Patents
Sitemap › G01 - Measuring; Testing › G01B - Measuring length, thickness or similar linear dimensions; Measuring angles; Measuring areas; Measuring irregularities of surfaces or contours › G01B 11 - Measuring arrangements characterised by the use of optical means
Patents for G01B 11 - Measuring arrangements characterised by the use of optical means (73,862)
05/2005
05/17/2005US6892463 Laser beam module for simultaneously producing two mutually perpendicular optical planes
05/17/2005CA2255093C Obstacle avoidance and crushing protection system for outriggers of a chassis
05/12/2005WO2005043600A2 Azimuthal scanning of a structure formed on a semiconductor wafer
05/12/2005WO2005043551A1 Cantilever assembly
05/12/2005WO2005043081A1 Distance calculation device and calculation program
05/12/2005WO2005043076A1 Method for calibrating a camera-laser-unit in respect to a calibration-object
05/12/2005WO2005042258A1 Pattern generating apparatus and an apparatus for measuring the physical properties of the surface
05/12/2005WO2005041770A1 Infant movement analysis system and infant movement analysis method
05/12/2005WO2005022127A3 Device for measuring a planar element
05/12/2005WO2005010940A3 High resolution, dynamic positioning mechanism for specimen inspection and processing
05/12/2005WO2004059258B1 Apparatus and method for displaying numeric values corresponding to the volume of segments of an irregularly shaped item
05/12/2005US20050102118 Method and device for correcting guiding errors in a coordinate measuring machine
05/12/2005US20050100206 Method for inspecting a pattern and method for manufacturing a semiconductor chip having a circuit pattern
05/12/2005US20050099638 High speed multiple line three-dimensional digitization
05/12/2005US20050099637 Integrated system for quickly and accurately imaging and modeling three-dimensional objects
05/12/2005US20050099636 Telecentric optical sensor
05/12/2005US20050099629 Substrate processing apparatus
05/12/2005US20050099627 System for measuring periodic structures
05/12/2005US20050099623 Optical measuring method for semiconductor multiple layer structures and apparatus therefor
05/12/2005US20050099620 Process and plant for quality control inspection of bakery products
05/12/2005US20050099410 Homogeneous and plain surface detection in optical navigation systems
05/12/2005US20050098744 Process and device for measuring the length and/or the diameter of filter bars
05/12/2005US20050098715 Beam rotation angle detecting apparatus, rotation detecting apparatus and beam rotation angle detecting method
05/12/2005US20050098104 Apparatus and method for simultaneously coating and measuring parts
05/12/2005US20050098004 Systems and methods for automated material processing
05/12/2005US20050097964 Material testing method
05/11/2005EP1530220A1 Cantilever assembly
05/11/2005EP1530022A1 Thickness measurement method of a resin joint boot
05/11/2005EP1529193A2 Method for controlling a recess etch process
05/11/2005EP1485678A4 Chromatic diffraction range finder
05/11/2005EP0701707B1 Laser diffraction particle sizing apparatus and method
05/11/2005CN1615426A Optical apparatus for measuring the two and three-dimensional shape of an object
05/11/2005CN1614550A Multi-channel raster analog digital display system
05/11/2005CN1614441A Automatic underwater object positioning method and system
05/11/2005CN1614427A Position regulator for pickup and non-contacted electric resistance rate determiner
05/11/2005CN1614398A Wire layout checking device and method
05/11/2005CN1614371A Pressure sensor of optical fiber micro-electromechanic system
05/11/2005CN1614354A Optical profiler for ultra-smooth surface based on right-angled incident beam deflection method
05/11/2005CN1614353A System for generating structural light with sine distribution in density
05/11/2005CN1614352A White light interference optical fibre sensor for straining measure
05/11/2005CN1614351A Three directional measuring device
05/11/2005CN1201262C Fingerprint inputting apparatus
05/11/2005CN1201261C Fingerprint inputting apparatus and identification method of living utilizing fingerprint
05/11/2005CN1201177C Convex-concave pattern detection apparatus
05/11/2005CN1201134C Distortion detector
05/10/2005US6891967 Systems and methods for detecting defects in printed solder paste
05/10/2005US6891628 Method and apparatus for examining features on semi-transparent and transparent substrates
05/10/2005US6891626 Caching of intra-layer calculations for rapid rigorous coupled-wave analyses
05/10/2005US6891625 Optical reflection sensor
05/10/2005US6891624 Cyclic error reduction in average interferometric position measurements
05/10/2005US6891608 Aligning a lens with respect to an axis of beam propagation
05/10/2005US6891601 High resolution, dynamic positioning mechanism for specimen inspection and processing
05/10/2005US6891526 Input device for commanding control operations of a real and virtual object
05/10/2005US6891182 Apparatus for automatically detecting size to be detected and automatic analyzer using the same
05/10/2005US6891181 Opto-electronic transmissive edge location sensor
05/10/2005US6891151 Probe with hollow waveguide and method for producing the same
05/10/2005US6889441 Laser roller alignment system
05/06/2005WO2005040850A1 Device for scanning three-dimensional objects
05/06/2005WO2005040776A1 Surface inspection device and surface inspection method
05/06/2005WO2005040773A1 Method of inspecting unevenness of partition surface of honeycomb structure and inspecting device
05/06/2005WO2005040721A1 3d automatic measuring apparatus
05/06/2005WO2005040720A1 Angle detection device and scan-type actuator using the same
05/06/2005WO2005040719A1 Shape profile measuring unit and production method for semiconductor device using it
05/06/2005WO2005040716A1 System for measuring an object by means of co-ordinate measuring devices
05/06/2005WO2005025894A3 Tire inspection apparatus and method
05/06/2005WO2004113834A3 Method of determining a dimension of a sample of a construction material and associated appartus
05/06/2005WO2004085993A3 Generic interface for an optical metrology system
05/06/2005WO2004038321A3 Method and apparatus for thickness decomposition of complicated layer structures
05/06/2005WO2000075713A9 Method/system measuring object features with 2d and 3d imaging coordinated
05/05/2005US20050096807 Camera technique for adaptive cruise control (ACC) sensor adjustment
05/05/2005US20050095730 Method for monitoring film thickness, a system for monitoring film thickness, a method for manufacturing a semiconductor device, and a program product for controlling film thickness monitoring system
05/05/2005US20050095515 Filtration measurement; measuring overlay displacement; calibration using model of optical errors
05/05/2005US20050094865 Wire loop height measurement apparatus and method
05/05/2005US20050094862 Method and apparatus for visual inspection
05/05/2005US20050094856 Systems and methods for detecting target focus and tilt errors during genetic analysis
05/05/2005US20050094853 Objective evaluation of fabric pilling using stereovision and measuring apparatus
05/05/2005US20050094542 Inspection device and inspection method
05/05/2005US20050094160 Two-dimensional spectroscopic system and film thickness measuring system
05/05/2005US20050094159 Angle detecting sensor and vehicular controlling system using the same
05/05/2005US20050094148 Method for measuring the filling level of a liquid in a cavity having a sub-mm wide opening
05/05/2005US20050094145 Overlay mark for aligning different layers on a semiconductor wafer
05/05/2005US20050094135 Method for dynamic measuring the position and the orientation of a wheel
05/05/2005US20050094112 Image-projecting apparatus
05/05/2005US20050092900 Device and method for optoelectronically identifying the displacement and/or position of an object
05/05/2005US20050092899 Apparatus and methods for optically inspecting a sample for anomalies
05/05/2005US20050092897 Method and apparatus for determining the phase and/or amplitude information of an electromagnetic wave for photomixing
05/05/2005US20050092724 Monitored laser shock peening
05/05/2005US20050092239 Method and apparatus for measuring and monitoring coatings
05/05/2005US20050091859 Laser beam module for simultaneously producing two mutually perpendicular optical planes
05/05/2005US20050091834 Method and apparatus for measuring slider mounting position in magnetic head, and magnetic head manufacturing system using the measurement apparatus
05/04/2005EP1528411A1 Distance measurement sensor
05/04/2005EP1528369A1 Optical rotation angle sensor
05/04/2005EP1528366A1 Position encoder with colour coded scale
05/04/2005EP1528358A1 Optical element and method for its fabrication
05/04/2005EP1528356A2 Apparatus for monitoring of large roller bearings
05/04/2005EP1528355A2 Dynamic artefact comparison
05/04/2005EP1528354A2 Method and apparatus for measuring of an object by using a coordinate measuring machine
05/04/2005EP1528353A1 Method of Calibrating a 3D Measuring Apparatus
05/04/2005EP1528110A1 Monitored laser shock peening
05/04/2005EP1527320A1 Method and apparatus for optically measuring the topography of nearly planar periodic structures
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