Patents
Patents for H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof (658,974)
04/2008
04/30/2008CN101170067A Making method for floating grid and non-volatile memory
04/30/2008CN101170066A Semiconductor component and its making method
04/30/2008CN101170065A Method for making floating gate discharging sharp angle
04/30/2008CN101170064A Method for flash technology high-voltage bar oxygen and tunnel-penetration oxidation layer
04/30/2008CN101170063A Etching liquid management device
04/30/2008CN101170062A Semiconductor manufacture method and apparatus
04/30/2008CN101170061A A making method for nano silicon thin film
04/30/2008CN101170060A Making method for silicon germanium extension layer
04/30/2008CN101170059A Method for making silicon base band irradiance and non-linear electric-light material
04/30/2008CN101170058A Manufacturing method of semiconductor device
04/30/2008CN101170057A Method for diagnosing electrostatic chuck, vacuum processing apparatus, and storage medium
04/30/2008CN101170056A Etching device of organic EL display panel and its method
04/30/2008CN101170055A Integrated method for removal of halogen residues from etched substrates by thermal process
04/30/2008CN101170054A Device and method for processing substrate and method for supplying plasma
04/30/2008CN101170053A Plasma processing device, plasma processing method and storage medium
04/30/2008CN101170052A Apparatus for controlling plasma etching process
04/30/2008CN101170051A Manufacturing method of semiconductor chip
04/30/2008CN101170050A Cleaning method for reaction cavity room, forming method of protection film, and protection wafer
04/30/2008CN101169626A Statistic process control system and its processing method
04/30/2008CN101169596A Whole-wet photoresist removing method
04/30/2008CN101169593A Metal lithographic mask box
04/30/2008CN101169592A On-line spherical aberration measuring method
04/30/2008CN101169591A Lens imaging system for overlay accuracy and its feeding and calibration method
04/30/2008CN101169526A A device for providing multiple pattern electrodes and a bonding apparatus of pattern electrodes having the same
04/30/2008CN101169461A Chip detecting method
04/30/2008CN101169337A LED measuring instrument
04/30/2008CN101169208A 设备连接定位模板 Positioning device connection template
04/30/2008CN101168851A Epitaxial silicon wafer and fabrication method thereof
04/30/2008CN101168847A Electrolytic liquid for electrolytic polishing and electrolytic polishing method
04/30/2008CN101168842A Low temperature aerosol deposition of a plasma resistive layer
04/30/2008CN101168647A Chemical mechanical polishing fluid for polishing polycrystalline silicon
04/30/2008CN101168509A Polyatomic phenol compound and chemical amplification type photoresist composition containing the same
04/30/2008CN101168438A Large area reverse roller impression method for micro-structure of flexible base macroelectron manufacture
04/30/2008CN101168275A Resin mold casting device
04/30/2008CN101168269A Hub-shape knife and cutting device
04/30/2008CN101168241A Voltage mode current control
04/30/2008CN100386014C Chip removal apparatus, fitting system and method of removing chips from a wafer
04/30/2008CN100386013C Substrate holding method and method of manufacturing electronic part
04/30/2008CN100385901C Plotter head unit, plotter and plotting method
04/30/2008CN100385757C Semiconductor laser, its manufacturing method, and manufacturing method of electron device
04/30/2008CN100385755C Integrated optical transducer assembly and method of forming the same
04/30/2008CN100385696C Epitaxial thin films
04/30/2008CN100385692C Semiconductor light emitting device and method for manufacturing same
04/30/2008CN100385691C Method for cutting of inverted mounting LED
04/30/2008CN100385686C Poly-SiGe schottky barrier diode and its preparing method
04/30/2008CN100385685C Electrically erasable programmable split-gate memory cell
04/30/2008CN100385684C Film transistor and manufacturing method of its lightly mixed drain area
04/30/2008CN100385683C Method for manufacturing thin-film transistor
04/30/2008CN100385682C Method of manufacturing thin-film transistor
04/30/2008CN100385681C Semiconductor device and method for making same
04/30/2008CN100385680C MOSFET and a method of making same
04/30/2008CN100385679C Semiconductor apparatus and method for manufacturing the same
04/30/2008CN100385678C Flash memory with concave grid local SONOS structure and manufacturing method thereof
04/30/2008CN100385677C Field effect transistor, transistor circuit, transistor device and transistor operation method
04/30/2008CN100385676C Silicon carbide horizontal channel buffered gate semiconductor devices
04/30/2008CN100385672C Thin film transistor array substrate and fabricating method thereof
04/30/2008CN100385671C Thin film transistor array substrate and method of fabricating the same
04/30/2008CN100385670C Semiconductor device comprising capacitor and method of fabricating the same
04/30/2008CN100385668C Multi-crystal storage structure, method for forming said structure and semiconductor storage device using said structure
04/30/2008CN100385667C Integrated circuit and producing method thereof
04/30/2008CN100385666C Integrated circuit device with built-in single temperature sensor
04/30/2008CN100385665C Chip and multi-chip semiconductor device using thereof and method for manufacturing same
04/30/2008CN100385662C Semiconductor structure, and quality control method of manufacturing semiconductor structure
04/30/2008CN100385660C Semiconductor element of improved electronic migration and method for forming semiconductor element
04/30/2008CN100385659C Integrated circuit apparatus and semiconductor device including metal isolator-metal capacitor
04/30/2008CN100385658C Lead frame and semiconductor device using the same
04/30/2008CN100385657C Electronic device and method of manufacturing the same
04/30/2008CN100385655C 集成电路封装 IC packaging
04/30/2008CN100385654C Wire rack packaging structure and manufacturing method thereof
04/30/2008CN100385649C 半导体器件 Semiconductor devices
04/30/2008CN100385647C SOI device with different crystallographic orientations
04/30/2008CN100385646C Semiconductor component of preventing breakdown, and manufacturing method
04/30/2008CN100385645C Manufacturing method of thin film integrated circuit device and manufacturing method of non-contact type thin film integrated circuit device
04/30/2008CN100385644C Method and apparatus for capturing and using designs in an integrated circuit fabrication process
04/30/2008CN100385643C Method for plug formation and method for manufacture double mosaic structure
04/30/2008CN100385642C Pad redistribution layer and method for fabricating pad redistribution layer
04/30/2008CN100385641C Semiconductor packaging with partially patterned lead frames and its making methods
04/30/2008CN100385640C Anodized substrate support
04/30/2008CN100385639C System and method for heating semiconductor in standard test environment
04/30/2008CN100385638C Test sample for bridging and continuous testing
04/30/2008CN100385637C Fabricating method for lead frame of integrated circuit
04/30/2008CN100385636C Composite leadframe LED package and method of making the same
04/30/2008CN100385635C Method and apparatus to increase strain effect in a transistor channel
04/30/2008CN100385634C Method of manufacture thin silicon on insulator (SOI) with recessed channel and devices manufactured thereby
04/30/2008CN100385633C Method for fabricating MOSFET element
04/30/2008CN100385632C Chemical machanical grinding method, and equipment for preventing rudimental grinding pulp
04/30/2008CN100385631C Polishing pad for electrochemical mechanical polishing
04/30/2008CN100385630C Method of manufacturing semiconductor wafer
04/30/2008CN100385629C Method and device for cleaning semiconductor crystal wafer
04/30/2008CN100385628C Semiconductor wafer and manufacturing process for semiconductor device
04/30/2008CN100385627C Semiconductor device producing method, semiconductor wafer and semiconductor device
04/30/2008CN100385626C Method of forming gate structures for semiconductor devices and semiconductor device
04/30/2008CN100385625C Polysiliconized metal grid structure and method for making same
04/30/2008CN100385624C Method for making semiconductor device and the semiconductor device
04/30/2008CN100385623C CVD apparatus and method of cleaning the CVD apparatus
04/30/2008CN100385622C Method for forming fine pattern
04/30/2008CN100385621C Semiconductor device and manufacturing method of the same
04/30/2008CN100385620C Electrode subassembly
04/30/2008CN100385619C Mask, method of making the same, and method of making thin film transistor using the same
04/30/2008CN100385618C Wafer protection system for wafer cleaning device and wafer cleaning process