Patents
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
05/2009
05/20/2009CN201242572Y Aging test system for electric automobile charger
05/20/2009CN201242571Y Operation apparatus with self-casting checkout
05/20/2009CN201239720Y Automatic battery detecting and sorting apparatus
05/20/2009CN101438253A Writing to and configuring flash memory
05/20/2009CN101438177A Method and apparatus for probing
05/20/2009CN101436939A Sensing apparatus for AC power supply
05/20/2009CN101436776A Grounding and line selection method for low current grounding system
05/20/2009CN101435968A Active element array substrate
05/20/2009CN101435924A Liquid crystal display panel and restoring method thereof
05/20/2009CN101435914A Sun blind ultraviolet camera lens
05/20/2009CN101435854A Detection device of electric vehicle battery
05/20/2009CN101435853A Test system
05/20/2009CN101435852A Method for measuring junction type semiconductor lighting device light efficiency degradation parameter by electric method
05/20/2009CN101435851A Method for detecting solar cell leakage current by infrared thermal imager
05/20/2009CN101435850A Balance type circuit of pulse current method for measuring three-phase electric power apparatus local discharge
05/20/2009CN101435849A Sensing method of local discharging VHF or UHF signal on electric power apparatus earth wire
05/20/2009CN101435848A Method for testing power cable fault based on secondary pulse mode
05/20/2009CN101435847A Low current grounding DC signal wire selecting method
05/20/2009CN101435846A Portable high voltage electric shock-proof detection alarming device
05/20/2009CN101435845A Small grounding current system double-loop wire single-phase ground fault distance measuring method
05/20/2009CN101435844A Fan failure detection circuit and detection method thereof
05/20/2009CN101435843A Method for recognizing short circuit fault of power distribution network by dynamically regulating over current fixed value
05/20/2009CN101435842A Multifunctional integrated test system
05/20/2009CN101435841A Test system and method
05/20/2009CN101435840A Mainframe panel testing device
05/20/2009CN101433987A Wire break detecting device for wire electric discharge machine
05/20/2009CN100490386C Method for providing guaranteed distributed failure notification
05/20/2009CN100490142C System and method pertaining to semiconductor dies
05/20/2009CN100490106C Test system and method for judging integrated circuit processing speed
05/20/2009CN100489925C Display device and test circuit thereof
05/20/2009CN100489797C Error detection on programmable logic equipment
05/20/2009CN100489795C SPARC processor single particle effect detection device and method
05/20/2009CN100489720C Method for compensating deviation of test temperature
05/20/2009CN100489602C Electric detection method for press-fit process
05/20/2009CN100489554C Test device and test emulation method
05/20/2009CN100489553C System and method for evaluating unit
05/20/2009CN100489552C Measurement of lateral diffusion of diffused layers
05/20/2009CN100489551C Integrated circuit with JTAG port, TAP linking module, and off-chip TAP interface port
05/20/2009CN100489550C Voltage-applied current measuring instrument and current buffer with switch used therefor
05/20/2009CN100489549C Wire short /open circuit test set
05/20/2009CN100489548C Circuit board inspection device
05/20/2009CN100489547C Electric power equipment on line failure prediagnosis device
05/20/2009CN100489545C Cable identifying method and cable identifying instrument
05/20/2009CN100489541C Electric connector
05/20/2009CN100489540C Component interface plate used for test of semiconductor integrated circuit
05/20/2009CN100489539C Apparatus for hot-probing integrated semiconductor circuits on wafers
05/20/2009CN100488733C Arm hanging type high voltage transmission line detecting robot
05/19/2009US7536620 Method of and apparatus for validation support, computer product for validation support
05/19/2009US7536619 RAM testing apparatus and method
05/19/2009US7536618 Wide frequency range signal generator and method, and integrated circuit test system using same
05/19/2009US7536617 Programmable in-situ delay fault test clock generator
05/19/2009US7536616 JTAG testing arrangement
05/19/2009US7536615 Logic analyzer systems and methods for programmable logic devices
05/19/2009US7536571 System and method to maintain data processing system operation in degraded system cooling condition
05/19/2009US7536476 Method for performing tree based ACL lookups
05/19/2009US7536267 Built-in self test for memory interconnect testing
05/19/2009US7535852 Information-processing device, information-processing method, and information-processing program product
05/19/2009US7535842 Method and system for merging bandwidth in multiplexing flows
05/19/2009US7535839 Method and apparatus for quality-of-service based admission control using prediction of scheduling gain
05/19/2009US7535838 Method for determining resource use in a network
05/19/2009US7535834 Node device configuring ring network and data frame control method
05/19/2009US7535833 Statistic counter device
05/19/2009US7535830 Dynamic cable assignment on gigabit infrastructure
05/19/2009US7535828 Algorithm for backup PE selection
05/19/2009US7535826 Routing protocols for accommodating nodes with redundant routing facilities
05/19/2009US7535548 Apparatus for testing liquid crystal display panel
05/19/2009US7535372 Method for measuring the operating state of a synchronous motor using composite power angle meter
05/19/2009US7535248 System for display test
05/19/2009US7535247 Interface for testing semiconductors
05/19/2009US7535246 Computing the characteristics of a field-effect-transistor (FET)
05/19/2009US7535245 Integrated circuit with integrated circuit section to aid in testing
05/19/2009US7535244 Apparatus for testing a semiconductor device
05/19/2009US7535243 Method and program for controlling an apparatus for measurement of characteristics of a semiconductor device under test
05/19/2009US7535242 Interface test circuit
05/19/2009US7535241 Test probe with hollow tubular contact with bullet-nosed configuration at one end and crimped configuration on other end
05/19/2009US7535240 Semiconductor device
05/19/2009US7535239 Probe card configured for interchangeable heads
05/19/2009US7535238 In-line electron beam test system
05/19/2009US7535234 ARC fault detector
05/19/2009US7535233 Traveling wave based relay protection
05/19/2009US7535214 Apparatus for testing system-in-package devices
05/19/2009US7535213 Method and system for prediction of atmospheric upsets in an integrated circuit
05/19/2009US7535126 Dry-type high-voltage load system device and method for preventing chain disconnection/arc discharge of the device
05/19/2009US7535102 High performance sub-system design and assembly
05/19/2009US7534654 Socket for making with electronic component, particularly semiconductor device with spring packaging, for fixturing, testing, burning-in or operating such a component
05/19/2009US7534632 Method for circuits inspection and method of the same
05/19/2009US7534631 Apparatus for measuring semiconductor physical characteristics
05/19/2009US7533462 Method of constructing a membrane probe
05/19/2009CA2486661C Loading device
05/19/2009CA2468860C Method and apparatus for embedded built-in self-test (bist) of electronic circuits and systems
05/19/2009CA2384592C Light element test method and device using the light element driving circuit
05/14/2009WO2009062055A1 Free-standing two-sided device fabrication
05/14/2009WO2009061973A1 Session-less load balancing of client traffic across servers in a server group
05/14/2009WO2009061023A1 Transferring device for tray using tray transfer unit and the method for the same
05/14/2009WO2009060948A1 Relay connector
05/14/2009WO2009060687A1 Adhesive sheet and method for manufacturing semiconductor device using the same
05/14/2009WO2009060686A1 Adhesive sheet for inspection
05/14/2009WO2009060515A1 Carrier device and electronic component handling device
05/14/2009WO2009060259A1 Testing of a circuit that has an asynchronous timing circuit
05/14/2009WO2009060131A1 Test bench