Patents
Patents for H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof (658,974)
06/2009
06/02/2009US7541007 Microreactor and method of use to produce hydrogen by methanol reforming
06/02/2009US7540971 Plasma etch process using polymerizing etch gases across a wafer surface and additional polymer managing or controlling gases in independently fed gas zones with time and spatial modulation of gas content
06/02/2009US7540968 Micro movable device and method of making the same using wet etching
06/02/2009US7540935 Plasma oxidation and removal of oxidized material
06/02/2009US7540931 Method of producing ceramic green sheet and method of producing electronic component using this ceramic green sheet
06/02/2009US7540923 Shower head structure for processing semiconductor
06/02/2009US7540921 Crystallization apparatus, crystallization method, phase modulation element, device and display apparatus
06/02/2009US7540800 Rough polishing method of semiconductor wafer and polishing apparatus of semiconductor wafer
06/02/2009US7540717 Membrane nanopumps based on porous alumina thin films, membranes therefor and a method of fabricating such membranes
06/02/2009US7540371 Break-away positioning conveyor mount for accommodating conveyor belt bends
06/02/2009CA2392445C Silicon layer highly sensitive to oxygen and method for obtaining same
06/02/2009CA2347425C Fabrication of gallium nitride layers by lateral growth
06/02/2009CA2320218C Crystal ion-slicing of single-crystal films
05/2009
05/29/2009WO2008062729A1 Silicon carbide semiconductor device and process for producing the same
05/29/2009CA2669581A1 Silicon carbide semiconductor device and method of manufacturing the same
05/28/2009WO2009067688A1 Systems and methods for preparing epitaxially textured polycrystalline films
05/28/2009WO2009067641A2 R-plane sapphire method and apparatus
05/28/2009WO2009067381A1 Method of controlling etch microloading for a tungsten-containing layer
05/28/2009WO2009067364A1 Transfer of high temperature wafers
05/28/2009WO2009067354A1 Photoresist compositions and process for multiple exposures with multiple layer photoresist systems
05/28/2009WO2009067299A1 Surface mount package with enhanced strength solder joint
05/28/2009WO2009067214A1 Mos transistors having niptsi contact layers and methods for fabricating the same
05/28/2009WO2009067162A1 Process using colored mask combined with selective area deposition
05/28/2009WO2009067160A1 Use of gradient colored mask
05/28/2009WO2009067154A1 Multicolored mask process for making display circuitry
05/28/2009WO2009067153A1 Multicolor mask
05/28/2009WO2009067147A1 Integrated color mask
05/28/2009WO2009067140A2 Fin-jfet
05/28/2009WO2009067104A1 Plasma etch process for controlling line edge roughness
05/28/2009WO2009066997A2 Contact etch for ams products
05/28/2009WO2009066993A2 Use of selective wee to obtain near planar topography
05/28/2009WO2009066983A2 Method of curing defects in spin-on-glass
05/28/2009WO2009066979A2 Mems based probe card and a method of testing semiconductor ion sensor using the same
05/28/2009WO2009066949A2 Fabricating method of polycrystalline silicon thin film, polycrystalline silicon thin film fabricated using the same
05/28/2009WO2009066923A2 Substrate rotating and oscillating apparatus for rapid thermal process
05/28/2009WO2009066905A1 Substrate oscillating apparatus for rapid thermal process
05/28/2009WO2009066852A1 Method and apparatus for controlling position of z-axis for wafer prober
05/28/2009WO2009066847A1 Method of aligning a wafer and method of manufacturing a flip chip using the same
05/28/2009WO2009066825A1 Method for preventing kirkendall void formation for packages fabricated by joining an electronic component finished with electroplated cu to solder and electronic packages fabricated by using the same
05/28/2009WO2009066768A1 Composition for surface antireflection films and pattern-making method
05/28/2009WO2009066764A1 Semiconductor integrated circuit device and its test method
05/28/2009WO2009066750A1 Etching solution composition
05/28/2009WO2009066739A1 Method for fabricating semiconductor device, semiconductor device, communication apparatus, and semiconductor laser
05/28/2009WO2009066725A1 Zno-group semiconductor element
05/28/2009WO2009066723A1 Electron emitting element, electron emitting device, light emitting device, image display, blower, cooling device, electrifying device, image forming device, electron beam curing device, and electron emitting element manufacturing method
05/28/2009WO2009066602A1 Dicing method
05/28/2009WO2009066573A1 Conveyance robot, locally cleaned housing with the conveyance robot, and semiconductor manufacturing device with the housing
05/28/2009WO2009066566A1 PROCESS FOR PRODUCING SINGLE CRYSTAL SiC SUBSTRATE AND SINGLE CRYSTAL SiC SUBSTRATE PRODUCED BY THE PROCESS
05/28/2009WO2009066551A1 Sputtering apparatus and film forming method
05/28/2009WO2009066524A1 Electrostatic discharge protection device and semiconductor integrated circuit including same
05/28/2009WO2009066500A1 Semiconductor device configuration method
05/28/2009WO2009066498A1 Active matrix substrate, liquid crystal panel, television receiver, and liquid crystal panel manufacturing method
05/28/2009WO2009066479A1 Thin-film transistor and process for producing the thin-film transistor
05/28/2009WO2009066466A1 Nitride semiconductor, nitride semiconductor crystal growth method, and nitride semiconductor light emitting element
05/28/2009WO2009066464A1 Nitride semiconductor and nitride semiconductor crystal growth method
05/28/2009WO2009066435A1 Resin laminate, pressure sensitive adhesive sheet, method for working adherend using the pressure sensitive adhesive sheet, and device for separating the pressure sensitive adhesive sheet
05/28/2009WO2009066434A1 Field effect transistor and method for manufacturing the same
05/28/2009WO2009066431A1 Fabrication system of semiconductor integrated circuit, fabrication device, fabrication method, integrated circuit and communication system
05/28/2009WO2009066409A1 Method for manufacturing semiconductor device
05/28/2009WO2009066355A1 Polishing head, polishing apparatus and work removing method
05/28/2009WO2009066351A1 Polishing head and polishing apparatus
05/28/2009WO2009066286A2 Amorphous group iii-v semiconductor material and preparation thereof
05/28/2009WO2009066135A1 Precise oxide dissolution
05/28/2009WO2009065757A1 Device and process for wet treating a peripheral area of a wafer-shaped article
05/28/2009WO2009065303A1 Plasma confinement device and semiconductor processing apparatus using the same
05/28/2009WO2009048255A3 Method for wafer test and probe card for the same
05/28/2009WO2009045844A3 Non contact substrate chuck
05/28/2009WO2009042976A3 Apparatus for testing devices
05/28/2009WO2009041774A3 Electrospray vaporizer
05/28/2009WO2009041304A8 Oscillation circuit
05/28/2009WO2009039342A3 X-ray inspection of solder reflow in high-density printed circuit board applications
05/28/2009WO2009039264A3 Wafer bonding activated by ion implantation
05/28/2009WO2009035989A3 Signal drop compensation at external terminal of integrated circuit package
05/28/2009WO2009031076A3 A transistor and a method of manufacturing the same
05/28/2009WO2009011975A3 Method for fabricating monolithic two-dimensional nanostructures
05/28/2009WO2009003552A3 Treatment system for flat substrates
05/28/2009WO2009000136A8 Polycrystalline silicon thin film transistors with bridged-grain structures
05/28/2009WO2008122889A3 Front-end processed wafer having through-chip connections
05/28/2009WO2008107194A3 Method for the precision processing of substrates and use of said method
05/28/2009WO2008099394A3 A method and device of diamond like carbon multi-layer doping growth
05/28/2009WO2008046304A8 A cleaning method for use in post etch and ashing a semiconductor wafer
05/28/2009WO2007059193A3 Low profile image sensor package
05/28/2009WO2004066367A3 Low-gidl mosfet structure and method for fabrication
05/28/2009US20090138118 Server and program
05/28/2009US20090137760 Adhesive composition and adhesive film
05/28/2009US20090137189 Polishing pad
05/28/2009US20090137188 Polishing pad
05/28/2009US20090137132 Decreasing the etch rate of silicon nitride by carbon addition
05/28/2009US20090137131 Thin film transistor, method of manufacturing same, display device, method of modifying an oxide film, method of forming an oxide film, semiconductor device, method of manufacturing semiconductor device, and apparatus for manufacturing semiconductor device
05/28/2009US20090137130 Method For Forming A Multiple Layer Passivation Film And A Device Incorporating The Same
05/28/2009US20090137129 Method for manufacturing semiconductor device
05/28/2009US20090137128 Substrate Processing Apparatus and Semiconductor Device Producing Method
05/28/2009US20090137127 Plasma etching method and storage medium
05/28/2009US20090137126 Method of forming a spacer
05/28/2009US20090137125 Etching method and etching apparatus
05/28/2009US20090137124 Polishing composition and method for high silicon nitride to silicon oxide removal rate ratios
05/28/2009US20090137123 Polishing Composition and Polishing Method
05/28/2009US20090137122 Method of passivating chemical mechanical polishing compositions for copper film planarization processes
05/28/2009US20090137121 Three-Dimensional Network in CMP Pad
05/28/2009US20090137120 Damping polyurethane cmp pads with microfillers