Patents
Sitemap › G01 - Measuring; Testing › G01B - Measuring length, thickness or similar linear dimensions; Measuring angles; Measuring areas; Measuring irregularities of surfaces or contours › G01B 11 - Measuring arrangements characterised by the use of optical means
Patents for G01B 11 - Measuring arrangements characterised by the use of optical means (73,862)
04/1999
04/21/1999EP0701685B1 A method and a device for the registration of the movement of a vehicle
04/21/1999CN1214455A Observation apparatus and fusion splicer for optical fibers
04/20/1999US5896362 Lens Inclination Adjustment System
04/20/1999US5896200 Optical design for laser encoder resolution extension and angular measurement
04/20/1999US5896195 Container sealing surface area inspection
04/20/1999US5896191 Reinforced elastomer panel with embedded strain and pressure sensors
04/20/1999US5895927 Electro-optic, noncontact, interior cross-sectional profiler
04/20/1999US5895845 Method and gauge for measuring the tread depth of a motor vehicle tire
04/16/1999CA2246042A1 Coupling alignment warning system
04/15/1999WO1999018466A1 Spherical-aberration detection system and optical device using the same
04/15/1999WO1999017921A1 Device for manufacturing package blanks
04/15/1999WO1999004248A9 Method for the automatic recognition of surface defects in body shells and device for carrying out said method
04/15/1999DE19824208A1 Fault analysis method for defect detection in semiconductor device
04/15/1999DE19754129C1 Arrangement for detecting contour changes of strain specimens at different temp.
04/15/1999DE19736169A1 Method to measure deformation or vibration using electronic speckle pattern interferometry
04/14/1999EP0908709A2 Device for contactless vibration measurement
04/14/1999EP0908698A2 Device for measuring longitudinal products
04/14/1999EP0908146A2 Real-time image-guided placement of anchor devices
04/14/1999EP0907875A1 Fringe pattern discriminator for interferometer using diffraction gratings
04/14/1999EP0783663A4 Improved boresight with single-beam triaxial measurement
04/14/1999EP0779969A4 Calibration frame
04/14/1999EP0711402B1 Improvements in or relating to apparatus for the measurement of curvature of a surface
04/14/1999CN1214116A Method and device for measuring defect of crystal on crystal surface
04/13/1999US5894529 Desk-top three-dimensional object scanner
04/13/1999US5894370 Inclination monitoring system
04/13/1999US5894345 Optical method of detecting defect and apparatus used therein
04/13/1999US5894127 Polarized specular reflectance infrared apparatus and method
04/13/1999US5894122 Scanning near field optical microscope
04/13/1999US5893796 Forming a transparent window in a polishing pad for a chemical mechanical polishing apparatus
04/13/1999US5893214 Measuring ball reflector
04/13/1999CA2036877C Apparatus for inspecting printed circuit boards
04/08/1999WO1999017133A1 A system for determining the spatial position of a target
04/08/1999WO1999017076A1 Three-dimensional shape measurement device and three-dimensional engraver using the measurement device
04/08/1999WO1999017074A1 Apparatus for judging whether bump height is proper or not
04/08/1999WO1999017073A1 Device for detecting the position of two bodies
04/08/1999WO1999016940A1 Method and system for controlling growth of a silicon crystal
04/08/1999DE19843155A1 Optical distance measuring unit
04/08/1999DE19743984A1 Device for making blanks by separation from continuous material path of packing material
04/08/1999DE19742177A1 Cable twist pitch is measured using a semiconductor camera
04/08/1999CA2271760A1 Three-dimensional shape measurement apparatus and three-dimensional sculpturing apparatus using said measuring apparatus
04/07/1999EP0907144A2 Method for extracting a three-dimensional model from a sequence of images
04/07/1999EP0837649A4 Diagnostic tomographic laser imaging apparatus
04/07/1999EP0700505A4 Interferometric flying height measuring device
04/07/1999EP0646770B1 Non-destructive inspection method for mechanical behaviour of article with load, its judgement method and apparatus
04/07/1999CN1213072A Mohr phase demodulation method
04/07/1999CN1042856C Method for mfg. special standard particle templet for laser granulameter
04/06/1999US5892989 Rotation device and apparatus equipped with rotation device
04/06/1999US5892576 Process and device for the electro-optical measurement of distance
04/06/1999US5891352 Optical techniques of measuring endpoint during the processing of material layers in an optically hostile environment
04/01/1999WO1999016102A1 Scanning evanescent electro-magnetic microscope
04/01/1999WO1999015930A1 Endoscope
04/01/1999WO1999015864A1 Machine vision methods using feedback to determine an orientation, pixel width and pixel height of a field of view
04/01/1999WO1999015854A1 Machine vision methods using feedback to determine calibration locations of multiple cameras that image a common object
04/01/1999WO1999015853A1 Device for determining the internal measurements of cylinder linings
04/01/1999WO1999015852A1 Checking of a water jet
04/01/1999WO1999015851A1 Method and apparatus for obtaining improved vertical metrology measurements
04/01/1999WO1998058400A3 Liquid etch endpoint detection and process metrology
04/01/1999DE19841235A1 Position calibrating method for an optical length measuring instrument
04/01/1999DE19835756A1 Method for measuring items transported on chain conveyor
04/01/1999DE19741731A1 System for optical scanning surface, especially cavities and inner spaces
04/01/1999DE19741730A1 Method to determine surface contour of objects
04/01/1999DE19739794A1 Verfahren zur Regelung eines Beschichtungsvorgangs Method for regulating a coating process
03/1999
03/31/1999EP0905538A2 Microscope calibration
03/31/1999EP0905526A1 Car's radar alignment adjusting device
03/31/1999EP0905477A2 Methods and apparatus for detecting core/cladding interfaces in optical waveguide blanks
03/31/1999EP0905476A2 Method of end point detection for a wet etch process
03/31/1999EP0904558A2 Confocal microscopic device
03/31/1999EP0766887B1 Self-illuminating touch activated optical switch
03/31/1999EP0649525B1 Apparatus for the detection of surface defects
03/31/1999CN1212364A Container sealing surface area inspection
03/30/1999US5890083 Apparatus for determining the distance of a vehicle from a roadway side marking
03/30/1999US5889593 Optical system and method for angle-dependent reflection or transmission measurement
03/30/1999US5889592 Nondestructive optical techniques for simultaneously measuring optical constants and thicknesses of single and multilayer films
03/30/1999US5889591 Interferometric measurement of toric surfaces at grazing incidence
03/30/1999US5889590 Optical cavity sensor
03/30/1999US5889278 Optical communication device
03/25/1999WO1999014558A1 Consolidated laser alignment and test station
03/25/1999WO1999014061A1 Three-dimensional shape data processing device, carved plate and carving device
03/25/1999WO1999001078A3 Image-guided surgery system
03/25/1999WO1998050885A3 Method and apparatus for performing global image alignment using any local match measure
03/25/1999DE19841399A1 Use-status determination arrangement for vehicle seat, e.g. to determine if seat is occupied to control airbag
03/25/1999DE19741525A1 Device for testing wire cables
03/25/1999CA2270051A1 Three-dimensional shape data processing device, carved plate and carving device
03/25/1999CA2247552A1 Methods and apparatus for detecting core/cladding interfaces in optical waveguide blanks
03/24/1999EP0903681A1 Apparatus and process for detecting the presence and the size of an object
03/24/1999EP0903609A1 Method of producing a three-dimensional image from thermal images
03/24/1999EP0903572A2 Window contamination detector
03/24/1999EP0903560A2 Optoelectronic sensor device
03/24/1999EP0903428A2 Apparatus and method for determining crystal diameters
03/24/1999EP0902874A1 Interferometer for measuring thickness variations of semiconductor wafers
03/24/1999EP0804713A4 Optical wafer positioning system
03/24/1999EP0712533B1 Probe microscopy
03/24/1999CN2311755Y Machine for measuring bending and camber of pinna fin
03/24/1999CN2311754Y Hydraulic lifting laser detecting apparatus controlled by computer
03/24/1999CN1212064A Automation method for 3D image metrology systems
03/24/1999CN1212049A Appearance inspection method for electronic parts
03/23/1999US5887080 Method and apparatus for processing pattern image data by SEM
03/23/1999US5887077 Method for the recognition and evaluation of defects in reflective surface coatings
03/23/1999US5886840 Optical turf evaluation device and method of use
03/23/1999US5886787 Displacement sensor and method for producing target feature thereof
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