| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 05/26/2009 | US7539135 System and method for establishing telecommunication carrier virtual networks |
| 05/26/2009 | US7539132 Methods, systems, and devices for determining COS level |
| 05/26/2009 | US7539129 Server, method for controlling data communication of server, computer product |
| 05/26/2009 | US7538571 Starter zero current test apparatus and method |
| 05/26/2009 | US7538570 Supply voltage monitoring |
| 05/26/2009 | US7538569 Integrated circuits with programmable well biasing |
| 05/26/2009 | US7538568 Spring loaded probe pin |
| 05/26/2009 | US7538567 Probe card with balanced lateral force |
| 05/26/2009 | US7538566 Electrical test system including coaxial cables |
| 05/26/2009 | US7538565 High density integrated circuit apparatus, test probe and methods of use thereof |
| 05/26/2009 | US7538564 Methods and apparatus for utilizing an optical reference |
| 05/26/2009 | US7538563 Determination of equivalent series resistance |
| 05/26/2009 | US7538560 System and method for component failure protection |
| 05/26/2009 | US7538559 System and method for reducing current in a device during testing |
| 05/26/2009 | US7538558 Failure detection apparatus and failure detection method for a semiconductor apparatus |
| 05/26/2009 | US7538557 Arc fault and ground fault circuit interrupter tester apparatus and method |
| 05/26/2009 | US7538542 Test handler and operation method thereof |
| 05/26/2009 | US7538333 Contactless charge measurement of product wafers and control of corona generation and deposition |
| 05/26/2009 | US7537953 Manufacturing method of microstructure and microelectromechanical system |
| 05/26/2009 | US7537943 Method of manufacturing a semiconductor integrated circuit device |
| 05/26/2009 | US7537940 Method of manufacturing electronic device capable of controlling threshold voltage and ion implanter controller and system that perform the method |
| 05/26/2009 | US7537939 System and method for characterizing lithography effects on a wafer |
| 05/26/2009 | US7537378 Wire disconnection inspecting device and method |
| 05/26/2009 | CA2352142C Method for diagnosing insulation degradation in underground cable |
| 05/22/2009 | WO2009065040A1 Systems and methods for providing power to a device under test |
| 05/22/2009 | WO2009065012A1 System and method for locating umts user equipment using measurement reports |
| 05/22/2009 | WO2009064820A2 Improved electronic component handler test plate |
| 05/22/2009 | WO2009064524A1 Automatic reduced audio low battery warning |
| 05/22/2009 | WO2009064285A1 Apparatus and method for testing semiconductor devices |
| 05/22/2009 | WO2009063688A1 Secondary battery control device and method |
| 05/22/2009 | WO2009063359A1 General purpose serial communication using jtag interface |
| 05/22/2009 | WO2009062552A1 Apparatus and method for testing of wiring for at least one discharge lamp |
| 05/22/2009 | WO2009034496A3 Wafer, method of manufacturing integrated circuits on a wafer, and method of storing data about said circuits |
| 05/22/2009 | WO2009007164A3 Junction-photovoltage method and apparatus for contactless determination of sheet resistance and leakage current of semiconductor |
| 05/22/2009 | WO2007024656A3 Architecture and method for testing of an integrated circuit device |
| 05/22/2009 | WO2007023501A3 Wafer inspection system and a method for translating wafers |
| 05/22/2009 | WO2006135626A3 Contactless area testing apparatus and method utilizing device switching |
| 05/22/2009 | CA2705759A1 System and method for locating umts user equipment using measurement reports |
| 05/21/2009 | US20090132884 Timing generator and semiconductor testing apparatus |
| 05/21/2009 | US20090132883 Test circuit |
| 05/21/2009 | US20090132882 Scan-load-based dynamic scan configuration |
| 05/21/2009 | US20090132881 Dual mode test access port method and apparatus |
| 05/21/2009 | US20090132880 Multiple-capture DFT system for detecting or locating crossing clock-domain faults during self-test or scan-test |
| 05/21/2009 | US20090132879 Multiplexing of scan inputs and scan outputs on test pins for testing of an integrated circuit |
| 05/21/2009 | US20090132878 System, method, and computer program product for performing a scan operation on a sequence of single-bit values using a parallel processor architecture |
| 05/21/2009 | US20090132877 Method for Embedded Integrated End-to-End Testing |
| 05/21/2009 | US20090132874 System and method for testing a data storage device without revealing memory content |
| 05/21/2009 | US20090132186 Method and system for reporting battery status based on current estimation |
| 05/21/2009 | US20090130785 Manufacturing method of semiconductor integrated circuit device |
| 05/21/2009 | US20090128184 Testing High Frequency Signals on a Trace |
| 05/21/2009 | US20090128183 Device for measuring thickness and square resistivity of interconnecting lines |
| 05/21/2009 | US20090128182 Driver circuit and test apparatus |
| 05/21/2009 | US20090128180 Cantilever-Type Probe and Method of Fabricating the Same |
| 05/21/2009 | US20090128179 Wiring Pattern Characteristic Evaluation Mounting Board |
| 05/21/2009 | US20090128178 Wafer inspecting apparatus, wafer inspecting method and computer program |
| 05/21/2009 | US20090128177 Attachment for socket and semiconductor device-testing unit having the same |
| 05/21/2009 | US20090128176 High density integrated circuit apparatus, test probe and methods of use thereof |
| 05/21/2009 | US20090128173 Testing system and method |
| 05/21/2009 | US20090128172 Calibration board for electronic device test apparatus |
| 05/21/2009 | US20090128171 Microstructure Probe Card, and Microstructure Inspecting Device, Method, and Computer Program |
| 05/21/2009 | US20090128160 Dual sensor system having fault detection capability |
| 05/21/2009 | US20090128159 Battery pack anomaly detecting method and battery pack |
| 05/21/2009 | US20090128134 Semiconductor integrated circuit apparatus, measurement result management system, and management server |
| 05/21/2009 | US20090127169 Electronic component handler test plate |
| 05/20/2009 | EP2060925A2 Test and measurement instrument and method of calibrating |
| 05/20/2009 | EP2060924A1 Failure predicting circuit and method, and semiconductor integrated circuit |
| 05/20/2009 | EP2060923A2 Assembly for measuring electric current |
| 05/20/2009 | EP1695362A4 Polymorphic automatic test systems and methods |
| 05/20/2009 | EP1402276A4 Method of determining when electrode pads are unsuitable for use by detecting relative humidity |
| 05/20/2009 | EP1099119B1 Signalling system |
| 05/20/2009 | DE202008016238U1 Prüfanordnung Test set |
| 05/20/2009 | DE19858757B4 Vorrichtung und Verfahren zum Komprimieren und Entkomprimieren von Musterdaten für ein Halbleiterprüfsystem Apparatus and method for compressing and decompressing data pattern for a semiconductor test system |
| 05/20/2009 | DE112007001435T5 Teststruktur und Messfühler für differentielle Signale Test structure and probe for differential signals |
| 05/20/2009 | DE10313365B4 Genauigkeitsbestimmung bei Bitleitungsspannungmessungen Accuracy in determination Bitleitungsspannungmessungen |
| 05/20/2009 | DE102008051079A1 Batterie-Lade-/Entladestrom-Erfassungsvorrichtung Battery charge / discharge current detection device |
| 05/20/2009 | DE102007054395A1 Anordnung zur Messung eines elektrischen Stromes Arrangement for measuring an electric current |
| 05/20/2009 | DE102007053295A1 Schaltungsanordnung und Verfahren zur Funktionsüberprüfung einer Logikschaltung in einer Schaltungsanordnung Circuit arrangement and method for functional verification of a logic circuit in a circuit |
| 05/20/2009 | DE102007052929A1 Schaltungsanordnung mit einer Akkumulatorkaskade Circuit with a battery cascade |
| 05/20/2009 | DE102006034754B4 Vorrichtung und Verfahren zum Testen eines Halbleiterbauelements und Eye-Mask-Generator Apparatus and method for testing a semiconductor device and Eye Mask Generator |
| 05/20/2009 | CN201243203Y Safety protection device for electric appliance |
| 05/20/2009 | CN201242800Y Theftproof system for power equipment and household equipment |
| 05/20/2009 | CN201242758Y Apparatus for managing non-contact type probe card |
| 05/20/2009 | CN201242592Y Gauge-clamp united calibration equipment for electric energy meter |
| 05/20/2009 | CN201242589Y Detection device for self-holding automatic detection machine of mobile phone battery build-in parameter |
| 05/20/2009 | CN201242588Y Switch test structure |
| 05/20/2009 | CN201242587Y Circuit test apparatus |
| 05/20/2009 | CN201242586Y Detection device for electrical leakage sensor printed circuit board |
| 05/20/2009 | CN201242585Y Test tools for server circuit board |
| 05/20/2009 | CN201242584Y Simple test pen for testing cable switching |
| 05/20/2009 | CN201242583Y Electrical leakage detection device |
| 05/20/2009 | CN201242582Y Test system for locating integrated circuit defect |
| 05/20/2009 | CN201242581Y Detection device for solid electrolyte capacitor |
| 05/20/2009 | CN201242580Y Automatic tester for capacitor |
| 05/20/2009 | CN201242579Y Automatic tester for capacitance |
| 05/20/2009 | CN201242578Y Identifier without zero alignment for semiconductor conductive types |
| 05/20/2009 | CN201242577Y Identifier for semiconductor conductive types |
| 05/20/2009 | CN201242576Y Detection circuit for cathode ear and anode ear of battery and detection device containing the same |
| 05/20/2009 | CN201242575Y 电缆测试终端 Cable testing terminal |
| 05/20/2009 | CN201242574Y Detector for electric car charger |
| 05/20/2009 | CN201242573Y Power supply system and isolating circuit apparatus |