| Patents for G01B 11 - Measuring arrangements characterised by the use of optical means (73,862) |
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| 01/31/2002 | DE10034252A1 Confocal imaging system has oscillating retro-reflector in form of transparent linear prism with rectangular-triangular base and mirrored mutually perpendicular rear surfaces |
| 01/31/2002 | DE10034023A1 Measurement sensor has movable sensing element mounted on bearer, sensing unit and a compressed gas line formed by casing enclosing electric cable so gas passes between casing and cable |
| 01/31/2002 | DE10033828A1 Optische Erfasung der Raumform von Körpern und Körperteilen Optical Erfasung the spatial shape of bodies and body parts |
| 01/31/2002 | DE10032356A1 Vorrichtung zum Ermitteln von Rad-, Achsgeometriedaten und/oder Bewegungsdaten der Karosserie eines Fahrzeugs Apparatus for determining wheel, axle geometry and / or movement data of the body of a vehicle |
| 01/30/2002 | EP1176636A2 System for manufacturing a thin-film transistor, method of manufacturing a thin-film transistor, method of evaluationg polysilicon, and apparatus for inspecting polysilicon |
| 01/30/2002 | EP1176631A1 Method and apparatus for monitoring polishing state, polishing device, process wafer, semiconductor device, and method of manufacturing semiconductor device |
| 01/30/2002 | EP1176416A1 Method and device for imaging liquid filling container |
| 01/30/2002 | EP1176388A2 Procedure and control system to control the quality of layers on objects |
| 01/30/2002 | EP1175592A1 Position detector with auxiliary means for detecting the direction of the gravity vector |
| 01/30/2002 | EP1175591A1 System for monitoring cables |
| 01/30/2002 | EP0938684B1 Improvements in or relating to an orientation detector arrangement |
| 01/30/2002 | EP0932819B1 Optical position indicator |
| 01/30/2002 | CN2474991Y Photoelectric axial angle coder with intercalation structure |
| 01/30/2002 | CN1333869A Method and device for inspecting objects |
| 01/30/2002 | CN1078703C Target space position and attitutde laser tracking-measuring system and method |
| 01/29/2002 | US6343370 Apparatus and process for pattern distortion detection for semiconductor process and semiconductor device manufactured by use of the apparatus or process |
| 01/29/2002 | US6342946 Device for determining the axial position of hollow cylinders |
| 01/29/2002 | US6342705 System for locating and measuring an index mark on an edge of a wafer |
| 01/29/2002 | US6342697 Method and apparatus for detecting origin of measurement |
| 01/29/2002 | US6341891 Pulsed laser thermometer |
| 01/24/2002 | WO2002007236A1 Displacement detector and processing system |
| 01/24/2002 | WO2002006848A2 System and method for locating and positioning an ultrasonic signal generator for testing purposes |
| 01/24/2002 | WO2002006798A1 Multi-angle inspection for products |
| 01/24/2002 | WO2002006768A1 Method and arrangement for detecting the spatial form of an object |
| 01/24/2002 | WO2002006767A1 Dental panoramic imaging system |
| 01/24/2002 | WO2002006765A1 Method for carrying out the non-contact measurement of geometries of objects |
| 01/24/2002 | WO2001056007A8 Self-referenced tracking |
| 01/24/2002 | US20020009814 Film thickness measuring method of member to be processed using emission spectroscopy and processing method of the member using the measuring method |
| 01/24/2002 | US20020009219 Wafer pattern observation method and device |
| 01/24/2002 | US20020009175 Exposure apparatus, maintenance method therefor, semiconductor device manufacturing method, and semiconductor manufacturing factory |
| 01/24/2002 | US20020009103 Dynamic change detecting method, dynamic change detecting apparatus and ultrasonic diagnostic apparatus |
| 01/24/2002 | US20020008877 Stage apparatus which supports interferometer, stage position measurement method, projection exposure apparatus, projection exposure apparatus maintenance method, semiconductor device manufacturing method, and semiconductor manufacturing factory |
| 01/24/2002 | US20020008875 Two stage optical alignment device and method of aligning optical components |
| 01/24/2002 | US20020008874 System for measuring polarimetric spectrum and other properties of a sample |
| 01/24/2002 | US20020008872 In situ spectroscopic method and related apparatus for measuring electrode gap distance |
| 01/24/2002 | US20020008862 Projection exposure method, manufacturing method for device using same, and projection exposure apparatus |
| 01/24/2002 | US20020008195 Optical encoder and method of fabricating its sensor head |
| 01/24/2002 | DE10134241A1 Pattern checking of a semiconductor wafer uses a master pattern automatically positioned above wafer |
| 01/24/2002 | DE10134169A1 Thickness measuring device for semiconductor wafer determines thickness of workpiece from distance between specified points at which laser beam reflected from top and bottom surface of workpiece fall on imaging unit |
| 01/24/2002 | DE10133674A1 Semiconductor wafer test unit has CAD navigation unit to position pattern test unit |
| 01/24/2002 | DE10044157C1 Vehicle profile measuring device evaluates interruption of sound waves or electromagnetic waves fed between emitter and receiver via reflectors attached to frame extending across vehicle path |
| 01/24/2002 | CA2411632A1 System and method for locating and positioning an ultrasonic signal generator for testing purposes |
| 01/23/2002 | EP1175104A2 Stereoscopic image disparity measuring system |
| 01/23/2002 | EP1174708A1 Inspection method |
| 01/23/2002 | EP1174707A1 Defect inspection method and defect inspection apparatus |
| 01/23/2002 | EP1174698A2 Procedure and device for the optical scanning of a vehicle wheel |
| 01/23/2002 | EP1174682A2 Position determination system |
| 01/23/2002 | EP1174681A2 Method and apparatus for the determination of the contour of sheet metal blanks |
| 01/23/2002 | EP1173787A2 Fiber array connection and scanning alignment method for endoscope application |
| 01/23/2002 | EP1173749A2 Image editing for preparing a texture analysis |
| 01/23/2002 | EP1173726A2 Optical device for measuring position |
| 01/23/2002 | EP1173724A1 Transient thermography measurement of a metal layer thickness |
| 01/23/2002 | EP1173723A1 Method and device for controlling the outline of a motor vehicle |
| 01/23/2002 | EP1068486B1 Position measuring device |
| 01/23/2002 | CN1332840A Information reader |
| 01/23/2002 | CN1332363A Non-contact convex contour and elliptic curve measuring system for piston |
| 01/23/2002 | CN1332358A Trigonometric laser measuirng head |
| 01/23/2002 | CN1078119C Laser working apparatus and laser working method |
| 01/22/2002 | US6341173 Device and method for the determination of diameters of crystals |
| 01/22/2002 | US6341016 Method and apparatus for measuring three-dimensional shape of object |
| 01/22/2002 | US6341015 Compensation for measurement uncertainty due to atmospheric effects |
| 01/22/2002 | US6341014 Method of and a system for detecting errors in harmonizing the axis of an optical instrument |
| 01/22/2002 | US6341013 Method and device for regulating the attitude of a motor vehicle |
| 01/22/2002 | US6340602 Method of measuring meso-scale structures on wafers |
| 01/22/2002 | US6340109 Solder bump measuring method and apparatus |
| 01/22/2002 | CA2137574C Holograms having a standard reference colour |
| 01/22/2002 | CA2116445C Portable laser device for alignment tasks |
| 01/22/2002 | CA2003373C Envelope flap profiling apparatus |
| 01/17/2002 | WO2002005211A1 Part recognition data creation method and apparatus, electronic part mounting apparatus, and recorded medium |
| 01/17/2002 | WO2002004988A1 Remote sensing and measurement of distances along a borehole |
| 01/17/2002 | WO2002004982A1 Apparatus for and method of optical detection and analysis of an object |
| 01/17/2002 | WO2002004891A1 Spatial positioning |
| 01/17/2002 | WO2002004890A1 Aligning optical components of an optical measuring system |
| 01/17/2002 | WO2002004889A1 Interferometric, low coherence shape measurement device for a plurality of surfaces (valve seat) via several reference planes |
| 01/17/2002 | WO2002004888A1 Interferometric, short coherent form-measuring device for several surfaces (valve seats) using multi-focal optics, optical segments or high depth of focus |
| 01/17/2002 | WO2002004885A1 Method and apparatus for high-speed thickness mapping of patterned thin films |
| 01/17/2002 | WO2002004884A1 Low-coherence interferometric device for depth scanning an object |
| 01/17/2002 | WO2002004312A1 Packaging material for packaging pourable food products, and package made therefrom |
| 01/17/2002 | WO2002004295A1 Machine for packaging pourable food products |
| 01/17/2002 | WO2002003852A2 Method and apparatus for diagnosing and monitoring eye disease |
| 01/17/2002 | WO2001059402A3 Optical systems for measuring form and geometric dimensions of precision engineered parts |
| 01/17/2002 | WO2001023831A3 Cable device for detecting and monitoring rock and soil displacement |
| 01/17/2002 | US20020006282 Image pickup apparatus and method, and recording medium |
| 01/17/2002 | US20020006000 Omnidirectional vision sensor |
| 01/17/2002 | US20020005959 Measuring device for reinforcing steel rods for concrete |
| 01/17/2002 | US20020005958 Non-contact thickness-measuring device |
| 01/17/2002 | US20020005956 Method and device for measuring three-dimensional position |
| 01/17/2002 | US20020005954 Device and method for measuring transmission and reflection properties of objects and surfaces |
| 01/17/2002 | US20020005947 Optical inspection method and apparatus utilizing a variable angle design |
| 01/17/2002 | US20020005945 Surface inspecting apparatus and method |
| 01/17/2002 | US20020005724 System and method for measuring dynamic loads in a magnetic bearing |
| 01/17/2002 | US20020005477 Optical encoder |
| 01/17/2002 | US20020005476 Apparatus for detecting rotational angle |
| 01/17/2002 | DE10123715A1 Method and arrangement for acquisition of three dimensional objects by supplementing two dimensional measurements with measurement from reference point to provide third dimension |
| 01/17/2002 | DE10036227A1 Mikroskop und Verfahren zur quantitativen optischen Messung der Topographie einer Oberfläche Microscope and method for the quantitative optical measurement of the topography of a surface |
| 01/17/2002 | DE10032498A1 Three-dimensional detection of surface particle characteristics of grinding tool by optically imaging to determine three-dimensional profile |
| 01/17/2002 | DE10031770A1 Telescopic and/or articulated arm for tomograph has optical transmitter and receivers attached to relatively movable parts of arm |
| 01/17/2002 | CA2415455A1 Apparatus for and method of optical detection and analysis of an object |
| 01/16/2002 | EP1172678A2 Omnidirectional vision sensor |
| 01/16/2002 | EP1172666A2 Aircraft identification system |