| Patents for G01B 11 - Measuring arrangements characterised by the use of optical means (73,862) |
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| 02/19/2002 | CA2134613C Method and apparatus for processing log for sawmill including end dogging carriage which rotationally repositions log to cutting position determined by computer after non-rotational scanning |
| 02/14/2002 | WO2002013140A2 Camera calibration for three-dimensional reconstruction of objects |
| 02/14/2002 | WO2002012825A1 Frequency transform phase shifting interferometry |
| 02/14/2002 | WO2002012823A1 Determining the position of an axis of rotation (patient positioning table, radiation therapy) on the basis of an angle of rotation and a chord through a movable mark |
| 02/14/2002 | WO2002012821A2 Two piece alignment head |
| 02/14/2002 | WO2001095441A9 Gas laser and optical system |
| 02/14/2002 | WO2001038827A3 Fiber bragg grating sensor |
| 02/14/2002 | WO2000060333A9 Illumination apparatus and method |
| 02/14/2002 | US20020018591 Bump inspection apparatus and method |
| 02/14/2002 | US20020018220 Optical displacement-measuring apparatus |
| 02/14/2002 | US20020018218 Method and apparatus for optically scanning a vehicle wheel |
| 02/14/2002 | US20020018216 Scanning wide-area surface shape analyzer |
| 02/14/2002 | US20020018215 Surface profile measurement apparatus |
| 02/14/2002 | US20020018214 Method and apparatus for measuring flying height of the slider and in-situ monitoring a slider-disk interface |
| 02/14/2002 | US20020018210 Optical method for the characterization of laterally-patterned samples in integrated circuits |
| 02/14/2002 | US20020018207 Alignment method, alignment apparatus, profiler, exposure apparatus, exposure apparatus maintenance method, semiconductor device manufacturing method, and semiconductor manufacturing factory |
| 02/14/2002 | US20020018205 Broadband spectroscopic rotating compensator ellipsometer |
| 02/14/2002 | US20020018139 Device for detecting tilt angle of optical axis and image measuring apparatus equipped therewith |
| 02/14/2002 | US20020018120 Vehicle front-view monitoring system |
| 02/14/2002 | US20020018119 Vehicle front-view monitoring system |
| 02/14/2002 | US20020018118 System for simultaneous projections of multiple phase-shifted patterns for the three-dimensional inspection of an object |
| 02/14/2002 | US20020018062 Method and apparatus for generating three-dimensional data |
| 02/14/2002 | US20020017911 Shape accuracy improvement using a novel calibration approach |
| 02/14/2002 | US20020017620 Surface inspection apparatus |
| 02/14/2002 | US20020017599 Shape measurement device |
| 02/13/2002 | EP1179803A2 Method and apparatus for object recognition |
| 02/13/2002 | EP1179729A1 Process for real time control of the making of thin film structure through ellipsometric measurement |
| 02/13/2002 | EP1178878A1 Automated product profiling apparatus and product slicing system using same |
| 02/13/2002 | EP0862729B1 Composite structure resin cure monitoring using an optical fiber grating sensor |
| 02/13/2002 | CN1335485A Space linearity measurer adopting ring optical grating method |
| 02/13/2002 | CN1335484A Diffraction light-free space linearity measurer |
| 02/13/2002 | CN1335483A Tumble angle measuring method and measurer |
| 02/13/2002 | CN1335482A All-optical fiber and large range displacement measurer |
| 02/12/2002 | US6347150 Method and system for inspecting a pattern |
| 02/12/2002 | US6346988 Laser position array optical measuring system and method |
| 02/12/2002 | US6346987 Micro-optical position indicator |
| 02/12/2002 | US6346986 Non-intrusive pellicle height measurement system |
| 02/12/2002 | US6346949 Three-dimensional form data processor retaining information on color boundaries of an object when thinning coordinate data |
| 02/12/2002 | US6346713 Method and installation for inspecting an article for defects |
| 02/07/2002 | WO2002011183A2 Shape accuracy improvement using a novel calibration approach |
| 02/07/2002 | WO2002010829A2 Multiple-source arrays with optical transmission enhanced by resonant cavities |
| 02/07/2002 | WO2002010721A2 Methods for high-precision gap and orientation sensing between a transparent template and substrate for imprint lithography |
| 02/07/2002 | WO2002010720A2 Photogrammetric image correlation and measurement system and method |
| 02/07/2002 | WO2002010681A1 Measuring device and measuring method for determining distance and/or position |
| 02/07/2002 | WO2002010679A1 Surface shape measuring system |
| 02/07/2002 | US20020016631 Prosthesis and method of making |
| 02/07/2002 | US20020015246 Method of recognizing master disk positioning mark |
| 02/07/2002 | US20020015159 Position detection device, position pointing device, position detecting method and pen-down detecting method |
| 02/07/2002 | US20020015158 Focus measurement in projection exposure apparatus |
| 02/07/2002 | US20020015157 Apparatus for evaluating metalized layers on semiconductors |
| 02/07/2002 | US20020015156 Position detecting method and system for use in exposure apparatus |
| 02/07/2002 | US20020015148 Surface inspection instrument and surface inspection method |
| 02/07/2002 | US20020015147 Optical alignment in capillary detection using capillary wall scatter |
| 02/07/2002 | US20020015146 Combined high speed optical profilometer and ellipsometer |
| 02/07/2002 | US20020015144 Three-dimensional image capturing device |
| 02/07/2002 | US20020014577 Circuit for machine-vision system |
| 02/07/2002 | DE10136197A1 Determination of a test object thickness, such as a lithium tantalum or diamond crystal with double refracting properties using optical refractive and polarizing equipment |
| 02/07/2002 | DE10047270A1 Verfahren zur optischen Vermessung einer Oberfläche eines Objektes A method for optical measurement of a surface of an object |
| 02/07/2002 | DE10036741A1 Verfahren und Kontrollsystem zur Kontrolle der Beschichtungsqualität von Werkstücken Procedures and control system for monitoring the quality of coating of workpieces |
| 02/07/2002 | DE10034984A1 Measurement arm positioning device for measuring equipment is coupled to measuring equipment or its measurement arm, after which position of device on x-y plane is then determined |
| 02/07/2002 | DE10034250A1 Konfokales Abbildungssystem Confocal imaging system |
| 02/07/2002 | DE10026625C1 Triangulations-Sensor Triangulation sensor |
| 02/06/2002 | EP1178436A2 Image measurement method, image measurement apparatus and image measurement program storage medium |
| 02/06/2002 | EP1178435A2 Image measurement method, image measurement apparatus and image measurement program storage medium |
| 02/06/2002 | EP1178434A2 Image measurement method, image measurement apparatus and image measurement program storage medium |
| 02/06/2002 | EP1178299A1 Superfine indentation tester |
| 02/06/2002 | EP1178281A1 Method for the determination of the optical thickness of coatings |
| 02/06/2002 | EP1177430A1 System and method to quantify appearance defects in molded plastic parts |
| 02/06/2002 | EP1177428A1 Inspection systems performing two-dimensional imaging with line light spot |
| 02/06/2002 | EP1177087A1 Method and apparatus for handling parts ejected from an injection molding machine |
| 02/06/2002 | EP1176919A1 Apparatus and method for compensating for respiratory and patient motion during treatment |
| 02/06/2002 | EP0822029B1 Method of screw hole recognition |
| 02/06/2002 | CN2475482Y On-line automatic length gauge for shape steel |
| 02/06/2002 | CN1334913A Apparatus and method to measure three-dimensional data |
| 02/06/2002 | CN1334452A Method and device for optically scanning wheel of car |
| 02/06/2002 | CN1334439A Spot image related optical position sensor |
| 02/05/2002 | US6345107 Image processing apparatus and method of processing height data to obtain image data using gradient data calculated for a plurality of different points of a surface and adjusted in accordance with a selected angle of illumination |
| 02/05/2002 | US6344916 Method and device for measuring depth of field |
| 02/05/2002 | US6344898 Interferometric apparatus and methods for measuring surface topography of a test surface |
| 02/05/2002 | US6344897 Inspection apparatus for foreign matter and pattern defect |
| 02/05/2002 | US6344656 Surface measuring apparatus having relative displacement between a probe and its carriage |
| 02/05/2002 | US6343703 Anti-two block device using non-contract measuring and detecting devices |
| 02/05/2002 | US6343503 Module appearance inspection apparatus |
| 01/31/2002 | WO2002008737A1 Method for the optical surveying of a surface of an object |
| 01/31/2002 | WO2002008688A1 Confocal imaging system having a divided retroreflector |
| 01/31/2002 | WO2002008685A2 Apparatus and method for determining the range of remote objects |
| 01/31/2002 | WO2001070001A3 Pick and place machine with improved vision system |
| 01/31/2002 | US20020013675 Method and device for the improvement of the pose accuracy of effectors on mechanisms and for the measurement of objects in a workspace |
| 01/31/2002 | US20020013120 Method and apparatus for optical monitoring in chemical mechanical polishing |
| 01/31/2002 | US20020013058 In-situ real-time monitoring technique and apparatus for endpoint detection of thin films during chemical/mechanical polishing planarization |
| 01/31/2002 | US20020012124 Apparatus and methods for measuring surface profiles and wavefront aberrations, and lens systems comprising same |
| 01/31/2002 | US20020012123 Spatial averaging technique for ellipsometry and reflectometry |
| 01/31/2002 | US20020012115 Small optical microphone/sensor |
| 01/31/2002 | US20020012044 Method and apparatus for recording a three dimensional figure on a two dimensional surface allowing clothing patterns to be produced |
| 01/31/2002 | US20020011576 6 degree-of-freedom (DOF) motion measuring apparatus using multidirectional reflector, and swing arm type optical system using the 6-DOF motion measuring apparatus to measure 6-DOF motion of HDD Slider |
| 01/31/2002 | US20020011552 Photodetector and distance measuring equipment using the same |
| 01/31/2002 | US20020011432 Article classifying system |
| 01/31/2002 | DE10128364A1 Device for measuring components has two objectives each forming image of test object characteristic element and characteristic section of standard on evaluation device |
| 01/31/2002 | DE10049303A1 Verfahren zum berührungslosen Messen von Geometrien von Gegenständen A method for the contactless measurement of geometries of objects |
| 01/31/2002 | DE10035118A1 Verfahren und Vorrichtung zum optischen Abtasten eines Fahrzeugrades Method and device for optically scanning a vehicle wheel |