| Patents for H01J 3 - Details of electron-optical or ion-optical arrangements or of ion traps common to two or more basic types of discharge tubes or lamps (4,773) |
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| 10/08/2009 | US20090252023 Integrated optical system and method of manufacturing the same and information recording and/or reproducing apparatus using the integrated optical system |
| 10/06/2009 | US7598499 Charged-particle exposure apparatus |
| 10/06/2009 | US7598498 Electric field lens and ion implanter having the same |
| 10/06/2009 | US7598495 Methods and systems for trapping ion beam particles and focusing an ion beam |
| 10/06/2009 | US7598483 Optical element and optical measurement device using the optical element |
| 10/01/2009 | US20090244654 Image reading device and image forming device |
| 10/01/2009 | US20090242792 Electron microscopy |
| 10/01/2009 | US20090242789 Charged particle beam irradiating apparatus |
| 10/01/2009 | US20090242788 Electron beam writing method, fine pattern writing system, method for manufacturing uneven pattern carrying substrate, and method for manufacturing magnetic disk medium |
| 10/01/2009 | US20090242787 Charged-particle beam writing method and charged-particle beam writing apparatus |
| 10/01/2009 | US20090242786 Aberration corrector for transmission electron microscope |
| 10/01/2009 | US20090242761 Method and apparatus for charged particle beam inspection |
| 10/01/2009 | US20090242757 Charged particle beam apparatus and method adjusting axis of aperture |
| 09/30/2009 | EP2104944A1 Cathode structure for a flat screen with refocusing grid |
| 09/29/2009 | US7595488 Method and apparatus for specifying working position on a sample and method of working the sample |
| 09/29/2009 | US7595481 Scanning optical system measuring device and scanning optical system measuring method |
| 09/29/2009 | US7595477 Anti- reflective device having an anti-reflection surface formed of silicon spikes with nano-tips |
| 09/24/2009 | US20090237376 Optical Position Sensing System and Optical Position Sensor Assembly with Convex Imaging Window |
| 09/24/2009 | US20090236522 Optical zoom system for a light scanning electron microscope |
| 09/24/2009 | US20090236495 Autofocus for high power laser diode based annealing system |
| 09/22/2009 | US7592604 Charged particle beam apparatus |
| 09/22/2009 | US7592582 Confocal scanner having beam spread angle adjustment device |
| 09/17/2009 | WO2009112668A1 Device and method of supplying power to an electron source, and ion-bombardment-induced secondary-emission electron source |
| 09/17/2009 | US20090230317 Aberration correction apparatus that corrects spherical aberration of charged particle apparatus |
| 09/17/2009 | US20090230316 Method of Suppressing Beam Position Drift, Method of Suppressing Beam Dimension Drift, and Charged-Particle Beam Lithography System |
| 09/10/2009 | US20090224170 Scanning electron microscope |
| 09/10/2009 | US20090224169 Scanning Transmission Electron Microscope and Method of Aberration Correction Therefor |
| 09/10/2009 | US20090224137 Light barrier |
| 09/09/2009 | EP2099058A2 Ion trap |
| 09/08/2009 | US7586086 Scanning imaging device for image-substraction confocal microscopy |
| 09/08/2009 | US7586085 Photo-detection device and method |
| 09/08/2009 | US7586082 Optical element for a document illuminator |
| 09/03/2009 | WO2009106759A1 Pumped electron source, power supply method for pumped electron source and method for controlling an electron pumped source |
| 09/03/2009 | US20090218508 Cold cathode field emission electron gun and its application to electron beam instruments |
| 09/03/2009 | US20090218507 Charged particle beam device |
| 09/03/2009 | US20090218506 Electron beam apparatus |
| 08/27/2009 | US20090216450 Apparatus and method for inspecting overlapping figure, and charged particle beam writing apparatus |
| 08/27/2009 | US20090213094 Optical Position Sensing System and Optical Position Sensor Assembly |
| 08/27/2009 | US20090212231 Heavy ion radiation therapy system with stair-step modulation |
| 08/27/2009 | US20090212230 Electron beam writing method, fine pattern writing system, method for manufacturing uneven pattern carrying substrate, and method for manufacturing magnetic disk medium |
| 08/27/2009 | US20090212229 Projection lens arrangement |
| 08/27/2009 | US20090212228 Charged particle beam apparatus including aberration corrector |
| 08/27/2009 | US20090212214 Sample inspection apparatus |
| 08/27/2009 | US20090212203 System for Determining An Operational State of a MEMS Based Display |
| 08/20/2009 | WO2009100753A1 Low-voltage field emission scanning electron microscope |
| 08/20/2009 | US20090206280 Charged-beam exposure apparatus having an improved alignment precision and exposure method |
| 08/20/2009 | US20090206271 Focussing mask |
| 08/20/2009 | US20090206238 Optical substrate for reduced background fluorescence |
| 08/19/2009 | EP1735806A4 Ion source with controlled superposition of electrostatic and gas flow fields |
| 08/19/2009 | CN101512763A Apparatus for obtaining radiant energy |
| 08/18/2009 | US7576315 Scanning type image display apparatus having a synchronization control circuit and a light transmitting area on the last surface of a scanning optical system |
| 08/18/2009 | US7576311 Optical detector having a sensing element, a lens and a frustum coupled to the lens |
| 08/18/2009 | US7576310 Imaging optical system and endoscope provided with imaging optical system |
| 08/13/2009 | US20090200497 Beam current calibration system |
| 08/13/2009 | US20090200484 Dual mode gas field ion source |
| 08/13/2009 | US20090200483 Inner Gantry |
| 08/13/2009 | US20090200482 Method for Focusing Electron Beam in Electron Column |
| 08/12/2009 | EP1077463B1 Electron beam emitting device and image forming device |
| 08/12/2009 | CN101506927A Electron beam control method, electron beam generating apparatus, apparatus using the same, and emitter |
| 08/11/2009 | US7573045 Plasmon wave propagation devices and methods |
| 08/11/2009 | US7573031 Methods for SEM inspection of fluid containing samples |
| 08/11/2009 | US7573022 Method for fabricating vertically-offset interdigitated comb actuator device |
| 08/06/2009 | US20090194711 Electron beam writing method, fine pattern writing system, method for manufacturing uneven pattern carrying substrate, and method for manufacturing magnetic disk medium |
| 08/06/2009 | US20090194692 Charged particle radiation apparatus |
| 08/05/2009 | CN100524581C Field emission device |
| 08/04/2009 | US7569833 Apparatus for generating a plurality of beamlets |
| 08/04/2009 | US7569805 Apparatus and method for calibrating a reflecting mirror |
| 07/30/2009 | US20090189094 Electron beam writing method, fine pattern writing system, and manufacturing method of uneven pattern carrying substrate |
| 07/29/2009 | EP2082411A2 X-ray tube with ion deflecting and collecting device made from a getter material |
| 07/29/2009 | CN100521061C Field emitting display with carbon nano tube emitting polar and its making method |
| 07/28/2009 | US7567027 Negative hole structure having a protruded portion and electron emission device including the same |
| 07/28/2009 | US7566882 Reflection lithography using rotating platter |
| 07/28/2009 | US7566864 Apparatus and methods for an area scanner having an adjustable mirror and a scan mirror with scan operable to 360 degrees |
| 07/23/2009 | US20090184256 Charged particle beam apparatus |
| 07/23/2009 | US20090184255 Inspection method and inspection system using charged particle beam |
| 07/23/2009 | US20090184243 Charged particle beam apparatus |
| 07/21/2009 | US7564042 Ion beam apparatus having plasma sheath controller |
| 07/16/2009 | US20090180192 Method and Apparatus for Imaging |
| 07/15/2009 | EP2079092A1 Device and method for supplying power to an electron source and electron source with secondary emission under ion bombardment |
| 07/14/2009 | US7560715 System for the delivery of proton therapy |
| 07/09/2009 | WO2009085081A2 Method and apparatus for reducing space charge in an ion trap |
| 07/09/2009 | US20090173888 Gas field ion source, charged particle microscope, and apparatus |
| 07/09/2009 | US20090173887 Charged particle beam trajectory corrector and charged particle beam apparatus |
| 07/09/2009 | US20090173875 Image pickup unit and endoscope using the same |
| 07/09/2009 | CA2710991A1 Method and apparatus for reducing space charge in an ion trap |
| 07/08/2009 | EP2077574A1 Method of controlling electron beam focusing of pierce type electron gun and control device therefor |
| 07/08/2009 | EP1550144A4 System for and method of gas cluster ion beam processing |
| 07/07/2009 | US7558161 Integrated optical system and method of manufacturing the same and information recording and/or reproducing apparatus using the integrated optical system |
| 07/07/2009 | US7557337 Micro-lens configuration for small lens focusing in digital imaging devices |
| 07/02/2009 | WO2009080411A1 Linear electron source, evaporator using linear electron source, and applications of electron sources |
| 07/02/2009 | US20090166553 Electron beam drawing method |
| 07/02/2009 | US20090166552 E-Beam Exposure Apparatus |
| 07/01/2009 | EP1805779A4 Remapping methods to reduce distortions in images |
| 06/30/2009 | US7554095 Static electricity deflecting device, electron beam irradiating apparatus, substrate processing apparatus, substrate processing method, and method of manufacturing substrate |
| 06/30/2009 | US7554083 Integration of electromagnetic detector on integrated chip |
| 06/25/2009 | US20090159811 Linear electron source, evaporator using linear electron source, and applications of electron sources |
| 06/25/2009 | DE102007058339A1 Herstellungsverfahren für einen Aluminat-UV-Leuchtstoff Manufacturing method for a UV-aluminate phosphor |
| 06/24/2009 | EP2073243A1 Linear electron source, evaporator using linear electron source, and applications of electron sources |
| 06/23/2009 | US7550713 System for determining an operational state of a MEMS based laser scanner |
| 06/23/2009 | US7550712 Optical scanning system with reduced spherical aberration and image forming apparatus using the same |