| Patents for G01N 23 - Investigating or analysing materials by the use of wave or particle radiation not covered by group or , e.g. x-rays, neutrons (32,258) |
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| 07/20/2000 | WO2000041628A1 Progressive correction of computed tomography ring artifacts |
| 07/20/2000 | WO2000025268A3 Computerized tomography for non-destructive testing |
| 07/20/2000 | DE19901767A1 Verfahren und Vorrichtung zum Testen der Funktion einer Vielzahl von Mikrostrukturelementen Method and device for testing the function of a plurality of micro-structural elements |
| 07/19/2000 | EP1020732A2 Procedure and apparatus for testing the function of a multitude of active microstructure elements |
| 07/19/2000 | EP1019918A1 Computed tomography scanner drive system and bearing |
| 07/19/2000 | EP1019708A1 Ct target detection using surface normals |
| 07/19/2000 | EP1019707A1 Rotary energy shield for computed tomography scanner |
| 07/19/2000 | EP1019682A1 An arrangement and a method for measuring level, interface level and density profile of a fluid in tanks or containers |
| 07/19/2000 | CN1260485A Method for non-destructive quantitative detection of gallium arsenide monocrystal chemical mix proportion |
| 07/19/2000 | CN1260478A Measuring device for laser plasma parameters and its measurement method |
| 07/18/2000 | US6091840 Methods and apparatus for single slice helical image reconstruction in a computed tomography system |
| 07/18/2000 | US6091795 Area detector array for computer tomography scanning system |
| 07/18/2000 | US6091249 Method and apparatus for detecting defects in wafers |
| 07/18/2000 | CA2144422C Continuous elemental analysis of process flows |
| 07/13/2000 | WO2000040952A2 Device for the precision rotation of samples |
| 07/13/2000 | WO2000010761A3 Automated barrel panel transfer and processing system |
| 07/13/2000 | DE19900346A1 Präzisions-Probendrehvorrichtung Precision rotation of samples device |
| 07/13/2000 | DE10000365A1 Methods for semiconductor testing using low voltage particle beam by locking up second surface locks and first surface and comparing registered image with reference in order to identify faults in checked substrate |
| 07/13/2000 | DE10000364A1 Defect detection method for patterned substrates, intended for detection of defects in voltage contrast of semiconductor wafers obtained using electron microscopes |
| 07/12/2000 | EP1017986A1 A method of determining the density profile |
| 07/12/2000 | CN2387536Y Intelligence potassium detector |
| 07/11/2000 | US6088424 Apparatus and method for producing a picture-in-a-picture motion x-ray image |
| 07/11/2000 | US6087673 Method of inspecting pattern and apparatus thereof |
| 07/11/2000 | US6087665 Multi-layered scintillators for computed tomograph systems |
| 07/11/2000 | US6087659 Apparatus and method for secondary electron emission microscope |
| 07/06/2000 | WO2000039836A1 Sem for transmission operation with a location-sensitive detector |
| 07/06/2000 | WO2000039569A1 Nanotomography |
| 07/06/2000 | DE19846885A1 Radiography equipment for examination of insulated pipelines has X-ray or gamma ray source in movable frame to enable scanning of pipe |
| 07/05/2000 | EP1016863A1 High vacuum xafs measuring instrument |
| 07/05/2000 | EP1015913A1 System for rapid x-ray inspection of enclosures |
| 07/05/2000 | EP1015876A1 X-ray inspection apparatus |
| 07/05/2000 | EP1014856A1 X-ray image processing |
| 07/05/2000 | CN1259026A X-ray image processing |
| 07/04/2000 | US6084936 Almost-everywhere extrapolation from cone-beam data |
| 07/04/2000 | US6084243 Apparatus and method for containing radioactive sources |
| 07/04/2000 | US6084239 Electron microscope |
| 07/04/2000 | US6083755 Adding radioactive marker to soiling substance, measuring parameters, partially inserting object into substance, cleaning object, measuring parameters, calculating indicator of cleaning action; medical instruments, drug/food apparatus |
| 06/29/2000 | WO2000037929A1 X-ray fluorescent emission analysis to determine material concentration |
| 06/29/2000 | WO2000037928A2 Unilateral hand-held x-ray inspection apparatus |
| 06/29/2000 | WO2000037620A1 Crystalline form of activated trap and use thereof for structure-based drug design |
| 06/29/2000 | DE19963331A1 X-ray fluorescence spectroscopy apparatus has a detector for receiving and analyzing a fluorescence beam emanating from a predetermined target location on a sample as result of excitation by a primary X-ray beam |
| 06/29/2000 | DE19859877A1 Nanotomographie Nanotomography |
| 06/29/2000 | CA2355830A1 Crystalline form of activated trap and use thereof for structure-based drug design |
| 06/29/2000 | CA2355742A1 X-ray fluorescent emission analysis to determine material concentration |
| 06/28/2000 | EP1014078A2 Radiographic testing of an object having a cristal lattice |
| 06/28/2000 | EP1014077A2 Method of determining the structure of polycristaline solid samples |
| 06/28/2000 | EP1012587A1 Charged particle analysis |
| 06/28/2000 | EP1012586A2 A tomographic inspection system |
| 06/28/2000 | EP1012585A1 A method for analyzing characteristics of a moving object, such as a log |
| 06/28/2000 | CN1258000A X-ray intelligent stress analyzer |
| 06/27/2000 | US6081580 Tomographic inspection system |
| 06/27/2000 | US6081579 Structural parameter analyzing apparatus and analyzing method |
| 06/27/2000 | US6081577 Method and system for creating task-dependent three-dimensional images |
| 06/27/2000 | US6080986 Secondary ion mass spectrometer with aperture mask |
| 06/27/2000 | US6079876 X-ray exposure system for 3D imaging |
| 06/22/2000 | WO2000036630A1 Particle-optical apparatus involving detection of auger electrons |
| 06/22/2000 | WO2000036405A2 Apparatus and method for characterizing libraries of different materials using x-ray scattering |
| 06/22/2000 | WO2000036404A1 Radiographic control of an object having a crystal lattice |
| 06/22/2000 | WO2000036403A2 X-ray device. |
| 06/22/2000 | WO2000036371A1 X-ray diffractometer without manual intervention for determining thickness of multiple non-metallica crystalline layers, fourier-and average value zero transformations |
| 06/21/2000 | EP1009975A1 A method and apparatus for measuring oil effluent flow rates |
| 06/21/2000 | EP1009422A1 STRUCTURE OF THE ANKYRIN BINDING DOMAIN OF A ALPHA-Na,K-ATPase |
| 06/21/2000 | EP0800655B1 Method and device for evaluating at least one characteristic parameter of a body |
| 06/21/2000 | DE19836884C1 Bestimmung des Meßflecks bei der Röntgenfluoreszenzanalyse Determination of the measurement spot in the x-ray fluorescence analysis |
| 06/21/2000 | CN2384216Y Movable container detector |
| 06/20/2000 | US6078642 Apparatus and method for density discrimination of objects in computed tomography data using multiple density ranges |
| 06/20/2000 | US6078638 Pixel grouping for filtering cone beam detector data during 3D image reconstruction |
| 06/20/2000 | US6078174 Apparatus for measuring exchange force |
| 06/20/2000 | US6078045 Process for analysis of a sample |
| 06/15/2000 | WO2000035254A1 An x-ray examination apparatus having an object absorption dependent brightness control |
| 06/15/2000 | WO2000034774A1 Using hair to screen for breast cancer |
| 06/15/2000 | WO2000033740A1 X-ray examination apparatus and method for generating distortion-free x-ray images |
| 06/15/2000 | DE19856536A1 Differenzverfahren zur Kalibration von C-Bogen Röntgenanordnungen Difference method for the calibration of the C-arm X-ray devices |
| 06/15/2000 | DE19854939A1 Production of computer tomography images of body region having rest and movement phases by analyzing data obtained during period equal to period of motion and using for image reconstruction if obtained during rest phase |
| 06/15/2000 | CA2354134A1 Using hair to screen for breast cancer |
| 06/14/2000 | CN2383071Y Special probe for ash content measurer |
| 06/14/2000 | CN2383070Y Gamma ray pipeline detector |
| 06/14/2000 | CN2383069Y Car detector |
| 06/14/2000 | CN2383068Y Raw oil water content monitor |
| 06/14/2000 | CN2383067Y Container detector |
| 06/14/2000 | CN1256418A Platform driving method of electronic probe microanalyzer |
| 06/14/2000 | CN1256417A Scanning system for computing fault with stable light-beam position |
| 06/14/2000 | CN1256416A Solid dosage instrument capable of measuring total ionizing radiation dosage |
| 06/13/2000 | US6075245 High speed electron beam based system for testing large area flat panel displays |
| 06/08/2000 | WO2000033109A1 Fan and pencil beams from a common source for x-ray inspection |
| 06/08/2000 | WO2000033060A2 X-ray back scatter imaging system for undercarriage inspection |
| 06/08/2000 | WO2000033059A2 Multiple scatter system for threat identification |
| 06/08/2000 | WO2000033058A2 A nonintrusive inspection system |
| 06/08/2000 | DE19854947A1 Image reconstruction for spiral computer tomography apparatus by combining projections from different lines of detector elements |
| 06/08/2000 | DE19854917A1 Image reconstruction method for computer tomography apparatus by adding extrapolated measuring points so that sequence begins and ends with zero value points |
| 06/08/2000 | DE19854438A1 Image reconstruction method for computer tomography |
| 06/08/2000 | DE19853822A1 Electron tomographic method of nondestructive testing and reconstruction of three-dimensional structures in solid e.g. for semiconductor testing or medical applications |
| 06/07/2000 | EP1005640A1 Material discrimination using single-energy x-ray imaging system |
| 06/07/2000 | EP1005639A1 Apparatus and method for in-situ thickness and stoichiometry measurement of thin films |
| 06/07/2000 | EP1005638A1 X-ray determination of the mass distribution in containers |
| 06/07/2000 | EP1005631A2 Improved detector array geometry for helical scanning volumetric computed tomography system |
| 06/06/2000 | US6072855 Method and apparatus for acquiring image information for energy subtraction processing |
| 06/06/2000 | US6072854 Method and apparatus for X-ray topography of single crystal ingot |
| 06/06/2000 | US6072853 Material analysis |
| 06/06/2000 | US6072178 Sample analyzing apparatus |