Patents
Patents for H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof (658,974)
09/2010
09/02/2010WO2010098186A1 Semiconductor element manufacturing method
09/02/2010WO2010098179A1 Surface inspecting apparatus and method for correcting same
09/02/2010WO2010098163A1 Light emitting element producing method and light emitting element
09/02/2010WO2010098153A1 Method for generating ion implantation distribution, and simulator
09/02/2010WO2010098151A1 Semiconductor device and method for manufacturing same
09/02/2010WO2010098121A1 Method for manufacturing dielectric body, method for manufacturing semiconductor device, program, and recording medium
09/02/2010WO2010098102A1 Transfer body and method for producing the same
09/02/2010WO2010098101A1 Transistor, transistor manufacturing method, and manufacturing device thereof
09/02/2010WO2010098100A1 Transistor, method for manufacturing transistor, and apparatus for manufacturing transistor
09/02/2010WO2010098076A1 Storage-, insulation gate-, and field effect-type transistor
09/02/2010WO2010098026A1 Capacitor fabrication method, capacitor fabricating device, capacitor fabricating program, and recording medium
09/02/2010WO2010098017A1 Pattern measurement apparatus
09/02/2010WO2010098012A1 Silicon epitaxial wafer and method for manufacturing silicon epitaxial wafer
09/02/2010WO2010098007A1 Method for manufacturing soi wafer
09/02/2010WO2010098004A1 Defect observation method and defect observation device
09/02/2010WO2010097997A1 Magnetic oscillation element
09/02/2010WO2010097972A1 Apparatus and method for inspecting thin film
09/02/2010WO2010097908A1 Junction-glass cutting method, package manufacturing method, package, piezoelectric vibrator, oscillator, electronic device, and radio-controlled watch
09/02/2010WO2010097896A1 Cleaning nozzle and cleaning method
09/02/2010WO2010097878A1 Defect inspecting method and defect inspecting apparatus
09/02/2010WO2010097862A1 Semiconductor memory cells and manufacturing method therefor as well as semiconductor memory devices
09/02/2010WO2010097859A1 Mounted transistor and method of producing same
09/02/2010WO2010097858A1 Electron microscope, and specimen holding method
09/02/2010WO2010097857A1 Resist material and pattern-forming method using same
09/02/2010WO2010097851A1 Semiconductor device, method and device for designing semiconductor device, and fault detection method
09/02/2010WO2010097841A1 Testing apparatus and testing method
09/02/2010WO2010097294A1 Method for manufacturing components
09/02/2010WO2010097191A1 A metallization system of a semiconductor device including metal pillars having a reduced diameter at the bottom
09/02/2010WO2010097190A1 Providing superior electromigration performance and reducing deterioration of sensitive low-k dielectrics in metallization systems of semiconductor devices
09/02/2010WO2010097064A2 Laser crystallisation by irradiation
09/02/2010WO2010097040A1 Method for preparing cds film
09/02/2010WO2010080423A3 Combined wafer area pressure control and plasma confinement assembly
09/02/2010WO2010078051A3 Embedded memory cell and method of manufacturing same
09/02/2010WO2010065427A3 Power device structures and methods
09/02/2010WO2010065412A3 A junction field effect transistor having a double gate structure and method of making same
09/02/2010WO2010065352A3 Thermocentric alignment of elements on parts of an apparatus
09/02/2010WO2010064185A3 Electronic devices having plastic substrates
09/02/2010WO2010059441A3 Methods of forming a masking pattern for integrated circuits
09/02/2010WO2010058379A3 Bicmos integration of multiple-times-programmable non-volatile memories
09/02/2010WO2010056823A3 Mass analysis magnet for a ribbon beam
09/02/2010WO2010054193A3 Conductive contamination resistant insulator
09/02/2010WO2006124387A3 Gallium nitride high electron mobility transistor structure
09/02/2010WO2006104529A3 Cmos transistor junction regions formed by a cvd etching and deposition sequence
09/02/2010US20100223277 Substrate Processing System and Operation Inspecting Method
09/02/2010US20100222919 Substrate supporting apparatus, substrate processing apparatus, substrate supporting method, control program of substrate supporting apparatus, and recording medium
09/02/2010US20100222918 Transfer device and transfer method
09/02/2010US20100222913 Methods for non lot-based integrated circuit manufacturing
09/02/2010US20100222506 Member arranged in wafer storing container and method for manufacturing the member
09/02/2010US20100221984 Polishing pad manufacturing method
09/02/2010US20100221927 Methods and apparatus for producing semiconductor on insulator structures using directed exfoliation
09/02/2010US20100221926 Laser annealing
09/02/2010US20100221925 METHOD OF FORMING CONFORMAL DIELECTRIC FILM HAVING Si-N BONDS BY PECVD
09/02/2010US20100221924 Methods of forming sic mosfets with high inversion layer mobility
09/02/2010US20100221923 Semiconductor device and method for fabricating the same
09/02/2010US20100221922 Electron beam processing device and method using carbon nanotube emitter
09/02/2010US20100221921 Methods of Forming Patterns in Semiconductor Devices
09/02/2010US20100221920 Spacer process for on pitch contacts and related structures
09/02/2010US20100221919 Method of forming patterns for semiconductor device
09/02/2010US20100221918 Aqueous dispersion for chemical mechanical polishing and method for preparing the same, kit for preparing aqueous dispersion for chemical mechanical polishing, and chemical mechanical polishing method for semiconductor device
09/02/2010US20100221917 Method of manufacturing silicon carbide semiconductor device
09/02/2010US20100221916 Methods of Etching Oxide, Reducing Roughness, and Forming Capacitor Constructions
09/02/2010US20100221915 Method and apparatus for semiconductor processing
09/02/2010US20100221914 Composition and method for low temperature deposition of silicon-containing films
09/02/2010US20100221913 Semiconductor manufacturing method for inter-layer insulating film
09/02/2010US20100221912 Method of Manufacturing a semiconductor device
09/02/2010US20100221911 Providing superior electromigration performance and reducing deterioration of sensitive low-k dielectrics in metallization systems of semiconductor devices
09/02/2010US20100221910 Method of producing semiconductor device
09/02/2010US20100221909 Method for making an electric interconnection between two conducting layers
09/02/2010US20100221908 Manufacturing method of semiconductor device
09/02/2010US20100221907 Method of Fabricating a Fuse for Use in a Semiconductor Device
09/02/2010US20100221906 Enhancing integrity of a high-k gate stack by confining a metal cap layer after deposition
09/02/2010US20100221905 Material infusion in a trap layer structure using gas cluster ion beam processing
09/02/2010US20100221904 Process for Manufacturing a Non-Volatile Memory Electronic Device Integrated on a Semiconductor Substrate and Corresponding Device
09/02/2010US20100221903 Methods of forming a low resistance silicon-metal contact
09/02/2010US20100221902 Use of cl2 and/or hcl during silicon epitaxial film formation
09/02/2010US20100221901 Method for preparing cadmium sulfide film
09/02/2010US20100221900 Mask for sequential lateral solidification (sls) process and a method for crystallizing amorphous silicon by using the same
09/02/2010US20100221899 Method of manufacturing a polycrystalline semiconductor thin film
09/02/2010US20100221898 Laser annealing method and laser annealing device
09/02/2010US20100221897 Semiconductor device and method of fabricating the same
09/02/2010US20100221896 Electrical Device with Improved Electrode Surface
09/02/2010US20100221895 Surface treatment apparatus and surface treatment method
09/02/2010US20100221894 Method for manufacturing nanowires by using a stress-induced growth
09/02/2010US20100221893 Method for separating a semiconductor wafer into individual semiconductor dies using an implanted impurity
09/02/2010US20100221892 Semiconductor device and manufacturing method thereof
09/02/2010US20100221891 Method of producing a hybrid substrate by partial recrystallization of a mixed layer
09/02/2010US20100221890 Method of manufacturing semiconductor device
09/02/2010US20100221889 Method of manufacturing semiconductor device having capacitor under bit line structure
09/02/2010US20100221888 Programmable Resistive RAM and Manufacturing Method
09/02/2010US20100221887 Oxygen-Rich Layers Underlying BPSG
09/02/2010US20100221886 Methods of Forming Charge-Trap Type Non-Volatile Memory Devices
09/02/2010US20100221885 Method of manufacturing dielectric film
09/02/2010US20100221884 Semiconductor device and manufacturing method thereof
09/02/2010US20100221883 Adjusting of a non-silicon fraction in a semiconductor alloy during transistor fabrication by an intermediate oxidation process
09/02/2010US20100221882 Nanoelectronic structure and method of producing such
09/02/2010US20100221881 Semiconductor device and method of manufacturing the same
09/02/2010US20100221880 Non-volatile semiconductor memory device and method of manufacturing the same
09/02/2010US20100221879 Methods of Manufacturing Phase-Changeable Memory Devices
09/02/2010US20100221878 Hybrid Metal Fully Silicided (FUSI) Gate
09/02/2010US20100221877 Method of manufacturing a soi structure having a sige layer interposed between the silicon and the insulator