Patents
Patents for H01J 3 - Details of electron-optical or ion-optical arrangements or of ion traps common to two or more basic types of discharge tubes or lamps (4,773)
03/2015
03/04/2015EP2843398A1 Electron source and X-ray fluorescence analyser using an electron source
03/03/2015US8969836 Method and apparatus for electron beam lithography
03/03/2015US8969778 Plasmonic light collectors
02/2015
02/26/2015DE102012002988B4 Ionenisolierung in überladenen HF-Ionenfallen Ion isolation in overloaded RF ion trap
02/24/2015US8963099 Electrode of electrostatic lens and method of manufacturing the same
02/24/2015US8963079 Systems and methods for transfer of ions for analysis
02/12/2015DE102013108603A1 Strahlungsquelle, Vorrichtung und Verfahren zur schnellen Wärmebehandlung von Beschichtungen Radiation source device and method for rapid heat treatment of coatings
02/10/2015US8952346 Systems and methods for isotopic source external beam radiotherapy
02/10/2015US8952343 System and method for automated cyclotron procedures
02/10/2015US8952340 High-frequency acceleration type ion acceleration and transportation apparatus having high energy precision
02/03/2015US8947232 Fault-tolerant distributed fiber optic intrusion detection
02/03/2015US8946618 System for detecting one or more predetermined optically derivable characteristics of a sample
01/2015
01/28/2015CN104319217A 低能量电子枪 Low energy electron gun
01/27/2015US8941077 Deceleration apparatus for ribbon and spot beams
01/27/2015US8941048 Pulse splitter with dispersion compensation
01/27/2015US8941043 Device for driving a light receiving element to track a light source
01/22/2015WO2015009457A1 Cathode assembly for use in a radiation generator
01/22/2015US20150022076 Electron-emitting cold cathode device
01/20/2015US8938049 Mesh electrode adhesion structure, electron emission device and electronic apparatus including the electron emission device
01/14/2015EP2823501A1 Pluridirectional very high electron energy radiation therapy systems and processes
01/13/2015US8933414 Focused ion beam low kV enhancement
01/07/2015CN204088257U 用于调节屏蔽罩内电子枪组件的单色管光偏调节工装 Monochromatic light is used to adjust the inner tube electron gun assembly shield bias adjustment tooling
01/06/2015US8927946 System and method for layer-wise proton beam current variation
01/06/2015US8927942 Ion source, nanofabrication apparatus comprising such source, and a method for emitting ions
12/2014
12/30/2014US8922107 Vacuum encapsulated hermetically sealed diamond amplified cathode capsule and method for making same
12/30/2014US8921805 Ion beam system and method of operating an ion beam system
12/30/2014US8921804 High brightness electron gun with moving condenser lens
12/30/2014US8921803 Electrostatic lenses and systems including the same
12/30/2014US8921802 Mass analyzer apparatus and systems operative for focusing ribbon ion beams and for separating desired ion species from unwanted ion species in ribbon ion beams
12/30/2014US8921759 Integrated image sensor package with liquid crystal lens
12/30/2014US8921758 Modulation device and charged particle multi-beamlet lithography system using the same
12/25/2014US20140374617 High-frequency acceleration type ion acceleration and transportation apparatus having high energy precision
12/24/2014CN104246961A 多向非常高电子能量放射治疗系统和过程 Much to the very high electron energy radiotherapy system and processes
12/23/2014US8916821 Assemblies for ion and electron sources and methods of use
12/23/2014US8916394 Method for manufacturing a carbon nanotube field emission device with overhanging gate
12/16/2014US8913719 Electron gun, X-ray generator and X-ray measurement apparatus
12/09/2014US8907312 Cytometry system with solid numerical-aperture-increasing lens
12/09/2014US8907307 Apparatus and method for maskless patterned implantation
12/09/2014US8907296 Charged particle beam system aperture
11/2014
11/27/2014US20140346368 Gun configured to generate charged particles
11/27/2014US20140346327 Electro-optical radiation collector for arc flash detection
11/25/2014US8896191 Mercury-free discharge lamp
11/18/2014US8890093 Charged particle beam apparatus and method for forming observation image
11/18/2014US8890059 Use of cryogenic ion chemistry to add a structural characterization capability to mass spectrometry through linear action spectroscopy
11/06/2014US20140326895 Permanent Magnet Based High Performance Multi-Axis Immersion Electron Lens Array with Low Axial Leakage Field
11/06/2014US20140326874 Printed circuit board multipole units used for ion transportation
11/04/2014US8878143 Electron beam lithography device and lithographic method
11/04/2014US8878122 Two dimensional solid-state image pickup device with a light condensing element including protrusions separated by recesses
10/2014
10/28/2014USRE45206 Lithography system, sensor and measuring method
10/21/2014US8866063 Lens-free wide-field super-resolution imaging device
10/02/2014DE102014104042A1 Emitterstruktur, Gasionenquelle und fokussiertes Ionenstrahl-System Emitter structure, gas ion source and focused ion beam system
09/2014
09/16/2014US8835868 Multi charged particle beam writing apparatus
09/16/2014US8835867 Multi-axis magnetic lens for focusing a plurality of charged particle beams
09/16/2014US8835848 Ultra-miniaturized electron optical microcolumn
09/11/2014US20140252245 Electron lens and the electron beam device
09/09/2014US8829466 Particle beam irradiation apparatus and particle beam therapy system
09/09/2014US8829422 Optical scanning apparatus using MEMS mirror and image forming apparatus provided with the same
09/09/2014US8829415 Correlation confocal microscope
09/02/2014US8822965 Charged particle beam irradiation apparatus
09/02/2014US8822945 Focused ion beam apparatus
09/02/2014US8822911 Focused ion beam apparatus and method of adjusting ion beam optics
09/02/2014US8822908 Image scanner, image forming apparatus and dew-condensation determination method
09/02/2014US8822902 Optical apparatus having adjustable pinhole by adjusting the transparence of a liquid crystal switch and method using the same
08/2014
08/28/2014US20140239175 Focused Ion Beam Low kV Enhancement
08/26/2014US8816297 Microfabricated high-bandpass foucault aperture for electron microscopy
08/26/2014US8814622 Method of manufacturing a fully integrated and encapsulated micro-fabricated vacuum diode
08/19/2014US8810866 Optical device, optical scanning apparatus, and image forming apparatus
08/14/2014US20140224999 Electrostatic lens and charged particle beam apparatus using the same
08/14/2014US20140224997 Ultra-miniaturized electron optical microcolumn
08/13/2014EP2764528A1 Image gating using an array of reflective elements
08/12/2014US8803411 Charged particle beam radiation apparatus
08/06/2014CN103972005A 电子枪用电子束流收束装置 Convergent beam electron gun with an electronic device
08/05/2014US8796639 Target for generating positive ions, method of fabricating the same, and treatment apparatus using the target
08/05/2014US8796638 Mass spectrometry for a gas analysis with a two-stage charged particle deflector lens between a charged particle source and a charged particle analyzer both offset from a central axis of the deflector lens
08/05/2014US8796620 Mass spectrometry for gas analysis with a one-stage charged particle deflector lens between a charged particle source and a charged particle analyzer both offset from a central axis of the deflector lens
08/05/2014US8796619 Electrostatic orbital trap mass spectrometer
07/2014
07/30/2014CN103956311A 带电粒子束轨迹控制装置 A charged particle beam trajectory control means
07/29/2014US8791424 Control grid design for an electron beam generating device
07/29/2014US8791423 Aberration correction device and charged particle beam device employing same
07/29/2014US8791403 Lens array for partitioned image sensor to focus a single image onto N image sensor regions
07/22/2014US8785880 Chromatic aberration corrector and electron microscope
07/22/2014US8785879 Electron beam wafer inspection system and method of operation thereof
07/22/2014US8785878 Charged particle beam apparatus
07/22/2014US8785835 Three-dimensional filter enables adaptive focus sensing
07/17/2014US20140197734 Spin rotation device
07/17/2014US20140197328 Ion Beam System and Method of Operating an Ion Beam System
07/17/2014US20140197325 Charged particle beam lens and exposure apparatus using the same
07/15/2014US8779381 Aperture unit for a particle beam device
07/15/2014US8779353 Ion guide and electrode for its assembly
07/08/2014US8772734 Charged particle beam lithography apparatus and method, and article manufacturing method
07/08/2014US8772733 Charged particle accelerator and particle beam therapy system
07/01/2014US8766218 Compact gantry for particle therapy
07/01/2014US8766208 Secondary-electron detector and charged particle beam apparatus
07/01/2014US8766183 Charged particle beam device
07/01/2014US8766171 Methods and systems for providing a substantially quadrupole field with a higher order component
07/01/2014US8766165 Pattern-based optical lens testing apparatus having a module comparing a viewed image representation to a copy of target pattern and method for using the same
07/01/2014US8766158 Production method of microlens
06/2014
06/26/2014WO2014098647A1 Light source with laser pumping and method for generating radiation
06/26/2014US20140175301 Ion Source, Nanofabrication Apparatus Comprising Such Source, and a Method for Emitting Ions
06/26/2014US20140175300 Enhanced integrity projection lens assembly
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