| Patents for G01B 11 - Measuring arrangements characterised by the use of optical means (73,862) |
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| 02/24/2000 | DE19836103A1 Vorrichtung und Verfahren zur zweidimensionalen Bestimmung von Lastpendelungen und/oder -rotationen an einem Kran Apparatus and method for two-dimensional determination of load oscillations and / or rotations of a crane |
| 02/24/2000 | DE19832615A1 Method to identify transparent bottle type, especially for returnable bottles; has light source to illuminate bottle from below, so that bottle can be identified while in its transport container |
| 02/24/2000 | DE19804666C1 System to determine center point position and rotational position of cylindrically designed machine tool table; has laser source and piezoelectric actuator also mirror and position detector |
| 02/24/2000 | CA2340440A1 System and method for image subtraction for ball and bumped grid array inspection |
| 02/24/2000 | CA2340420A1 System and method for arithmetic operations for electronic package inspection |
| 02/23/2000 | EP0981051A1 Optical probe for proximity field |
| 02/23/2000 | EP0766810B1 Optical device for determining the position of a reflective graticule |
| 02/23/2000 | EP0701707A4 Laser diffraction particle sizing apparatus and method |
| 02/23/2000 | EP0700511A4 Apparatus and method for determining the size of particles using light scattering |
| 02/23/2000 | CN2365642Y Electronic instrument for measuring length |
| 02/23/2000 | CN1245284A Instrument for measuring shift and vibration of object by polarized light interference of optical fibre |
| 02/22/2000 | US6028672 High speed three dimensional imaging method |
| 02/22/2000 | US6028670 Interferometric methods and systems using low coherence illumination |
| 02/22/2000 | US6028669 Signal processing for in situ monitoring of the formation or removal of a transparent layer |
| 02/22/2000 | US6028661 Multi-branched optical line testing apparatus |
| 02/22/2000 | US6028302 Transparent container relief indiciae scanning system |
| 02/22/2000 | US6026583 Shape measuring apparatus and method |
| 02/17/2000 | WO2000008588A2 Enhanced sensor |
| 02/17/2000 | WO2000008419A1 Apparatus and method for measurement of a liquid droplet |
| 02/17/2000 | WO2000008415A1 Imaging a three-dimensional structure by confocal focussing an array of light beams |
| 02/17/2000 | DE19937632A1 Distance measuring unit with image sensor system, e.g. to measure distance of vehicle in front; has group of light sensors divided in part groups for reception of image in each of several measurement units inside field of view |
| 02/17/2000 | DE19937326A1 Device for precise measurement of workpieces, especially to position computer chips in chip sockets, using image processing device; has carrier with associated reference points that are stored in memory |
| 02/17/2000 | DE19934925A1 Identification of environment within range of a road vehicle using a vehicle mounted CCD camera and an on board image processing system |
| 02/17/2000 | DE19847711A1 Anordnung zur Messung von Strukturen eines Objektes Arrangement for measuring structures of an object |
| 02/17/2000 | DE19835282A1 System to determine strength of trolley wires for electrically operated rail vehicles and register wire structural elements; has longitudinally-sliding guide casing at line with channel-type guide having spring-loaded flap guide elements |
| 02/17/2000 | DE19755739A1 Lightwave conductor strain gauge strip system for measuring mechanical strain uses LWL-DMS on or in the surface of object to measure testing object |
| 02/16/2000 | EP0979796A1 Device and method for the determination of the two-dimensional sway and /or the rotation of a crane load |
| 02/16/2000 | EP0979485A1 Method and apparatus for the optical determination of the orientation of a garment workpiece |
| 02/16/2000 | EP0979386A1 Method and system for measuring object features |
| 02/16/2000 | EP0979385A1 Position adjustment of an object being imaged |
| 02/16/2000 | CN1049492C Device and mehtod for measuring transparent container wall thickness |
| 02/15/2000 | US6025916 Wall deposition thickness sensor for plasma processing chamber |
| 02/15/2000 | US6025909 Container sealing surface area inspection |
| 02/15/2000 | US6025908 Alignment of optical elements in telescopes using a laser beam with a holographic projection reticle |
| 02/15/2000 | US6025906 Methods and apparatus for detecting core/cladding interfaces in optical waveguide blanks |
| 02/15/2000 | US6025790 Position recognizing system of autonomous running vehicle |
| 02/15/2000 | US6025688 Alignment apparatus |
| 02/15/2000 | US6025596 Method for measuring epitaxial film thickness of multilayer epitaxial wafer |
| 02/15/2000 | US6024020 Fluorescence dot area meter for measuring the halftone dot area on a printing plate |
| 02/15/2000 | US6023967 Method for measuring tire wear using intensity of reflected light |
| 02/12/2000 | CA2279568A1 Installation and process for measuring the unroundness and diameter of railway wheels |
| 02/10/2000 | WO2000007146A1 Method and apparatus for calibrating a non-contact range sensor |
| 02/10/2000 | WO2000007034A1 Method and apparatus for angle measurement or to define angular location of an object |
| 02/10/2000 | DE19937265A1 Measuring head positioning device on a non-contact three-dimensional measuring machine has a device for determining the position of the measuring head with respect to a first reference system |
| 02/09/2000 | EP0978765A2 Positioning mark and alignment method using the same |
| 02/09/2000 | EP0978710A2 Method for wall thickness measurement applied to the complete surface of a hollow body manufactured by a transparent material |
| 02/09/2000 | EP0978704A2 In-process kerf measurement system |
| 02/09/2000 | EP0977982A1 Sensor unit, process and device for inspecting the surface of an object |
| 02/09/2000 | CN2363266Y Rotary laser plane positioner |
| 02/09/2000 | CN1244250A Device for determining the point of impact of darts on a practice target |
| 02/09/2000 | CN1243943A Method and equipment for measuring and calculating curvature radius of quenched bent rib |
| 02/08/2000 | USRE36560 Method and system for high-speed, high-resolution, 3-D imaging of an object at a vision station |
| 02/08/2000 | US6023665 Aircraft identification and docking guidance systems |
| 02/08/2000 | US6023337 See through laser alignment target device |
| 02/08/2000 | US6023335 Optoelectronic sensor |
| 02/08/2000 | US6023333 Device and method for optical detection of the deformation of a surface |
| 02/08/2000 | US6023325 Arrangement for sensing elastic deformation in a tool stem in a machine tool |
| 02/08/2000 | US6023276 Image processing apparatus and method for forming a three-dimensional display |
| 02/08/2000 | US6023220 Vehicle having a scanning system |
| 02/08/2000 | US6022650 Substrate box; photoresist layer; rotation |
| 02/08/2000 | US6022154 Image position error detection technique using parallel lines and embedded symbols to alert an operator of a mis-registration event |
| 02/08/2000 | US6021665 Cantilever tracking type scanning probe microscope |
| 02/08/2000 | CA2153774C Particle detection system with reflective line-to-spot collector |
| 02/07/2000 | CA2279565A1 Automated suspension correction for twin i-beam suspensions |
| 02/03/2000 | WO2000005897A1 Vehicle wheel alignment data by rotating vision sensor |
| 02/03/2000 | WO2000004952A1 Eye tracking employing a retro-reflective disk |
| 02/03/2000 | WO2000004796A1 Bar-like specimen inspection device |
| 02/03/2000 | WO2000004763A1 Device and method for automatically milking cows |
| 02/03/2000 | WO1999058929A3 Wavelength-dependent surface contour measurement system and method |
| 02/03/2000 | DE19935843A1 System to test lens or other optical element; involves using camera after rotating this through predetermined angle and transforming image data by co-ordinate transformation using polar co-ordinate system |
| 02/03/2000 | DE19929646A1 Scanning and data acquisition method for use during three- dimensional computerized tomography imaging of region of interest in object |
| 02/03/2000 | DE19834718A1 Image processing system for identifying irregularities of textured surface such as object surface and other parameters with units for carrying work namely selection of areas of textured |
| 02/03/2000 | DE19833291A1 Absolute three-dimensional optical area measurement of objects; has single light source and interferometer, where interference output and surface of illuminated object is observed with at least one camera |
| 02/03/2000 | DE19829278C1 3-D-Kamera zur Erfassung von Oberflächenstrukturen, insbesondere für zahnmedizinische Zwecke 3-D camera to detect surface structures, in particular for dental purposes |
| 02/02/2000 | EP0977244A2 Stage system and stage driving method for use in exposure apparatus |
| 02/02/2000 | EP0977029A1 Pattern inspecting apparatus |
| 02/02/2000 | EP0975935A1 Method and device for measuring three-dimensional shapes |
| 02/02/2000 | EP0975934A1 Device and method for determining the position of a point |
| 02/02/2000 | EP0975441A1 Device and process for measuring the rigidity of flat mail |
| 02/02/2000 | EP0975211A1 Apparatus and method for recognising and determining the position of a part of an animal |
| 02/02/2000 | EP0879396A4 Optical measurement system |
| 02/02/2000 | CN1243476A Three-dimensional shape data processing device, carved plate and carving device |
| 02/02/2000 | CN1049045C Thinfilm thickness monitoring method and apparatus |
| 02/01/2000 | US6021380 Automatic semiconductor wafer sorter/prober with extended optical inspection |
| 02/01/2000 | US6021363 System for detecting and controlling the position of a mobile robot |
| 02/01/2000 | US6020969 Cigarette making machine including band inspection |
| 02/01/2000 | US6020968 Method of and apparatus for inspecting residue of metal film |
| 02/01/2000 | US6020966 Enhanced optical detection of minimum features using depolarization |
| 02/01/2000 | US6020965 Phase interference microscope |
| 02/01/2000 | US6020957 System and method for inspecting semiconductor wafers |
| 02/01/2000 | US6019504 Method of and an apparatus for photothermally examining workpiece surfaces |
| 02/01/2000 | US6018990 Flatness measuring and analyzing method |
| 02/01/2000 | CA2178194C Base curve bender |
| 01/27/2000 | WO2000004508A1 Automated 3d scene scanning from motion images |
| 01/27/2000 | WO2000004488A1 An automated wafer defect inspection system and a process of performing such inspection |
| 01/27/2000 | WO2000004340A1 Thickness measurement of fluorescing coatings |
| 01/27/2000 | DE19830646A1 Correcting geometrical collection of errors in axis of coordinate measuring machine by applying correction factor derived from part of volume to measurement result |
| 01/26/2000 | EP0974811A1 Digital cameras |
| 01/26/2000 | EP0974463A1 Ink-jet image forming device |
| 01/26/2000 | EP0974128A1 Three-dimensional imaging method and device |