| Patents for G01B 11 - Measuring arrangements characterised by the use of optical means (73,862) |
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| 05/04/2005 | EP1527319A2 System and method for automatically calibrating an alignment reference source |
| 05/04/2005 | EP1527318A1 Determining topography and composition of a sample by using an interferometer |
| 05/04/2005 | EP1527317A2 Fringe pattern discriminator for grazing incidence interferometer |
| 05/04/2005 | EP1526948A2 Uniform thin films produced by magnetorheological finishing |
| 05/04/2005 | EP1332334B1 Measuring device for contactless measurement of tyres |
| 05/04/2005 | DE4431059C5 Verfahren und Einrichtung zum Vermessen von Werkzeugen, insbesondere Maschinenwerkzeugen in Einstellgeräten Method and apparatus for the measurement of tools, in particular machine tools in presetters |
| 05/04/2005 | DE10257732B4 Wegänderungsmesseinrichtung für bewegliche Messarme für Prüfmaschinen Wegänderungsmesseinrichtung for Portable Measuring Arms for Testing |
| 05/04/2005 | CN2697630Y Deflection displacement measuring mechanism for small impact bar test |
| 05/04/2005 | CN2697612Y Reflection type optics sensor, support frame and data processing equipment |
| 05/04/2005 | CN2697585Y Quick ellipse measurer |
| 05/04/2005 | CN1613001A Method and device for detecting the shape of a three-dimensional object |
| 05/04/2005 | CN1612507A Two-dimensional position control method and two-dimensional position control apparatus |
| 05/04/2005 | CN1612313A Wire loop height measurement apparatus and method |
| 05/04/2005 | CN1612222A Inspection device and inspection method |
| 05/04/2005 | CN1612032A Image-projecting apparatus |
| 05/04/2005 | CN1611962A Optical element and method for its fabrication |
| 05/04/2005 | CN1611916A Angle detecting sensor and control system adopting said sensor for vehicle |
| 05/04/2005 | CN1611615A Monitored laser shock peening |
| 05/04/2005 | CN1200325C Amplifying holographic device for co-axle recorded phase difference |
| 05/04/2005 | CN1200268C 外观检查装置 Appearance inspection device |
| 05/04/2005 | CN1200261C Superfine indentation tester |
| 05/04/2005 | CN1200247C Transverse double-frequency zeeman laser linearity/coaxality measuring mechanism |
| 05/04/2005 | CN1200245C Apparatus and method for measuring non-spheric surface with hologram and concave surface |
| 05/03/2005 | US6889175 Tunable filter device for spatial positioning systems |
| 05/03/2005 | US6888966 Length calculation and determination device, angle calculation and determination device and image determination system |
| 05/03/2005 | US6888955 Picture recognition apparatus and method |
| 05/03/2005 | US6888918 Surface inspection method and surface inspection apparatus |
| 05/03/2005 | US6888639 In-situ film thickness measurement using spectral interference at grazing incidence |
| 05/03/2005 | US6888623 Fiber optic sensor for precision 3-D position measurement |
| 05/03/2005 | US6888143 Apparatus and method for inspecting pre-fastened articles |
| 05/03/2005 | US6888126 Coded disc for an optoelectronic displacement or angle measuring device |
| 05/03/2005 | US6888119 Light scanning probe apparatus using light of low coherence |
| 05/03/2005 | US6888082 Analyzing method and device for automatically sorting products such as fruit |
| 05/03/2005 | US6886462 Labeling methods and apparatus |
| 05/03/2005 | CA2334225C Method and device for opto-electrical acquisition of shapes by axial illumination |
| 04/28/2005 | WO2005038446A1 Defect inspection device, defect inspection method, and method of machining internal surface of cylindrial object |
| 04/28/2005 | WO2005038445A1 Surface defect inspecting method and device |
| 04/28/2005 | WO2005038396A1 Computer simulation model for determining damage to the human central nervous system |
| 04/28/2005 | WO2005038392A2 Optical device for determining at least one dimensional characteristic of a drop of liquid |
| 04/28/2005 | WO2005037699A1 Method for determining the effects of fancy yarn |
| 04/28/2005 | WO2005037495A1 Calibration method |
| 04/28/2005 | US20050091000 Analog encoder method for determining distance moved |
| 04/28/2005 | US20050090912 Two-dimensional position control method and two-dimensional position control apparatus |
| 04/28/2005 | US20050090749 Method and device for carrying out optical pick up |
| 04/28/2005 | US20050089210 Flatness measurement system for metal strip |
| 04/28/2005 | US20050089196 Method for detecting sub-pixel motion for optical navigation device |
| 04/28/2005 | US20050088665 Azimuthal scanning of a structure formed on a semiconductor wafer |
| 04/28/2005 | US20050088664 Method for writing a pattern on a surface intended for use in exposure equipment and for measuring the physical properties of the surface |
| 04/28/2005 | US20050088663 Scanning interferometry for thin film thickness and surface measurements |
| 04/28/2005 | US20050088647 Apparatus and method of detecting the electroless deposition endpoint |
| 04/28/2005 | US20050088644 Surface profile measurement |
| 04/28/2005 | US20050088638 Off-axis levelling in lithographic projection apparatus |
| 04/28/2005 | US20050088529 System and a method for three-dimensional imaging systems |
| 04/28/2005 | US20050087681 Reflective imaging encoder |
| 04/28/2005 | US20050087021 Reflective strain gauge and polarization-sensitive devices |
| 04/28/2005 | US20050086815 Optical angle sensor |
| 04/27/2005 | EP1204845B1 Method and device for detecting a bending angle on a workpiece |
| 04/27/2005 | EP1123059B1 System for positioning patients |
| 04/27/2005 | EP1056987B1 Laser scanner measurement system |
| 04/27/2005 | EP0880676B1 Apparatus and methods for surface contour measurement |
| 04/27/2005 | CN1610817A Polarization bearing detection type two-dimensional light reception timing detecting device and surface shape measuring device using it |
| 04/27/2005 | CN1610060A Grating alignment procedure |
| 04/27/2005 | CN1609713A Lithographic apparatus and device manufacturing method, and measurement systems |
| 04/27/2005 | CN1609603A Image testing method for chemical fibre thermal contraction rate and testing apparatus thereof |
| 04/27/2005 | CN1609562A Depth measuring instrument |
| 04/27/2005 | CN1609551A Rotary kiln riding wheel axle laser projection calibrating kiln method and riding wheel axle laser projector |
| 04/27/2005 | CN1609550A Apparatus for measuring convex shape and method thereof |
| 04/27/2005 | CN1609549A Double-view field star sensor and method for identifying star atlas using the same |
| 04/27/2005 | CN1609548A Automatic working out system for laser scanning head stroke used for three-dimensional measurement machine tool |
| 04/27/2005 | CN1609547A Detected lens holding table for interferometer apparatus |
| 04/27/2005 | CN1199040C Container sealing surface area inspection |
| 04/27/2005 | CN1199031C Method and arrangement for generating position regulating circuit regulating volumn |
| 04/27/2005 | CA2485906A1 Distance measurement sensor |
| 04/26/2005 | US6885785 Optical fiber bragg grating coating removal detection |
| 04/26/2005 | US6885467 Method and apparatus for thickness decomposition of complicated layer structures |
| 04/26/2005 | US6885466 Method for measuring thickness of oxide film |
| 04/26/2005 | US6885464 3-D camera for recording surface structures, in particular for dental purposes |
| 04/26/2005 | US6885463 Sensor device that provides part quality and profile information |
| 04/26/2005 | US6885461 Weighted least-square interferometric measurement of multiple surfaces |
| 04/26/2005 | US6885460 Apparatus for and method of measuring surface shape of an object |
| 04/26/2005 | US6885459 Apparatus and method for measuring two opposite surfaces of a body |
| 04/26/2005 | US6885458 Apparatus and method for determining the active dopant profile in a semiconductor wafer |
| 04/26/2005 | US6885451 Infrared detection of composite article components |
| 04/26/2005 | US6885429 System and method for automated focus measuring of a lithography tool |
| 04/26/2005 | US6885400 CCD imaging device and method for high speed profiling |
| 04/26/2005 | US6885019 Sample positioning system to improve edge measurements |
| 04/26/2005 | US6885017 Method and apparatus for discriminating latent fingerprint optical fingerprint input apparatus |
| 04/26/2005 | US6884640 Method and apparatus for determining layer thickness and composition using ellipsometric evaluation |
| 04/26/2005 | US6883567 Pneumatic tire having wear indicator |
| 04/26/2005 | US6883385 Single-axial precision measuring apparatus |
| 04/26/2005 | CA2432727C Fiber optic displacement sensor |
| 04/21/2005 | WO2005036618A1 Stage device and exposure device |
| 04/21/2005 | WO2005036601A2 Wafer characteristics via reflectomeytry and wafer processing apparatus and method |
| 04/21/2005 | WO2005036589A2 Position shift detection mark, wafer, and pattern position shift measurement method |
| 04/21/2005 | WO2005036098A1 Optical metrology method which is used to determine the three-dimensional topography of a hole |
| 04/21/2005 | WO2005036097A1 Three-dimensional measuring instrument and three-dimensional measuring method |
| 04/21/2005 | WO2005035155A1 Method of measuring misalignment of multi-stage rolling mill and measuring device therefor |
| 04/21/2005 | WO2005015142A3 Radiometer, sight for an ir device and method |
| 04/21/2005 | WO2004088721A3 Optimized model and parameter selection for optical metrology |
| 04/21/2005 | WO2004061388A3 Nondestructive characterization of thin films using measured basis spectra and/or based on acquired spectrum |