Patents for G01B 11 - Measuring arrangements characterised by the use of optical means (73,862)
08/2001
08/02/2001WO2000057228A3 Apparatus for producing and guiding a light beam
08/02/2001US20010010363 Surface inspection using the ratio of intensities of s- and p-polarized light components of a laser beam reflected a rough surface
08/02/2001DE19962278A1 Positionsmeßeinrichtung A position
08/02/2001DE10001800A1 Verfahren und Vorrichtung zur Messung insbesondere von Oberflächentopologien in mikroskopischer Auflösung Method and apparatus for measurement of surface topologies in particular microscopic resolution
08/02/2001CA2398943A1 Safety interlock for mechanically actuated closure device
08/02/2001CA2397419A1 Optical element
08/01/2001EP1120753A2 Paper sheet discriminating device
08/01/2001EP1120640A1 Method and apparatus for inspecting appearance and shape of subject body
08/01/2001EP1120627A2 Wheel alignment apparatus
08/01/2001EP1120211A1 Automatic flitch planer
08/01/2001EP1119821A1 System and method for image subtraction for ball and bumped grid array inspection
08/01/2001EP1119742A1 Fibre optic sensor
08/01/2001EP1119740A1 Distance measuring device with magneto-optical effect and measuring chain incorporating same
08/01/2001EP1119739A1 Measurement of small, periodic undulations in surfaces
08/01/2001CN2441116Y Device for measuring moderate and long radius of curves with high accuracy
08/01/2001CN2441115Y Online measuring instrument for geometric size of high voltage introductive wires
08/01/2001CN1306616A Appts. and associated method for inspecting containers for bulges
08/01/2001CN1069133C Non-contact measuring method and equipment fo thermal expansion coefficient
07/2001
07/31/2001USRE37299 Atomic force microscopy
07/31/2001US6269197 Determining a depth
07/31/2001US6268923 Optical method and system for measuring three-dimensional surface topography of an object having a surface contour
07/31/2001US6268921 Interferometric device for recording the depth optical reflection and/or transmission characteristics of an object
07/31/2001US6268919 System and method for measuring thin film properties and analyzing two-dimensional histograms using and/not operations
07/31/2001US6268918 Three-dimensional input device
07/31/2001US6268916 System for non-destructive measurement of samples
07/31/2001US6268912 Angle detection method for bending machine, angle detection apparatus and angle sensor
07/31/2001US6268093 Optical exposure system
07/31/2001CA2333439A1 Method and apparatus to measure the cross-sectional area of an object
07/26/2001WO2001054068A2 Method and system for detecting defects on a printed circuit board
07/26/2001WO2001053798A1 Method and apparatus for measuring surface configuration
07/26/2001WO2001053778A1 Method and arrangement for optically detecting the position of a moveable mirror
07/26/2001WO2001053775A1 Scanning using position transmission for triggering the recording of measured values
07/26/2001US20010009462 Compensation for measurement uncertainty due to atmospheric effects
07/26/2001US20010009460 Angle compensation method
07/26/2001US20010009070 Wheel alignment apparatus
07/26/2001DE10101250A1 Überwachung der Umgebung eines Motorfahrzeugs auf Kollisionsgefahr Monitoring the environment of a motor vehicle collision risk
07/26/2001DE10023894C1 Optical scanner for optical control of welding electrode usage uses evaluation of light reflected from welding electrode
07/26/2001DE10003717A1 Measurement arrangement and procedure for two-dimensional object involves computing and outputting position and assessments of object by microprocessor from output signal of CCD sensor
07/26/2001DE10003194A1 Optical triangulation method for determining surface roughness of optically scattering surface, involves using incoherent light source for surface roughness measurement
07/26/2001DE10002684A1 Verfahren zur Ermittlung von Umform-Kenngrössen an Blechformteilen Procedure for the determination of metal forming characteristic sizes of sheet metal parts
07/26/2001DE10002196A1 Method for control of position of rotating mirrors by optically determining position monitors laser beam reflected from mirror to diode position sensor
07/26/2001DE10001239A1 Device for measuring structures on substrate has non-optical measurement device on bearer element, whereby normal air pressure conditions exist between measurement device and substrate
07/25/2001EP1118835A1 Clearance measuring device and method for exposure
07/25/2001EP1118834A2 Device to optically measure the wheels of railway vehicles
07/25/2001EP1118494A2 Method of aligning a sensor in an adaptive cruise control system in a vehicle
07/25/2001EP1118400A2 Method for applying deformation indicators on metal sheets
07/25/2001EP1117975A1 Document imaging system
07/25/2001EP1117974A1 Calibrating a depth sensor of a laser-processing device and producing a die layer by layer using variable programming
07/25/2001EP1117973A1 Method and apparatus for interferometric measurement
07/25/2001EP1078217A4 Non-destructive analysis of a semiconductor using reflectance spectrometry
07/25/2001EP1078216A4 Method and apparatus for recording three-dimensional distribution of light scattering
07/25/2001EP0963541A4 Variable pitch grating for diffraction range finding system
07/25/2001CN1305582A Method and arrangement for determining geometry of objects using coordinate measuring device
07/24/2001US6266198 Consolidated laser alignment and test station
07/24/2001US6266148 Method for measuring surfaces by confocal microcopy
07/24/2001US6266143 End cap incorporating laser alignment target
07/24/2001US6266142 Noncontact position and orientation measurement system and method
07/24/2001US6266138 System and method for detecting defects in a surface of a workpiece
07/24/2001US6266130 Position detecting method and position detecting system
07/24/2001US6265992 Position measuring system and method for operating a position measuring system
07/24/2001US6265725 Optoelectronic device for detecting objects in a monitoring range with a distance sensor
07/24/2001US6265719 Inspection method and apparatus using electron beam
07/24/2001US6265683 Semiconductor material classification device
07/24/2001US6263583 Method of measuring eyeglass frame, an apparatus for the method, and eyeglass lens grinding apparatus having the same
07/19/2001WO2001051887A1 Phase profilometry system with telecentric projector
07/19/2001WO2001051886A1 Apparatus and methods for surface contour measurement
07/19/2001WO2001051885A1 A method and system for measuring bumps height
07/19/2001US20010008992 Periphery monitoring device for motor vehicle and recording medium containing program for determining danger of collision for motor vehicle
07/19/2001US20010008448 Reflectance method for evaluating the surface characteristics of opaque materials
07/19/2001US20010008446 Method of aligning an ACC-sensor on a vehicle
07/19/2001US20010008445 System, method, and coating for strain analysis
07/19/2001US20010008442 Positioning mark and alignment method using the same
07/19/2001US20010008275 Paper sheet discriminating device
07/19/2001US20010008273 Abbe arm calibration system for use in lithographic apparatus
07/19/2001US20010008272 Measuring instrument and method for measuring features on a substrate
07/19/2001US20010008270 Rotation detecting apparatus detecting rotation operation by light transmission to prevent invalid detection
07/19/2001US20010008061 Component handling apparatus and method of handling the same
07/19/2001DE19937647C1 Three-dimensional scanning method for spectacles frame lens seat uses timble movement of image of lens opening relative to video scanner system
07/19/2001DE10001429A1 Calibration device for optical strip projection measuring system, has surface which has coarseness with middle depth of roughness that is large in relation to wavelength of electromagnetic radiation
07/19/2001DE10001343A1 Detecting method for three=dimensional form and color of object surface, involves obtaining color information of every image from three or more detections of different photographed illumination colors
07/18/2001EP1117129A2 Semiconductor wafer inspection machine
07/18/2001EP1116950A1 Method and apparatus for inspecting a printed circuit board assembly
07/18/2001EP1116937A1 Optical microphone/sensor
07/18/2001EP1116932A2 Measuring apparatus and method for measuring structures on a substrat
07/18/2001EP1116170A1 Programmable lens assemblies and optical systems incorporating them
07/18/2001EP1116169A1 Improvements relating to pattern recognition
07/18/2001EP1116056A1 Variable coupler fiberoptic sensor and sensing apparatus using the sensor
07/18/2001EP1116007A1 Fabricating optical waveguide gratings and/or characterising optical waveguides
07/18/2001EP1036310A4 Apparatus and associated method for inspecting containers for bulges
07/18/2001EP0678189B1 Determination of the surface properties of an object
07/18/2001EP0674759B1 Method and apparatus for determining the alignment of motor vehicle wheels
07/18/2001CN1304286A Conveying device and method for component
07/18/2001CN1068677C 原子力显微镜 AFM
07/17/2001US6263292 High accuracy particle dimension measurement system
07/17/2001US6262802 Scale for sensing moving object, and apparatus for sensing moving object using same
07/17/2001US6262738 Method for estimating volumetric distance maps from 2D depth images
07/17/2001US6261152 Heterdoyne Thickness Monitoring System
07/12/2001WO2001050760A1 Solder paste inspection system
07/12/2001WO2001050410A1 Inspection system with vibration resistant video capture
07/12/2001WO2001050157A1 Optical barrier device