Patents for G01B 11 - Measuring arrangements characterised by the use of optical means (73,862)
01/2002
01/02/2002EP0857293B1 Optical encoder for indicating the position of an adjustable member
01/01/2002US6336019 Surface position and velocity measurement for photoreceptor belt
01/01/2002US6335793 Planar waveguide chemical sensor
01/01/2002US6335792 Method and apparatus for measuring internal property distribution in scattering medium
01/01/2002US6335757 CCD imaging device for high speed profiling
01/01/2002US6335523 Semiconductor dark image position sensitive device
01/01/2002US6335522 Optical probe having a refractive index micro-lens and method of manufacturing the same
12/2001
12/27/2001WO2001099044A1 A system for the location of a position of objects
12/27/2001WO2001098761A1 Overlay alignment mark design
12/27/2001WO2001098760A1 Illumination device for inspection
12/27/2001WO2001098732A1 Measuring device for detecting the dimensions of test samples
12/27/2001WO2001098730A2 Sizing objects from an image
12/27/2001US20010055438 Fiber optic displacement sensor
12/27/2001US20010055418 Image-correspondence position detection device, distance measuring device and apparatus using the same
12/27/2001US20010055415 Pattern inspection method and pattern inspection device
12/27/2001US20010055095 Method of corneal anlysis using a checkered placido apparatus
12/27/2001US20010055063 Position detection apparatus, position detection method and position detection program
12/27/2001US20010055016 System and method for volume rendering-based segmentation
12/27/2001US20010054306 Apparatus and method for determining porosity
12/27/2001CA2382075A1 Method of measuring and sizing objects from an image of a human face using iris size
12/26/2001CN1328635A Optical measuring device
12/25/2001US6334097 Method of determining lethality of defects in circuit pattern inspection method of selecting defects to be reviewed and inspection system of circuit patterns involved with the methods
12/25/2001US6333992 Defect judgement processing method and apparatus
12/25/2001US6333786 Aligning method
12/25/2001US6333785 Standard for calibrating and checking a surface inspection device and method for the production thereof
12/25/2001US6333783 Distance measuring system
12/25/2001US6333782 Distance measuring apparatus
12/25/2001US6333733 Position-sensing unit and multidimensional pointer comprising one or more such units
12/25/2001US6333696 Collision preventing device for a measuring apparatus and measuring apparatus having collision preventing unit
12/25/2001US6333500 Method of inspecting a substrate furnished with a phosphor layer
12/25/2001US6333497 Probe with tip having micro aperture for detecting or irradiating light, near-field optical microscope, recording/reproduction apparatus, and exposure apparatus using the probe, and method of manufacturing the probe
12/25/2001US6332365 Method and devices for detecting flexure, and structure such as a geotechnical or building structure equipped with such a device
12/25/2001US6332275 Margin inspector for IC wafers
12/20/2001WO2001096926A2 Microscope and method for measuring surface topography in a quantitative and optical manner
12/20/2001WO2001096816A1 A position detector for a scanning device
12/20/2001US20010053942 Input device for commanding control operations of a real and virtual object
12/20/2001US20010053588 System of fabricating plane parallel substrates with uniform optical paths
12/20/2001US20010053557 Inspection of defects on the circumference of semiconductor wafers
12/20/2001US20010053245 Image alignment method, comparative inspection method, and comparative inspection device for comparative inspections
12/20/2001US20010052987 Method and apparatus for measuring film thickness
12/20/2001US20010052985 Image capturing apparatus and distance measuring method
12/20/2001US20010052984 Object-displacement detector and object-displacement controller
12/20/2001US20010052983 Device for quantitative assessment of the aligned position of two machine parts, workpieces or the like
12/20/2001US20010052979 Simultaneous imaging and spectroscopy apparatus
12/20/2001US20010052581 Position sensing device having a single photosensing element
12/20/2001US20010052269 Methods and apparatus for determining the location of a shaft within a vessel
12/20/2001US20010052257 Nanotomography
12/20/2001DE10121288A1 Vermessungsinstrument mit optischem Entfernungsmesser Surveying instrument with optical rangefinder
12/20/2001DE10027449A1 Visualization method of periodic structures on rough cylindrical surface, involves detecting peak-to-valley value of periodic structures on sample, based on signal-to-noise ratio and enlarged diffraction lines
12/20/2001DE10027439A1 Topography parameters interpretation method for periodic surface structures on sample, involves detecting symmetry characteristics of periodic structures, based on spacing of diffraction orders
12/19/2001EP1164405A2 Method and device to generate a three dimensional object
12/19/2001EP1163940A1 3-d model providing device
12/19/2001EP1163488A1 Method and apparatus for wafer metrology
12/19/2001EP1163136A1 Device for continuously measuring deformations in a tyre during the travel movement of a motor vehicle
12/19/2001EP1000344A4 Method and apparatus for parameter difference imaging of a sample surface
12/19/2001EP0970391B1 Optical device for the contactless measurement of distance of a light source
12/19/2001EP0932818B1 Apparatus with a retracing optical circuit for the measurement of physical quantities having high rejection of environmental noise
12/19/2001EP0807262B1 Electro-optical measuring device for absolute distances
12/19/2001EP0635151B1 Method of determining the interior points of an object in a background
12/19/2001CN2466603Y Optical device for automatic dialgage tester
12/19/2001CN1076480C Method for making new transmission metering raster
12/18/2001US6332047 Test equipment for color printing
12/18/2001US6331893 Foot analyzer
12/18/2001US6331890 Thickness measuring apparatus, substrate processing method, and substrate processing apparatus
12/18/2001US6331887 Outdoor range finder
12/18/2001US6331714 Guidance system and method for an automated media exchanger
12/13/2001WO2001095441A1 Gas laser and optical system
12/13/2001WO2001095370A2 Calibration methods for placement machines incorporating on-head linescan sensing
12/13/2001WO2001095037A2 Device for registration of optical holograms on the amorphous molecular semiconductor films
12/13/2001WO2001094922A1 Apparatus and method for viewing and inspecting a circumferential surface area of an object
12/13/2001WO2001094881A1 System of fabricating plane parallel substrates with uniform optical paths
12/13/2001WO2001094880A1 Lattice pattern projector using liquid crystal lattice
12/13/2001WO2001094879A1 A method and a device for alignment of an object in relation to a projected image
12/13/2001WO2001068305A3 Laser based centerline gauge conversion kit
12/13/2001WO2000012961A9 Combination thin-film stress and thickness measurement device
12/13/2001US20010051856 Caching of intra-layer calculations for rapid rigorous coupled-wave analyses
12/13/2001US20010050773 Height scanning interferometer for determining the absolute position and surface profile of an object with respect to a datum
12/13/2001US20010050771 Method and Device for measuring thickness of liquid crystal layer
12/13/2001US20010050768 Optical fiber distortion measurement device
12/13/2001US20010049880 Carrier shape measurement device
12/13/2001DE10111227A1 Sash door position sensing apparatus for controlling air flow through laboratory fume hood, has sensor for determining opening of cabinet, based on rotation of shaft
12/13/2001DE10027473A1 Determining inclinations of deformations on two arranged surfaces used in e.g. production line, involves determining deviations in the patterns detected and repeatedly imaged based on arranged surfaces
12/13/2001DE10027459A1 Determination method for e.g. compact disc, involves determining deformation of tested surface based on reflection point of reflected light from tested surface to planar focal plane
12/13/2001DE10026894A1 Optical scanning sensor element, has lens arrangement extending from the individual beam paths formed between two dividing lenses to focus the light beams reflecting from an object
12/13/2001DE10025922A1 Automatische photogrammetrische Digitalisierung von Körpern und Objekten Automatic photogrammetric digitization of bodies and objects
12/12/2001EP1162610A2 Focus error correction from tilt measurement
12/12/2001EP1162447A1 Method and apparatus for measuring diameter and distribution of micro bubble and micro liquid drop and optical system for measuring diameter and distribution of micro bubble and micro liquid drop
12/12/2001EP1162430A1 Measuring device for concrete reinforcing rods
12/12/2001EP1162054A1 Methods of forming linear groove in car skin and measuring/recording residual wall thickness and device therefor
12/12/2001EP1161663A1 A modulated fibre bragg grating strain gauge assembly for absolute gauging of strain
12/12/2001EP1161655A1 System for measuring the position of an edge of a transparent article
12/12/2001EP1161653A1 Methods and apparatus for high-speed longitudinal scanning in imaging systems
12/12/2001EP1161194A1 Imaging and planning device for ligament graft placement
12/12/2001EP1031057A4 Laser scanning method and system
12/12/2001EP0963540A4 System and method for laser ultrasonic bond integrity evaluation
12/12/2001CN1326543A Method and apparatus for measuring cell gap of va liquid crystal panel
12/12/2001CN1326129A Optical position detector
12/12/2001CN1076096C Method and device for registration of movement of vehicle
12/11/2001US6330523 Integrated system for quickly and accurately imaging and modeling three-dimensional objects
12/11/2001US6330522 Rotational angle detector and method