Patents for G01B 11 - Measuring arrangements characterised by the use of optical means (73,862) |
---|
08/02/2001 | WO2000057228A3 Apparatus for producing and guiding a light beam |
08/02/2001 | US20010010363 Surface inspection using the ratio of intensities of s- and p-polarized light components of a laser beam reflected a rough surface |
08/02/2001 | DE19962278A1 Positionsmeßeinrichtung A position |
08/02/2001 | DE10001800A1 Verfahren und Vorrichtung zur Messung insbesondere von Oberflächentopologien in mikroskopischer Auflösung Method and apparatus for measurement of surface topologies in particular microscopic resolution |
08/02/2001 | CA2398943A1 Safety interlock for mechanically actuated closure device |
08/02/2001 | CA2397419A1 Optical element |
08/01/2001 | EP1120753A2 Paper sheet discriminating device |
08/01/2001 | EP1120640A1 Method and apparatus for inspecting appearance and shape of subject body |
08/01/2001 | EP1120627A2 Wheel alignment apparatus |
08/01/2001 | EP1120211A1 Automatic flitch planer |
08/01/2001 | EP1119821A1 System and method for image subtraction for ball and bumped grid array inspection |
08/01/2001 | EP1119742A1 Fibre optic sensor |
08/01/2001 | EP1119740A1 Distance measuring device with magneto-optical effect and measuring chain incorporating same |
08/01/2001 | EP1119739A1 Measurement of small, periodic undulations in surfaces |
08/01/2001 | CN2441116Y Device for measuring moderate and long radius of curves with high accuracy |
08/01/2001 | CN2441115Y Online measuring instrument for geometric size of high voltage introductive wires |
08/01/2001 | CN1306616A Appts. and associated method for inspecting containers for bulges |
08/01/2001 | CN1069133C Non-contact measuring method and equipment fo thermal expansion coefficient |
07/31/2001 | USRE37299 Atomic force microscopy |
07/31/2001 | US6269197 Determining a depth |
07/31/2001 | US6268923 Optical method and system for measuring three-dimensional surface topography of an object having a surface contour |
07/31/2001 | US6268921 Interferometric device for recording the depth optical reflection and/or transmission characteristics of an object |
07/31/2001 | US6268919 System and method for measuring thin film properties and analyzing two-dimensional histograms using and/not operations |
07/31/2001 | US6268918 Three-dimensional input device |
07/31/2001 | US6268916 System for non-destructive measurement of samples |
07/31/2001 | US6268912 Angle detection method for bending machine, angle detection apparatus and angle sensor |
07/31/2001 | US6268093 Optical exposure system |
07/31/2001 | CA2333439A1 Method and apparatus to measure the cross-sectional area of an object |
07/26/2001 | WO2001054068A2 Method and system for detecting defects on a printed circuit board |
07/26/2001 | WO2001053798A1 Method and apparatus for measuring surface configuration |
07/26/2001 | WO2001053778A1 Method and arrangement for optically detecting the position of a moveable mirror |
07/26/2001 | WO2001053775A1 Scanning using position transmission for triggering the recording of measured values |
07/26/2001 | US20010009462 Compensation for measurement uncertainty due to atmospheric effects |
07/26/2001 | US20010009460 Angle compensation method |
07/26/2001 | US20010009070 Wheel alignment apparatus |
07/26/2001 | DE10101250A1 Überwachung der Umgebung eines Motorfahrzeugs auf Kollisionsgefahr Monitoring the environment of a motor vehicle collision risk |
07/26/2001 | DE10023894C1 Optical scanner for optical control of welding electrode usage uses evaluation of light reflected from welding electrode |
07/26/2001 | DE10003717A1 Measurement arrangement and procedure for two-dimensional object involves computing and outputting position and assessments of object by microprocessor from output signal of CCD sensor |
07/26/2001 | DE10003194A1 Optical triangulation method for determining surface roughness of optically scattering surface, involves using incoherent light source for surface roughness measurement |
07/26/2001 | DE10002684A1 Verfahren zur Ermittlung von Umform-Kenngrössen an Blechformteilen Procedure for the determination of metal forming characteristic sizes of sheet metal parts |
07/26/2001 | DE10002196A1 Method for control of position of rotating mirrors by optically determining position monitors laser beam reflected from mirror to diode position sensor |
07/26/2001 | DE10001239A1 Device for measuring structures on substrate has non-optical measurement device on bearer element, whereby normal air pressure conditions exist between measurement device and substrate |
07/25/2001 | EP1118835A1 Clearance measuring device and method for exposure |
07/25/2001 | EP1118834A2 Device to optically measure the wheels of railway vehicles |
07/25/2001 | EP1118494A2 Method of aligning a sensor in an adaptive cruise control system in a vehicle |
07/25/2001 | EP1118400A2 Method for applying deformation indicators on metal sheets |
07/25/2001 | EP1117975A1 Document imaging system |
07/25/2001 | EP1117974A1 Calibrating a depth sensor of a laser-processing device and producing a die layer by layer using variable programming |
07/25/2001 | EP1117973A1 Method and apparatus for interferometric measurement |
07/25/2001 | EP1078217A4 Non-destructive analysis of a semiconductor using reflectance spectrometry |
07/25/2001 | EP1078216A4 Method and apparatus for recording three-dimensional distribution of light scattering |
07/25/2001 | EP0963541A4 Variable pitch grating for diffraction range finding system |
07/25/2001 | CN1305582A Method and arrangement for determining geometry of objects using coordinate measuring device |
07/24/2001 | US6266198 Consolidated laser alignment and test station |
07/24/2001 | US6266148 Method for measuring surfaces by confocal microcopy |
07/24/2001 | US6266143 End cap incorporating laser alignment target |
07/24/2001 | US6266142 Noncontact position and orientation measurement system and method |
07/24/2001 | US6266138 System and method for detecting defects in a surface of a workpiece |
07/24/2001 | US6266130 Position detecting method and position detecting system |
07/24/2001 | US6265992 Position measuring system and method for operating a position measuring system |
07/24/2001 | US6265725 Optoelectronic device for detecting objects in a monitoring range with a distance sensor |
07/24/2001 | US6265719 Inspection method and apparatus using electron beam |
07/24/2001 | US6265683 Semiconductor material classification device |
07/24/2001 | US6263583 Method of measuring eyeglass frame, an apparatus for the method, and eyeglass lens grinding apparatus having the same |
07/19/2001 | WO2001051887A1 Phase profilometry system with telecentric projector |
07/19/2001 | WO2001051886A1 Apparatus and methods for surface contour measurement |
07/19/2001 | WO2001051885A1 A method and system for measuring bumps height |
07/19/2001 | US20010008992 Periphery monitoring device for motor vehicle and recording medium containing program for determining danger of collision for motor vehicle |
07/19/2001 | US20010008448 Reflectance method for evaluating the surface characteristics of opaque materials |
07/19/2001 | US20010008446 Method of aligning an ACC-sensor on a vehicle |
07/19/2001 | US20010008445 System, method, and coating for strain analysis |
07/19/2001 | US20010008442 Positioning mark and alignment method using the same |
07/19/2001 | US20010008275 Paper sheet discriminating device |
07/19/2001 | US20010008273 Abbe arm calibration system for use in lithographic apparatus |
07/19/2001 | US20010008272 Measuring instrument and method for measuring features on a substrate |
07/19/2001 | US20010008270 Rotation detecting apparatus detecting rotation operation by light transmission to prevent invalid detection |
07/19/2001 | US20010008061 Component handling apparatus and method of handling the same |
07/19/2001 | DE19937647C1 Three-dimensional scanning method for spectacles frame lens seat uses timble movement of image of lens opening relative to video scanner system |
07/19/2001 | DE10001429A1 Calibration device for optical strip projection measuring system, has surface which has coarseness with middle depth of roughness that is large in relation to wavelength of electromagnetic radiation |
07/19/2001 | DE10001343A1 Detecting method for three=dimensional form and color of object surface, involves obtaining color information of every image from three or more detections of different photographed illumination colors |
07/18/2001 | EP1117129A2 Semiconductor wafer inspection machine |
07/18/2001 | EP1116950A1 Method and apparatus for inspecting a printed circuit board assembly |
07/18/2001 | EP1116937A1 Optical microphone/sensor |
07/18/2001 | EP1116932A2 Measuring apparatus and method for measuring structures on a substrat |
07/18/2001 | EP1116170A1 Programmable lens assemblies and optical systems incorporating them |
07/18/2001 | EP1116169A1 Improvements relating to pattern recognition |
07/18/2001 | EP1116056A1 Variable coupler fiberoptic sensor and sensing apparatus using the sensor |
07/18/2001 | EP1116007A1 Fabricating optical waveguide gratings and/or characterising optical waveguides |
07/18/2001 | EP1036310A4 Apparatus and associated method for inspecting containers for bulges |
07/18/2001 | EP0678189B1 Determination of the surface properties of an object |
07/18/2001 | EP0674759B1 Method and apparatus for determining the alignment of motor vehicle wheels |
07/18/2001 | CN1304286A Conveying device and method for component |
07/18/2001 | CN1068677C 原子力显微镜 AFM |
07/17/2001 | US6263292 High accuracy particle dimension measurement system |
07/17/2001 | US6262802 Scale for sensing moving object, and apparatus for sensing moving object using same |
07/17/2001 | US6262738 Method for estimating volumetric distance maps from 2D depth images |
07/17/2001 | US6261152 Heterdoyne Thickness Monitoring System |
07/12/2001 | WO2001050760A1 Solder paste inspection system |
07/12/2001 | WO2001050410A1 Inspection system with vibration resistant video capture |
07/12/2001 | WO2001050157A1 Optical barrier device |