strukturen auf oder in einem Substrat sowie von Materialparametern A method of determining geometrical structures on or in a substrate and from material parameters |
| 05/17/2001 | DE19949044A1 Vorrichtung und Feinpositionierung eines Bauteils und Koordinaten-Messmaschine mit einer Vorrichtung zur Feinpositionierung eines Bauteils And fine positioning device of a component and the coordinate measuring machine with a device for fine positioning of a component |
| 05/17/2001 | DE10050749A1 Laser interferometer has reference beam path and mirror which are arranged linearly along movement direction of slider |
| 05/17/2001 | CA2389929A1 Online screen calibration and measuring method |
| 05/16/2001 | EP1099936A1 Two-dimensional absolute position measurement |
| 05/16/2001 | EP1099120A1 Method and apparatus for angle measurement or to define angular location of an object |
| 05/16/2001 | EP1098562A1 Device and method for automatically milking cows |
| 05/16/2001 | EP0713590B1 Automatic garment inspection and measurement system |
| 05/16/2001 | CN1295268A Device for measuring relative position error |
| 05/16/2001 | CN1065955C Apparatus and method for surface inspection |
| 05/15/2001 | US6233370 Interference measurement apparatus and probe used for interference measurement apparatus |
| 05/15/2001 | US6233083 Light modulation apparatus and optical information processing system |
| 05/15/2001 | US6233050 Apparatus and process for measuring the unroundness and diameter of railway wheels |
| 05/15/2001 | US6233049 Three-dimensional measurement apparatus |
| 05/15/2001 | US6233046 Method of measuring the thickness of a layer of silicon damaged by plasma etching |
| 05/15/2001 | US6233004 Image processing method and apparatus |
| 05/15/2001 | US6231918 Film on integrated circuits with oxide layers |
| 05/15/2001 | US6230552 Surface treatment shape evaluation system and surface treatment shape |
| 05/15/2001 | US6230416 Laser square |
| 05/10/2001 | WO2001033494A1 Hand-held fingerprint scanner with on-board image normalization data storage |
| 05/10/2001 | WO2001033184A1 Method of measuring the twist imparted to an optical fibre and procedure for processing an optical fibre using this method |
| 05/10/2001 | WO2001033166A1 Automatic contrast focussing with three optical paths |
| 05/10/2001 | WO2001033165A1 Optical fiber navigation system |
| 05/10/2001 | WO2001033164A1 Measurement of objects |
| 05/10/2001 | WO2001020297A3 Method and apparatus for measuring aerodynamic characteristics of a golf ball |
| 05/10/2001 | US20010000978 Method and apparatus for recording three-dimensional distribution of light backscattering potential in transparent and semi-transparent structures |
| 05/10/2001 | US20010000904 Solder bump measuring method and apparatus |
| 05/10/2001 | DE19953966A1 Method and equipment for measuring thickness of transparent layers of blood based on camera images recorded as specimen moves through focussing planes of objective lens |
| 05/10/2001 | DE19953290A1 Verfahren und Vorrichtung zur Überwachung des von einer Beleuchtungsvorrichtung abgestrahlten Lichtes für ein optisches Messgerät Method and device for monitoring the light emitted by an illumination device for an optical measuring instrument |
| 05/10/2001 | DE19949704A1 Verfahren und Einrichtung zum Bewerten des Spieles in Lagern oder Gelenken miteinander gekoppelter Bauteile Method and apparatus for evaluating the game in bearings or joints of interlocking components |
| 05/10/2001 | DE19948797A1 Substrathalter und Verwendung des Substrathalters in einem hochgenauen Messgerät Substrate holder and use of the substrate holder in a highly accurate measuring device |
| 05/09/2001 | EP1098556A1 Device for measuring a positioning error |
| 05/09/2001 | EP1098551A2 Method and apparatus for monitoring the light emitted by a light source in an optical measuring device |
| 05/09/2001 | EP1098458A2 An apparatus and a method for locating a fault of a transmission line |
| 05/09/2001 | EP1098268A2 Method for the threedimensional optical measurement of object surfaces |
| 05/09/2001 | EP1098166A2 Method and apparatus for thickness measurement on transparent films |
| 05/09/2001 | EP1097432A1 Automated 3d scene scanning from motion images |
| 05/09/2001 | EP1097352A1 Thickness measurement of fluorescing coatings |
| 05/09/2001 | EP1096974A1 Eye tracking employing a retro-reflective disk |
| 05/09/2001 | CN1065638C Method for laser measuring tube thickness of picture tube |
| 05/09/2001 | CN1065626C Yarn measuring device |
| 05/08/2001 | US6229913 Apparatus and methods for determining the three-dimensional shape of an object using active illumination and relative blurring in two-images due to defocus |
| 05/08/2001 | US6229619 Compensation for measurement uncertainty due to atmospheric effects |
| 05/08/2001 | US6229617 High resolution non-contact interior profilometer |
| 05/08/2001 | US6229610 System and method for measuring thin film properties and analyzing two-dimensional histograms using substraction operation |
| 05/08/2001 | US6229609 Scanning near-field optic/atomic force microscope |
| 05/08/2001 | US6229607 Fine movement mechanism unit and scanning probe microscope |
| 05/08/2001 | US6229600 Spherical-aberration detection system and optical device using the same |
| 05/08/2001 | US6229598 Electro-optic distance measuring apparatus |
| 05/08/2001 | US6229331 Apparatus for and method of inspecting patterns on semiconductor integrated devices |
| 05/08/2001 | US6228277 Etch endpoint detection |
| 05/08/2001 | US6227142 Apparatus and method for recognizing and determining the position of a part of an animal |
| 05/08/2001 | US6226879 Method of and means for establishing vehicle datum |
| 05/08/2001 | US6226830 Vacuum cleaner with obstacle avoidance |
| 05/08/2001 | CA2089079C Machine vision surface characterization system |
| 05/03/2001 | WO2001031570A2 Tracking motion of a writing instrument |
| 05/03/2001 | WO2001031564A1 Adjustable, rotatable finger guide in a tenprint scanner with movable prism platen |
| 05/03/2001 | WO2001031563A1 Objective lens system |
| 05/03/2001 | WO2001031294A1 Optical measurements of patterned structures |
| 05/03/2001 | WO2001031293A1 A method and a device for measuring parameters of paint films |
| 05/03/2001 | WO2001031290A2 Method for determination of forest stand attributes and a computer program to perform the method |
| 05/03/2001 | WO2001031289A1 Method and device for real time non-destructive determination of residual stresses in objects by optical holographic interferometry technique |
| 05/03/2001 | WO2001031286A2 Method and device for non-destructive inspection of objects by means of optical holographic interferometry |
| 05/03/2001 | WO2001030545A1 A device and a method for determining coordinates and orientation |
| 05/03/2001 | WO2001004567A3 Method and apparatus for three dimensional inspection of electronic components |
| 05/03/2001 | DE19959570A1 Sensor zum berührenden Vermessen von Materialien Sensor for measurement of contact materials |
| 05/03/2001 | DE19951852A1 Measuring arrangement for non-contact measurement of geometry of outer toothed components; has projection unit with modulated light structure, two cameras and evaluation unit |
| 05/03/2001 | DE19949275A1 Method to determine shape of object; involves arranging several optical 3D sensors in fixed arrangement, and using them to simultaneously image calibration object to define common co-ordinate system |
| 05/03/2001 | DE19949019A1 Messgerät und Verfahren zum Vermessen von Strukturen auf Substraten verschiedener Dicke Instrument and method for measuring structures on substrates of different thickness |
| 05/03/2001 | DE19947374A1 Method to detect geometrical variations of co-ordinate measuring devices or tools; involve measuring large number of lengths optically and determining two-dimensional network by trilateration |
| 05/03/2001 | DE10054142A1 Roughness measuring method of wafer surface, by measuring selected area containing majority of points on wafer surface using atomic force microscope to measure microroughness |
| 05/03/2001 | DE10053187A1 Geometric distortion removal for image taken by e.g. charge coupled device camera, involves applying fine transformation and spatial subdivision repeatedly to image areas whose distortion exceeds threshold |
| 05/03/2001 | DE10009946A1 Vorrichtung zum Vermessen von Bohrungen Apparatus for measuring bores |
| 05/03/2001 | DE10008059A1 Establishing similarity between objects, e.g. goods - determining similarity of first object to several second objects, determining ranking sequence of second objects and then the quality of goods |
| 05/03/2001 | CA2324913A1 A device for measuring relative position error |
| 05/02/2001 | EP1096268A2 System for determining the spatial position and/or orientation of one or more objects |
| 05/02/2001 | EP1095257A1 System and method for image acquisition for inspection of articles on a moving conveyor |
| 05/02/2001 | EP1095247A1 Method for determining direction-dependent properties of enamels |
| 05/02/2001 | EP1095240A1 Shadow casting method for profile measurement |
| 05/02/2001 | CN1293603A Method and apparatus for determining the position of elongated object relative the surface of obstructing body by means of electromagnetic radiation |
| 05/02/2001 | CN1293365A 外观检查装置 Appearance inspection device |
| 05/02/2001 | CN1065336C Paper thickness dynamic measuring device |
| 05/01/2001 | US6226417 Method and system for recognizing a rotated image pattern with reduced processing time and memory space |
| 05/01/2001 | US6226416 Apparatus and method for measuring rotation quantity of spherical object |
| 05/01/2001 | US6226092 Full-field geometrically desensitized interferometer using refractive optics |
| 05/01/2001 | US6226087 Method for measuring the positions of structures on a mask surface |
| 05/01/2001 | US6226086 Thickness monitoring |
| 05/01/2001 | US6226085 Method and apparatus for surface effect characterization |
| 05/01/2001 | US6226079 Defect assessing apparatus and method, and semiconductor manufacturing method |
| 05/01/2001 | US6226076 Distance measuring apparatus using pulse light |
| 05/01/2001 | US6226036 Device for optical investigation of an object |
| 05/01/2001 | US6225012 Method for positioning substrate |
| 05/01/2001 | US6224613 Device for referencing a system of coordinates |
| 04/29/2001 | CA2325036A1 Optical fiber navigation system |
| 04/28/2001 | CA2324894A1 System for determining spatial position and/or orientation of one or more objects |
| 04/26/2001 | WO2001029873A1 Method and apparatus for controlling wafer uniformity using spatially resolved sensors |
| 04/26/2001 | WO2001029504A1 Sensor for contact measurement of materials |
| 04/26/2001 | WO2001029503A1 Method and device for evaluating the tolerance in bearings or joints consisting of coupled components |
| 04/26/2001 | WO2001029502A1 Method for determining geometric structures on or in a substrate as well as material parameters |
| 04/26/2001 | WO2001028737A1 Method and device for testing the cutting edge geometry of a rotary-driven tool |