| Patents for G01N 23 - Investigating or analysing materials by the use of wave or particle radiation not covered by group or , e.g. x-rays, neutrons (32,258) |
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| 04/05/2000 | CN1249446A X-ray tomograph system having view selector with prism |
| 04/04/2000 | US6047083 Method of and apparatus for pattern inspection |
| 04/04/2000 | US6047042 Automatic exposure and brightness control for fluoroscopic and radio-graphic imaging |
| 04/04/2000 | US6047041 Apparatus and method for comparison |
| 04/04/2000 | US6047039 Method for post-processing of a tomogram, and computed tomography apparatus operating in accordance with the method |
| 03/30/2000 | DE19843812A1 Computertomographie-Verfahren mit kegelförmigem Strahlenbündel Computed tomography method with conical radiation beam |
| 03/29/2000 | EP0989520A2 Computer tomography method with cone beam |
| 03/29/2000 | EP0989399A1 Apparatus and method for measuring crystal lattice strain |
| 03/29/2000 | CN1248697A Material high-precision weighing method and nucleon balance made by said method |
| 03/28/2000 | US6043486 Absolute standard reference materials for low-level concentration measurements |
| 03/23/2000 | WO2000016371A1 Beam-utilizing equipment |
| 03/23/2000 | WO2000016078A1 X-ray fluorescence elemental analyzer |
| 03/23/2000 | WO2000016077A1 Application of x-ray optics to energy dispersive spectroscopy |
| 03/23/2000 | WO2000015112A1 Reduced-angle mammography device and variants |
| 03/22/2000 | EP0987669A1 Method of authentication of works of art and apparatus for carrying out said method |
| 03/22/2000 | EP0987543A2 Holder for particle forming sample |
| 03/22/2000 | EP0987542A2 Rotating scanner system for reading multiple storage layer radiation screens |
| 03/22/2000 | EP0986766A1 Method and device for measuring the relative proportion of plutonium and uranium in a body |
| 03/22/2000 | EP0986745A1 Single beam photoneutron probe and x-ray imaging system for contraband detection and identification |
| 03/21/2000 | US6041132 Computed tomography inspection of composite ply structure |
| 03/21/2000 | US6041098 X-ray reflectometer |
| 03/21/2000 | US6041096 Method and apparatus for total reflection X-ray fluorescence spectroscopy |
| 03/21/2000 | US6041095 X-ray fluorescence analyzer |
| 03/21/2000 | US6040198 Element concentration measuring method and apparatus, and semiconductor device fabrication method and apparatus |
| 03/21/2000 | US6039804 Crystallization tray |
| 03/16/2000 | WO2000014519A1 Chemical analysis of defects using electron appearance spectroscopy |
| 03/16/2000 | WO2000014311A1 Crystallization tray |
| 03/16/2000 | WO2000014105A1 Modifications of the vegf receptor-2 protein and methods of use |
| 03/16/2000 | DE19839872A1 Measuring system used for micro-characterization of the near-surface region of the solid samples has an integral electron filter between the sample and detector |
| 03/16/2000 | CA2340598A1 Modifications of the vegf receptor-2 protein and methods of use |
| 03/15/2000 | EP0985926A2 Method and apparatus for analyzing samples using x-ray spectroscopy |
| 03/15/2000 | EP0984722A1 Electromagnetical imaging and therapeutic (emit) systems |
| 03/15/2000 | CN1247687A Phase retrieval in phase contrast imaging |
| 03/15/2000 | CN1247447A X-ray device |
| 03/15/2000 | CN1050426C Method for measurement of moving ability and composition of calculus |
| 03/14/2000 | US6038282 X-ray imaging system |
| 03/14/2000 | US6038280 Method and apparatus for measuring the thicknesses of thin layers by means of x-ray fluorescence |
| 03/14/2000 | US6038018 Substrate inspecting apparatus, substrate inspecting system having the same apparatus and substrate inspecting method |
| 03/14/2000 | US6037597 Non-destructive detection systems and methods |
| 03/14/2000 | US6037588 Method for testing semiconductor device |
| 03/08/2000 | EP0984302A1 Method and apparatus for X-ray examination of luggage |
| 03/08/2000 | EP0984272A2 System and method for using precalculated strips in calculating scatter radiation |
| 03/08/2000 | EP0983685A2 Image pick-up apparatus including a correction unit |
| 03/08/2000 | EP0776473B1 Rotating scanner system for reading multiple storage layer radiation screens |
| 03/08/2000 | EP0766518B1 Cigarette manufacture |
| 03/08/2000 | CN1246921A Device for inspecting bearings of main motors of rolling stock |
| 03/08/2000 | CN1246647A Multifunctional industrial X-ray imaging system |
| 03/07/2000 | US6035227 System and method for identifying malformation of a hip in a human or animal subject |
| 03/07/2000 | US6035014 Multiple-stage apparatus and method for detecting objects in computed tomography data |
| 03/02/2000 | WO2000011457A1 Ion implantation dosimetry method and apparatus |
| 03/02/2000 | WO2000011456A1 Inspection of containers |
| 03/02/2000 | WO2000011455A1 Digital radiographic weld inspection system |
| 03/02/2000 | WO2000010761A2 Automated barrel panel transfer and processing system |
| 03/01/2000 | EP0982683A2 Methods and apparatus for monitoring detector image quality |
| 03/01/2000 | EP0982579A1 Devices for inspecting bearings of main motors of rolling stock |
| 03/01/2000 | EP0981995A2 Computer tomograph with conical beam and helical source trajectory |
| 03/01/2000 | CN1245895A Position sensitive X-ray spectrograph using whole X-ray lens |
| 02/29/2000 | US6031893 Stray radiation grid |
| 02/29/2000 | US6031235 Ultra-high vacuum apparatus |
| 02/24/2000 | WO2000010020A1 Method for measuring two-dimensional potential distribution in cmos semiconductor components |
| 02/24/2000 | WO2000010012A2 Device and process for investigating chemical interactions |
| 02/24/2000 | DE19836588A1 Method for testing quality of cast conducting structures |
| 02/24/2000 | DE19833524A1 X-ray analytical device for nondestructive testing of powder and liquid specimens; has graded multilayer Bragg reflector with specific characteristics |
| 02/23/2000 | EP0980520A1 Process and circuitry for inspecting welding points |
| 02/22/2000 | US6028913 X-ray examination apparatus including an image sensor matrix with a correction unit |
| 02/22/2000 | US6028912 Apparatus and method for point reconstruction and metric measurement on radiographic images |
| 02/22/2000 | US6028911 X-ray analyzing apparatus with enhanced radiation intensity |
| 02/22/2000 | US6028910 High resolution areal tomosynthesis |
| 02/17/2000 | WO2000008653A1 X-ray examination apparatus having an adjustable x-ray filter |
| 02/17/2000 | WO2000008450A1 Sample changer for transferring radioactive samples between a hot cell and a measuring apparatus |
| 02/17/2000 | DE19931298A1 X-ray fluorescence analysis of thin film structure comprises irradiating with primary X-ray beam to produce hard and soft secondary radiation which is measured and calculating e.g. thickness of chemical elements |
| 02/17/2000 | DE19837490A1 Method to measure two-dimensional potential distribution in CMOS semiconductor element and determine two-dimensional doping distribution, uses electron holography to measure phase of electron wave in transmission electron microscope |
| 02/17/2000 | CA2339645A1 Sample changer for transferring radioactive samples between a hot cell and a measuring apparatus |
| 02/16/2000 | CN2364459Y X-ray detector |
| 02/16/2000 | CN1244658A Detection method and detector utilizing slow-scanning CCD ray image |
| 02/16/2000 | CN1049496C Device and method for determinating X-ray residual stress |
| 02/15/2000 | US6026171 Apparatus and method for detection of liquids in computed tomography data |
| 02/15/2000 | US6026143 Apparatus and method for detecting sheet objects in computed tomography data |
| 02/15/2000 | US6025598 Radiation photographic apparatus |
| 02/10/2000 | WO2000006999A1 Examining the orientation of the lattice of a crystal |
| 02/10/2000 | WO1999045389A3 Ligand screening and design by x-ray crystallography |
| 02/10/2000 | DE19835296A1 Computer tomography device with conical radiation beam and helical scan path; has defined geometric arrangement of radiation source to edges of detection window, to form relative motion helix |
| 02/10/2000 | DE19834457A1 X-ray arrangement, especially for computer tomograph |
| 02/10/2000 | DE19833919A1 High-efficiency, photoconductor-based, circular-array X-ray detector, avoids inefficiencies associated with scintillation detectors, to form compact unit suitable for use in medical tomography or transport security |
| 02/10/2000 | CA2339109A1 Examining the orientation of the lattice of a crystal |
| 02/10/2000 | CA2279778A1 System and method for using precalculated strips in calculating scatter radiation |
| 02/08/2000 | US6023497 Apparatus for detecting foreign matter with high selectivity and high sensitivity by image processing |
| 02/08/2000 | US6023496 X-ray fluorescence analyzing apparatus |
| 02/08/2000 | US6023494 Methods and apparatus for modifying slice thickness during a helical scan |
| 02/08/2000 | CA2199945C X-ray emitting interstitial implants |
| 02/03/2000 | WO2000005876A1 X-ray examination apparatus with a high-resolution image sensor |
| 02/03/2000 | WO2000004830A1 Creating task-dependent three-dimensional images |
| 02/02/2000 | EP0977219A2 Electric double layer capacitor and electrode therefor |
| 02/02/2000 | EP0975953A1 Device for inspecting test objects and the use thereof |
| 02/02/2000 | CN1243246A Container inspection adapting single area array type detector and alternative-gating light source |
| 02/02/2000 | CN1049049C Helium leak detector |
| 01/27/2000 | WO2000004579A1 Process for mapping metal contaminant concentration on a silicon wafer surface |
| 01/27/2000 | WO2000004376A1 Imaging plate x-ray diffraction apparatus |
| 01/27/2000 | DE19842797C1 Holder for crystalline samples and especially protein crystals |
| 01/26/2000 | EP0974149A1 High resolution x-ray imaging of very small objects |