Patents
Sitemap › H01 - Basic electric elements › H01L - Semiconductor devices; Electric solid state devices not otherwise provided for › H01L 29 - Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having at least one potential-jump barrier or surface barrier; Capacitors or resistors with at least one potential-jump barrier or surface barrier, e.g. pn-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof
Patents for H01L 29 - Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having at least one potential-jump barrier or surface barrier; Capacitors or resistors with at least one potential-jump barrier or surface barrier, e.g. pn-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof (218,143)
11/2008
11/18/2008US7452775 Non-volatile memory device and manufacturing method and operating method thereof
11/18/2008US7452771 Method for fabricating a semiconductor device
11/18/2008US7452767 Selective implementation of barrier layers to achieve threshold voltage control in CMOS device fabrication with high k dielectrics
11/18/2008US7452764 Gate-induced strain for MOS performance improvement
11/18/2008US7452761 Hybrid SOI-bulk semiconductor transistors
11/18/2008US7452760 Thin film transistors and semiconductor constructions
11/18/2008US7452757 Silicon-on-insulator structures and methods
11/18/2008US7452736 Surface emitting device, manufacturing method thereof and projection display device using the same
11/18/2008CA2441912C High power mosfet semiconductor device
11/18/2008CA2272104C Method for making a thin film resonant microbeam absolute pressure sensor
11/13/2008WO2008137724A1 Strained channel p-type jfet and fabrication method thereof
11/13/2008WO2008137627A1 Semiconductor device having a fin structure and fabrication method thereof
11/13/2008WO2008137483A1 Double gate jfet and fabrication method therefor
11/13/2008WO2008137478A2 Small geometry mos transistor with thin polycrystalline surface contacts and method for making
11/13/2008WO2008137317A1 Semiconductor device having strain-inducing substrate and fabrication methods thereof
11/13/2008WO2008137310A1 Method for applying a stress layer to a semiconductor device and device formed therefrom
11/13/2008WO2008137309A1 Inverted junction field effect transistor and method of forming thereof
11/13/2008WO2008137304A1 Jfet device with improved off-state leakage current and method of fabrication
11/13/2008WO2008137294A1 Jfet device with virtual source and drain link regions and method of fabrication
11/13/2008WO2008137293A1 A jfet having a step channel doping profile and method of fabrication
11/13/2008WO2008137292A1 Transistor providing different threshold voltages and method of fabrication thereof
11/13/2008WO2008137264A1 Methods of making semiconductor-based electronic devices on a wire and articles that can be made thereby
11/13/2008WO2008137243A1 Method of forming a transistor having multiple types of schottky junctions
11/13/2008WO2008136813A2 Semiconductor memory having both volatile and non-volatile functionality and method of operating
11/13/2008WO2008136505A1 Semiconductor device, thin film transistor and methods for manufacturing the semiconductor device and the thin film transistor
11/13/2008WO2008136409A1 Silicon carbide zener diode
11/13/2008WO2008136316A1 Laminated substrate structure and method for manufacturing the same
11/13/2008WO2008136311A1 Nonvolatile storage device, method for operating the nonvolatile storage device and method for manufacturing the nonvolatile storage device
11/13/2008WO2008136270A1 Display element and field effect transistor
11/13/2008WO2008136259A1 Schottky electrode in diamond semiconductor element, and process for producing the same
11/13/2008WO2008136225A1 Soi substrate and manufacturing method of the same, and semiconductor device
11/13/2008WO2008136158A1 Substrate unit for display device, display device and wiring substrate unit
11/13/2008WO2008135812A1 Esd protection device and method of forming an esd protection device
11/13/2008WO2008135554A1 Method for forming a planar stacked gate nonvolatile semiconductor memory device having a floating gate electrode and devices obtained thereof
11/13/2008WO2008097339A3 Ballistic deflection transistor and logic circuits based on same
11/13/2008WO2008052017A3 Flexible fingerprint sensor
11/13/2008WO2008006110A3 Liquid metal wetting of micro-fabricated charged particle emission structures
11/13/2008WO2007149487A3 Opto-electronic and electronic devices using n-face or m-plane gan substrate prepared with ammonothermal growth
11/13/2008WO2007019023A3 Fin-type field effect transistor
11/13/2008WO2006076087A3 METHOD OF FORMING HfSiN METAL FOR n-FET APPLICATIONS
11/13/2008WO2004095524A3 Semiconductor alignment aid
11/13/2008US20080282217 Method for creating mask layout data, apparatus for creating mask layout data, and method for manufacturing semiconductor device
11/13/2008US20080280430 Method of forming films in a trench
11/13/2008US20080280426 Gallium nitride-on-silicon interface
11/13/2008US20080280416 Techniques for Layer Transfer Processing
11/13/2008US20080280413 Methods for forming a transistor
11/13/2008US20080280412 Method of manufacturing silicon carbide semiconductor device
11/13/2008US20080280410 Self aligned narrow storage elements for advanced memory device
11/13/2008US20080280409 Memory Arrays, Semiconductor Constructions And Electronic Systems; And Methods Of Forming Memory Arrays, Semiconductor Constructions And Electronic Systems
11/13/2008US20080277765 Inhibiting damage from dicing and chip packaging interaction failures in back end of line structures
11/13/2008US20080277764 Method of Manufacturing a Semiconductor Device Having a Buried Doped Region
11/13/2008US20080277763 Abrupt Metal-Insulator Transition Wafer, and Heat Treatment Apparatus and Method For the Wafer
11/13/2008US20080277762 Semiconductor device including capacitor including upper electrode covered with high density insulation film and production method thereof
11/13/2008US20080277761 On-chip isolation capacitors, circuits therefrom, and methods for forming the same
11/13/2008US20080277760 Integrated circuit device having openings in a layered structure
11/13/2008US20080277759 Post last wiring level inductor using patterned plate process
11/13/2008US20080277756 Electronic device and method for operating a memory circuit
11/13/2008US20080277748 Ternary, complex ruthenium ferrites exhibit long-range ferromagnetic order well above room temperature, narrow-gap semiconducting properties, large anomalous Hall conductance, low resistivity, high carrier concentration; tune by chemical substitution of Fe and Co, or vary concentration of 3d, 4d elements
11/13/2008US20080277747 MEMS device support structure for sensor packaging
11/13/2008US20080277746 Nanowire sensor with self-aligned electrode support
11/13/2008US20080277745 Fin filled effect transistor and method of forming the same
11/13/2008US20080277744 High voltage device
11/13/2008US20080277743 Semiconductor device and method for fabricating the same
11/13/2008US20080277742 Semiconductor device
11/13/2008US20080277740 Semiconductor device and semiconductor device manufacturing method
11/13/2008US20080277738 Memory cells, memory banks, memory arrays, and electronic systems
11/13/2008US20080277737 Method of Manufacturing a Semiconductor Device and Semiconductor Device Obtained with Such a Method
11/13/2008US20080277735 MOS devices having elevated source/drain regions
11/13/2008US20080277734 Implantation processes for straining transistor channels of semiconductor device structures and semiconductor devices with strained transistor channels
11/13/2008US20080277733 Semiconductor device and process for manufacturing the same
11/13/2008US20080277732 P-channel mos transistor and semiconductor integrated circuit device
11/13/2008US20080277731 Body bias to facilitate transistor matching
11/13/2008US20080277730 Semiconductor Device Manufactured Using a Laminated Stress Layer
11/13/2008US20080277723 Semiconductor Device
11/13/2008US20080277722 Semiconductor device and method of manufacturing the semiconductor device
11/13/2008US20080277721 Thin film transistor, pixel structure and fabricating method thereof
11/13/2008US20080277720 Non-volatile memory device, method of fabricating the same, and semiconductor package including the same
11/13/2008US20080277718 1T MEMS scalable memory cell
11/13/2008US20080277716 Semiconductor device
11/13/2008US20080277715 Dielectric film and formation method thereof, semiconductor device, non-volatile semiconductor memory device, and fabrication method for a semiconductor device
11/13/2008US20080277713 Semiconductor memory device and method of fabricating the same
11/13/2008US20080277712 Flash memory cell with a flair gate
11/13/2008US20080277711 Memory cell
11/13/2008US20080277710 Semiconductor devices and methods of forming the same
11/13/2008US20080277708 Semiconductor devices and methods of forming the same
11/13/2008US20080277705 Semiconductor device, semiconductor wafer structure and method for manufacturing the semiconductor wafer structure
11/13/2008US20080277699 Recess Etch for Epitaxial SiGe
11/13/2008US20080277698 Field effect transistor
11/13/2008US20080277697 Semiconductor device for high frequency
11/13/2008US20080277696 Lateral Junction Field Effect Transistor and Method of Manufacturing The Same
11/13/2008US20080277694 Semiconductor component and method of manufacture
11/13/2008US20080277692 Semiconductor device
11/13/2008US20080277691 Production of a Transistor Gate on a Multibranch Channel Structure and Means for Isolating This Gate From the Source and Drain Regions
11/13/2008US20080277689 Electro-static discharge protection device
11/13/2008US20080277688 Semiconductor device and fabrication method thereof
11/13/2008US20080277687 High power density switch module with improved thermal management and packaging
11/13/2008US20080277678 Light emitting device and method for making the same
11/13/2008US20080277669 SiC semiconductor having junction barrier Schottky device
11/13/2008US20080277668 SIS semiconductor having junction barrier schottky device
11/13/2008US20080277667 Method of producing III-nitride substrate
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