Patents for G01B 11 - Measuring arrangements characterised by the use of optical means (73,862)
09/1999
09/07/1999US5949543 Monolithic optical assembly and associated retroreflector with beamsplitter assembly
09/07/1999US5949086 Method and device for measuring the characteristic quantities of a log
09/07/1999US5948976 Method for analyzing a separation in a deformable structure
09/07/1999US5948024 Vehicle alignment condition measurement and display
09/07/1999CA2140622C Method and apparatus for remote detection and thickness measurement of solid or liquid layer
09/07/1999CA2114025C Method and apparatus for nondestructive testing of the mechanical behavior of objects under loading
09/02/1999WO1999044096A2 Aperture coded camera for three-dimensional imaging
09/02/1999WO1999044051A1 Laser-ultrasound spectroscopy apparatus and method with detection of shear resonances for measuring anisotropy, thickness, and other properties
09/02/1999WO1999044024A1 Device for fastening optical fibres
09/02/1999WO1999044013A1 Variable pitch grating for diffraction range finding system
09/02/1999WO1999044012A1 Method and apparatus for measuring caliper of moving web
09/02/1999WO1999044011A1 Infrared measuring device for measuring the thickness of a layer
09/02/1999WO1999044009A1 Interferometric measuring device for determining the profile or the pitch of especially rough surfaces
09/02/1999DE19808536A1 Verfahren und Vorrichtung zum Überwachen einer Ausgangsschichtdicke sowie Verwendung der Vorrichtung Method and apparatus for monitoring an initial layer thickness as well as using the apparatus
09/01/1999EP0939382A1 Image acquisition device
09/01/1999EP0939294A1 Determining topographical values
09/01/1999EP0938684A1 Improvements in or relating to an orientation detector arrangement
09/01/1999EP0938599A1 Method and device for monitoring a melt for producing crystals
09/01/1999EP0938273A1 Vacuum cleaner with obstacle avoidance
09/01/1999CN2336325Y Conversion device for automatic perpendicular and horizontal laser emitter
09/01/1999CN1227629A Apparatus and method for tire condition assessment
08/1999
08/31/1999US5946645 Three dimensional imaging method and device
08/31/1999US5946424 Method for reconstructing a shape and an apparatus for reconstructing a shape
08/31/1999US5946102 Method and apparatus for parameter difference imaging of a sample surface
08/31/1999US5946100 Three-dimensional shape measuring apparatus
08/31/1999US5946099 Method of measuring positions of optical transmission members
08/31/1999US5946096 Heterodyne interferometry method for measuring physical parameters of medium
08/31/1999US5946094 Apparatus for determining the curvature of an elongated hole
08/31/1999US5946029 Image processing process
08/31/1999US5945666 Hybrid fiber bragg grating/long period fiber grating sensor for strain/temperature discrimination
08/31/1999US5945665 Bolt, stud or fastener having an embedded fiber optic Bragg Grating sensor for sensing tensioning strain
08/31/1999US5943783 Method and apparatus for determining the alignment of motor vehicle wheels
08/26/1999WO1999042908A1 Linear conoscopic holography
08/26/1999WO1999042816A1 Organic material detector having function of calibrating indication and organic material monitor system using the same
08/26/1999WO1999042413A1 Automatic melt stream positioning device
08/26/1999WO1999027348A3 Method and apparatus for detecting an object
08/26/1999WO1999023451A3 Computerized automotive service system
08/26/1999DE19806288A1 Laserscanner-Meßsystem Laser scanner measuring system
08/26/1999DE19805602A1 Method of measuring and setting gauge openings formed by drive and/or non-driven rollers, e.g. for rolling systems for producing rolled goods
08/25/1999EP0938012A1 Probe for near-field optical microscope, method for manufacturing the same and scanning near-field optical microscope
08/25/1999EP0937573A1 Process, device and use of this device to check the precision of the folding of a parallelepipedic box
08/25/1999EP0937229A1 Interferometric measuring device for form measurement on rough surfaces
08/25/1999EP0937228A1 Measuring device for scanning dimensions, especially diameters
08/25/1999EP0564618B1 Adaptive vision method and system
08/25/1999CN2335123Y Laser collimation measurer
08/25/1999CN2335122Y Structure horizontal displacement measurer
08/24/1999US5943512 Apparatus equipment with position detecting device
08/24/1999US5943135 Position detecting method and position detecting system using the same
08/24/1999US5943134 Method of measuring thickness and refractive indices of component layers of laminated structure and measuring apparatus for carrying out the same
08/24/1999US5943133 System and method for performing selected optical measurements on a sample using a diffraction grating
08/24/1999US5943125 Ring illumination apparatus for illuminating reflective elements on a generally planar surface
08/24/1999US5943122 Integrated optical measurement instruments
08/24/1999US5942750 Method and device for continuous monitoring of dynamic loads
08/24/1999CA2087560C Laser apparatus for simultaneously generating mutually perpendicular planes
08/24/1999CA2075253C Method and apparatus for measuring deviation
08/19/1999WO1999041568A1 Laser scanner measurement system
08/19/1999WO1999041567A1 Device for continuously monitoring the junction of a conveyor belt
08/19/1999WO1999041566A1 Method and apparatus to determine fly height of a recording head
08/19/1999WO1999041151A1 Label sensor
08/19/1999DE19902759A1 Continuous monitoring device for conveyor belt coupling joint
08/19/1999DE19806446A1 Measuring distance between boundary surfaces of transparent media
08/19/1999DE19806142A1 Alignment device for components in processing line, e.g. for nappy manufacture
08/19/1999DE19805200A1 Measuring dimensions or distance of transparent objects, e.g. thickness of thin glasses
08/18/1999EP0936576A2 A system for reconstructing the 3-dimensional motions of a human figure from a monocularly-viewed image sequence
08/18/1999EP0935737A1 Method for increasing the significance of tridimensional measuring of objects
08/18/1999EP0935736A1 Three-dimensional object measurement process and device
08/18/1999EP0935735A1 Monitoring distortion of a spinning mirror
08/18/1999EP0859941A4 Target for laser leveling systems
08/18/1999CN2334014Y Paper money length measuring sensor for money-checking machine
08/18/1999CN1225999A Method for measuring diameter of elongated article of circular cross section
08/17/1999US5940634 Range finding device
08/17/1999US5940566 3D array optical displacement sensor and method using same
08/17/1999US5940302 Controlled machining of combustion chambers, gears and other surfaces
08/17/1999US5940181 Measuring method and measuring apparatus
08/17/1999US5940180 For a positioning device
08/17/1999US5940173 Method and apparatus for inspecting the quality of transparent protective overlays
08/17/1999US5940170 Laser scanning system
08/17/1999US5939709 Scanning probe optical microscope using a solid immersion lens
08/17/1999US5939623 Atomic force microscope
08/12/1999WO1999040473A1 System and method for selective scanning of an object or pattern including scan correction
08/12/1999WO1999040445A1 Optical probe for proximity field
08/12/1999WO1999040391A1 Level with angle and distance measurement apparatus
08/12/1999WO1999040390A1 Method and device for measuring the form and/or the position of an unwinding product surface profile
08/12/1999WO1999040389A1 Method and apparatus for making absolute range measurements
08/12/1999WO1999040388A1 System for detecting the presence and location of at least one object in a field by using a divergent radiation source and an array of opposed plural detectors which rotate together around the field
08/12/1999WO1999027342A3 Grazing incidence interferometry for measuring transparent plane-parallel plates
08/12/1999DE19840523A1 Deadpath compensating interferometer for displacement measurements
08/12/1999DE19805040A1 Optical co-ordinate measuring machine using light transmission
08/12/1999DE19803553A1 Measuring device for determining diameter of rail vehicle contact wire
08/12/1999DE19758533A1 Object surface structuring method for processing of semiconductor wafer
08/12/1999CA2319535A1 System for detecting the presence and location of at least one object in a field by using a divergent radiation source and an array of opposed plural detectors which rotate together around the field
08/12/1999CA2318140A1 Method and apparatus for making absolute range measurements
08/11/1999EP0934503A1 Method and apparatus for determining a contact area between a probe and a specimen
08/11/1999EP0934502A1 Method and apparatus for three-dimensional color scanning
08/11/1999EP0858638A4 Astigmatism measurement apparatus and method
08/11/1999CN1225720A Optical measurement
08/10/1999US5937105 Image processing method and apparatus
08/10/1999US5937079 Method for stereo image object detection
08/10/1999US5936738 For use with a lithographic system and a substrate
08/10/1999US5936737 Wheelset sensing system