| Patents for G01B 11 - Measuring arrangements characterised by the use of optical means (73,862) |
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| 05/26/2005 | US20050112475 Monitoring pattern configured to obtain information required for adjusting optical system; asymmetrical diffraction grating generates positive first order diffracted light and negative first order diffracted light; probing phase shifters |
| 05/26/2005 | US20050111726 Parts manipulation and inspection system and method |
| 05/26/2005 | US20050111081 Broad band deep ultraviolet/vacuum ultraviolet catadioptric imaging system |
| 05/26/2005 | US20050111012 Laser survey device |
| 05/26/2005 | US20050111009 Laser triangulation system |
| 05/26/2005 | US20050111005 Lithographic interferometer system |
| 05/26/2005 | US20050110893 Knife edge tracking system and method |
| 05/26/2005 | US20050110868 System and method for inputting contours of a three-dimensional subject to a computer |
| 05/26/2005 | US20050110198 Apparatus and method for simultaneously coating and measuring parts |
| 05/26/2005 | US20050110000 Multiple sensor system |
| 05/26/2005 | US20050109961 Imaging apparatus and method |
| 05/26/2005 | US20050109959 Systems and methods for rapidly automatically focusing a machine vision inspection system |
| 05/25/2005 | EP1533996A1 Systems and methods for rapidly automatically focusing a machine vision inspection system |
| 05/25/2005 | EP1533989A2 Imaging apparatus and method |
| 05/25/2005 | EP1533653A1 A stereo camera apparatus |
| 05/25/2005 | EP1533594A1 Apparatus for detecting displacement |
| 05/25/2005 | EP1532479A1 Device and method for inspecting an object |
| 05/25/2005 | EP1532422A1 Sensor device for multiple measuring tasks |
| 05/25/2005 | EP1532421A1 A method and a system for automatic measurement and tracking of logs, industrial wood and boards |
| 05/25/2005 | EP1531770A2 Device and method for measuring an optical penetration in a tissue |
| 05/25/2005 | DE4212404B4 Vorrichtung und Verfahren zur Bestimmung der räumlichen Form eines langgestreckten Bauteils Apparatus and method for determining the spatial form of an elongate member |
| 05/25/2005 | DE10344922A1 Rundum-Scanner All-scanner |
| 05/25/2005 | DE10342689B3 Making test bodies for testing measurement devices for micro bores with large aspect ratios involves stacking individual calibrated micro bore segments with small aspect rations to form test body as micro bore with large aspect ratio |
| 05/25/2005 | DE10333119B3 Nichtinvasives Verfahren zur Charakterisierung und Identifizierung eingebetteter Mikrostrukturen A noninvasive method for the characterization and identification of embedded microstructures |
| 05/25/2005 | CN1620627A Machine and method for inspecting ferrule of optical connector |
| 05/25/2005 | CN1620341A Method and apparatus for detecting a liquid spray pattern |
| 05/25/2005 | CN1620112A Multifunction target mark |
| 05/25/2005 | CN1619790A Method for inspecting defect |
| 05/25/2005 | CN1619299A Apparatus and method for detecting damage of glass base plate edge |
| 05/25/2005 | CN1619288A Selecting a hypothetical profile to use in optical metrology with sample diffraction signal |
| 05/25/2005 | CN1619256A Omnidirectional automatic regulating device of drilling needle detecting instrument for circuit board hold drilling and its feeding device |
| 05/25/2005 | CN1619225A Operating device and operating method for an electric domestic appliance |
| 05/25/2005 | CN1203363C 照明装置 Lighting device |
| 05/25/2005 | CN1203292C Method for measuring object three dimension surface outline |
| 05/25/2005 | CN1203291C Phase and time based focusing shiftable pickup and measuring instrument thereof |
| 05/25/2005 | CA2488301A1 Laser survey device |
| 05/24/2005 | US6898537 Measurement of diffracting structures using one-half of the non-zero diffracted orders |
| 05/24/2005 | US6898486 Position detecting device and takeout apparatus with position detecting device |
| 05/24/2005 | US6898478 Systems and methods of processing materials |
| 05/24/2005 | US6898304 Hardware configuration for parallel data processing without cross communication |
| 05/24/2005 | US6897966 Non-contacting mensuration system |
| 05/24/2005 | US6897964 Thickness measuring apparatus, thickness measuring method, and wet etching apparatus and wet etching method utilizing them |
| 05/24/2005 | US6897957 Material independent optical profilometer |
| 05/24/2005 | US6897956 Apparatus and method for measuring alignment accuracy, as well as method and system for manufacturing semiconductor device |
| 05/24/2005 | US6897946 Ranger finder device and camera |
| 05/24/2005 | US6897938 Position measuring method and apparatus |
| 05/24/2005 | US6897854 Electronic pen input device and coordinate detecting method therefor |
| 05/24/2005 | US6897789 System for determining kind of vehicle and method therefor |
| 05/24/2005 | US6897464 Active optical component alignment system and method |
| 05/24/2005 | US6897462 Surface position detection device and exposure apparatus and exposure method achieved by utilizing detection device |
| 05/24/2005 | US6896192 Spray can targeting and positioning system |
| 05/24/2005 | US6896117 Apparatus for processing a sheet |
| 05/24/2005 | CA2298363C A method of surveying a track |
| 05/19/2005 | WO2005045891A2 Method and apparatus for measuring and monitoring coatings |
| 05/19/2005 | WO2005045658A1 Position-detecting device and method |
| 05/19/2005 | WO2005045403A1 Interferometric device |
| 05/19/2005 | WO2005045363A1 3-dimensional shape detection device, imaging device, and 3-dimensional shape detection program |
| 05/19/2005 | WO2005045362A1 Apparatus for interferometric eye length measurement with increased sensitivity |
| 05/19/2005 | WO2005045361A2 Scanning interferometry for thin film thickness and surface measurements |
| 05/19/2005 | WO2005026772A3 Self-compensating laser tracker |
| 05/19/2005 | WO2004099713A3 Uniaxial thermal and/or mechanical deformation-measuring device, system and method employing a bragg grating optical fibre |
| 05/19/2005 | WO2004079294A3 Characterizing and profiling complex surface structures using scanning interferometry |
| 05/19/2005 | WO2004066028A3 Method for process optimization and control by comparison between 2 or more measured scatterometry signals |
| 05/19/2005 | US20050105103 Optical techniques for measuring layer thicknesses and other surface characteristics of objects such as semiconductor wafers |
| 05/19/2005 | US20050105102 Wafer stage position calibration method and system |
| 05/19/2005 | US20050105100 Optical position measuring system and method using a low coherence light source |
| 05/19/2005 | US20050105081 Sensor for determining the angular position of a radiating point source in two dimensions |
| 05/19/2005 | US20050105077 Miniaturized cytometer for detecting multiple species in a sample |
| 05/19/2005 | US20050105076 Three-dimensional location measurement sensor |
| 05/19/2005 | DE10348950A1 Verfahren zur Volumenbestimmung von kleinen bewegten kugelförmigen Objekten Method for determining the volume of small moving spherical objects |
| 05/19/2005 | DE10348684A1 Abstandsbild-Video-Kamera Distance Picture Video Camera |
| 05/19/2005 | DE10347898A1 Light source beam guiding system, e.g. for sensor, has variable spacing and/or angle of two mirrors for varying deflection of outgoing light beam |
| 05/19/2005 | DE10347608A1 Reference mark for photogrammetry/metrophotography has elements for fixing the center of the mark and for variable encoding of data on a circle around the center of the mark |
| 05/19/2005 | DE10346850A1 Measuring or testing lateral dimension or volume of recess in layer on substrate surface, or properties of materials in recess, by irradiating and analyzing interaction of radiation with recess |
| 05/19/2005 | DE10346467A1 Messgerät und -verfahren zum Prüfen der Schnittqualität eines Blattes Instrument and method for testing the cut quality of a leaf |
| 05/19/2005 | DE10335565A1 Verfahren zur Überprüfung von periodischen Strukturen auf Lithographiemasken Proceedings for review of periodic structures on lithography masks |
| 05/19/2005 | DE102004046584A1 Contactless optical method for determining three-dimensional position of object e.g. for production line automation in manufacturing plant, uses evaluation of object image provided by camera |
| 05/19/2005 | DE102004009484A1 Optical distance sensor using the triangulation principle has lens associated with receiver with second main surface divided into N cylindrical lens segments in addition to first main surface with certain total opening |
| 05/18/2005 | EP1531326A1 Material testing method |
| 05/18/2005 | EP1531318A1 Process and apparatus for measuring a 3D shape of an object |
| 05/18/2005 | CN2700827Y Detecting apparatus for moving object |
| 05/18/2005 | CN1618008A Optical torque and angle sensor |
| 05/18/2005 | CN1618007A Method and device for determining surface position at least with one forming pattern region |
| 05/18/2005 | CN1618006A Aligning optical components of an optical measuring system |
| 05/18/2005 | CN1618005A Senser for measuring three dimension shape and its measuring method |
| 05/18/2005 | CN1618004A Method and apparatus for measuring stress in semiconductor wafers |
| 05/18/2005 | CN1617009A Three-dimensional digital imaging method based on space lattice projection |
| 05/18/2005 | CN1616918A Scaling mechanism for position measurer |
| 05/18/2005 | CN1202403C Optical measuring apparatus and method for measuring objects position on machines |
| 05/17/2005 | US6895360 Method to measure oxide thickness by FTIR to improve an in-line CMP endpoint determination |
| 05/17/2005 | US6895359 Workpiece coordinate system origin setting method, workpiece coordinate system origin setting program and workpiece coordinate system origin setting device of a surface property measuring machine |
| 05/17/2005 | US6895132 Multiplexable fiber-optic strain sensor system with temperature compensation capability |
| 05/17/2005 | US6894788 Interferometric system for automated radius of curvature measurements |
| 05/17/2005 | US6894783 Overlay alignment mark design |
| 05/17/2005 | US6894781 Monitoring temperature and sample characteristics using a rotating compensator ellipsometer |
| 05/17/2005 | US6894771 Wheel alignment apparatus and method utilizing three-dimensional imaging |
| 05/17/2005 | US6894302 Surface inspection apparatus and method thereof |
| 05/17/2005 | US6894261 Position measuring system for use in lithographic apparatus |
| 05/17/2005 | US6893787 Method of a photolithography processing system |
| 05/17/2005 | US6892465 Portable coordinate measurement machine with integrated magnetic mount |