Patents
Patents for H01J 3 - Details of electron-optical or ion-optical arrangements or of ion traps common to two or more basic types of discharge tubes or lamps (4,773)
02/2010
02/18/2010US20100038555 Optical coupling apparatus for a dual column charged particle beam tool for imaging and forming silicide in a localized manner
02/18/2010US20100038554 Compensation of dose inhomogeneity and image distortion
02/18/2010US20100038538 Objective lens
02/17/2010CN100590767C Corona discharge electrode and method of operating the same
02/16/2010US7663094 Probe for data storage apparatus
02/11/2010US20100032580 Compact Accelerator For Medical Therapy
02/11/2010US20100032562 Slit Disk for Modified Faraday Cup Diagnostic for Determing Power Density of Electron and Ion Beams
02/09/2010US7659509 System for scanning probe microscope input device
02/09/2010US7659501 Image-sensing module of image capture apparatus and manufacturing method thereof
02/04/2010WO2010012021A1 Neutral particle generator
02/04/2010US20100025578 Dual Beam System
02/04/2010CA2732372A1 Neutral particle generator
02/02/2010US7655923 Spherical aberration corrected electrostatic lens, input lens, electron spectrometer, photoemission electron microscope and measuring system
01/2010
01/28/2010US20100019167 Fan beam modulator for ion beams providing continuous intensity modulation
01/28/2010US20100019166 Method for Controlling Electron Beam in Multi-Microcolumn and Multi-Microcolumn Using The Same
01/28/2010US20100018839 Baggage deposit system
01/27/2010CN100585780C Electron emission device and electron emission display using the same
01/21/2010US20100015537 Beam dose computing method and writing method and record carrier body and writing apparatus
01/21/2010US20100012825 Confocal imaging methods and apparatus
01/14/2010US20100006770 Charged particle beam acceleration and extraction method and apparatus used in conjunction with a charged particle cancer therapy system
01/14/2010US20100006747 Optical head that can be easily assembled
01/12/2010US7646149 Electronic switching device
01/07/2010US20100001204 Open-ended electromagnetic corrector assembly and method for deflecting, focusing, and controlling the uniformity of a traveling ion beam
01/07/2010US20100001203 Method of acquiring offset deflection amount for shaped beam and lithography apparatus
01/07/2010US20100001202 Spherical aberration correction decelerating lens, spherical aberration correction lens system, electron spectrometer, and photoelectron microscope
01/07/2010US20100001174 Semiconductor device, its manufacturing method and optical pickup module
01/06/2010EP2141725A1 Surface emission type electron source and drawing device
01/06/2010EP1386324B1 Actuating and sensing device for scanning probe microscopes
12/2009
12/31/2009US20090325452 Cathode substrate having cathode electrode layer, insulator layer, and gate electrode layer formed thereon
12/31/2009US20090321655 Ion Transfer Tube with Spatially Alternating DC Fields
12/29/2009US7638784 Radiation protection system
12/29/2009US7638782 Semiconductor device manufacturing method and ion implanter used therein
12/24/2009US20090314950 Lithography apparatus and focusing method for charged particle beam
12/24/2009US20090314949 Laser-driven deflection arrangements and methods involving charged particle beams
12/23/2009CN100573777C Field emission electronic source and its manufacturing method
12/22/2009US7635850 Ion implanter
12/17/2009US20090310738 Imaging apparatus and imaging method
12/17/2009US20090309040 Charged particle beam acceleration and extraction method and apparatus used in conjunction with a charged particle cancer therapy system
12/17/2009US20090309039 Application specific implant system and method for use in solar cell fabrications
12/17/2009US20090309038 Charged particle beam extraction method and apparatus used in conjunction with a charged particle cancer therapy system
12/17/2009US20090309022 Apparatus for inspecting a substrate, a method of inspecting a substrate, a scanning electron microscope, and a method of producing an image using a scanning electron microscope
12/17/2009US20090309018 Multi-source plasma focused ion beam system
12/17/2009US20090309014 Method and apparatus to sharply focus aerosol particles at high flow rate and over a wide range of sizes
12/17/2009US20090309010 Image sensor with decreased optical interference between adjacent pixels
12/15/2009US7633053 Microscope, particularly a laser scanning microscope with adaptive optical arrangement
12/10/2009US20090302233 Charged particle beam apparatus
12/10/2009US20090302217 Hybrid Phase Plate
12/09/2009CN101599401A Method for inhibiting oscillation of binode magnetic injection gun region of gyrotron amplifier
12/09/2009CN100568645C Ionizer and discharge electrode assembly to be assembled therein
12/08/2009US7629736 Method and device for preventing junction leakage in field emission devices
12/03/2009WO2009144727A2 Charged particle detection system and method
12/03/2009US20090294687 Three modes particle detector
12/03/2009US20090294638 Nanomechanical Oscillator
12/02/2009EP2126953A1 High frequency, cold cathode, triode-type, field-emitter vacuum tube and process for manufacturing the same
12/02/2009CN100565774C Electronic optical focusing, deflexion and signals collection method for the turning gear immerged object lens
12/02/2009CN100565751C Medium layer, method for forming negative holes structure, and electron emission device
12/01/2009US7626166 Electron microscope
12/01/2009US7626157 Image sensor including microlens having sizes differing according to deposition of color filter array
11/2009
11/26/2009WO2009143005A1 Method and apparatus for single-axis cross-sectional scanning of parts
11/26/2009US20090289196 Deflection Signal Compensation for Charged Particle Beam
11/26/2009US20090289195 Charged Particle Source with Integrated Energy Filter
11/26/2009US20090289194 Particle beam therapy system
11/26/2009US20090289193 Ion implanting apparatus and ion beam deflection angle correcting method
11/26/2009US20090289192 Scanning aperture ion beam modulator
11/26/2009US20090289191 Ultra high precision measurement tool with control loop
11/26/2009CA2725058A1 Method and apparatus for single-axis cross-sectional scanning of parts
11/24/2009US7622705 Dielectric microcavity fluorosensors excited with a broadband light source
11/19/2009US20090283665 Image sensor with an aligned optical assembly
11/18/2009CN100561634C Ion gun
11/17/2009US7619235 Optical sampling arrangements
11/17/2009US7619203 High throughput multi beam detection system and method
11/11/2009CN100559170C Tomography imaging apparatus
11/10/2009US7615739 Spin microscope based on optically detected magnetic resonance
11/10/2009US7615738 Scanning probe microscope assembly and method for making spectrophotometric, near-field, and scanning probe measurements
11/05/2009US20090273789 Interferometer
11/05/2009US20090272911 Method for inspecting settling time of deflection amplifier, and method for judging failure of deflection amplifier
11/05/2009US20090272891 Mass Spectrometer
11/03/2009US7612346 Non-axisymmetric charged-particle beam system
11/03/2009US7612330 Optical scanning probe, optical scanning probe device and method for controlling the optical scanning probe
11/03/2009US7612329 Apparatus and method for free space optical communications beam steering without gimbals
11/03/2009US7612323 Optical element for condensing incident light
11/03/2009US7612318 Complementary metal oxide semiconductor image sensor having cross talk prevention and method for fabricating the same
11/03/2009US7612317 Beam steering for optical target identification and tracking without gimbals or scanning mirrors
10/2009
10/29/2009US20090266997 Ion source with adjustable aperture
10/29/2009US20090266984 Plasma Ion Source Mass Spectrometer
10/28/2009CN101568985A Method and apparatus for communicating radiation pressure provided by a light wave
10/28/2009CN100555551C Beam uniformity and angular distribution measurement system
10/28/2009CN100555532C Electron emission device
10/27/2009US7608845 Charged particle beam writing apparatus and method thereof, and method for resizing dimension variation due to loading effect
10/22/2009US20090261267 Projection lens arrangement
10/22/2009US20090261251 Inspection apparatus and inspection method
10/20/2009US7605377 On-chip reflectron and ion optics
10/20/2009US7604922 Reciprocating device; mercury lamps
10/15/2009US20090256082 Ion implanting apparatus
10/15/2009US20090256081 Focused ion beam apparatus
10/14/2009EP2109132A2 Electron beam apparatus and image display apparatus using the same
10/14/2009CN100550430C Semiconductor device and method of manufacturing such a device
10/13/2009US7601949 Optical scanner device
10/13/2009US7601944 High throughput multi beam detection system and method
10/13/2009US7601938 Imaging system, methodology, and applications employing reciprocal space optical design
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