Patents
Patents for H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof (658,974)
09/2006
09/20/2006EP1454112A4 Interferometry system having a dynamic beam-steering assembly for measuring angle and distance
09/20/2006EP1442487B1 Organic thin film transistor with siloxane polymer interface
09/20/2006EP1368123B1 Penetrable cap
09/20/2006EP1305107B1 Method and apparatus for blending process materials
09/20/2006EP1272903B1 Apparatus for generating a laser pattern on a photomask and associated methods
09/20/2006EP1230334B1 Non-corrosive cleaning composition for removing plasma etching residues
09/20/2006EP1181401B1 Semi-insulating silicon carbide without vanadium domination
09/20/2006EP1127294B1 Apparatus for extreme UV lithography comprising a wafer chamber and gas curtain
09/20/2006EP0975731B1 Ethylenediaminetetraacetic acid or its ammonium salt semiconductor process residue removal composition and process
09/20/2006EP0951066B1 Method of manufacturing semiconductor device
09/20/2006CN2819480Y Semiconductor non-volatile memory of self-aligning quantum-point reinforced FN tunnel
09/20/2006CN2819471Y Heating lining bracket for nitride semiconductor material annealing
09/20/2006CN2819470Y Chip case
09/20/2006CN1836336A Mirror image non-volatile memory cell transistor pairs with single poly layer
09/20/2006CN1836335A Electric power transforming apparatus
09/20/2006CN1836330A 半导体集成电路 The semiconductor integrated circuit
09/20/2006CN1836329A Circuit device and method for manufacturing same
09/20/2006CN1836326A Semiconductor device and method for making the same
09/20/2006CN1836325A Methods and apparatus for packaging integrated circuit devices
09/20/2006CN1836323A High-performance CMOS SOI device on hybrid crystal-oriented substrates
09/20/2006CN1836322A Self-aligned drain/channel junction in vertical pass transistor DRAM cell design for device scaling
09/20/2006CN1836321A High ft and fmax bipolar transistor and method of making same
09/20/2006CN1836320A Method of producing thin layers of semiconductor material from a double-sided donor wafer
09/20/2006CN1836319A Lead frame routed chip pads for semiconductor packages
09/20/2006CN1836318A Thin germanium oxynitride gate dielectric for germanium-based devices
09/20/2006CN1836317A Method for forming film, method for manufacturing semiconductor device, semiconductor device and substrate treatment system
09/20/2006CN1836316A Production of insulating film with low dielectric constant
09/20/2006CN1836315A Abrasive compound for semiconductor planarization
09/20/2006CN1836314A Failure analysis methods and systems
09/20/2006CN1836313A Strained-silicon-on-insulator single-and double-gate MOSFET and method for forming the same
09/20/2006CN1836312A Exposure apparatus, exposure method and device manufacturing method
09/20/2006CN1836062A Process for producing wafer
09/20/2006CN1836017A Coating composition and low dielectric siliceous material produced by using same
09/20/2006CN1835825A Flexible formed sheets for treating surfaces
09/20/2006CN1835824A Cell, system and article for electrochemical mechanical processing
09/20/2006CN1835794A Process for the recovery of surfactants
09/20/2006CN1835649A Substrate-loading instrument having the function of heating a substrate
09/20/2006CN1835255A Production method for light emitting element
09/20/2006CN1835254A Production method for light emitting element
09/20/2006CN1835249A Semiconductor device and method of manufacturing the same
09/20/2006CN1835248A Silicon-on-nothing metal-oxide-semiconductor field-effect-transistor and method for manufacturing the same
09/20/2006CN1835246A Image sensor device and manufacturing method of the same
09/20/2006CN1835242A Liquid crystal display device using thin-film transistor and method for manufacturing the same
09/20/2006CN1835241A Oxide ferroelectric memory cell and prepn process
09/20/2006CN1835240A Nonvolatile semiconductor memory device and method of fabricating the same
09/20/2006CN1835239A Semiconductor device and manufacturing method of the same
09/20/2006CN1835238A Semiconductor device with gate insulating film and manufacturing method thereof
09/20/2006CN1835235A Semiconductor device and mim capacitor
09/20/2006CN1835233A System single chip with electromagnetic interference shielding functional design
09/20/2006CN1835232A Multi-chip semiconductor device with high withstand voltage, and a fabrication method of the same
09/20/2006CN1835231A Semiconductor device and manufacturing method therefor
09/20/2006CN1835229A Semiconductor device and method of manufacturing semiconductor device
09/20/2006CN1835228A Three-dimensional package and method of forming same
09/20/2006CN1835226A Semiconductor device and manufacturing process therefor
09/20/2006CN1835225A 半导体芯片 Semiconductor chip
09/20/2006CN1835222A Semiconductor device and a manufacturing method of the same
09/20/2006CN1835219A Mounting structure and mounting method of a semiconductor device, and liquid crystal display device
09/20/2006CN1835217A Methods and systems for improving microelectronic
09/20/2006CN1835214A Semiconductor device and manufacturing method therefor
09/20/2006CN1835212A Electronic device substrate and its fabrication method, and electronic device and its fabrication method
09/20/2006CN1835211A Circuit board of electronic device and mfg method thereof
09/20/2006CN1835210A NROM device and its manufacturing method
09/20/2006CN1835209A Method for manufacturing semiconductor device with recess channels and asymmetrical junctions
09/20/2006CN1835208A Method for fabricating semiconductor device
09/20/2006CN1835207A Method of preventing energy analysis attack to RSA algorithm
09/20/2006CN1835206A Method of forming double-setting line arrange for semiconductor device using protective access cover layer
09/20/2006CN1835205A Substrate mounting table, substrate processing apparatus and substrate processing method
09/20/2006CN1835204A Chip holder and chip treatment method
09/20/2006CN1835203A Substrate supporting member and substrate processing apparatus
09/20/2006CN1835202A Rotary table device using multi-group clips for retaining wafers
09/20/2006CN1835201A Tester for optical device
09/20/2006CN1835200A Vacuum apparatus, method for measuring a leak rate thereof, program used in measuring the leak rate and storage medium storing the program
09/20/2006CN1835199A Etch monitor and method thereof
09/20/2006CN1835198A Bonding method and bonding apparatus
09/20/2006CN1835197A Chip welding device and method using same
09/20/2006CN1835196A Method for manufacturing semiconductor device and semiconductor device
09/20/2006CN1835195A Method for manufacturing a semiconductor package with a laminated chip cavity
09/20/2006CN1835194A Method for manufacturing semiconductor device and semiconductor device
09/20/2006CN1835193A Atmospheric transfer chamber, processed object transfer method, program for performing the transfer method, and storage medium storing the program
09/20/2006CN1835192A Cleaning method of semiconductor component
09/20/2006CN1835191A Semiconductor integrated circuit, manufacturing method thereof, and manufacturing apparatus thereof
09/20/2006CN1835190A Partial implantation method for semiconductor manufacturing
09/20/2006CN1835189A Nitride semiconductor device and manufacturing method thereof
09/20/2006CN1835188A Micro movable device and method of making the same using wet etching
09/20/2006CN1835056A Light-emitting module and driving method therefor, and optical sensor
09/20/2006CN1834791A Decompression dry device
09/20/2006CN1834790A Method of mfg. lower substrate of LCD device by using three masks
09/20/2006CN1834789A Exposal device and method
09/20/2006CN1834788A Method of realizing continuous scanning to explore two patterns by using two mask plates
09/20/2006CN1834787A Proximity type exposure apparatus
09/20/2006CN1834786A Method of coating photoresist by sprayer head
09/20/2006CN1834782A Mask data generation method
09/20/2006CN1834732A Matrix display device and method for manufacturing the same, and heat pressing connection head
09/20/2006CN1834679A Method and apparatus for a twisting fixture probe for probing test access point structures
09/20/2006CN1834678A Multi-channel analyzer of non-contact applied chip
09/20/2006CN1834675A Inspection method and device of using scan laser SQUID microscope
09/20/2006CN1834674A Method and apparatus for a reliability testing
09/20/2006CN1834668A System class testing method
09/20/2006CN1834662A Test jig for measuring To packed base high frequency of photoelectronic device
09/20/2006CN1834638A Method and device for controlling the contamination of wafer substrates