Patents for G01B 11 - Measuring arrangements characterised by the use of optical means (73,862) |
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03/23/1999 | US5886782 Vehicle rear end alignment device |
03/23/1999 | US5886781 Device for the geometric inspection of vehicles |
03/23/1999 | US5886775 Noncontact digitizing imaging system |
03/23/1999 | US5886521 Device and method for determining the thickness of an insulating coating on an electrical conductor of a cable and the diameter of the cable |
03/23/1999 | US5886350 Multi-axis wheel transducer with angular position detector |
03/23/1999 | US5886342 Image reader and document curvature measurement using visible and infrared light |
03/18/1999 | WO1999013468A1 Method for regulating a coating process |
03/18/1999 | WO1999013306A2 An optical sensor for measuring forces applied to a body and items of clothing incorporating such sensors |
03/18/1999 | WO1999013294A1 Interferometric measuring device for form measurement on rough surfaces |
03/18/1999 | WO1999013293A1 Highly accurate three-dimensional surface digitizing system and methods |
03/18/1999 | WO1999013292A1 Measuring device for scanning dimensions, especially diameters |
03/18/1999 | WO1999013291A1 Multiple wavelength image plane interferometry |
03/18/1999 | WO1999013290A1 3-d imaging using laser illumination interferometry |
03/18/1999 | WO1998055826A3 Measuring surface flatness using shadow moire technology and phase-stepping image processing |
03/18/1999 | DE19840725A1 Optical interferometer for measuring e.g. semiconductor surface microstructure |
03/18/1999 | DE19741122A1 Interferometric near-field device, e.g. near-field microscope for measuring and structuring material |
03/18/1999 | DE19740678A1 Optical position or vibration measuring device using laser interferometer |
03/18/1999 | DE19740614A1 Device to measure thickness, parallelism, length, straightness, or roughness of long body |
03/18/1999 | DE19740044A1 Machining or grinding workpieces for production of jewelry or designer goods |
03/18/1999 | DE19739885A1 Surface qualification device for quality control |
03/18/1999 | DE19738977A1 Meßgerät zum Scannen von Maßen, insbesondere Durchmessern Instrument to scan dimensions, especially diameters |
03/18/1999 | DE19738900A1 Interferometrische Meßvorrichtung zur Formvermessung an rauhen Oberflächen Interferometric measurement device for shape measurement on rough surfaces |
03/17/1999 | EP0902395A1 Linear estimation method for three-dimensional position with affine camera correction |
03/17/1999 | EP0902351A2 Method and device for determining distance values between vectors |
03/17/1999 | EP0902275A1 Fold inspection device for transparent overwrap film |
03/17/1999 | EP0736167B1 Contour measurement system |
03/17/1999 | EP0619717A4 Method and apparatus for processing images. |
03/17/1999 | CN1210976A Peeling detector for tunnel wall surface |
03/17/1999 | CN1210970A Method for determining thickness of optical sample |
03/16/1999 | US5884239 Optical system for accurate monitoring of the position and orientation of an object |
03/16/1999 | US5883982 Astigmatism measurement apparatus and method based on a focal plane separation measurement |
03/16/1999 | US5883969 Procedure and device for detecting the movement of a target and their applications |
03/16/1999 | US5883803 Six degree of freedom sensor |
03/16/1999 | US5883720 Method of measuring a film thickness of multilayer thin film |
03/16/1999 | US5883709 Inclination monitoring system including reflection of collimated light |
03/16/1999 | US5883585 On-road object detecting system |
03/16/1999 | US5883390 Method and apparatus for positioning a member in a desired attitude relative to the surface of an object |
03/16/1999 | US5883386 Light-receiving apparatus having a position detectable portion on a sealing frame and its manufacturing method |
03/16/1999 | US5882938 Apparatus and method for evaluating contamination caused by organic substances deposited on substrate surface |
03/16/1999 | US5882402 Method for controlling growth of a silicon crystal |
03/16/1999 | US5881780 Apapratus for and method of locating the center of an opening in a vehicle |
03/16/1999 | US5881467 Method of reading off the cross-section of the bezel of an eyeglass frame, corresponding feeler, and application of this method to trimming the lens to be fitted |
03/16/1999 | CA2166323C Road surface discriminator and apparatus applying same |
03/12/1999 | CA2246927A1 Non-contact measuring apparatus |
03/11/1999 | WO1999012082A1 Method for calibration of a robot inspection system |
03/11/1999 | WO1999012079A1 System and method for three-dimensional imaging |
03/11/1999 | WO1999012052A1 Distance measuring apparatus using pulse light |
03/11/1999 | WO1999012004A1 Optical sensing |
03/11/1999 | WO1999012001A1 Interline transfer ccd driven with enhanced frame transfer frequency for high speed profiling |
03/11/1999 | WO1999012000A1 Monitoring distortion of a spinning mirror |
03/11/1999 | WO1999011844A1 Method and device for monitoring a melt for producing crystals |
03/11/1999 | WO1999011517A1 Ship provided with a distortion sensor and distortion sensor arrangement for measuring the distortion of a ship |
03/11/1999 | DE19827786A1 Opto-analytical detection system |
03/11/1999 | DE19738766A1 Automobile external contour display device |
03/11/1999 | DE19737919A1 Meßgerät zur Messung der Profiltiefe eines Kraftfahrzeugreifens Measuring device for measuring the tread depth of a motor vehicle tire |
03/11/1999 | DE19734645A1 Ellipsometer measuring device for layer thickness measurement |
03/11/1999 | CA2299395A1 Ship provided with a distortion sensor and distortion sensor arrangement for measuring the distortion of a ship |
03/10/1999 | EP0901105A1 Image processing apparatus |
03/10/1999 | EP0900364A1 Method and apparatus for generating a control signal |
03/10/1999 | EP0900356A1 Optical measurement |
03/10/1999 | CN1210585A System for measuring surface flatness using shadow Moire technology |
03/10/1999 | CN1210312A Raster system for creating shift and position signals by two optical sensors |
03/09/1999 | US5881123 Simplified cone beam image reconstruction using 3D backprojection |
03/09/1999 | US5880882 Scale and method for making a scale |
03/09/1999 | US5880849 Component placement machine and method of placing a component on a carrier by means of said component placement machine |
03/09/1999 | US5880847 Measuring method of sphericity of ball end mill |
03/09/1999 | US5880846 Method and apparatus for color-coded optical profilometer |
03/09/1999 | US5880844 Hybrid confocal microscopy |
03/09/1999 | US5880841 Method and apparatus for three-dimensional imaging using laser illumination interferometry |
03/09/1999 | US5880840 Alumina recession determination using a flying height tester |
03/09/1999 | US5880839 Optical displacement measuring apparatus including a light-emitting element and an adjacent ball lens |
03/09/1999 | US5880838 System and method for optically measuring a structure |
03/09/1999 | US5880831 Reflectance spectrophotometric apparatus with optical relay |
03/09/1999 | US5880468 For particle detection |
03/09/1999 | US5880463 Optical fiber strain-measuring apparatus |
03/09/1999 | US5880459 Method and apparatus for control of a detector array based imaging |
03/09/1999 | US5880393 Keyboard musical instrument and recorder/playback controller incorporated therein |
03/09/1999 | US5879628 Blood coagulation system having a bar code reader and a detecting means for detecting the presence of reagents in the cuvette |
03/04/1999 | WO1999010708A1 Method and measuring device for measuring at an envelope surface |
03/04/1999 | WO1999010707A1 Measuring device for measuring the tread depth of an automobile tyre |
03/04/1999 | WO1999010706A1 Digital 3-d light modulated position measurement system |
03/04/1999 | WO1999010136A1 Laser calibration of robotics systems |
03/04/1999 | WO1998044375A3 Confocal microscopic device |
03/04/1999 | DE19816428A1 Uneven surface data detection device |
03/04/1999 | DE19738438A1 Crystal diameter determination during Czochralski growth process |
03/04/1999 | DE19734646A1 Ellipsometer-Meßvorrichtung Ellipsometer measurement device |
03/03/1999 | EP0899584A2 Position determining system |
03/03/1999 | EP0899542A1 Route guiding device for vehicle |
03/03/1999 | EP0899541A2 Apparatus for determining the thickness of an optical sample |
03/03/1999 | EP0899540A2 Method for determining the thickness of an optical sample |
03/03/1999 | EP0898703A1 Method and apparatus for analysing optical parameters |
03/03/1999 | EP0728322B1 Microscopic electromagnetic radiation transmitter or detector |
03/03/1999 | EP0708918B1 Multiple angle spectroscopic analyzer |
03/03/1999 | EP0602145B1 Measurement method and apparatus |
03/02/1999 | US5878358 Data processor for selecting data elements having the highest magnitude values and storing them in ascending order |
03/02/1999 | US5878156 Detection of the open/closed state of eyes based on analysis of relation between eye and eyebrow images in input face images |
03/02/1999 | US5878072 Laser alignment cross hair |
03/02/1999 | US5877960 Method and apparatus for monitoring and positioning a beam or jet for operating on a workpiece |
03/02/1999 | US5877860 System and method for measuring the microroughness of a surface of a substrate |
03/02/1999 | US5877859 Broadband spectroscopic rotating compensator ellipsometer |