Patents
Patents for H01L 29 - Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having at least one potential-jump barrier or surface barrier; Capacitors or resistors with at least one potential-jump barrier or surface barrier, e.g. pn-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof (218,143)
07/2004
07/27/2004US6768139 Insulated p-type well surrounded by a buried n-type emitter well is used as base terminal; random access memory computers; n-p-n junction transistors as footprint diodes
07/27/2004US6768138 Diode element
07/27/2004US6768134 Semiconductor device and a method for forming patterns
07/27/2004US6768132 Surface modified organic thin film transistors
07/27/2004US6767847 Method of forming a silicon nitride-silicon dioxide gate stack
07/27/2004US6767845 Method of manufacturing semiconductor device
07/27/2004US6767843 Oxidizing silicon carbide in nitrous oxide using a temperature profile of about 1200 degrees c
07/27/2004US6767814 Semiconductor device having silicide thin film and method of forming the same
07/27/2004US6767813 Integrated circuit devices having active regions with expanded effective widths and methods of manufacturing same
07/27/2004US6767810 Method to increase substrate potential in MOS transistors used in ESD protection circuits
07/27/2004US6767808 Method for fabricating semiconductor device
07/27/2004US6767799 Laser beam irradiation method
07/27/2004US6767798 Comprises silicon nitride/dioxide layers; high speed, bipolar transistors
07/27/2004US6767796 Method of manufacturing semiconductor device and the semiconductor device
07/27/2004US6767795 Highly reliable amorphous high-k gate dielectric ZrOXNY
07/27/2004US6767794 Method of making ultra thin oxide formation using selective etchback technique integrated with thin nitride layer for high performance MOSFET
07/27/2004US6767793 Strained fin FETs structure and method
07/27/2004US6767791 Structure and method for suppressing oxide encroachment in a floating gate memory cell
07/27/2004US6767790 Methods of writing/erasing of nonvolatile semiconductor storage device
07/27/2004US6767783 Self-aligned transistor and diode topologies in silicon carbide through the use of selective epitaxy or selective implantation
07/27/2004US6767780 Method for fabricating CMOS transistor
07/27/2004US6767779 Asymmetrical MOSFET layout for high currents and high speed operation
07/27/2004US6767777 Method for manufacturing and structure for transistors with reduced gate to contact spacing including etching to thin the spacers
07/27/2004US6767776 Semiconductor device, and method for manufacturing the same
07/27/2004US6767773 Method of Production of a thin film type semiconductor device having a heat-retaining layer
07/27/2004US6767772 Active matrix substrate, electrooptical device, and method of producing active matrix substrate
07/27/2004US6767771 Formation process of quantum dots or wires
07/27/2004US6767770 Method of forming self-aligned thin capacitively-coupled thyristor structure
07/27/2004US6767760 Process of manufacturing a thin-film transistor
07/27/2004US6767757 High-vacuum packaged microgyroscope and method for manufacturing the same
07/27/2004US6767755 Method of producing electrooptical device and method of producing driving substrate for driving electrooptical device
07/27/2004US6767751 Integrated driver process flow
07/27/2004US6767694 Process for forming pattern and method for producing liquid crystal apparatus employing process for forming pattern
07/22/2004WO2004061991A1 Thin film transistor substrate and method for forming metal wire thereof
07/22/2004WO2004061978A1 Field-effect transistor
07/22/2004WO2004061977A1 Semiconductor storage and mobile electronic device
07/22/2004WO2004061975A1 Trench mis device having implanted drain-drift region and thick bottom oxide and process for manufacturing the same
07/22/2004WO2004061974A2 Silicon carbide power mos field effect transistors and manufacturing methods
07/22/2004WO2004061973A1 Group iii nitride based flip-chip integrated circuit and method for fabricating
07/22/2004WO2004061972A1 Dense dual-plane devices
07/22/2004WO2004061971A1 P-type nitride semiconductor structure and bipolar transistor
07/22/2004WO2004061970A1 Indium phosphide heterojunction bipolar transistor layer structure and method of making the same
07/22/2004WO2004061923A1 Gallium nitride crystal, homoepitaxial gallium-nitride-based devices and method for producing same
07/22/2004WO2004061920A2 Method of forming a thick strained silicon layer and semiconductor structures incorporating a thick strained silicon layer
07/22/2004WO2004061915A2 Integrating n-type and p-type metal gate transistors
07/22/2004WO2004061881A1 Thin film capacitor and method for manufacturing same
07/22/2004WO2004061863A2 Programmable memory array structure incorporating series-connected transistor strings and methods for fabrication and operation of same
07/22/2004WO2004061859A2 Stochastic assembly of sublithographic nanoscale interfaces
07/22/2004WO2004061851A2 An improved method for making high-density nonvolatile memory
07/22/2004WO2004040622A3 Nickel silicide with reduced interface roughness
07/22/2004WO2004040616A3 Field effect transistor and method for production thereof
07/22/2004WO2003100835A3 Gate oxide process methods for high performance mos transistors by reducing remote scattering
07/22/2004WO2002082510A9 Single transistor rare earth manganite ferroelectric nonvolatile memory cell
07/22/2004US20040143805 Device for determining the mask version utilized for each metal layer of an integrated circuit
07/22/2004US20040142582 Thin film structure from LILAC annealing
07/22/2004US20040142581 Method for manufacturing a semiconductor device
07/22/2004US20040142579 Semiconductor device and method for fabricating the same
07/22/2004US20040142573 Method for manufacturing MOSFET semiconductor device
07/22/2004US20040142570 Post high voltage gate dielectric pattern plasma surface treatment
07/22/2004US20040142569 Methods for fabricating semiconductor devices
07/22/2004US20040142547 Method of fabricating non-volatile memory
07/22/2004US20040142546 Semiconductor device and method for fabricating the same
07/22/2004US20040142545 Semiconductor with tensile strained substrate and method of making the same
07/22/2004US20040142544 Semiconductor device including semiconductor thin films having different crystallinity, substrate of the same, and manufacturing method of the same, and liquid crystal display amd manufacturing method of the same
07/22/2004US20040142543 Method of fabricating a semiconductor device utilizing a catalyst material solution
07/22/2004US20040142538 Method of manufacturing semiconductor device
07/22/2004US20040142537 Strained-silicon channel CMOS with sacrificial shallow trench isolation oxide liner
07/22/2004US20040142533 CMOS compatible process for making a charge trapping device
07/22/2004US20040142528 Decoupling capacitor for high frequency noise immunity
07/22/2004US20040142525 Method of manufacturing a semiconductor device
07/22/2004US20040142524 Insulated gate field effect transistor having passivated Schottky barriers to the channel
07/22/2004US20040142523 Method of forming vertical mosfet with ultra-low on-resistance and low gate charge
07/22/2004US20040142522 Semiconductor device
07/22/2004US20040142521 Methods for manufacturing a semiconductor device
07/22/2004US20040142518 Use of fluorine implantation to form a charge balanced nitrided gate dielectric layer
07/22/2004US20040142516 Thin film transistor having copper alloy wire and method of manufacturing the same
07/22/2004US20040142515 SOI MOSFETS exhibiting reduced floating-body effects
07/22/2004US20040142508 Non-planar surface for semiconductor chips
07/22/2004US20040142504 Focal plane arrays in type II-superlattices
07/22/2004US20040142502 Active matrix type organic light emitting diode device and thin film transistor thereof
07/22/2004US20040142500 Reduced hot carrier induced parasitic sidewall device activation in isolated buried channel devices by conductive buried channel depth optimization
07/22/2004US20040142497 Electrostatic discharge protection of thin-film resonators
07/22/2004US20040142211 Chemical monolayer memory device
07/22/2004US20040142118 Flexible electronic device and production method of the same
07/22/2004US20040141453 Micro-electronic junctions devices containing same
07/22/2004US20040141359 2F2 memory device
07/22/2004US20040141357 Ferroelectric transistor for storing two data bits
07/22/2004US20040141352 Memory on a SOI substrate
07/22/2004US20040141326 Light emitting diode light source
07/22/2004US20040141130 Electro-optical device and electronic apparatus
07/22/2004US20040141116 Reflection-transmission type liquid crystal display device and method for manufacturing the same
07/22/2004US20040141097 Electro-optical device and electronic apparatus
07/22/2004US20040140849 Negative feedback amplifier with electrostatic discharge protection circuit
07/22/2004US20040140575 Contact structure of a wiring and a thin film transistor array panel including the same
07/22/2004US20040140566 Composition for a wiring, a wiring using the composition, manufacturing method thereof, a display using the wiring and a manufacturing method thereof
07/22/2004US20040140550 High-frequency package
07/22/2004US20040140547 Semiconductor chip and method for manufacturing the same
07/22/2004US20040140546 [stack chip package structure]
07/22/2004US20040140544 Semiconductor device
07/22/2004US20040140535 Semiconductor device, method of forming epitaxial film, and laser ablation device