Patents for G01B 11 - Measuring arrangements characterised by the use of optical means (73,862)
10/1999
10/26/1999US5973786 Method for absolutely measuring the diffraction grating spacing and apparatus thereof
10/26/1999US5973785 Method of forming light beam, apparatus therefor, method of measuring sizes using the same, method of inspecting appearance, method of measuring height, method of exposure, and method of fabricating semiconductor integrated circuits
10/26/1999US5973784 Common path, interferometric systems and methods using a birefringent material for topographic imaging
10/26/1999US5973776 Surface inspection apparatus
10/26/1999US5973320 Optical position sensor
10/26/1999US5973317 Washer having fiber optic Bragg Grating sensors for sensing a shoulder load between components in a drill string
10/26/1999US5971782 Connector with a steering angle sensor and column structure using the same
10/26/1999US5971608 Apparatus for inspecting bump junction of flip chips and method of inspecting the same
10/26/1999US5971586 Identifying causes of semiconductor production yield loss
10/21/1999WO1999053271A1 Method for determining the profile of a material surface by point-by-point scanning according to the auto-focussing principle, and coordinate-measuring device
10/21/1999WO1999053270A1 Planar light beam orientation device
10/21/1999WO1999053269A1 Method and arrangement for measuring the structures of an object
10/21/1999WO1999053268A1 Method and arrangement for determining the geometry of objects using a coordinate measuring device
10/21/1999WO1999023464A9 Apparatus and method for determining axial stability
10/21/1999DE19817006A1 Photo-electric detection of weft or wales in fabrics by rotary or oscillating scanning
10/21/1999DE19816706A1 Determining dimensions of building or part of building which are needed for carrying manual craft work at building or part of building
10/21/1999DE19816270A1 Verfahren und Anordnung zur Erfassung der Geometrie von Gegenständen mittels eines Koordinatenmeßgeräts Method and apparatus for detecting the geometry of objects by means of a coordinate
10/21/1999CA2327788A1 Planar light beam orientation device
10/20/1999EP0950881A2 Method and device for automatically positioning samples relative to an ellipsometer
10/20/1999EP0950168A1 Optoelectronic system using spatiochromatic triangulation
10/20/1999EP0770219B1 An optical measurement method and apparatus
10/20/1999CN2344751Y Electric digital display band tape and electric electronic calculator combined band tape
10/20/1999CN1232171A Spherical method for measuring thickness of film
10/19/1999US5970168 Fourier filtering mechanism for inspecting wafers
10/19/1999US5969823 Dimensioning system
10/19/1999US5969822 Arbitrary-geometry laser surface scanner
10/19/1999US5969821 Optical waveguide probe and optical system and atomic force microscope using the optical waveguide probe
10/19/1999US5969819 Measuring surface flatness using shadow moire technology and phase-stepping image processing
10/19/1999US5969817 Precision indexing angle measuring method and system for machine tools
10/19/1999US5969372 Film scanner with dust and scratch correction by use of dark-field illumination
10/19/1999US5969371 Method and apparatus for finding media top-of-page in an optical image scanner
10/19/1999US5969246 Apparatus and method for determining axial stability
10/19/1999US5968690 Thin film thickness and optimal focus measuring using reflectivity
10/19/1999US5967033 Method of determining ink coverage in a print image
10/14/1999WO1999052094A1 Wireless optical instrument for position measurement and method of use therefor
10/14/1999WO1999051969A1 A method and system for monitoring or scanning an object, material or the like
10/14/1999WO1999051967A1 Method and device for measuring concentration of absorbing component of scattering/absorbing body
10/14/1999WO1999051939A1 Contact detecting probe with light barrier
10/14/1999WO1999051938A1 Interferometrical, optical retroreflection with low coherence source
10/14/1999WO1999051937A1 Position measuring device
10/14/1999WO1999041568A9 Laser scanner measurement system
10/14/1999DE19914994A1 Surface inspection method for detecting contamination on integrated circuit (IC)
10/14/1999DE19911419A1 Area sensor for determining dimensions of object having varying profile and degree of reflection
10/14/1999DE19816272A1 Verfahren und Anordnung zur Messung von Strukturen eines Objekts Method and apparatus for measuring structures of an object
10/14/1999CA2324112A1 A method and system for monitoring or scanning an object, material or the like
10/13/1999EP0949482A2 Measuring sidewall thickness of glass containers
10/13/1999EP0949480A2 Measuring device for saw blades
10/13/1999EP0948760A1 Method for calibrating the initial position and the orientation of one or several mobile cameras
10/13/1999CN1231724A Method for increasing the significance of tridimensional measuring of objects
10/13/1999CN1045559C Industrial module and a device for measuring movements relative to the said module
10/12/1999US5966677 High accuracy particle dimension measurement system
10/12/1999US5966482 Optical near-field probe and process for its manufacture
10/12/1999US5966472 Method for automatic recognition of a concavity or convexity
10/12/1999US5966216 For use in aligning a mask and wafer in lithography
10/12/1999US5966214 Gauge for measuring glass thickness and glass pane spacing
10/12/1999US5966213 Method and apparatus for measuring the surface shape of a golf ball
10/12/1999US5966195 Method of determining cell thickness and twist angle parameters of liquid crystal cell
10/12/1999US5964980 Fitted endpoint system
10/12/1999US5964643 Apparatus and method for in-situ monitoring of chemical mechanical polishing operations
10/12/1999CA2048326C Method and device for photoelectric identification of a material web
10/10/1999CA2267873A1 Measuring sidewall thickness of glass containers
10/07/1999WO1999044096A3 Aperture coded camera for three-dimensional imaging
10/07/1999WO1999038033A8 General asphere-conic conformal optical windows
10/07/1999DE19909518A1 Position detection method of stacked flat material, especially paper stack at input of printing machine
10/07/1999DE19839287A1 Method to determine position of edge of rolled metal band
10/07/1999DE19823942C1 Coplanarity testing method e.g. for row of contacts of SMD
10/07/1999DE19820536C1 Body surface test arrangement esp. for inspection of paint surface of vehicle
10/07/1999DE19815241A1 Positionsmeßeinrichtung A position
10/07/1999DE19815201A1 Meßanordnung zur Erfassung von Dimensionen von Prüflingen, vorzugsweise von Hohlkörpern, insbesondere von Bohrungen in Werkstücken, sowie Verfahren zur Messung solcher Dimensionen A measuring arrangement for the detection of dimensions of specimens, preferably hollow bodies, in particular of bores in workpieces, as well as methods for measuring such dimensions
10/07/1999DE19814779A1 Verfahren und Vorrichtung zum Steuern eines beweglichen Gegenstandes Method and apparatus for controlling a moving object
10/07/1999DE19814057A1 Spectral interferometric optical tomography device
10/07/1999DE19812911A1 Verfahren und Vorrichtung zum Vermessen eines Zweiradrahmens Method and apparatus for measuring a bicycle frame
10/07/1999DE19811105A1 Axial measuring probe for automated measuring of industrially manufactured product
10/07/1999DE19750984C1 Profile control arrangement for object on pallet transported on conveyor belt
10/06/1999EP0947898A2 Method and device for controlling a movable object
10/06/1999EP0947828A2 Method and apparatus for improved inspection measurements
10/06/1999EP0947802A2 Measurement arrangement for test pieces dimensions detection,preferably hollow bodies,in particular for bores in workpieces,as well as measurement method for such dimensions
10/06/1999EP0946883A1 Method and device to measure and check workpieces
10/06/1999EP0946857A1 Method and device for wheel alignment
10/06/1999EP0946856A1 Apparatus and method for rapid 3d image parametrization
10/06/1999EP0789832B1 Process and device for the optical inspection of products
10/06/1999CN2342381Y Detection microscope special for screen display four-ball tester
10/05/1999US5963781 Technique for determining semiconductor substrate thickness
10/05/1999US5963660 Method and apparatus for detecting and measuring laps and gaps in composite materials
10/05/1999US5963331 Shape input device
10/05/1999US5963329 Method and apparatus for measuring the profile of small repeating lines
10/05/1999US5963328 Surface inspecting apparatus
10/05/1999US5963316 Method and apparatus for inspecting a surface state
10/05/1999US5963310 Surface imaging skin friction instrument and method
10/05/1999US5961713 Method for manufacturing a wafer having a microdefect-free layer of a precisely predetermined depth
10/05/1999CA2148113C Product discrimination system and method therefor
09/1999
09/30/1999WO1999049280A1 Method for determining the spatial and rotational positions of an object
09/30/1999WO1999049278A1 An arrangement and a method for gauging a distance between surfaces of an object
09/30/1999WO1999049277A1 An optical sensor system for incorporation in a conveyor system and a method for determining the geometry and/or angular position of a moving object
09/30/1999WO1999026052A3 Automatic lens inspection system
09/30/1999DE19913139A1 System for measuring relative momentum between two objects
09/30/1999DE19813318A1 Determining angular setting of element swivellable about axis of rotation especially throttle flap or throttle valve shaft
09/30/1999DE19812842A1 System for determining steering wheel revolutions with transmitting elements arranged at steering wheel reflecting or self transmitting several IR or electromagnetic beams
09/30/1999DE19811460A1 Shape measurement unit for precise measuring or testing accuracy of shape or deviation of workpiece surface
09/30/1999DE19800441A1 Vorrichtung zum Ermitteln des Auftreffpunktes von Wurfpfeilen auf einer Zielscheibe Apparatus for determining the impact point of throwing arrows at a target