| Patents for G01B 11 - Measuring arrangements characterised by the use of optical means (73,862) |
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| 03/28/2002 | WO2002025207A1 Method for measuring the geometry of an object by means of a co-ordination measuring device |
| 03/28/2002 | WO2002025206A1 Assembly and method for the optical-tactile measurement of a structure |
| 03/28/2002 | WO2001090726A3 Optical alignment in capillary detection using capillary wall scatter |
| 03/28/2002 | WO2001090685A3 Height scanning interferometer for determining the absolute position and surface profile of an object with respect to a datum |
| 03/28/2002 | WO2000057127A9 Method and apparatus for wafer metrology |
| 03/28/2002 | US20020038196 Database interpolation method for optical measurement of diffractive microstructures |
| 03/28/2002 | US20020038084 Medical therapeutic and/or diagnostic apparatus having a position detecting device |
| 03/28/2002 | US20020037460 Stage unit, measurement unit and measurement method, and exposure apparatus and exposure method |
| 03/28/2002 | US20020037252 Gamma radiation emitted from a near-infrared fluorescent colorant injected in advance into the vicinity of a tumor is detected by use of a gamma-probe. |
| 03/28/2002 | US20020037099 Pattern inspection apparatus and pattern inspection method |
| 03/28/2002 | US20020036779 Apparatus for measuring three-dimensional shape |
| 03/28/2002 | US20020036777 Light receiving apparatus, mark detecting apparatus using light receiving apparatus, exposing apparatus, maintenance method of exposing apparatus, manufacturing method of semiconductor device using exposing apparatus and semiconductor manufacturing plant |
| 03/28/2002 | US20020036772 Defect inspection apparatus for phase shift mask |
| 03/28/2002 | US20020036769 Method and apparatus for inspecting defects of a specimen |
| 03/28/2002 | US20020036767 Method for monitoring an optical waveguide, as well as monitoring system and monitoring unit for said method |
| 03/28/2002 | US20020036764 Laser tracking interferometric length measuring instrument and method of measuring length and coordinates using the same |
| 03/28/2002 | US20020036570 Object detection apparatus |
| 03/28/2002 | US20020036512 Inspection method of electrical part, inspection apparatus of electric junction box and inspection apparatus of terminal fittings |
| 03/28/2002 | US20020036039 Pneumatic tire and measuring method of tread wear amount of the same |
| 03/28/2002 | DE10046818A1 Angle or position measurement device has an adjustment mechanism that allows a scanner unit to be moved relative to a measurement body in a precisely linear manner |
| 03/28/2002 | DE10042723A1 Cylinder head chamber volume measurement method in vehicle production line, involves projecting strip patterns on head and determining projection depth by image processing during which head openings are virtually sealed |
| 03/28/2002 | CA2429036A1 A device and a method for producing information about the properties of an environment |
| 03/27/2002 | EP1191714A1 Method for monitoring an optical waveguide, monitoring system and monitoring unit for said method |
| 03/27/2002 | EP1191481A2 Method and measuring apparatus for position estimation of a structure element border on a substrate |
| 03/27/2002 | EP1191350A1 Optical sensor with controlled emission |
| 03/27/2002 | EP1191304A2 Hole center detecting apparatus, straightness measuring apparatus and residual torsion measuring apparatus |
| 03/27/2002 | EP1190818A2 Position-orientation recognition device |
| 03/27/2002 | EP1190679A2 Therapeutic and/or diagnostic medical apparatus with a position detection device |
| 03/27/2002 | EP1190370A1 Device for identifying persons |
| 03/27/2002 | EP1190216A1 A method and a device for calibrating equipment for determining the surface uniformity of film or sheet material |
| 03/27/2002 | EP1190215A1 Measuring angles of wheels using transition points of reflected laser lines |
| 03/27/2002 | EP1190214A1 Apparatus and method for determining the position and orientation of a first axis of a part relative to a known frame of reference |
| 03/27/2002 | EP1190213A1 Color structured light 3d-imaging system |
| 03/27/2002 | EP1190212A1 Device for optoelectronic determination of the length and/or width of a body situated on a support |
| 03/27/2002 | EP1190211A1 Method for optically detecting the shape of objects |
| 03/27/2002 | EP1190210A1 Analysing method and device for automatically sorting products such as fruits |
| 03/27/2002 | EP1190209A1 Method and device for measuring the thickness of a layer |
| 03/27/2002 | EP1190208A1 Method for measuring a three-dimensional object, or assembly of objects |
| 03/27/2002 | EP1190207A1 Measurement apparatus for measuring the position and orientation of a first part to be worked, inspected or moved |
| 03/27/2002 | EP1189732A1 Method and device for calibrating robot measuring stations, manipulators and associated optical measuring devices |
| 03/27/2002 | EP1159596A4 Hand held probe for measuring tire tread wear |
| 03/27/2002 | EP1040039B1 Adaptive absolute steering angle sensor |
| 03/27/2002 | EP1012621B1 Distance measuring apparatus using pulse light |
| 03/27/2002 | EP0923705B1 Method and device for determining the spatial coordinates of objects |
| 03/27/2002 | EP0787338B1 Aircraft identification and docking guidance systems |
| 03/27/2002 | CN1341853A Chip testing device |
| 03/27/2002 | CN1081793C Apparatus and method for detecting outward appearance of electronic elements |
| 03/26/2002 | US6363169 Apparatus and method of three-dimensional modeling |
| 03/26/2002 | US6363166 Automated photomask inspection apparatus |
| 03/26/2002 | US6362883 Method and device for aligning substrates in flat panel displays |
| 03/26/2002 | US6362492 Method and device for detecting edge structures |
| 03/26/2002 | US6362468 Optical unit for detecting object and coordinate input apparatus using same |
| 03/21/2002 | WO2002023918A2 Mehthod and device for measuring three-dimensional shapes |
| 03/21/2002 | WO2002023291A2 Digital imaging system having distribution controlled over a distributed network |
| 03/21/2002 | WO2002023231A2 Generation of a library of periodic grating diffraction signals |
| 03/21/2002 | WO2002023127A1 Method for identifying measuring points in an optical measuring system |
| 03/21/2002 | WO2002023126A1 Method for establishing the position of a temporary on an object relative to know features of the object |
| 03/21/2002 | WO2002023124A1 Method and device for measuring the curvature of a reflective surface |
| 03/21/2002 | WO2002023123A1 Optical sensor |
| 03/21/2002 | WO2002023121A1 Positioning in computer aided manufacturing by measuring both parts (cameras, retro reflectors) |
| 03/21/2002 | WO2002023118A1 Optical metrology system and method employing laser-server supplying laser energy to distributed slave metrology heads |
| 03/21/2002 | WO2002022019A1 Frameless radiosurgery treatment system and method |
| 03/21/2002 | WO2002021894A2 Method for the reconstruction of the geometry of the inner surface of a cavity |
| 03/21/2002 | WO2001095370A3 Calibration methods for placement machines incorporating on-head linescan sensing |
| 03/21/2002 | WO2001088467A3 Data age adjustments |
| 03/21/2002 | WO2001082634A3 Three-dimensional image projector |
| 03/21/2002 | WO2001064138A3 Systems and methods for mapping and marking the thickness of bioprosthetic sheet |
| 03/21/2002 | WO2001061371A3 Device for detecting the presence of objects |
| 03/21/2002 | US20020035717 Navigation method and device for pattern observation of semiconductor device |
| 03/21/2002 | US20020035455 Generation of a library of periodic grating diffraction signals |
| 03/21/2002 | US20020035435 Method for inspecting defect and system therefor |
| 03/21/2002 | US20020034831 Alignment method and exposure apparatus using the method |
| 03/21/2002 | US20020034327 Position-orientation recognition device |
| 03/21/2002 | US20020034317 Displacement sensor having a display data output |
| 03/21/2002 | US20020034151 Planar shape characteristic measuring apparatus and planar shape characteristic measuring method |
| 03/21/2002 | US20020033955 Method for depth detection in 3D imaging providing a depth measurement for each unitary group of pixels |
| 03/21/2002 | US20020033954 Caching of intra-layer calculations for rapid rigorous coupled-wave analyses |
| 03/21/2002 | US20020033951 Dynamic angle measuring interferometer |
| 03/21/2002 | US20020033945 Spectroscopic scatterometer system |
| 03/21/2002 | US20020033941 Method and system for aligning an optical fiber delivery system |
| 03/21/2002 | US20020033885 Method and apparatus for the determination of the contour of sheet metal blanks |
| 03/21/2002 | US20020033819 Apparatus and method for three-dimensional scanning of a subject, fabrication of a model therefrom, and the model produced thereby |
| 03/21/2002 | US20020033441 Image pickup apparatus |
| 03/21/2002 | US20020033052 Rotary shaft axial elongation measuring method and device |
| 03/21/2002 | DE10043155A1 Test body impression evaluating device identifies location of debonded regions, and quantitatively determines area of debonded regions in boundary area outside test body impression |
| 03/21/2002 | DE10042123A1 Parameter measuring device for semiconductor wafer manufacturing, has case which is attached to vacuum adapter to bellows and flange in cover plate |
| 03/21/2002 | CA2422271A1 Digital imaging system having distribution controlled over a distributed network |
| 03/21/2002 | CA2422263A1 Mehthod and device for measuring three-dimensional shapes |
| 03/20/2002 | EP1189017A1 Displacement sensor |
| 03/20/2002 | EP1189015A1 Rotary shaft axial elongation measuring method and device |
| 03/20/2002 | EP1188035A1 Method and device for scanning objects |
| 03/20/2002 | EP1092123A4 Method and apparatus for detecting ultrasonic surface displacements using post-collection optical amplification |
| 03/20/2002 | CN1340690A Inspection method for liquid crystal box thickness, control system for liquid crystal box thickness and manufacture method for liquid crystal device |
| 03/20/2002 | CN1081326C Laser on-line testing and checking apparatus for rubber element outline |
| 03/19/2002 | US6360012 In situ projection optic metrology method and apparatus |
| 03/19/2002 | US6359741 Adjusting device for attitude and position of optical elements |
| 03/19/2002 | US6359694 Method and device for identifying the position of an electrical component or terminals thereof, and equipping head employing same |
| 03/19/2002 | US6359692 Method and system for profiling objects having multiple reflective surfaces using wavelength-tuning phase-shifting interferometry |
| 03/19/2002 | US6359691 Device for measuring translation, rotation or velocity via light beam interference |
| 03/19/2002 | US6359690 Apparatus, system and method for determining wear of an article |