| Patents for G01B 11 - Measuring arrangements characterised by the use of optical means (73,862) |
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| 04/12/2005 | US6879933 Method and system for assisting a user taking measurements using a coordinate measurement machine |
| 04/12/2005 | US6879719 Method for measurement of full-two dimensional submicron shapes |
| 04/12/2005 | US6879407 Displacement sensor |
| 04/12/2005 | US6879406 Use of scatterometry as a control tool in the manufacture of extreme UV masks |
| 04/12/2005 | US6879403 Three dimensional scanning camera |
| 04/12/2005 | US6879402 Scanning interferometer for aspheric surfaces and wavefronts |
| 04/12/2005 | US6879393 Defect inspection apparatus for phase shift mask |
| 04/12/2005 | US6879392 Method and apparatus for inspecting defects |
| 04/12/2005 | US6879384 Process and apparatus for measuring an object space |
| 04/12/2005 | US6879382 Substrate processing apparatus |
| 04/12/2005 | US6878953 Optical measuring apparatus for measuring objects on machines |
| 04/12/2005 | US6878922 Optical system for compensating for non-uniform illumination of an object |
| 04/12/2005 | US6878916 Method for focus detection for optically detecting deviation of the image plane of a projection lens from the upper surface of a substrate, and an imaging system with a focus-detection system |
| 04/12/2005 | US6878316 Method and apparatus for handling parts ejected from an injection molding machine |
| 04/12/2005 | US6878301 Methods and apparatuses for trench depth detection and control |
| 04/12/2005 | CA2345656C Detection of irregularities in a convex surface, such as a tire sidewall, using band-pass filtering |
| 04/10/2005 | CA2484298A1 Studfinder and laser line layout tool |
| 04/07/2005 | WO2005031647A1 Method and device for contactless optical determination of the 3-d position of an object |
| 04/07/2005 | WO2005031326A1 System and method of imaging the characteristics of an object |
| 04/07/2005 | WO2005031253A1 Three-dimensional shape measuring device, imaging device, and three-dimensional shape measuring program |
| 04/07/2005 | WO2005031252A1 Three-dimensional shape determining apparatus, three-dimensional shape determining system, and three-dimensional shape determining program |
| 04/07/2005 | WO2005031251A1 Optical method and device for determining the structure of a surface |
| 04/07/2005 | WO2005031249A1 Apparatus for automatically measuring external and internal profile of a pipe at the end thereof |
| 04/07/2005 | WO2005003679A3 Position-to-number electro-optical converter |
| 04/07/2005 | WO2004109229A3 3d and 2d measurement system and method with increased sensitivity and dynamic range |
| 04/07/2005 | US20050075798 Automated quality assurance method and apparatus and method of conducting business |
| 04/07/2005 | US20050075752 Robotic physical distribution tracking system |
| 04/07/2005 | US20050075585 Apparatus and method for measuring jaw motion |
| 04/07/2005 | US20050074248 Recording material discrimination device, image forming apparatus and method therefor |
| 04/07/2005 | US20050074162 Surface reconstruction and registration with a Helmholtz reciprocal image pair |
| 04/07/2005 | US20050074161 System and method for the measurement of the relative position of an object with respect to a point of reference |
| 04/07/2005 | US20050074144 Image processing method and contactless image input apparatus utilizing the method |
| 04/07/2005 | US20050073743 Process for controlling a laser scanning microscope with a tiltable fine focusing stage |
| 04/07/2005 | US20050073694 Means for in-place automated calibration of optically-based thickness sensor |
| 04/07/2005 | US20050073692 Profiling complex surface structures using scanning interferometry |
| 04/07/2005 | US20050073590 Three-dimensional measuring instrument, filter striped plate, and illuminating means |
| 04/07/2005 | US20050072939 Electron beam writing equipment and electron beam writing method |
| 04/07/2005 | US20050072905 Optical navigation sensor device and image processing method using 2-dimensional sequential image process |
| 04/07/2005 | DE19614896B4 Verfahren zur feldmäßigen Bestimmung von Deformationszuständen in mikroskopisch dimensionierten Prüflingsbereichen und Verwendung des Verfahrens Method for determination of deformation for field conditions in microscopic sized Prüflingsbereichen and use of the method |
| 04/07/2005 | DE102004043472A1 Verfahren und Vorrichtung zum Messen einer Koaxialbeziehung zwischen zwei mechanischen Teilen Method and apparatus for measuring a coaxial relation between two mechanical parts |
| 04/07/2005 | CA2539269A1 System and method of imaging the characteristics of an object |
| 04/06/2005 | EP1521212A2 Surface reconstruction and registration with a Helmholtz reciprocal image pair |
| 04/06/2005 | EP1521211A2 Method and apparatus for determining the position and orientation of an image receiving device |
| 04/06/2005 | EP1521136A2 Recording material discrimination device, image forming apparatus and method therefor |
| 04/06/2005 | EP1521060A2 Fiber coupled Interferometric displacement sensor |
| 04/06/2005 | EP1521056A2 Method and apparatus for internal feature reconstruction |
| 04/06/2005 | EP1521055A2 Quality control method and installation in a bakery |
| 04/06/2005 | EP1520291A2 System and method for controlling wafer temperature |
| 04/06/2005 | EP1470388A4 Laser scanner with parabolic collector |
| 04/06/2005 | EP1381824B1 Measurement of components that have been micro-galvanically produced, using a sample component by means of photoresist webs |
| 04/06/2005 | EP1305565B1 Determining the position of an axis of rotation (patient positioning table, radiation therapy) on the basis of an angle of rotation and a chord through a movable mark |
| 04/06/2005 | EP1190211B1 Method for optically detecting the shape of objects |
| 04/06/2005 | EP1135237B1 Method and device for improving the position exactness of effectors in mechanisms and for measuring objects in a work space |
| 04/06/2005 | CN1605189A Imaging device |
| 04/06/2005 | CN1605015A Alignment apparatus |
| 04/06/2005 | CN1604335A CCD image sensor and high accuracy linear dimension measuring device and measuring method thereof |
| 04/06/2005 | CN1604126A Optical navigation sensor device and image processing method using 2-dimensional sequential image process |
| 04/06/2005 | CN1603979A Holographic phasic difference amplifying and reconfiguration unit |
| 04/06/2005 | CN1603978A Method for reducing diffraction angle in holographic phasic difference magnification |
| 04/06/2005 | CN1603976A Recording material discrimination device, image forming apparatus and method therefor |
| 04/06/2005 | CN1603944A Calibration jig for a stereoscopic camera and calibrating method for the camera |
| 04/06/2005 | CN1603836A Method and apparatus for internal feature reconstruction |
| 04/06/2005 | CN1603755A Optical fiber grating inclination angle sensor |
| 04/06/2005 | CN1603740A Dynamic detection method based on image recognition for emery wheel appearance |
| 04/06/2005 | CN1603739A Nano laser measuring rule and subdivision method for nano measurement realization |
| 04/06/2005 | CN1603738A Large-scale nano detection optical system |
| 04/06/2005 | CN1196182C Monitor, method of monitoring, polishing device, and method of manufacturing semiconductor wafer |
| 04/06/2005 | CN1195978C Surface state checking method and circuit board checker |
| 04/06/2005 | CN1195927C Control system for construction machinery |
| 04/05/2005 | US6876762 Apparatus for imaging and image processing and method thereof |
| 04/05/2005 | US6876459 Method and apparatus for optical measurement of the leading edge position of an airfoil |
| 04/05/2005 | US6876458 Method and device for determining the absolute coordinates of an object |
| 04/05/2005 | US6876456 Absolute calibration of optical flats |
| 04/05/2005 | US6876455 Method and apparatus for broadband optical end point determination for in-situ film thickness measurement |
| 04/05/2005 | US6876454 Apparatus and method for in-situ endpoint detection for chemical mechanical polishing operations |
| 04/05/2005 | US6876453 Metrology system for precision 3D motion |
| 04/05/2005 | US6876452 Apparatus and methods for high accuracy metrology and positioning of a body |
| 04/05/2005 | US6876436 Interferometric alignment system for use in vacuum-based lithographic apparatus |
| 04/05/2005 | US6876435 Exposure method, plane alignment method, exposure apparatus, and device manufacturing method |
| 04/05/2005 | US6876392 Rangefinder for obtaining information from a three-dimensional object |
| 04/05/2005 | US6875992 Position measuring device, position measuring system, lithographic apparatus, and device manufacturing method |
| 04/05/2005 | US6875078 Apparatus and method for in-situ endpoint detection for chemical mechanical polishing operations |
| 04/05/2005 | CA2264752C Measuring device primarily for use with vehicles |
| 04/05/2005 | CA2117872C Rectification of a laser pointing device |
| 03/31/2005 | WO2005029193A2 Interferometric analysis of surfaces. |
| 03/31/2005 | WO2005029192A2 Surface triangulation and profiling through a thin film coating |
| 03/31/2005 | WO2005029139A2 A light-force sensor and method for measuring axial optical-trap forces from changes in light momentum along an optic axis |
| 03/31/2005 | WO2005028995A1 Fbg sensing system |
| 03/31/2005 | WO2005028992A2 Line profile asymmetry measurement |
| 03/31/2005 | WO2005028705A1 Apparatus and method of detecting the electroless deposition endpoint |
| 03/31/2005 | WO2005027770A2 High speed multiple line three-dimensional digitization |
| 03/31/2005 | WO2004113932A3 Method and system for automatic target finding |
| 03/31/2005 | WO2004099818B1 A modular non-contact measurement device for quickly and accurately obtaining dimensional measurement data |
| 03/31/2005 | US20050071105 Method and system for calibrating relative fields of view of multiple cameras |
| 03/31/2005 | US20050069791 Patterns with pivots measured in energy and semiconductor construction |
| 03/31/2005 | US20050069190 Discrimination sensor and discrimination machine |
| 03/31/2005 | US20050069173 Direction-recognizing apparatus, direction-recognizing method, direction-recognizing system, and robot apparatus |
| 03/31/2005 | US20050069172 Index identifying method and system |
| 03/31/2005 | US20050068545 Caching of intra-layer calculations for rapid rigorous coupled-wave analyses |
| 03/31/2005 | US20050068544 Panoramic scanner |