Patents for G01B 11 - Measuring arrangements characterised by the use of optical means (73,862)
05/2000
05/17/2000EP1001087A1 Surface treatment shape evaluation system and surface treatment shape
05/17/2000EP1000890A2 Device for measuring thickness
05/17/2000EP1000529A1 Process and device for generating test patterns when applying solder paste by a screen printing process on printed circuit boards
05/17/2000EP1000346A1 System for detecting anomalies and/or features of a surface
05/17/2000EP1000344A1 Method and apparatus for parameter difference imaging of a sample surface
05/17/2000EP1000330A1 Measurement of waveplate retardation using a photoelastic modulator
05/17/2000EP1000318A2 Scanning apparatus and methods
05/17/2000EP1000317A1 An apparatus and method for measuring a property of a structure comprising at least one layer
05/17/2000EP1000316A1 Apparatus and method for measuring a property of a structure
05/17/2000CN2378717Y Iron plate offset detection alarmer
05/17/2000CN2378716Y Standard quantity interpolation real-time error-correcting dynamic angular instrument
05/17/2000CN2378715Y 电子激光检测仪 Electron Laser Detector
05/17/2000CN2378366Y Paper money predetermined length metering device for money tally
05/17/2000CN1253636A Telecentric stop 3-D camera and its method
05/17/2000CN1253280A Three-D shaped measuring device
05/16/2000US6064759 Computer aided inspection machine
05/16/2000US6064757 Process for three dimensional inspection of electronic components
05/16/2000US6064756 Apparatus for three dimensional inspection of electronic components
05/16/2000US6064750 Apparatus and method for determining vehicle wheel alignment measurements from three dimensional wheel positions and orientations
05/16/2000US6064630 Sensor with an optical interferometric pick-off
05/16/2000US6064629 Object detection apparatus and method
05/16/2000US6064484 Pattern inspection method and system
05/16/2000US6064482 Interferometric measuring device for form measurement on rough surfaces
05/16/2000US6064481 Method and apparatus for positioning object in space using a low-coherence laser beam which is reflected by two references to sharpen the interference fringe lines
05/16/2000US6064476 Self-targeting reader system for remote identification
05/16/2000US6064471 Distance measuring device
05/16/2000US6064462 Inspecting method and inspecting apparatus for liquid crystal display panel whereby the cell gap is inspected
05/16/2000US6064060 Near-field scanning optical microscope
05/16/2000US6062224 Movement-response system for conducting tests on freely-moving animals
05/16/2000US6062084 Apparatus for detecting wafer edge defects and method of using
05/11/2000WO2000027131A2 Improved methods and apparatus for 3-d imaging
05/11/2000WO2000026850A1 Electronics assembly apparatus with stereo vision linescan sensor
05/11/2000WO2000026647A1 Glass inspection system
05/11/2000WO2000026646A1 Method and apparatus for improved defect detection
05/11/2000WO2000026640A1 Electronics assembly apparatus with improved imaging system
05/11/2000WO2000026617A1 Improved methods and apparatus for controlling glint in a multi-nozzle position alignment sensor
05/11/2000WO2000026616A1 Inspection system for flanged bolts
05/11/2000WO2000026615A1 Device for determining the spatial co-ordinates of objects
05/11/2000WO2000026614A1 Apparatus and method for measuring thin film thickness
05/11/2000WO2000026613A1 Optical monitoring of radial ranges in chemical mechanical polishing a metal layer on a substrate
05/11/2000WO2000026612A1 Profile measuring system and method for the implementation thereof
05/11/2000WO2000026611A1 Tomographic reconstruction of electronic components from shadow image sensor data
05/11/2000WO2000026609A2 Method and apparatus for measuring substrate layer thickness during chemical mechanical polishing
05/11/2000WO2000009992A3 Device for measuring work pieces using an image processing system
05/11/2000WO2000008588A3 Enhanced sensor
05/11/2000DE19951147A1 Determining surface inclination at electron beam incident point with scanning electron microscope involves deriving angle from measured emissions using calibrated relationship
05/11/2000DE19950607A1 Vorrichtung zur Dickenmessung Thickness measurement device
05/11/2000DE19851176A1 Arrangement for determining radius of curvature of curved surfaces has deflector with three pairs of reflective surfaces before receiver, reflective surface pairs enclose 90 degree angles
05/11/2000DE19851018A1 Meßeinrichtung Measuring device
05/11/2000DE19850118A1 Profilmeßsystem und Verfahren zur Durchführung And profile measuring method for performing
05/11/2000DE19848765A1 Three-dimensional positioning reference insertion method for video camera image e.g. for positioning patient for computer tomography, uses computer-aided evaluation of infra-red images of space viewed by video camera
05/10/2000EP0999430A1 Three-dimensional contour measuring apparatus
05/10/2000EP0999429A1 Three-dimentional shape measuring instrument with laser scanner and digital camera
05/10/2000EP0998656A1 Method and apparatus for surface profiling of materials and calibration of ablation lasers
05/10/2000EP0832471A4 Apparatus and method for recreating and manipulating a 3d object based on a 2d projection thereof
05/10/2000EP0765463B1 Method for spatially locating a trihedron
05/10/2000CN1052321C Method and apparatus for detection of position
05/10/2000CN1052209C Method for determining the state of a yarn fed to a textile machine by sensing its movement in front of an optical sensor, ad device thereof
05/10/2000CN1052151C Method and device for examing diameter of cigarette rod
05/09/2000US6061645 Process and apparatus for measuring the volume of an object
05/09/2000US6061466 Apparatus and method for inspecting an LSI device in an assembling process, capable of detecting connection failure of individual flexible leads
05/09/2000US6061137 In-situ endpoint detection for membrane formation
05/09/2000US6061136 Method for measuring shape of object and apparatus for carrying out the same
05/09/2000US6061127 Device for registering parameters of an elongated test material
05/09/2000US6061126 Detecting system for surface form of object
05/09/2000CA2162599C Automatic garment inspection and measurement system
05/06/2000CA2253085A1 Methods and system for measuring three dimensional spatial coordinates and for external camera calibration necessary for that measurement
05/04/2000WO2000025088A1 Detection of irregularities in a convex surface, such as a tire sidewall, using band-pass filtering
05/04/2000WO2000024467A1 Method and system for physiological gating of radiation therapy
05/04/2000WO2000024466A1 Method and system for predictive physiological gating of radiation therapy
05/04/2000WO2000024333A1 Method and system for positioning patients
05/04/2000DE19950778A1 Geometrically desensitized interferometer with high scattered radiation management capability has image generator receiving light reflected back from test surface via optical system
05/04/2000DE19944021A1 Aspheric surface shape measuring apparatus has null element provided in optical path between light source and examined surface to convert spherical wave to desired aspherical wave
05/04/2000DE19848067A1 Spatial shift detection arrangement for construction parts and structures
05/04/2000DE19847617A1 Measuring length of optical fibre cable involves deriving length from wavelength-dependent damping constants of cable and measured ratio of input/output intensities for two wavelengths
05/04/2000DE19839999C1 Verfahren und Vorrichtung zum Kalibrieren eines Verfahrwegs und/oder einer Winkellage einer Haltevorrichtung in einer Einrichtung zur Herstellung von elektrischen Baugruppen sowie Kalibriersubstrat Method and apparatus for calibrating a traverse and / or an angular position of a holding apparatus in a device for producing electrical assemblies, and calibration substrate
05/04/2000CA2348092A1 Method and system for positioning patients
05/04/2000CA2348091A1 Method and system for predictive physiological gating of radiation therapy
05/04/2000CA2347944A1 Method and system for physiological gating of radiation therapy
05/03/2000EP0997952A2 Semiconductor image position sensitive device
05/03/2000EP0997826A2 Method for processing interferometric measurement data
05/03/2000EP0997722A1 Procedure and instrument for controlling the connection of the bars in honeycomb panel cells
05/03/2000EP0997707A1 Rotary position sensor
05/03/2000EP0997703A1 Interferometric thickness profiles with a flatness maintaining channel for the moving material
05/03/2000EP0997702A1 Interferometric thickness profiles with maintenance of a flatness of the moving material
05/03/2000EP0996963A1 Multiple point position scanning system
05/03/2000EP0996868A1 Apparatus and method for adjusting wheel alignment camera height
05/03/2000EP0996850A1 Method for dry-calibrating vortex flow sensors
05/03/2000EP0875044B1 Edge sensing
05/03/2000EP0809800B1 Surface topography enhancement
05/03/2000CN1052066C Apparatus and method for optical inspection of container finish dimensional parameters
05/03/2000CN1051981C Determination of position of stream of molten material
05/02/2000US6057967 Apparatus for extracting pattern features
05/02/2000US6057927 Laser-ultrasound spectroscopy apparatus and method with detection of shear resonances for measuring anisotropy, thickness, and other properties
05/02/2000US6057924 Optical system for measuring and inspecting partially transparent substrates
05/02/2000US6057922 Optical testing method and apparatus employing a distortion verification grid
05/02/2000US6057921 Two piece mirror arrangement for interferometrically controlled stage
05/02/2000US6057911 Fiber optic fabry-perot sensor for measuring absolute strain
05/02/2000US6057909 Optical ranging camera
05/02/2000US6056218 Fishing reel