Patents
Sitemap › G01 - Measuring; Testing › G01B - Measuring length, thickness or similar linear dimensions; Measuring angles; Measuring areas; Measuring irregularities of surfaces or contours › G01B 11 - Measuring arrangements characterised by the use of optical means
Patents for G01B 11 - Measuring arrangements characterised by the use of optical means (73,862)
12/1999
12/29/1999EP0967458A2 Opto-electronic sensor
12/29/1999EP0967457A2 System and method for optically measuring dielectric thickness in semiconductor devices
12/29/1999EP0967456A2 Automated measurements and visualization system
12/29/1999EP0966651A1 Non-contact position sensor
12/29/1999CN2356315Y Laser ring scanning flatness measurer
12/29/1999CN1047842C Method and device for detecting position for crease line of packaging web
12/29/1999CN1047841C Combined interferometer and refractometer
12/28/1999US6009189 Apparatus and method for making accurate three-dimensional size measurements of inaccessible objects
12/28/1999US6008904 Apparatus and methods for detecting and correcting distortion of interference fringes
12/28/1999US6008901 Shape measuring heterodyne interferometer with multiplexed photodetector aaray or inclined probe head
12/28/1999US6008890 Positioning system for the arm of ore car turning equipment
12/28/1999US6008503 Oxide film thickness standards
12/28/1999US6007996 In situ method of analyzing cells
12/28/1999US6007034 Device for the attachment of a sensor
12/28/1999US6006608 Method and apparatus for examining the mechanical-dynamical properties of a workpiece
12/23/1999WO1999066286A1 Ellipsometric method and control device for making a thin-layered component
12/23/1999DE19827140A1 Laser-scanning microscope with an AOTF
12/23/1999DE19825829A1 Verfahren zur Bestimmung der Lage P eines Strukturelementes auf einem Substrat A method for determining the position P of a structure element on a substrate
12/23/1999DE19824107A1 Tastschnittverfahren sowie Anordnung zur Messgrößenbestimmung einer Oberfläche eines Prüflings nach dem Tastschnittverfahren Profile method and arrangement for measuring sizing a surface of a test specimen by the profile method
12/22/1999EP0965843A1 Displacement measuring apparatus
12/22/1999EP0965836A1 Inspection of container mouth using infrared energy emitted by the container bottom
12/22/1999EP0965817A1 Optical characterisation method of a rail track along which a guided vehicle travels
12/22/1999EP0965816A2 Device to measure the geometrical contour of an object
12/22/1999EP0965036A1 Standard for calibrating and checking a surface inspection device and method for the production thereof
12/22/1999EP0871940A4 Locating shapes in two-dimensional space curves
12/22/1999EP0828990B1 Dimensioning system
12/22/1999CN1239070A Anti-two block device using non-contact measuring and detecting devices
12/21/1999US6005959 Produce size recognition system
12/21/1999US6005669 Non contact measuring method for three dimensional micro pattern in measuring object
12/21/1999US6004187 Method and apparatus for measuring film thickness and film thickness distribution during polishing
12/21/1999US6003340 Method of putting a bend into a fiber to make a strain sensor
12/16/1999WO1999064882A1 Measuring and compensating for warp in the inspection of printed circuit board assemblies
12/16/1999WO1999064818A1 Method and device for positioning an object with respect to a reference direction
12/16/1999WO1999064817A1 Interferometer
12/16/1999WO1999064816A1 Method and device for optoelectric acquisition of shapes by axial illumination
12/16/1999WO1999064815A1 Method for determining the distance p of an edge of a structural element on a substrate
12/16/1999DE19925889A1 Light beam scanner for two-dimensional scanning of object e.g. using laser beam, for measuring gap between vehicles
12/16/1999DE19925413A1 Focal position detector of welding laser
12/16/1999DE19836192C1 Optical testing of dimensional accuracy in flat laminated pieces
12/15/1999EP0964251A1 Optical waveguide probe and its manufacturing method
12/15/1999EP0963849A2 Method for inspecting the liquid discharge condition of liquid jet head, and apparatus for inspecting liquid discharge condition
12/15/1999EP0963548A1 Inspection method
12/15/1999EP0963541A1 Variable pitch grating for diffraction range finding system
12/15/1999EP0963540A1 System and method for laser ultrasonic bond integrity evaluation
12/15/1999EP0781396B1 Method for the correlation of three dimensional measurements obtained by image capturing units and system for carrying out said method
12/15/1999CN1238840A Method for telemeasuring and telemeter
12/15/1999CN1238836A Process and device for determining the cell density of honeycombed body, in particular for exhaust fume catalytic converter
12/15/1999CN1238461A Method and apparatus for reducing measurement error for inspection measurements
12/15/1999CN1047439C Searching unit for three-D measurement
12/15/1999CN1047438C Method for automatic compensation of measuring error due to linear bar inclination
12/14/1999US6002656 Device for inspecting the surface of disc-shaped recording medium
12/14/1999US6002485 Multivariable measuring ellipsometer method and system
12/14/1999US6002484 Phase contrast aberroscope
12/14/1999US6002473 Optical level and square
12/14/1999US6002125 Product scanning apparatus and method using a plurality of eight sensors over the entire width of a background surface means
12/14/1999US6001998 Macrocyclic lactone compounds and their production process
12/14/1999US6001445 A transparent glass or glass-ceramic comprising silica and oxides of sodium, potassium and/or lithium, having electric resistivity and low abrasion; a hard disk for a computer
12/14/1999US6000996 Grinding process monitoring system and grinding process monitoring method
12/14/1999US6000801 Multi-color laser projector for optical layup template and the like
12/09/1999WO1999063304A1 Apparatus and methods for surface contour measurement
12/09/1999WO1999063303A1 Differential curvature transducer
12/09/1999WO1999063302A1 Compensation for measurement uncertainty due to atmospheric effects
12/09/1999WO1999063301A1 System for measuring structures of an object
12/09/1999WO1999063300A1 Methods and apparatus for confocal interference microscopy using wavenumber domain reflectometry and background amplitude reduction and compensation
12/09/1999WO1999063299A1 Feeling method and a device for determining the surface characteristics of a test piece according to the feeling method
12/09/1999DE19822392A1 Method to determine three-dimensional coordinates of defect on surface of another object, for use in quality control
12/09/1999CA2334037A1 Compensation for measurement uncertainty due to atmospheric effects
12/09/1999CA2331017A1 Differential curvature transducer
12/08/1999EP0962746A2 Procedure and device to verify the alignment of two axles
12/08/1999EP0962745A1 Three-dimensional shape measurement device and three-dimensional engraver using the measurement device
12/08/1999EP0962744A1 Differential curvature transducer
12/08/1999EP0962685A1 Valve arrangement
12/08/1999EP0961928A1 Method of scanning semiconductor wafers to inspect for defects
12/08/1999EP0961915A1 Thickness measuring apparatus
12/08/1999EP0815411B1 Process and device for determining three-dimensional structures in the submicron range
12/08/1999CN2352922Y Laser three direction linear measuring device
12/08/1999CN2352921Y Semiconductor laser coordinates of cross instrument for measuring linear dimensions
12/07/1999US5999840 System and method of registration of three-dimensional data sets
12/07/1999US5999267 Nondestructive optical techniques for simultaneously measuring optical constants and thicknesses of single and multilayer films
12/07/1999US5999266 Method for inspecting height, and a height inspection apparatus to carry out the method
12/07/1999US5999265 System for measuring gap and mismatch between opposing parts
12/07/1999US5999264 On-the-fly optical interference measurement device, machining device provided with the measurement device, and machine tool suited to on-the-fly optical measurement
12/07/1999US5999252 Method for marking workpieces
12/07/1999US5999249 Position detecting element and range sensor
12/07/1999US5999005 Voltage and displacement measuring apparatus and probe
12/07/1999US5998801 Surface position detecting method, surface position adjusting apparatus and projection exposure apparatus effecting accurate positioning of a substrate
12/02/1999WO1999062313A2 Method and device for checking the oblique position or coplanarity of a contact bank of smd components
12/02/1999WO1999061948A1 Range finder and camera
12/02/1999WO1999061893A1 Method and device for measuring internal characteristic distribution of scattering/absorbing body
12/02/1999WO1999061867A1 An apparatus and method for measuring a property of a structure comprising at least one layer
12/02/1999WO1999061866A1 Apparatus and method for measuring a property of a structure
12/02/1999WO1999061706A1 Surface treatment shape evaluation system and surface treatment shape
12/02/1999WO1999061247A1 Engraving system and method comprising improved imaging
12/02/1999WO1999047885A3 Product scanning system and method
12/02/1999WO1999046603B1 Optical translation measurement
12/02/1999DE19924583A1 Infrared (IR) spectroscopy inspection of semiconductor wafers
12/02/1999DE19821800A1 CCD camera quality checking system for products employing plan and side view image processing
12/02/1999DE19821059A1 Determining shape deviations of objects, especially objects with diffusely reflecting surfaces
12/01/1999EP0961103A1 Position measuring apparatus and optical deflection angle measuring apparatus for underground excavators
12/01/1999EP0961101A2 Device for measuring rotation angle of rotary element by unit angles grouped for five units
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