| Patents for H01J 3 - Details of electron-optical or ion-optical arrangements or of ion traps common to two or more basic types of discharge tubes or lamps (4,773) |
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| 05/17/2011 | US7943896 Mechanical galvanometer tilt correction control |
| 05/17/2011 | US7943894 Optical element for free-space propagation between an optical waveguide and another optical waveguide, component, or device |
| 05/17/2011 | US7943889 Apparatus for improving detection efficiency of multiphoton microscopy systems by focus compensation, pupil image division, and parallel pupil rearrangement |
| 05/12/2011 | US20110108736 SACP Method and Particle Optical System for Performing the Method |
| 05/11/2011 | EP2320446A1 Electron emitter and field emission device provided with electron emitter |
| 05/05/2011 | WO2011053556A1 Covering wide areas with ionized gas streams |
| 05/05/2011 | US20110101235 Particle beam irradiation apparatus and particle beam therapy system |
| 05/05/2011 | US20110100428 Photoelectric conversion unit |
| 05/03/2011 | US7935920 Illumination optical system including luminous flux conversion system |
| 04/28/2011 | US20110095198 System and method for fabricating macroscopic objects, and nano-assembled objects obtained therewith |
| 04/27/2011 | EP1751783B1 Charged particle gun |
| 04/27/2011 | CN201813579U Electronic gun for electron beam melting furnace |
| 04/27/2011 | CN102037536A Method and apparatus for single-axis cross-sectional scanning of parts |
| 04/21/2011 | US20110089334 Ion implanter with variable aperture and ion implant method thereof |
| 04/21/2011 | US20110089333 Assemblies for ion and electron sources and methods of use |
| 04/20/2011 | EP1831760B1 Optoelectronic position determination system |
| 04/19/2011 | US7928357 High speed scanning platform for microarray scanner |
| 04/14/2011 | US20110084216 Method for treating non-planar structures using gas cluster ion beam processing |
| 04/14/2011 | US20110084215 Method and system for tilting a substrate during gas cluster ion beam processing |
| 04/14/2011 | US20110084214 Gas cluster ion beam processing method for preparing an isolation layer in non-planar gate structures |
| 04/13/2011 | EP2308273A1 Neutral particle generator |
| 04/12/2011 | US7923699 Tracking control method and electron beam writing system |
| 04/12/2011 | US7923677 Coded aperture imager comprising a coded diffractive mask |
| 04/12/2011 | US7923676 Optical unit, solid-state image sensing device with position adjusting section and electronic apparatus comprising same |
| 04/07/2011 | US20110079731 Multipole lens for electron column |
| 04/07/2011 | US20110079730 Imaging system |
| 03/31/2011 | US20110073759 Electromagentic field application system |
| 03/30/2011 | CN101625946B Electronic emission device |
| 03/29/2011 | US7915597 Extraction electrode system for high current ion implanter |
| 03/29/2011 | US7915572 Imaging optical system and endoscope provided with imaging optical system |
| 03/23/2011 | EP2297763A2 Charged particle detection system and method |
| 03/22/2011 | US7911120 Source for providing an electron beam of settable power |
| 03/17/2011 | US20110062335 Detecting electromagnetic radiation |
| 03/10/2011 | US20110057566 Pulsed electron source, power supply method for pulsed electron source and method for controlling a pulsed electron source |
| 03/10/2011 | US20110057565 Device and method of supplying power to an electron source, and ion-bombardment-induced secondary-emission electron source |
| 03/10/2011 | US20110057114 Electron beam lithography apparatus and electron beam lithography method |
| 03/08/2011 | US7902504 Charged particle beam reflector device and electron microscope |
| 03/08/2011 | US7902492 Measuring unit for air flow |
| 03/03/2011 | US20110049382 Pattern modification schemes for improved fib patterning |
| 03/03/2011 | US20110049337 Photodetection device and photodetection method, and microscope and endoscope |
| 03/02/2011 | EP2289087A1 Method and apparatus for single-axis cross-sectional scanning of parts |
| 03/01/2011 | US7897903 Image detection system of optical channels arranged next to one another |
| 03/01/2011 | US7895885 Method and system for nanoknife and MEMS platform |
| 02/24/2011 | US20110042578 Ion beam monitoring arrangement |
| 02/24/2011 | DE102009028182B3 High frequency-photoelectron source has semiconducting cavity resonator system that has cathode, choke cell and gun cell |
| 02/22/2011 | US7893605 Back-gated field emission electron source |
| 02/15/2011 | US7888653 Techniques for independently controlling deflection, deceleration and focus of an ion beam |
| 02/15/2011 | US7888628 Optical zoom system for a light scanning microscope |
| 02/10/2011 | US20110031408 Mask health monitor using a faraday probe |
| 02/10/2011 | US20110031384 Speckle reduction method and apparatus |
| 02/10/2011 | US20110031380 Optical pointing device |
| 02/10/2011 | DE102008057342B4 Gasentladungskammer mit Glühkathode und Polschuhlinse Gas discharge chamber with hot cathode and Polschuhlinse |
| 02/08/2011 | USRE42111 Multideflector |
| 02/08/2011 | US7884372 Diamond UV-Ray sensor |
| 02/08/2011 | US7884334 Charged particle beam imaging method and system thereof |
| 02/08/2011 | US7884333 Particle beam and crabbing and deflecting structure |
| 02/03/2011 | US20110025811 Light scanning unit and electrophotographic image forming apparatus using the same |
| 02/03/2011 | US20110025184 Illuminating device |
| 02/01/2011 | US7880375 Triode cathode apparatus and method of making a triode cathode apparatus |
| 02/01/2011 | US7880147 Components for reducing background noise in a mass spectrometer |
| 02/01/2011 | US7880146 Tune-stabilized, non-scaling, fixed-field, alternating gradient accelerator |
| 02/01/2011 | US7880130 Optical device and mobile apparatus |
| 01/27/2011 | US20110017920 Method and system for electron beam applications |
| 01/20/2011 | WO2011008288A1 Adjustable louvered plasma electron flood enclosure |
| 01/20/2011 | US20110013167 Apparatus with plasma radiation source and method of forming a beam of radiation and lithographic apparatus |
| 01/19/2011 | EP2276056A2 Ion trap |
| 01/19/2011 | EP1194944B1 Electron beam accelerator |
| 01/19/2011 | CN101952927A Device and method of supplying power to an electron source, and ion-bombardment-induced secondary-emission electron source |
| 01/19/2011 | CN101952926A Pumped electron source, power supply method for pumped electron source and method for controlling an electron pumped source |
| 01/18/2011 | USRE42033 Single step multi-section exposure scanning method |
| 01/18/2011 | US7872798 Microscopic apparatus and observing method |
| 01/18/2011 | US7872241 Method and apparatus for production and maintenance of electron beam space-charge neutralization |
| 01/18/2011 | US7872240 Corrector for charged-particle beam aberration and charged-particle beam apparatus |
| 01/13/2011 | WO2011003186A1 Methods and systems for providing a substantially quadrupole field with a higher order component |
| 01/13/2011 | US20110006271 Dielectric composition with reduced resistance |
| 01/13/2011 | CA2767444A1 Methods and systems for providing a substantially quadrupole field with a higher order component |
| 01/12/2011 | CN1652283B Field emitting electronic source device and its preparing process |
| 01/11/2011 | US7868301 Deflecting a beam of electrically charged particles onto a curved particle path |
| 01/11/2011 | US7868300 Lithography system, sensor and measuring method |
| 01/11/2011 | US7868284 Optical semiconductor package having an optical module with a progressively varying refractive index |
| 01/06/2011 | WO2009085081A3 Method and apparatus for reducing space charge in an ion trap |
| 01/06/2011 | US20110001058 Gas field ion source with coated tip |
| 01/06/2011 | US20110001057 Component for manipulating a stream of charged particles |
| 01/06/2011 | US20110001056 Component for manipulating a stream of charged particles |
| 01/05/2011 | EP2270832A1 Spin polarized electron source |
| 01/04/2011 | US7863587 Symmetrical shaper for an ion beam deposition and etching apparatus |
| 01/04/2011 | US7863580 Electron beam apparatus and an aberration correction optical apparatus |
| 01/04/2011 | US7863555 Illumination apparatus and projection display apparatus |
| 01/04/2011 | US7863552 Digital images and related methodologies |
| 12/30/2010 | US20100327180 Beam quality in fib systems |
| 12/30/2010 | US20100327179 Charged particle beam column and method of operating same |
| 12/30/2010 | US20100327160 Method for examining a sample by using a charged particle beam |
| 12/28/2010 | US7860352 Light-collecting apparatus and contact-type solid-state imaging apparatus using the same |
| 12/28/2010 | US7858951 Skew chicane based betatron eigenmode exchange module |
| 12/28/2010 | US7858923 Light beam scanning apparatus and image forming apparatus provided with the same |
| 12/23/2010 | US20100320393 Off-axis ion milling device for manufacture of magnetic recording media and method for using the same |
| 12/23/2010 | US20100320366 Beam power with beam redirection |
| 12/22/2010 | CN101019201B Charged particle gun |
| 12/21/2010 | US7855373 Charged particle gun |
| 12/14/2010 | US7851756 Charged particle beam irradiation system |