Patents
Patents for H01J 3 - Details of electron-optical or ion-optical arrangements or of ion traps common to two or more basic types of discharge tubes or lamps (4,773)
11/2013
11/19/2013US8586942 Beam position monitor and particle beam therapy system
11/19/2013US8586909 Method of manufacturing an optical member having stacked high and low refractive index layers
11/06/2013CN103383910A Electronic pulse electrostatic time-domain compression device and method
11/05/2013US8575831 EHID lamp having integrated field applicator and optical coupler
11/05/2013US8575564 Particle beam irradiation apparatus and particle beam therapy system
10/2013
10/30/2013CN103376343A Electronic gun system capable of moving inter-electrode distances for high current electron beam analysis meter
10/29/2013US8569726 Reduced temperature sterilization of stents
10/29/2013US8569678 Micron-scale lens array having diffracting structures
10/29/2013US8569677 Devices useful for vacuum ultraviolet beam characterization including a movable stage with a transmission grating and image detector
10/24/2013US20130277569 System and method for layer-wise proton beam current variation
10/22/2013US8564224 High average current, high quality pulsed electron injector
10/22/2013US8563942 Multi-beam deflector array means with bonded electrodes
10/17/2013US20130273478 Charged particle optical system, drawing apparatus, and method of manufacturing article
10/17/2013US20130270452 Charged Particle Trajectory Control Apparatus, Charged Particle Accelerator, Charged Particle Storage Ring, and Deflection Electromagnet
10/17/2013US20130270449 Da conversion device and electron beam exposure system using the same
10/15/2013US8558161 Lens having multiple conic sections for LEDs and proximity sensors
10/15/2013US8558155 Device for driving a light receiving element to track a light source
10/10/2013US20130265486 Molded image sensor package having lens holder
10/10/2013US20130264477 Particle-beam column corrected for both chromatic and spherical aberration
10/08/2013US8552405 Charged particle beam writing apparatus and charged particle beam writing method
10/08/2013US8552397 Focused ion beam device and focused ion beam processing method
10/08/2013US8552358 Quantum tunneling photodetector array including electrode nano wires
10/03/2013US20130256555 Shaping offset adjustment method and charged particle beam drawing apparatus
10/03/2013US20130256554 Enhanced integrity projection lens assembly
10/03/2013US20130256553 Automated Ion Beam Idle
10/03/2013US20130256552 Ion Beam Bending Magnet for a Ribbon-Shaped Ion Beam
10/03/2013US20130256527 Hybrid electrostatic lens for improved beam transmission
10/03/2013US20130256526 Hybrid electrostatic lens for improved beam transmission
10/01/2013US8546769 Charged particle beam irradiation apparatus, charged particle beam irradiating method, and method of attaching and detaching transport line
10/01/2013US8546741 Compact optical finger navigation system based on speckles with an optical element including an optical redirection surface
10/01/2013US8546739 Manufacturing method of wafer level chip scale package of image-sensing module
09/2013
09/26/2013US20130248730 Multi-axis Magnetic Lens for Focusing a Plurality of Charged Particle Beams
09/25/2013EP2642504A2 Method and apparatus for communicating radiation pressure provided by a light wave
09/24/2013US8541735 Inlaid optical material and method of manufacture
09/19/2013US20130240751 Charged Particle Extraction Device and Method of Design There for
09/19/2013US20130240720 Focused ion beam apparatus and method of adjusting ion beam optics
09/17/2013US8536503 Faceted retro-mirror for line-of-sight jitter sensing
09/17/2013US8535643 Flourescent dendrimer compounds and use of such compounds in multi-photon devices or processes
09/12/2013WO2013133936A1 Pluridirectional very high electron energy radiation therapy systems and processes
09/11/2013CN103299390A Device for producing an electron beam
09/10/2013US8530851 Electron beam profile measurement system and method with optional Faraday cup
09/10/2013US8530822 Illumination device and projection having a plurality of collimating and converging lenses
09/04/2013EP2633546A1 Fast-switching dual-polarity ion mobility spectrometry
09/04/2013EP2633543A1 Device for producing an electron beam
09/03/2013US8526560 Method of using deuterium-cluster foils for an intense pulsed neutron source
09/03/2013US8525098 Solid-state image pickup device, method for manufacturing solid-state image pickup device, and camera
09/03/2013US8525097 Wireless laser system for power transmission utilizing a gain medium between retroreflectors
08/2013
08/29/2013US20130221232 Microplasma ion source for focused ion beam applications
08/27/2013US8519355 Charged particle source
08/27/2013US8519353 Method and apparatus for controlling an asymmetric electrostatic lens about a central ray trajectory of an ion beam
08/27/2013US8519324 Laser projector for projecting and displaying an image based on the raster scanning of a laser beam
08/27/2013US8519323 Electric field/magnetic field sensors and methods of fabricating the same
08/27/2013CA2673790C Ion trap
08/22/2013US20130216246 Optical sensor and image forming apparatus
08/22/2013US20130215425 Waveguide-based detection system with scanning light source
08/21/2013CN101313092B Interconnects and heat dissipators based on nanostructures
08/15/2013US20130206999 Charged particle beam lens and charged particle beam exposure apparatus
08/14/2013CN103247501A One-way electron sender
08/13/2013US8507873 Drift measuring method, charged particle beam writing method, and charged particle beam writing apparatus
08/13/2013US8507855 Inductive modulation of focusing voltage in charged beam system
08/01/2013WO2013110546A1 Field-emission electron source
07/2013
07/30/2013US8497486 Ion source having a shutter assembly
07/30/2013US8497464 Detector arrangement having increased sensitivity
07/25/2013US20130187060 Compact gantry for particle therapy
07/23/2013US8492732 Multi charged particle beam writing apparatus and multi charged particle beam writing method
07/18/2013US20130181138 Multi-axis Magnetic Lens for Focusing a Plurality of Charged Particle Beams
07/18/2013US20130180845 Filter for removing macro-particles from a plasma beam
07/16/2013US8487235 Photoelectric sensor for sensing a target at a predetermined location
07/16/2013US8487228 System for adjusting focus of a liquid lens in a machine vision system
07/11/2013US20130175440 Radio frequency (rf) ion guide for improved performance in mass spectrometers
07/11/2013DE102012000220A1 Device for controllable generation of free electrons i.e. microwaves, with controllable kinetic energy in magnetron, has field electrode connected with voltage source over electrical feed cable and surrounded by electron-emitting cathode
07/10/2013EP2611501A2 System and method for automatic cyclotron procedures
07/09/2013US8482817 Image reading apparatus and method for controlling the same
07/09/2013US8481960 Deceleration lens
07/09/2013US8481959 Apparatus and method for multi-directionally scanning a beam of charged particles
07/03/2013EP2609611A1 Control grid design for an electron beam generating device
07/02/2013US8476610 Composite segment collimators for SPECT without dead zones
07/02/2013US8476581 Speckle reduction method and apparatus
06/2013
06/25/2013US8471229 System for radiation sterilization of medical devices
06/25/2013US8471201 Methods and apparatus for ion sources, ion control and ion measurement for macromolecules
06/25/2013US8471190 Vertical waveguides with various functionality on integrated circuits
06/20/2013US20130153782 Multi-axis Magnetic Lens for Focusing a Plurality of Charged Particle Beams
06/19/2013EP2605266A2 Converter of orbital momentum into spin momentum for the polarization of particle beams
06/18/2013US8466436 System and method for metered dosage illumination in a bioanalysis or other system
06/18/2013US8466430 Electrostatic lens
06/18/2013US8466429 Particle beam injector system and method
06/18/2013US8466407 Stray light baffles for a conformal dome with arch corrector optics
06/11/2013US8461554 Apparatus and method for charge neutralization during processing of a workpiece
06/11/2013US8461553 Masked ion implant with fast-slow scan
06/11/2013US8461548 Ion beam irradiation device and method for suppressing ion beam divergence
06/11/2013US8461525 Charged particle source with integrated energy filter
06/06/2013US20130140468 Charged particle beam scanning using deformed high gradient insulator
06/06/2013US20130140450 Inductively-Coupled Plasma Ion Source for Use with a Focused Ion Beam Column with Selectable Ions
06/04/2013US8455847 Mask health monitor using a faraday probe
05/2013
05/30/2013US20130137044 Scanning apparatus, drawing apparatus, and method of manufacturing article
05/30/2013US20130134323 Electron Beam Profile Measurement System and Method with Optional Faraday Cup
05/30/2013US20130134322 Electron lens and the electron beam device
05/30/2013US20130134307 Inductively Coupled Plasma Source as an Electron Beam Source for Spectroscopic Analysis
05/28/2013US8451511 Method and device for optically scanning an object and device
05/23/2013US20130126730 Sequential radial mirror analyser
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