| Patents for G01B 9 - Instruments as specified in the subgroups and characterised by the use of optical measuring means (14,810) |
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| 01/28/2009 | EP2018546A1 Method of assessing bond integrity in bonded structures |
| 01/28/2009 | CN201187995Y Length detection apparatus |
| 01/28/2009 | CN101354477A Focusing lens for dual-wavelength OCT system |
| 01/28/2009 | CN100456080C Constant-offset collimated output beam splitter |
| 01/28/2009 | CN100455987C Three-dimensional on-line measuring method and system using synthesis wave to interfere whole-field nano surface |
| 01/28/2009 | CN100455986C Beam-scanning interference type nano surface tri-dimensional on-line measuring system and method |
| 01/28/2009 | CN100455985C Transverse shearing interferometer agglutination checking method |
| 01/27/2009 | US7483146 Systems configured to provide illumination of a specimen or to inspect a specimen |
| 01/27/2009 | US7483145 Simultaneous phase shifting module for use in interferometry |
| 01/27/2009 | US7483144 Apparatus and method for resonant chemical and biological sensing |
| 01/27/2009 | US7483143 Method and apparatus for conducting heterodyne frequency-comb spectroscopy |
| 01/27/2009 | US7483142 Security systems and monitoring methods using quantum states |
| 01/27/2009 | US7481944 Etch amount detection method, etching method, and etching system |
| 01/22/2009 | WO2009012207A1 Generating model signals for interferometry |
| 01/22/2009 | WO2009011356A1 Measurement method, stage apparatus, and exposure apparatus |
| 01/22/2009 | WO2009010750A1 Improved interferometer |
| 01/22/2009 | US20090024360 Determination of chemical or pysical properties of sample or component of a sample |
| 01/22/2009 | US20090022463 Imaging system and related techniques |
| 01/22/2009 | US20090021748 Method and system for wavefront measurements of an optical system |
| 01/22/2009 | US20090021746 Tomography apparatus |
| 01/22/2009 | US20090021745 Optical Coherence Tomography Device and Measuring Head |
| 01/22/2009 | US20090021726 Device and method for the optical measurement of an optical system by using an immersion fluid |
| 01/22/2009 | DE102007039556B3 Optische Mikrosonde Optical microprobe |
| 01/21/2009 | EP2015669A2 Processes, arrangements and systems for providing frequency domain imaging of a sample |
| 01/21/2009 | EP1716388A4 Method of full-color optical coherence tomography |
| 01/21/2009 | EP1664931B1 Surface triangulation and profiling |
| 01/21/2009 | CN101349540A Image regulating method and image viewfinding apparatus |
| 01/21/2009 | CN100453965C Conformity interference scan method |
| 01/20/2009 | US7480060 Interferometric optical position encoder employing spatial filtering of diffraction orders for improved accuracy |
| 01/20/2009 | US7480058 Fourier-domain optical coherence tomography imager |
| 01/20/2009 | US7480057 Interferometric device |
| 01/20/2009 | US7480056 Multi-pulse heterodyne sub-carrier interrogation of interferometric sensors |
| 01/20/2009 | US7480055 Two-beam interferometer for fourier transform spectroscopy with double pivot scanning mechanism |
| 01/15/2009 | WO2009009801A1 Apparatus and methods for uniform frequency sample clocking |
| 01/15/2009 | WO2009006919A1 Method of measuring a deviation an optical surface from a target shape |
| 01/15/2009 | WO2009006914A1 Method of measuring a deviation of an actual shape from a target shape of an optical surface |
| 01/15/2009 | WO2008017005A3 Sloping electrodes in a spatial light modulator |
| 01/15/2009 | WO2007001308A3 Laser and environmental monitoring system |
| 01/15/2009 | US20090015844 Interferometry Method for Ellipsometry, Reflectometry, and Scatterometry Measurements, Including Characterization of Thin Film Structures |
| 01/15/2009 | US20090015842 Phase Sensitive Fourier Domain Optical Coherence Tomography |
| 01/15/2009 | US20090015821 Scatterometry target and method |
| 01/15/2009 | DE102007032446A1 Method for the interferometric determination of an optical wavelength between the surface of an object and a reference surface comprises directing the coherent electromagnetic wave front onto the surface of the object |
| 01/14/2009 | EP2013570A1 Method and apparatus for recording of images and study of surfaces |
| 01/14/2009 | EP1809162A4 Optical apparatus and method for comprehensive eye diagnosis |
| 01/14/2009 | EP1805480B1 Method and device for detecting the contour data and/or optical characteristics of a three-dimensional semi-transparent object |
| 01/14/2009 | EP1527317A4 Fringe pattern discriminator for grazing incidence interferometer |
| 01/14/2009 | CN101346673A Method and apparatus for analysis of a sample of cells |
| 01/14/2009 | CN101344375A High resolution heterodyne laser interference system and method for improving definition |
| 01/14/2009 | CN100451694C Optical sensor using low-coherence interferometry |
| 01/14/2009 | CN100451580C Wavefront-measuring interferometer apparatus, and light beam measurement apparatus and method thereof |
| 01/14/2009 | CN100451536C Quasi-common path type feedback interferometer of laser in microchip |
| 01/14/2009 | CN100451535C Phase-shift interference image information processing system and processing method thereof |
| 01/13/2009 | US7477399 Inner surface measuring apparatus |
| 01/13/2009 | US7477398 Multi-beam heterodyne laser doppler vibrometer |
| 01/13/2009 | US7477366 Contact lens blister packages and methods for automated inspection of hydrated contact lenses |
| 01/13/2009 | US7477362 Moiré interferometric strain sensor |
| 01/08/2009 | WO2007103082A3 Interferometry systems and methods of using interferometry systems |
| 01/08/2009 | US20090012404 Electronically Scanned Optical Coherence Tomography With Frequency Modulated Signals |
| 01/08/2009 | US20090009772 Optical measuring apparatus and optical measuring method |
| 01/08/2009 | US20090009771 Diffraction grating based interferometric systems and methods |
| 01/08/2009 | DE102008001448A1 Aberration measuring method for optical imaging system, involves illuminating object structure, producing image output in image plane, and carrying out sequential wavelength-selective measuring of wave front of image output |
| 01/08/2009 | DE102007030814A1 Optical arrangement e.g. surface sensor, for depth discrimination for performing topographic measurements, has etalon with better transmission or reflection in measurement areas than areas, which are deviated from measurement areas |
| 01/07/2009 | EP2010861A2 Bandwidth measuring device for high pulse repetition rate pulsed laser |
| 01/07/2009 | EP1391718B1 Optical coherence tomography device |
| 01/07/2009 | CN101339002A Large angle Michelson type shearing speckle interferometer |
| 01/07/2009 | CN100449300C Device and method for determining the chromatic dispersion of optical components |
| 01/07/2009 | CN100449260C Method for precision measuring space offset of telephotolens and eyepiece using interferometer |
| 01/07/2009 | CN100449257C A method for determining material interfacial and metrology information of a sample using atomic force microscopy |
| 01/07/2009 | CN100449256C Clamp device for optical plug and interferometer comprising same |
| 01/07/2009 | CN100449255C Interferometer comprising a mirror assembly for measuring an object to be measured |
| 01/06/2009 | US7474413 Method and apparatus for analyzing interference fringe |
| 01/06/2009 | US7474412 Etalon device and manufacturing method thereof |
| 01/06/2009 | US7474411 System and method to reduce laser noise for improved interferometric laser ultrasound detection |
| 01/06/2009 | US7474409 Lithographic interferometer system with an absolute measurement subsystem and differential measurement subsystem and method thereof |
| 01/06/2009 | US7474408 Low coherence interferometry utilizing phase |
| 01/06/2009 | US7474407 Optical coherence tomography with 3d coherence scanning |
| 01/06/2009 | US7474405 Miniature Fourier transform spectrophotometer |
| 01/02/2009 | DE19814057B4 Anordnung zur optischen Kohärenztomographie und Kohärenztopographie Arrangement for optical coherence tomography and coherence topography |
| 01/02/2009 | DE102007029822A1 Interferometer for linear measurements, comprises light source for emitting coherent light, and detectors for measuring intensity of light, where interferometer is standing wave interferometer |
| 01/01/2009 | US20090003789 Imaging system and related techniques |
| 01/01/2009 | US20090003765 Imaging system and related techniques |
| 01/01/2009 | US20090002717 Condition assessment system for a structure including a semiconductor material |
| 01/01/2009 | US20090002716 Laser scanning interferometric surface metrology |
| 01/01/2009 | US20090002714 Optical Device Comprising a Cantilever and Method of Fabrication and Use Thereof |
| 01/01/2009 | US20090002713 Optical Coherence Tomography System |
| 01/01/2009 | US20090002712 Passively biased fiber-optic gyroscope and current sensor |
| 01/01/2009 | US20090002663 Projection illumination system |
| 12/31/2008 | CN201173770Y Bridge deformation detection device |
| 12/31/2008 | CN100447524C Light intensity ratio adjustment filter for an interferometer, interferometer, and light interference measurement method |
| 12/30/2008 | US7471399 Photosensing optical cavity output light |
| 12/30/2008 | US7471398 Method for measuring contour variations |
| 12/30/2008 | US7471397 Position-measuring device |
| 12/30/2008 | US7471396 Dual polarization interferometers for measuring opposite sides of a workpiece |
| 12/30/2008 | US7471372 Exposure apparatus and production method of device using the same |
| 12/30/2008 | US7469454 Mounting system for optical frequency reference cavities |
| 12/25/2008 | US20080318345 Plasma ion implantation process control using reflectometry |
| 12/25/2008 | US20080317084 Laser Interferometer Mirror Assembly |
| 12/25/2008 | US20080316575 Aberration correction of optical traps |
| 12/25/2008 | US20080316500 Methods of testing and manufacturing optical elements |
| 12/25/2008 | US20080316498 Apparatus and method for two wave mixing (twm) based ultrasonic laser testing |