| Patents for H01J 3 - Details of electron-optical or ion-optical arrangements or of ion traps common to two or more basic types of discharge tubes or lamps (4,773) |
|---|
| 02/24/2009 | US7495244 Apparatus and method for controlled particle beam manufacturing |
| 02/24/2009 | US7495243 Writing method of charged particle beam, support apparatus of charged particle beam writing apparatus, writing data generating method and program-recorded readable recording medium |
| 02/17/2009 | US7492530 Metallic nano-optic lenses and beam shaping devices |
| 02/17/2009 | US7491933 Electron beam apparatus |
| 02/17/2009 | US7491919 Circuit for detecting a clock error in a scanned-image system and related circuits, systems, and methods |
| 02/12/2009 | US20090039281 Aberration corrector and charged particle beam apparatus using the same |
| 02/12/2009 | US20090039280 Magnetic lens assembly |
| 02/11/2009 | EP2023373A2 Charged particle beam apparatus and irradiation method |
| 02/11/2009 | EP1402562B1 Ion trapping |
| 02/10/2009 | US7488931 Optical zoom system for a light scanning electron microscope |
| 02/05/2009 | US20090032724 Focused negative ion beam field source |
| 02/05/2009 | US20090032723 Charged Particle Beam Irradiation System |
| 02/05/2009 | US20090032722 Corrector for charged-particle beam aberration and charged-particle beam apparatus |
| 02/05/2009 | US20090032708 Inspection system by charged particle beam and method of manufacturing devices using the system |
| 02/04/2009 | EP2020048A2 Surface plasmon signal transmission |
| 02/04/2009 | CN100459018C Electron emission device and drive method thereof |
| 02/03/2009 | US7486012 Electron emission device with auxiliary electrode and manufacturing method thereof |
| 02/03/2009 | US7486011 Thread-type electron emission element |
| 02/03/2009 | US7485846 Scanning microscope and method for scanning microscope |
| 02/03/2009 | US7485835 Imaging system having a plurality of vortex lenses |
| 01/29/2009 | US20090027748 MEMS Oscillator Having A Combined Drive Coil |
| 01/29/2009 | US20090026944 Field emission cathode structure and method of making the same |
| 01/29/2009 | US20090026384 Electrostatic lens assembly |
| 01/29/2009 | US20090026354 Separate-type detector |
| 01/28/2009 | CN100456413C Electron-emitting device, electron source, picture display unit and manufacturing process therefor |
| 01/27/2009 | US7482572 Transmissive diffuser with a layer of polytetrafluoroethylene on the output surface for use with an on-orbit radiometric calibration |
| 01/27/2009 | US7482567 Optical feedback system with improved accuracy |
| 01/22/2009 | US20090020707 Particle beam application apparatus, radiation device and method for guiding a particle beam |
| 01/22/2009 | US20090020694 Adiabatically-tuned linear ion trap with fourier transform mass spectrometry with reduced packet coalescence |
| 01/20/2009 | US7479626 Optical scanner device |
| 01/20/2009 | US7479212 Method of manufacturing high-density data storage medium |
| 01/15/2009 | US20090014663 Charged-particle beam writing method |
| 01/14/2009 | CN101345175A Electron emission device |
| 01/14/2009 | CN100452274C Electron-emitting device, electron source, image display apparatus, and television apparatus |
| 01/13/2009 | US7476847 Adaptive image reading apparatus and control method of the apparatus |
| 01/13/2009 | US7476846 Radar device and MEMS mirror device therefor |
| 01/08/2009 | US20090009731 Optical beam scanning device, image forming apparatus |
| 01/08/2009 | US20090008572 Charged-particle beam apparatus |
| 01/08/2009 | US20090008568 Charged particle beam writing apparatus and method thereof |
| 01/08/2009 | US20090008539 Method for correcting a control of an optical scanner in a device for mapping a sample by scanning and the device for performing the method |
| 01/06/2009 | US7473916 Apparatus and method for detecting contamination within a lithographic apparatus |
| 01/06/2009 | US7473905 Electrostatic deflector |
| 01/06/2009 | US7473888 Display with compensated light source drive |
| 01/06/2009 | US7473887 Resonant scanning probe microscope |
| 01/01/2009 | US20090001279 Charged particle beam apparatus |
| 12/30/2008 | US7471454 Dynamic optical tag communicator and system using corner cube modulating retroreflector |
| 12/30/2008 | US7470892 Optical encoder |
| 12/25/2008 | US20080315120 Focusing and positioning device for a particle-optical raster microscope |
| 12/25/2008 | US20080315113 Beam guidance magnet |
| 12/25/2008 | US20080315112 Charged particle beam deflection method with separate stage tracking and stage positional error signals |
| 12/25/2008 | US20080315111 Particle therapy system |
| 12/25/2008 | US20080315089 Electron gun, electron beam exposure apparatus, and exposure method |
| 12/23/2008 | US7468508 System for and method of projecting an image and adjusting a data frequency of a video signal during image projection |
| 12/23/2008 | US7468507 Optical spot grid array scanning system |
| 12/23/2008 | US7468506 Spot grid array scanning system |
| 12/18/2008 | US20080308742 In-chamber electron detector |
| 12/18/2008 | US20080308741 Focused ion beam apparatus |
| 12/18/2008 | US20080308721 Ion transport device |
| 12/16/2008 | US7466408 Measurement system |
| 12/16/2008 | US7465922 Accelerating electrostatic lens gun for high-speed electron beam inspection |
| 12/11/2008 | US20080302972 Broad energy-range ribbon ion beam collimation using a variable-gradient dipole |
| 12/10/2008 | EP1751782A4 Field emission device and field emission display device using the same |
| 12/10/2008 | EP1314182B1 System and method for removing particles entrained in an ion beam |
| 12/10/2008 | EP1314181B1 Electrostatic trap for particles entrained in an ion beam |
| 12/09/2008 | US7462981 Electron emission device including conductive layers for preventing accumulation of static charge |
| 12/09/2008 | US7462838 Electrostatic deflection control circuit and method of electronic beam measuring apparatus |
| 12/04/2008 | US20080296509 Phase-shifting element and particle beam device having a phase-shifting element |
| 12/04/2008 | US20080296478 Methods for reducing cross talk in optical sensors |
| 12/04/2008 | US20080296477 Optical system for inducing focus diversity |
| 12/02/2008 | US7459839 Low voltage electron source with self aligned gate apertures, and luminous display using the electron source |
| 11/27/2008 | US20080290297 Particle Accelerator for Radiotherapy by Means of Ion Beams |
| 11/27/2008 | US20080290288 Measurement System and a Method |
| 11/27/2008 | US20080290287 Multichannel Energy Analyzer for Charged Particles |
| 11/26/2008 | CN100437875C Electron emission device and method for fabricating the same |
| 11/25/2008 | US7456383 Surface plasmon-enhanced nano-optic devices and methods of making same |
| 11/20/2008 | US20080283767 Pattern definition device having distinct counter-electrode array plate |
| 11/19/2008 | EP1993119A1 Charged particle beam emitting device and method for operating a charged particle beam emitting device |
| 11/18/2008 | US7453055 Image reading apparatus |
| 11/11/2008 | US7450287 Optical scanning device and method for detecting synchronization signal |
| 11/11/2008 | US7449673 Peak power and speckle contrast reduction for a single layer pulse |
| 11/06/2008 | WO2008133275A1 Surface emission type electron source and drawing device |
| 11/04/2008 | US7446601 Electron beam RF amplifier and emitter |
| 10/30/2008 | WO2008131416A1 Method and apparatus for performing apertureless near-field scanning optical microscopy |
| 10/30/2008 | US20080265174 Charged particle beam writing apparatus and method |
| 10/30/2008 | US20080265148 Determining an operational state of a MEMS based laser scanner |
| 10/28/2008 | US7442940 Focal plane array incorporating ultra-small resonant structures |
| 10/28/2008 | US7442918 MEMS device having simplified drive |
| 10/23/2008 | WO2008018986A3 Apparatus for obtaining radiant energy |
| 10/23/2008 | US20080261337 Low voltage electron source with self aligned gate apertures, fabrication method thereof, and luminous display using the electron source |
| 10/23/2008 | US20080258074 Beam processing apparatus |
| 10/23/2008 | US20080258073 Method and apparatus for simultaneously depositing and observing materials on a target |
| 10/22/2008 | EP1983543A1 Gun chamber, charged particle beam apparatus and method of operating same |
| 10/22/2008 | CN100428397C Electronic optical lens barrel and production method therefor |
| 10/21/2008 | US7439661 Image display apparatus having ION pump including permanent magnet |
| 10/21/2008 | US7439491 Error reduction for image capturing device |
| 10/21/2008 | US7439483 Real-time confocal microscope using the dispersion optics |
| 10/16/2008 | WO2007130100A3 A focal plane array incorporating ultra-small resonant structures |
| 10/16/2008 | WO2007108993A3 Scanned-beam imager with phase offset photon emission imaging |
| 10/16/2008 | US20080251736 Charged Particle Gun |
| 10/15/2008 | CN100426440C Cold cathode electron gun and vacuum gauge tube using the same |