| Patents for H01J 3 - Details of electron-optical or ion-optical arrangements or of ion traps common to two or more basic types of discharge tubes or lamps (4,773) |
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| 10/14/2008 | US7436564 Light scanning apparatus and method to prevent damage to an oscillation mirror in an abnormal control condition via a detection signal outputted to a controller even though the source still emits light |
| 10/14/2008 | US7435535 Method for forming patterned insulating elements and methods for making electron source and image display device |
| 10/09/2008 | WO2008120341A1 Electron gun and electron beam exposure system |
| 10/09/2008 | WO2008013930A3 Method and apparatus for communicating radiation pressure provided by a light wave |
| 10/07/2008 | US7432645 Electron emission device and electron emission display using the same |
| 10/07/2008 | US7432644 Electron emission device having expanded outer periphery gate holes |
| 10/07/2008 | US7432494 Color image forming apparatus and method of controlling the color image forming apparatus that efficiently perform position displacement detection operation and density detection operation |
| 10/02/2008 | WO2008051189A3 Method and system of array imaging |
| 09/30/2008 | US7429725 Optical assembly with optical transmitting and receiving functions |
| 09/25/2008 | WO2008116190A2 Beam control assembly for ribbon beam of ions for ion implantation |
| 09/25/2008 | WO2008115950A1 High resolution near field scanning optical microscopy |
| 09/25/2008 | WO2007130099A3 Integration of electromagnetic detector on integrated chip |
| 09/25/2008 | US20080230712 Beam control assembly for ribbon beam of ions for ion implantation |
| 09/25/2008 | US20080230711 Charged-Particle Exposure Apparatus With Electrostatic Zone Plate |
| 09/25/2008 | US20080230694 Beam Optical Component Having a Charged Particle Lens |
| 09/24/2008 | EP1825491B1 Ion source with substantially planar design |
| 09/23/2008 | US7427747 Optical image pickup apparatus for imaging living body tissue |
| 09/23/2008 | US7427746 Optical module having optical path adjustable mechanism |
| 09/23/2008 | US7427742 Microlens for use with a solid-state image sensor and a non-telecentric taking lens |
| 09/18/2008 | WO2008113079A1 Charged particle optics with azimuthally-varying third-order aberrations for generation of shaped beams |
| 09/18/2008 | US20080224063 Charged particle optics with azimuthally-varying third-order aberrations for generation of shaped beams |
| 09/16/2008 | US7425698 Feedback influenced increased-quality-factor scanning probe microscope |
| 09/12/2008 | WO2008108453A1 Electron source, image display apparatus, and information display reproducing apparatus |
| 09/11/2008 | US20080217554 Charged particle beam writing apparatus and charged particle beam writing method |
| 09/11/2008 | US20080217553 Focusing method of charged particle beam and astigmatism adjusting method of charged particle |
| 09/11/2008 | US20080217531 Integrated deflectors for beam alignment and blanking in charged particle columns |
| 09/11/2008 | US20080217528 Ion guide chamber |
| 09/10/2008 | EP1968094A2 Non-axisymmetric charged-particle beam system |
| 09/10/2008 | CN101263574A Non-heavy metal optical bandpass filter in electro-optical readers |
| 09/09/2008 | US7421973 System and method for performing SIMOX implants using an ion shower |
| 09/04/2008 | WO2008104394A1 Method for producing a particle radiation source |
| 09/04/2008 | WO2008047267A3 X-ray tube with ion deflecting and collecting device made from a getter material |
| 09/03/2008 | EP1964154A2 Electron source for ionization with leakage current suppression |
| 09/02/2008 | US7420167 Apparatus and method for electron beam inspection with projection electron microscopy |
| 08/28/2008 | WO2008102435A1 Electron gun, electron beam exposure apparatus and electron beam exposure method |
| 08/28/2008 | US20080203317 Multi-beam deflector array device for maskless particle-beam processing |
| 08/28/2008 | US20080203301 Electron Microscope |
| 08/28/2008 | US20080203279 Electro-optical device, semiconductor device, display device, and electronic apparatus having the display device |
| 08/27/2008 | EP1960748A2 Method and system of array imaging |
| 08/27/2008 | CN100414343C Optical beam scanning device and image forming apparatus |
| 08/26/2008 | US7417219 Effect of the plasmonic dispersion relation on the transmission properties of subwavelength holes |
| 08/21/2008 | WO2008061173A3 Generation, acceleration, focusing and collection of a high-brightness, space-charge-dominated circular charged-particle beam |
| 08/20/2008 | EP1329927B1 Cold-cathode electron source and field-emission display |
| 08/20/2008 | CN101246663A Method and circuit of driving electron-emitting device, electron source, and image-forming apparatus |
| 08/19/2008 | US7414355 Charged particle beam extraction and formation apparatus |
| 08/19/2008 | US7414249 Broad energy-range ribbon ion beam collimation using a variable-gradient dipole |
| 08/19/2008 | US7414232 Image sensor and method for fabricating the same |
| 08/14/2008 | US20080191144 Non-axisymmetric charged-particle beam system |
| 08/14/2008 | US20080191143 Laser Irradiated Hollow Cylinder Serving as a Lens for Ion Beams |
| 08/13/2008 | EP1508910B1 A gun with a cold cathode |
| 08/06/2008 | CN101237908A Apparatus for the production of electron beams and x-ray beams for interstitial and intra-operatory radiation therapy |
| 08/05/2008 | US7408172 Charged particle beam apparatus and charged particle beam irradiation method |
| 08/05/2008 | US7408144 Method for manufacturing semiconductor device including a multi-phase prism |
| 07/31/2008 | US20080182185 Charged particle beam writing apparatus and method thereof, and method for resizing dimension variation due to loading effect |
| 07/31/2008 | US20080180791 Photosensor-chip, laser-microscope comprising a photosensor-chip and method for reading a photosensor-chip |
| 07/31/2008 | US20080179536 Changed particle beam emitting device and method for adjusting the optical axis |
| 07/31/2008 | US20080179503 Optical Device and Manufacturing Method of Optical Device |
| 07/29/2008 | US7405402 Method and apparatus for aberration-insensitive electron beam imaging |
| 07/29/2008 | US7405401 Ion extraction devices, mass spectrometer devices, and methods of selectively extracting ions and performing mass spectrometry |
| 07/29/2008 | US7405385 Micro-lens configuration for small lens focusing in digital imaging devices |
| 07/24/2008 | US20080173799 Optical element for a document illuminator |
| 07/23/2008 | EP1945840A2 Interconnects and heat dissipators based on nanostructures |
| 07/23/2008 | CN201091050Y High pressure electrode for corona discharge and discharging unit using the electrode |
| 07/23/2008 | CN100405523C Field emission display |
| 07/16/2008 | CN100403361C Driving method and driving apparatus for field emission device |
| 07/15/2008 | US7399215 Method of manufacturing electron-emitting device and electron source |
| 07/10/2008 | CA2673790A1 Ion trap |
| 07/08/2008 | US7397175 Solid state vacuum devices |
| 07/08/2008 | US7397057 Optical information readout apparatus |
| 07/03/2008 | US20080156998 Focused Ion Beam Apparatus |
| 07/02/2008 | CN101211729A Electron emission device and method for driving same |
| 07/02/2008 | CN100399495C Electron emission device |
| 07/01/2008 | US7394063 Microscope for investigating the lifetime of excited states in a sample |
| 06/26/2008 | WO2008074825A1 Cathode structure for a flat screen with refocusing grid |
| 06/26/2008 | WO2005008707A3 Improved tip for nanoscanning electron microscope |
| 06/26/2008 | US20080149846 Particle-beam apparatus with improved wien-type filter |
| 06/26/2008 | US20080149831 Beam Apparatus |
| 06/26/2008 | US20080149818 Procedure for the optical acquisition of objects by means of a light raster microscope with line by line scanning |
| 06/25/2008 | CN100397550C Swinging retarding immersion type lens electron optics focusing, deflection and signal collection system |
| 06/25/2008 | CN100397549C System and method for fast focal length alterations |
| 06/24/2008 | US7391145 Cold-cathode electron source, microwave tube using it, and production method thereof |
| 06/24/2008 | US7391037 Apparatus for generating a plurality of beamlets |
| 06/24/2008 | US7391013 Scanning beam device with detector assembly |
| 06/19/2008 | WO2007119123A3 Interconnects and heat dissipators based on nanostructures |
| 06/19/2008 | US20080143451 Driving a MEMS oscillator through a secondary set of support arms |
| 06/19/2008 | US20080143196 MEMS scanner driven by two or more signal lines |
| 06/19/2008 | US20080142723 Charged-Particle Beam System |
| 06/19/2008 | US20080142689 High throughput multi beam detection system and method |
| 06/17/2008 | US7388326 Electron emission device having a novel electron emission region design |
| 06/17/2008 | US7388191 Mirror positioning unit of laser scanning unit and laser scanning unit employing the same |
| 06/12/2008 | WO2008068806A1 Rf electron gun |
| 06/12/2008 | US20080135777 Ion implanter |
| 06/12/2008 | US20080135738 Device for detecting ambient light and light in the area in front of a motor vehicle |
| 06/12/2008 | US20080135733 Multi-band tracking and calibration system |
| 06/10/2008 | US7385344 Electron emission device including dummy electrodes |
| 06/10/2008 | US7385205 Method and device for aligning a charged particle beam column |
| 06/10/2008 | US7385203 Charged particle beam extraction system and method |
| 06/10/2008 | US7385173 Photosensitive array detector for spectrally split light |
| 06/10/2008 | US7385165 Multibeam type scanning microscope |
| 06/05/2008 | US20080129177 System and method for limiting arc effects in field emitter arrays |