Patents for H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof (658,974) |
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08/12/2010 | WO2010089831A1 Semiconductor device and method for producing the same |
08/12/2010 | WO2010089818A1 Semiconductor device and method for manufacturing same |
08/12/2010 | WO2010089814A1 Semiconductor substrate structure and semiconductor device |
08/12/2010 | WO2010089675A1 Ic and ic manufacturing method |
08/12/2010 | WO2010089662A2 Modular pvd system for flex pv |
08/12/2010 | WO2010089647A1 Junction body, semiconductor module, and manufacturing method for junction body |
08/12/2010 | WO2010089632A1 Semiconductor structure, an integrated circuit including a semiconductor structure and a method for manufacturing a semiconductor structure |
08/12/2010 | WO2010089623A1 Epitaxial methods and structures for forming semiconductor materials |
08/12/2010 | WO2010068530A3 Graded high germanium compound films for strained semiconductor devices |
08/12/2010 | WO2010068460A3 Particle reflow etching |
08/12/2010 | WO2010065474A3 Modulation of rf returning straps for uniformity control |
08/12/2010 | WO2010065415A3 Rf device and method with trench under bond pad feature |
08/12/2010 | WO2010065301A3 Method of enabling selective area plating on a substrate |
08/12/2010 | WO2010065252A3 Methods of fabricating substrates |
08/12/2010 | WO2010065251A3 Methods of fabricating substrates |
08/12/2010 | WO2010062918A3 Confinement of foam delivered by a proximity head |
08/12/2010 | WO2010062910A3 Using optical metrology for feed back and feed forward process control |
08/12/2010 | WO2010062818A3 Two-line mixing of chemical and abrasive particles with endpoint control for chemical mechanical polishing |
08/12/2010 | WO2010062345A3 Lower electrode assembly of plasma processing chamber |
08/12/2010 | WO2010062100A3 Digital 3d lithography method |
08/12/2010 | WO2010059870A3 Interlocking valve chamber and lid |
08/12/2010 | WO2010059701A3 Temperature uniformity measurement during thermal processing |
08/12/2010 | WO2010059595A3 Laser-scribing tool architecture |
08/12/2010 | WO2010059361A3 Methods and apparatus for producing semiconductor on insulator structures using directed exfoliation |
08/12/2010 | WO2010057068A3 Method and apparatus for wafer bonding with enhanced wafer mating |
08/12/2010 | WO2010056212A3 Method for encapsulating semiconductor dies |
08/12/2010 | WO2010055730A9 Bonding apparatus and bonding method |
08/12/2010 | WO2010054173A3 Thin film semiconductor alloy material prepared by a vhf energized plasma deposition process |
08/12/2010 | WO2010053924A3 In-line wafer thickness sensing |
08/12/2010 | WO2010051351A3 Chalcogenide alloy sputter targets for photovoltaic applications and methods of manufacturing the same |
08/12/2010 | WO2010051269A3 Method to reduce surface damage and defects |
08/12/2010 | WO2010048165A3 Multiple gas feed apparatus and method |
08/12/2010 | WO2010048161A3 Techniques for atomic layer deposition |
08/12/2010 | WO2010036999A3 Substrate processing chamber with off-center gas delivery funnel |
08/12/2010 | WO2010036942A3 Power mosfet having a strained channel in a semiconductor heterostructure on metal substrate |
08/12/2010 | WO2010024932A3 Enhanced wire bond stability on reactive metal surfaces of a semiconductor device by encapsulation of the bond structure |
08/12/2010 | WO2009136873A3 Wafer level integration module with interconnects |
08/12/2010 | WO2009051663A3 Transistor device and method |
08/12/2010 | US20100204949 Semiconductor test system with self-inspection of electrical channel |
08/12/2010 | US20100204947 Bridge fault removal apparatus, bridge fault removal method, and computer readable medium comprising computer program code for removing bridge fault |
08/12/2010 | US20100204934 Semiconductor device, power supply current measuring device and method of measuring power supply |
08/12/2010 | US20100204826 Transfer apparatus |
08/12/2010 | US20100204821 Substrate treatment apparatus |
08/12/2010 | US20100204820 Apparatus and method for substrate handling |
08/12/2010 | US20100204422 Fluorine-Containing Cyclic Compound, Fluorine-Containing Polymer Compound, Resist Material Using Same and Method for Forming Pattern |
08/12/2010 | US20100203806 Semiconductor manufacturing apparatus |
08/12/2010 | US20100203742 Negatively Charged Passivation Layer in a Photovoltaic Cell |
08/12/2010 | US20100203741 Semiconductor manufacturing system |
08/12/2010 | US20100203740 Process for Increasing Feature Density During the Manufacture of a Semiconductor Device |
08/12/2010 | US20100203739 Method for etching a layer on a silicon semiconductor substrate |
08/12/2010 | US20100203738 Method of manufacturing a semiconductor device |
08/12/2010 | US20100203737 Etching method and system |
08/12/2010 | US20100203736 Plasma Processing Method |
08/12/2010 | US20100203735 Solution for removing residue after semiconductor dry process and method of removing the residue using the same |
08/12/2010 | US20100203734 Method of pitch halving |
08/12/2010 | US20100203733 Etching method, semiconductor and fabricating method for the same |
08/12/2010 | US20100203732 Fin and finfet formation by angled ion implantation |
08/12/2010 | US20100203731 Formation of a Zinc Passivation Layer on Titanium or Titanium Alloys Used in Semiconductor Processing |
08/12/2010 | US20100203730 Epitaxial Lift Off in Inverted Metamorphic Multijunction Solar Cells |
08/12/2010 | US20100203729 Composition for chemical mechanical polishing |
08/12/2010 | US20100203728 Semiconductor device and a manufacturing method thereof |
08/12/2010 | US20100203727 Method for integrated circuit fabrication using pitch multiplication |
08/12/2010 | US20100203726 Method of Forming a Through Substrate Via in a Compound Semiconductor |
08/12/2010 | US20100203725 Methods of fabricating semiconductor devices and semiconductor devices including a contact plug processed by rapid thermal annealing |
08/12/2010 | US20100203724 Method of manufacturing a semiconductor integrated circuit device |
08/12/2010 | US20100203723 Semiconductor device and method of manufacturing semiconductor device |
08/12/2010 | US20100203722 Semiconductor Device Having a Second Level of Metallization Formed over a First Level with Minimal Damage to the First Level and Method |
08/12/2010 | US20100203721 Multi-component integrated circuit contacts |
08/12/2010 | US20100203720 Semiconductor package and method for manufacturing the same for decreasing number of processes |
08/12/2010 | US20100203719 Method of Forming an Antifuse and a Conductive Interconnect, and Methods of Forming DRAM Circuitry |
08/12/2010 | US20100203718 Mitigation of high stress areas in vertically offset structures |
08/12/2010 | US20100203717 Cut first methodology for double exposure double etch integration |
08/12/2010 | US20100203716 Method of fabricating semiconductor device having dual gate |
08/12/2010 | US20100203715 Thin film transistor array panel and fabrication |
08/12/2010 | US20100203714 Semiconductor storage device |
08/12/2010 | US20100203713 Method of manufacturing electronic device |
08/12/2010 | US20100203712 Process for forming a wire portion in an integrated electronic circuit |
08/12/2010 | US20100203711 Trench Formation Method For Releasing A Thin-Film Substrate From A Reusable Semiconductor Template |
08/12/2010 | US20100203710 Method of manufacturing a semiconductor device |
08/12/2010 | US20100203709 Deposition of chalcogenide materials via vaporization process |
08/12/2010 | US20100203708 Amorphization/templated recrystallization method for hybrid orientation substrates |
08/12/2010 | US20100203707 Substrate dividing method |
08/12/2010 | US20100203706 Method of manufacturing an soi substrate and method of manufacutirng a semiconductor device |
08/12/2010 | US20100203705 Semiconductor device with improved overlay margin and method of manufacturing the same |
08/12/2010 | US20100203704 Semiconductor device manufacturing method |
08/12/2010 | US20100203703 Deep Trench Isolation Structures and Methods of Formation Thereof |
08/12/2010 | US20100203702 Method for forming isolation layer and method for fabricating nonvolatile memory device using the same |
08/12/2010 | US20100203701 Crack Stop and Moisture Barrier |
08/12/2010 | US20100203700 Method of forming semiconductor device |
08/12/2010 | US20100203699 Method of forming semiconductor device |
08/12/2010 | US20100203698 Method of forming a semiconductor structure |
08/12/2010 | US20100203697 Integrated semiconductor nonvolatile storage device |
08/12/2010 | US20100203696 Semiconductor device and method for manufacturing the same |
08/12/2010 | US20100203695 Method of manufacturing semiconductor devices |
08/12/2010 | US20100203694 Methods for fabricating dual bit flash memory devices |
08/12/2010 | US20100203693 Manufacturing method of dynamic random access memory |
08/12/2010 | US20100203692 Methods of fabricating integrated circuit devices including strained channel regions and related devices |
08/12/2010 | US20100203691 High Voltage CMOS Devices |
08/12/2010 | US20100203690 Mosfet having a channel region with enhanced stress and method of forming same |
08/12/2010 | US20100203689 finFET TRANSISTOR AND CIRCUIT |