Patents
Patents for H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof (658,974)
01/1992
01/22/1992EP0466931A1 Method of and device for working clad plate
01/22/1992EP0229180B1 Process for manufacturing semiconductor devices
01/22/1992EP0214177B1 Apparatus for replenishing a melt
01/22/1992EP0196897B1 Thermal etching of a compound semiconductor
01/22/1992CN1058117A Schottky barrier semiconductor device
01/22/1992CN1058055A Wet-tip die for efg crystal growth apparatus
01/21/1992US5083234 Multilayer transducer with bonded contacts and method for implementation of bonding
01/21/1992US5083193 Semiconductor package, method of manufacturing the same, apparatus for carrying out the method, and assembly facility
01/21/1992US5083191 Semiconductor device
01/21/1992US5083190 Shared gate CMOS transistor
01/21/1992US5083188 Integrated circuit having superconductive wirings
01/21/1992US5083186 Semiconductor device lead frame with rounded edges
01/21/1992US5083183 Semiconductor device and method for producing the same
01/21/1992US5083182 Darlington device with an ultra-lightweight emitter speed-up transistor
01/21/1992US5083181 Semiconductor integrated circuit device and wiring method thereof
01/21/1992US5083180 Lateral-type semiconductor device
01/21/1992US5083179 CMOS semiconductor integrated circuit device
01/21/1992US5083178 Semiconductor cmos gate array
01/21/1992US5083176 Semiconductor device having increased breakdown voltage
01/21/1992US5083172 Dynamic random access memory device fabricated with two kinds of field effect transistor different in thickness of gate oxide films
01/21/1992US5083061 Electron beam excited ion source
01/21/1992US5083048 Bimos tri-state output buffer
01/21/1992US5083035 Position location in surface scanning using interval timing between scan marks on test wafers
01/21/1992US5083033 Reacting silicon compound with gas in vacuum
01/21/1992US5083032 Electron beam exposure apparatus
01/21/1992US5082801 Process for producing multilayer interconnection for semiconductor device with interlayer mechanical stress prevention and insulating layers
01/21/1992US5082800 Masking; warped substrate
01/21/1992US5082799 Method for fabricating indium phosphide/indium gallium arsenide phosphide buried heterostructure semiconductor lasers
01/21/1992US5082798 Crystal growth method
01/21/1992US5082797 Method of making stacked textured container capacitor
01/21/1992US5082796 Doping, etching, heating
01/21/1992US5082795 Window opening; vertical channel
01/21/1992US5082794 Method of fabricating mos transistors using selective polysilicon deposition
01/21/1992US5082793 Method for making solid state device utilizing ion implantation techniques
01/21/1992US5082792 Forming a physical structure on an integrated circuit device and determining its size by measurement of resistance
01/21/1992US5082791 Method of fabricating solar cells
01/21/1992US5082762 Charged particle beam exposure method
01/21/1992US5082696 Method of forming semiconducting amorphous silicon films from the thermal decomposition of dihalosilanes
01/21/1992US5082615 Method for packaging semiconductor devices in a resin
01/21/1992US5082606 Catalytic hydrogen oxidation to form water vapor; cofiring
01/21/1992US5082524 Addition of silicon tetrabromide to halogenated plasmas as a technique for minimizing photoresist deterioration during the etching of metal layers
01/21/1992US5082522 Dielectric layer in semiconductor
01/21/1992US5082518 Sparger plate for ozone gas diffusion
01/21/1992US5082165 Device for forwarding semiconductor lead frames and method of operating the same
01/21/1992US5081949 Apparatus for selective tinning of substrate leads
01/21/1992US5081796 Method and apparatus for mechanical planarization and endpoint detection of a semiconductor wafer
01/21/1992US5081795 Polishing apparatus
01/21/1992US5081764 Terminal structure and process of fabricating the same
01/21/1992US5081733 Automatic cleaning apparatus for disks
01/21/1992CA1294717C Zero bird-beak oxide isolation scheme for integrated circuits
01/21/1992CA1294716C Method of manufacturing a planar electrical interconnection utilizing isotropic deposition of conductive material
01/21/1992CA1294713C Semiconductor memory comprising trench capacitor
01/21/1992CA1294676C Feed forward darlington circuit with reduced npn reverse beta sensitivity
01/20/1992CA2047329A1 Compact sram cell layout
01/19/1992WO1992002038A1 Processing microchips
01/19/1992CA2087429A1 Processing microchips
01/16/1992DE4122019A1 Semiconductor device with improved element isolation - has diffusion layer located below contact and has good field screening properties and prevents short circuiting
01/16/1992DE4114741A1 Corrosion resistant metal connection pattern prodn.
01/16/1992DE4021791A1 Contact pin aligning rule for semiconductor integrated circuit - has rows of aligned notches along longitudinal side edges to straighten contact pins
01/16/1992DE4021516A1 Differential tungsten growth by CVD - by controlling reaction gas ratio for improved step coverage e.g. in DRAM mfr.
01/16/1992DE4021515A1 Tungsten interconnection pattern formation method for semiconductor - growing tungsten on exposed portions of poly:silicon film defined in pattern defining layer which is preferably highly doped oxide film
01/15/1992EP0466598A1 Method and apparatus for deposition of antireflection coatings and control of their thickness
01/15/1992EP0466562A2 Method and apparatus for measuring three-dimensional configuration of wire-shaped object in a short time
01/15/1992EP0466527A2 Process for manufacturing the gate of a transistor
01/15/1992EP0466508A1 MOS-type semiconductor device and manufacturing method thereof
01/15/1992EP0466495A2 Liquid crystal display apparatus
01/15/1992EP0466482A2 Code setting circuit
01/15/1992EP0466457A1 Method for pulling semiconductor single crystal
01/15/1992EP0466426A2 Semiconductor memory device having an increased capacitance of memory cell
01/15/1992EP0466380A2 Integrated circuit structure analysis
01/15/1992EP0466377A2 Liquid crystal display for displaying half-tone images
01/15/1992EP0466359A2 Process for making low optical density polymers and copolymers for photoresists and optical applications
01/15/1992EP0466335A2 Process of manufacturing semiconductor devices
01/15/1992EP0466320A2 Process for preparing a semiconductor device including the selective deposition of a metal
01/15/1992EP0466205A1 Method for coating a substrate with a silicon nitrogen-containing material.
01/15/1992EP0466195A2 A fabrication method for semiconductor devices
01/15/1992EP0466176A1 Compound semiconductor integrated circuit device
01/15/1992EP0466166A1 Gate or interconnection for semiconductor device and method of manufacture thereof
01/15/1992EP0466103A1 Method for forming a metallization by evaporation using an oblique direction of incidence on semiconductor material
01/15/1992EP0466051A2 Non-volatile progammable read only memory device having memory cells each implemented by a memory transistor and a switching transistor coupled in parallel and method of memorizing a data bit
01/15/1992EP0466016A2 Silicide/metal capacitor for polysilicon gate
01/15/1992EP0466014A2 External gettering during manufacture of semiconductor devices
01/15/1992EP0465961A1 Semiconductor device on a dielectric isolated substrate
01/15/1992EP0465949A2 Light sensitive registration element, fabrication and processing and apparatus for implementing said process
01/15/1992EP0465888A1 Trench capacitor for large scale integrated memory
01/15/1992EP0465886A2 Semiconductor device having an insulator film of silicon oxide in which OH ions are incorporated
01/15/1992EP0465868A2 Controlled compliance polishing pad
01/15/1992EP0465862A2 Permeable base transistor and method of making the same
01/15/1992EP0465858A1 Method for manufacturing a polyimide
01/15/1992EP0465855A2 Process for manufacturing polished silicon wafers having stabilized surfaces for storing
01/15/1992EP0465814A1 A semiconductor device package and method of its manufacture
01/15/1992EP0465515A1 Process and device for monitoring assisted ion machining processes on wafers.
01/15/1992CN1057796A Washing/drying method and apparatus
01/15/1992CN1015306B Making method for power transistor
01/14/1992WO1992001090A1 Wet-tip die for efg crystal growth apparatus
01/14/1992USRE33797 Reaction of a disiloxane, a diamine and a dianhydride
01/14/1992US5081610 Reference cell for reading eeprom memory devices
01/14/1992US5081562 Circuit board with high heat dissipations characteristic
01/14/1992US5081559 Enclosed ferroelectric stacked capacitor
01/14/1992US5081520 Chip mounting substrate having an integral molded projection and conductive pattern