Patents
Patents for H01J 3 - Details of electron-optical or ion-optical arrangements or of ion traps common to two or more basic types of discharge tubes or lamps (4,773)
10/2007
10/16/2007US7282722 Charged particle beam apparatus and charged particle beam irradiation method
10/16/2007US7282708 Method of selecting ions in an ion storage device
10/16/2007US7282701 Sensor for use in a lithographic apparatus
10/11/2007US20070235659 Method and device for aligning a charged particle beam column
10/10/2007EP1843378A1 Electron emission device, method of manufacturing the electron emission device, and electron emission display using the electron emission device
10/10/2007CN100342518C Processed object processing apparatus, processed object processing method, pressure control method, processed object transfer method, and transfer apparatus
10/10/2007CN100342472C 电子发射装置 Electron-emitting devices
10/09/2007US7279882 Method and apparatus for measuring properties of particle beams using thermo-resistive material properties
10/09/2007US7279830 Electron emission device
10/09/2007US7279696 Optical information code reading apparatus using marker beam
10/09/2007US7279675 Floating periscope
10/09/2007US7279253 Near-field light generating structure, near-field exposure mask, and near-field generating method
10/09/2007CA2319395C A fed crt having various control and focusing electrodes along with horizontal and vertical deflectors
10/04/2007US20070228266 Optical scanning apparatus
10/03/2007CN101047098A Image display apparatus
10/03/2007CN101047085A Field emission electronic source and its manufacturing method
10/02/2007US7276843 Electron-emitting device with electron blocking layer, electron source, and image-forming apparatus
10/02/2007US7276685 Optical system with photo catalytic reactor and incident beam splitter
09/2007
09/27/2007US20070221860 Charged particle beam column
09/25/2007US7274139 Electron emission device with improved electron emission source structure
09/25/2007US7274137 Electron emission device with emission controlling resistance layer
09/25/2007US7274032 Document processor with optical sensor arrangement
09/25/2007US7274012 Optical fiber probe, light detection device, and light detection method
09/20/2007WO2007105389A1 Electron gun, energy ray generating device, electron beam generating device, and x-ray generating device
09/20/2007US20070215813 Electronic energy switch
09/19/2007CN100338687C Actuating and sensing device for scanning probe microscopes
09/18/2007US7271399 Manipulator assembly in ion implanter
09/18/2007US7271396 Method and device for aligning a charged particle beam column
09/18/2007US7271383 Scanning system with feedback for a MEMS oscillating scanner
09/18/2007US7271382 Process for the observation of at least one sample region with a light raster microscope with light distribution in the form of a point
09/18/2007US7271379 Dielectric microcavity fluorosensors excited with a broadband light source
09/13/2007US20070210253 Methods for SEM inspection of fluid containing samples
09/13/2007US20070210245 Optical scanning device and image forming apparatus
09/13/2007US20070210041 Automatic focusing of electron beams using a modified Faraday cup diagnostic
09/12/2007EP1831760A1 Optoelectronic position determination system
09/12/2007CN100337300C 电子发射装置及其制造方法 The electron-emitting device and manufacturing method thereof
09/11/2007US7268482 Preventing junction leakage in field emission devices
09/11/2007US7268481 Field emission display with smooth aluminum film
09/11/2007US7268480 Field emission device, display adopting the same and method of manufacturing the same
09/11/2007US7268345 Optical scanner and method for 3-dimensional scanning
09/11/2007US7268340 Wide-angle sensor system with a cube corner reflector, and production of the molds
09/06/2007US20070205374 For use in the wafer level testing of integrated circuits, such as memory or logic devices; two-part probe elements, socket-able probes and their mounts, for example, probes have slide in mounting structure; simplified production, reliable
09/06/2007US20070205355 Image reading apparatus
09/04/2007US7265915 Detection device for a confocal microscope
09/04/2007US7264978 Field emission type cold cathode and method of manufacturing the cold cathode
08/2007
08/30/2007US20070200056 Anti-reflection coated image sensor and manufacturing method thereof
08/29/2007EP1825491A2 Ion source with substantially planar design
08/29/2007CN101026074A Electron emission device and electron emission display using the same
08/29/2007CN101026058A Electron emission device and electron emission display using the same
08/23/2007US20070194214 High-Speed Measuring Device And Method Based On A Confocal Microscopy Principle
08/23/2007US20070194206 Confocal laser scanning microscope
08/22/2007EP1820257A2 Electronic apparatus
08/22/2007EP1129465B1 High voltage standoff, current regulating, hollow electron beam switch tube
08/22/2007CN101023574A Electronic apparatus
08/21/2007US7259378 Closed drift ion source
08/16/2007US20070187614 Radio frequency ion guide
08/16/2007US20070187578 Optical assembly with adjustable sensors
08/15/2007CN101019201A 带电粒子枪 Charged particle gun
08/14/2007US7256535 Diamond triode devices with a diamond microtip emitter
08/09/2007US20070181820 Apparatus and method for controlling ion beam
08/09/2007US20070181819 Deflector for equipment of electron beam lithography and equipment of electron beam lithography
08/09/2007DE102005005801B4 Elektrostatisches Ablenksystem für Korpuskularstrahlung An electrostatic deflection system for corpuscular
08/08/2007EP1586106A4 An extractor for a micro-column, an alignment method for an extractor aperture to an electon emitter, and a measuring method and an alignment method using thereof
08/07/2007US7253417 Multi-axis compound lens, beam system making use of the compound lens, and method using the compound lens
08/07/2007US7253394 Image sensor and method for fabricating the same
08/07/2007US7251988 Topography analyzing system
08/02/2007WO2004075171A3 Data recording using carbon nanotube electron sources
08/02/2007US20070177338 Inverter device
08/02/2007US20070176083 Camera system for a motor vehicle
08/01/2007EP1814141A2 Electron emission device, blacklight unit (BLU) including the electron emission device, flat display apparatus including the BLU, and method of driving the electron emission device
08/01/2007CN1329942C Electron emission device including dummy electrodes and producing method thereof
08/01/2007CN101009190A Image display apparatus
07/2007
07/31/2007US7250598 Plasmon enhanced near-field optical probes
07/26/2007US20070170370 Structures and methods for coupling energy from an electromagnetic wave
07/26/2007US20070170356 Light scanning apparatus
07/25/2007EP1810299A2 Integrated sub-nanometer-scale electron beam systems
07/25/2007CN1328746C Thermally conductive lamp reflector
07/25/2007CN101005000A Electron emission device and display
07/24/2007US7248413 Microlensing particles and applications
07/24/2007US7247842 Method and system for scanning apertureless fluorescence mircroscope
07/24/2007US7247841 Light scanning apparatus
07/24/2007US7247840 Image forming apparatus, and method of correcting timing for generating laser beams
07/19/2007US20070164230 Patient alignment system with external measurement and object coordination for radiation therapy system
07/19/2007US20070164229 Technique for providing a segmented electrostatic lens in an ion implanter
07/19/2007US20070164204 Optical beam scanning device and image forming apparatus
07/19/2007US20070164203 Speckle reduction method and apparatus
07/18/2007CN101000844A Composite field electronic emitting material and preparation method and use thereof
07/17/2007US7245067 Electron emission device
07/17/2007US7244924 Transparent optical component for light emitting/receiving elements
07/17/2007US7244063 Method and system for three dimensional tomosynthesis imaging
07/17/2007CA2288758C Optical scanner and image reader for reading images and decoding optical information including one and two dimensional symbologies at variable depth of field
07/11/2007EP1805779A1 Remapping methods to reduce distortions in images
07/11/2007CN1998059A Non-axisymmetric charged-particle beam system
07/11/2007CN1996547A Electronic optical focusing, deflexion and signals collection method for the turning gear immerged object lens
07/10/2007US7241987 Probe for near-field microscope, the method for manufacturing the probe and scanning probe microscope using the probe
07/05/2007WO2007032920A3 Non-heavy metal optical bandpass filter in electro-optical readers
07/05/2007US20070152147 Camera module fabrication method
07/05/2007US20070152145 Compensation apparatus for image scan
07/05/2007US20070152139 Techniques to control illumination for image sensors
07/04/2007CN1993792A 高分辨率阴极结构 High-resolution cathode structure
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