Patents for H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof (658,974) |
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06/21/1989 | EP0321326A1 Method for positioning an electronic component on a substrate |
06/21/1989 | EP0321281A2 Immersion development and rinse machine and process |
06/21/1989 | EP0321239A2 Fabricating method of semiconductor device |
06/21/1989 | EP0321238A2 Electrode connecting method |
06/21/1989 | EP0321226A1 Intermediate potential generation circuit for generating a potential intermediate between a power source potential and ground potential |
06/21/1989 | EP0321147A2 Photoelectron mask and photo cathode image projection method using the same |
06/21/1989 | EP0321144A2 Patterning method in the manufacture of miniaturized devices |
06/21/1989 | EP0321142A2 Soldering method using localized heat source |
06/21/1989 | EP0321133A1 Semiconductor integrated circuit having a DC test function |
06/21/1989 | EP0321065A2 Method of manufacture of Schottky compound semiconductor devices |
06/21/1989 | EP0321038A2 Liquid crystal display devices and their method of manufacture |
06/21/1989 | EP0321029A1 Process for obtaining aligned patterns on opposite sides of an opaque support |
06/21/1989 | EP0320977A2 Method for manufacturing semiconductor devices having twin wells |
06/21/1989 | EP0320971A2 Epitaxial growth apparatus |
06/21/1989 | EP0320970A2 Vapour-phase epitaxial growth process |
06/21/1989 | EP0320919A2 Semiconductor integrated circuit with an improved macro cell pattern |
06/21/1989 | EP0320916A2 Electrically erasable and programmable read only memory using stacked-gate cell |
06/21/1989 | EP0320852A2 Method of washing super precision devices |
06/21/1989 | EP0320660A2 Integrated circuit package |
06/21/1989 | EP0320618A1 Housing for a GTO power thyristor |
06/21/1989 | EP0320542A1 IC package extracting mechanism used in IC socket |
06/21/1989 | EP0205422A4 Continuously pulled single crystal silicon ingots. |
06/21/1989 | CN1004592B Chip holder for semiconductor silicon element |
06/20/1989 | US4841556 Plasma X-ray source |
06/20/1989 | US4841533 Semiconductor laser device having a graded index waveguide |
06/20/1989 | US4841531 Semiconductor laser device |
06/20/1989 | US4841486 Semiconductor memory device and sense amplifier |
06/20/1989 | US4841481 Semiconductor memory device |
06/20/1989 | US4841354 Electronic device with peripheral protective electrode |
06/20/1989 | US4841352 Semi-custom integrated circuit provided with standardized capacitor cells |
06/20/1989 | US4841347 MOS VLSI device having shallow junctions and method of making same |
06/20/1989 | US4841342 Apparatus for treating photoresists |
06/20/1989 | US4841275 Thick-film integrated circuit device capable of being manufactured by means of easy-to-perform trimming operation |
06/20/1989 | US4841239 Method and measuring instrument for identifying the diffusion length of the minority charge carriers for non-destructive detection of flaws and impurities in semiconductor crystal bodies |
06/20/1989 | US4841233 Semiconductor integrated circuit adapted to carry out operation test |
06/20/1989 | US4841180 Integrable evaluating circuit |
06/20/1989 | US4841099 Electrically insulating polymer matrix with conductive path formed in situ |
06/20/1989 | US4840924 Method of fabricating a multichip package |
06/20/1989 | US4840923 Simultaneous multiple level interconnection process |
06/20/1989 | US4840920 Method of isolating a semiconductor device using local oxidation |
06/20/1989 | US4840918 Diffused atomic hydrogen passivation; |
06/20/1989 | US4840917 Atomic hydrogen diffusion; density |
06/20/1989 | US4840876 Method of treating photoresists |
06/20/1989 | US4840874 Method of forming resist pattern |
06/20/1989 | US4840872 Pattern forming method by use of X-ray exposure |
06/20/1989 | US4840701 Etching apparatus and method |
06/20/1989 | US4840654 Heat bonding glass ceramic substrates having electroconductive patterned surfaces |
06/20/1989 | US4840530 Transfer apparatus for semiconductor wafers |
06/20/1989 | US4840487 Measuring apparatus for etching pits |
06/20/1989 | US4840302 Barrier layer; semiconductor chips |
06/20/1989 | US4840139 Apparatus for the formation of a functional deposited film using microwave plasma chemical vapor deposition process |
06/20/1989 | CA1256207A1 Charge transfer device provided with self-induction members |
06/20/1989 | CA1256188A1 Textured crystal picosecond photoresponsive element |
06/15/1989 | WO1989005519A1 Self-aligned interconnects for semiconductor devices |
06/15/1989 | WO1989005518A1 Process for forming isolation regions in a semiconductor substrate |
06/15/1989 | WO1989005517A1 Self-aligned, planarized contacts for semiconductor devices |
06/15/1989 | WO1989005516A1 Self-aligned semiconductor devices |
06/15/1989 | WO1989005515A1 Plasma pinch system and method of using same |
06/15/1989 | DE3840560A1 Semiconductor device and method for fabricating it |
06/15/1989 | DE3741186A1 Three-dimensional single-transistor cell, and arrangement of single-transistor cells for dynamic semiconductor memories, and method for producing them |
06/15/1989 | DE3740773A1 Method for producing electroconductive bonds |
06/14/1989 | EP0320425A2 Plasma amplified photoelectron process endpoint detection apparatus |
06/14/1989 | EP0320405A2 Semiconductor static random access memory device |
06/14/1989 | EP0320321A1 Integrated circuit fuse-blowing means |
06/14/1989 | EP0320297A2 Method of temperature control of a wafer on a chuck |
06/14/1989 | EP0320292A2 A process for forming a pattern |
06/14/1989 | EP0320273A1 Bi-mos semiconductor device |
06/14/1989 | EP0320244A2 Electrical contact bump and a package provided with the same |
06/14/1989 | EP0320231A2 Erasable programmable memory |
06/14/1989 | EP0320217A2 An improved twin-well BiCMOS process |
06/14/1989 | EP0320115A1 Method and equipement for manufacturing silicon single crystal |
06/14/1989 | EP0320090A2 Shaping silicon semiconductor wafers |
06/14/1989 | EP0320089A2 Interconnected semiconductor devices |
06/14/1989 | EP0320045A1 Method of manufacturing a semiconductor device, in which photoresist on a silicon oxide layer on a semiconductor substrate is stripped |
06/14/1989 | EP0320016A1 Sputtering device |
06/14/1989 | EP0319871A1 Thin film orthogonal microsensor for air flow and method for its fabrication |
06/14/1989 | EP0319858A2 Method of controlling floating zone |
06/14/1989 | EP0319806A1 Semiconductor wafer surface treatment method |
06/14/1989 | EP0319805A1 Wafer processing method |
06/14/1989 | EP0319804A1 Semiconductor wafer surface treatment method |
06/14/1989 | EP0319797A2 Method and apparatus for measuring defect density and defect distribution |
06/14/1989 | EP0319575A1 Fabrication of interlayer conductive paths in integrated circuits. |
06/14/1989 | EP0174986A4 Process for forming and locating buried layers. |
06/13/1989 | US4839911 Charger transfer shift register with voltage sensing device using a floating-potential diode |
06/13/1989 | US4839821 Automatic cell-layout arranging method and apparatus for polycell logic LSI |
06/13/1989 | US4839820 Monolithic semi-custom LSI |
06/13/1989 | US4839787 Integrated high voltage generating system |
06/13/1989 | US4839768 Protection of integrated circuits from electrostatic discharges |
06/13/1989 | US4839715 Chip contacts without oxide discontinuities |
06/13/1989 | US4839711 Dielectric for laser trimming |
06/13/1989 | US4839710 CMOS cell which can be used as a resistor, a capacitor, an RC component or a terminating impedance of a signal |
06/13/1989 | US4839707 LCMOS displays fabricated with implant treated silicon wafers |
06/13/1989 | US4839705 X-cell EEPROM array |
06/13/1989 | US4839704 Application of deep-junction non-self-aligned transistors for suppressing hot carriers |
06/13/1989 | US4839703 High speed and power transistor |
06/13/1989 | US4839702 Semiconductor device based on charge emission from a quantum well |
06/13/1989 | US4839701 Photosensitive to long wavelengths |
06/13/1989 | US4839612 High-frequency power amplifier having heterojunction bipolar transistor |
06/13/1989 | US4839588 Method for the examination of electrically active impurities of semiconductor materials or structures and measuring arrangement for carrying out the method |
06/13/1989 | US4839586 Apparatus for irradiating electronic circuits |