Patents for G01B 11 - Measuring arrangements characterised by the use of optical means (73,862)
03/1999
03/02/1999US5877858 Textured surface monitoring and control apparatus
03/02/1999US5877857 Eccentricity tester for head turnout zone of magnetic disk and testing method thereof
03/02/1999US5877854 Azimuth alignment system
03/02/1999US5877853 Method of evaluating an optical transmission path
03/02/1999US5877506 Method and device for monitoring blanks or revenue seals for cigarette packages
03/02/1999US5877493 Optical sensing apparatus
03/02/1999US5877491 Method and apparatus for imaging an object illuminated with light
03/02/1999US5877490 Quadrant light detector
03/02/1999US5877424 Capacitive pressure measuring arrangement having protection against interference signals
03/02/1999US5877412 Probe for atomic force microscope and atomic force microscope
03/02/1999US5877035 Analyzing method and apparatus for minute foreign substances, and manufacturing methods for manufacturing semiconductor device and liquid crystal display device using the same
03/02/1999CA2113752C Inspection system for cross-sectional imaging
02/1999
02/28/1999CA2244425A1 Apparatus for determining the thickness of an optical sample
02/28/1999CA2240054A1 Method for determining the thickness of an optical sample
02/25/1999WO1999009371A1 Method and apparatus for detecting the endpoint in chemical-mechanical polishing of semiconductor wafers
02/25/1999WO1999009370A1 Large scale high speed multiplexed optical fiber sensor network
02/25/1999WO1999009327A1 Load indicating fastener systems method and apparatus
02/25/1999WO1999008584A1 Vacuum cleaner with obstacle avoidance
02/25/1999WO1998053271A3 Method and apparatus for determining angular displacement, surface translation, and twist
02/25/1999WO1998050827A3 Multi-color laser projector for optical layup template and the like
02/25/1999DE19735246A1 Volume measurement
02/24/1999EP0898245A1 Image processing apparatus
02/24/1999EP0898148A2 Method for the determination of the road surface condition
02/24/1999EP0898147A2 Method for the determination of the road surface condition and device for carrying out the method
02/24/1999EP0897526A1 Device for measuring volume
02/24/1999EP0897524A1 Device for non-contact measurement of the surface of a three dimensional object
02/24/1999EP0789846B1 A method in an image recording system
02/24/1999CN2308879Y Electronic indicating instrument for reading and writing distance
02/24/1999CN1208851A Laser method for alignment measuring form and position tolerance
02/23/1999US5875418 Compensation for undesired angle deviations arising during vehicle wheel alignment operations
02/23/1999US5875031 Distance measuring device based on laser interference with a baffle structure member
02/23/1999US5875030 Method and apparatus for coherent electromagnetic field imaging through fourier transform heterodyne
02/23/1999US5874729 Device for filtering odd-numbered harmonic signal components
02/18/1999WO1999008224A1 Fourier filtering mechanism for inspecting wafers
02/18/1999WO1999008074A1 Scanning unit for an optical position measuring device
02/18/1999WO1999008068A1 Ellipsometer measuring instrument
02/18/1999WO1999008066A1 Interference method and system for measuring the thickness of an optically-transmissive thin layer formed on a relatively planar, optically-reflective surface
02/18/1999WO1999008065A1 Calibration standard for microroughness measuring instruments
02/18/1999DE19733775A1 Measuring surface roughness of reflective material, e.g. paper
02/18/1999DE19732376C1 Method of distance measurement using triangulation principle
02/17/1999CN2308073Y Signal output equipment of optical ruler
02/17/1999CN1208258A Horizontal transfer test handler
02/17/1999CN1208171A 线性光栅系统 Linear encoder system
02/16/1999US5872871 Method and device for measuring the position of a pattern
02/16/1999US5872863 Component detection method
02/16/1999US5872860 Calibration cassette for use in calibrating an automated agglutination reaction analyzing system
02/16/1999US5872633 Methods and apparatus for detecting removal of thin film layers during planarization
02/16/1999US5872632 Cluster tool layer thickness measurement apparatus
02/16/1999US5872631 To carry out a method for the dimensional measuring of objects
02/16/1999US5872629 Analytical depth monitor utilizing differential interferometric analysis
02/16/1999US5872626 Consolidated laser alignment and test station
02/16/1999US5872355 Electroluminescent device and fabrication method for a light detection system
02/16/1999US5871391 Apparatus for determining dimensions
02/11/1999WO1999006950A2 Scanning apparatus and methods
02/11/1999WO1999006868A1 Light projecting method, surface inspection method, and apparatus used to implement these methods
02/11/1999WO1999006823A1 System for detecting anomalies and/or features of a surface
02/11/1999DE19833439A1 Sensing unit for optical position measurement
02/11/1999DE19830925A1 Sensing unit for optical position measurement
02/11/1999DE19824623A1 Technical surface characterisation device
02/11/1999DE19733711A1 Coordinate measuring device testing method
02/11/1999DE19733709A1 Optical scanning head for three=dimensional co=ordinate measuring device
02/11/1999DE19733297A1 Contactless optical thickness measuring device
02/11/1999CA2299426A1 Scanning apparatus and methods
02/10/1999EP0896267A2 Position recognizing system of autonomous running vehicle
02/10/1999EP0896239A2 Magneto-optically modulating system
02/10/1999EP0896206A2 Read-out unit for an optical position measuring device
02/10/1999EP0896203A2 Device and method for mutually aligning bodies
02/10/1999EP0896202A2 Array element examination method and array element examination device
02/10/1999EP0896199A1 Electronic tape measure
02/10/1999EP0895609A1 Method for marking an object made of translucent synthetic material, in particular an ophthalmic lens, marked object and corresponding reader
02/10/1999EP0895577A2 Integrated system for imaging and modeling three-dimensional objects
02/10/1999EP0662211B1 Method and apparatus for measuring the dimensions of an object
02/10/1999EP0657260B1 Process for controlling and insuring the quality of moulded building elements
02/10/1999CN1207494A Method and device for real-time correction of working/measuring error by multiple grating
02/10/1999CN1207493A Method and apparatus for non-contact measuring thickness of non-metal coating on surface of metal matrix
02/09/1999US5870507 Rigidity checking method and apparatus with the result freed from the influence of picture resolutions
02/09/1999US5870490 Apparatus for extracting pattern features
02/09/1999US5870315 Apparatus and method for determining vehicle wheel alignment measurements from three dimensional wheel positions and orientations
02/09/1999US5870220 For determining a three-dimensional profile of an object
02/09/1999US5870200 Apparatus for determining the thickness of an optical sample
02/09/1999US5870199 Apparatus for determining the profile of a surface
02/09/1999US5870195 Method and system for determining the distance between optical fibres
02/09/1999US5870191 Apparatus and methods for surface contour measurement
02/09/1999US5869834 Photodetector having an integrated function for elimination of the effects of stray light
02/04/1999WO1999005703A1 Wafer out-of-pocket detector and susceptor leveling tool
02/04/1999WO1999005530A1 Probe, method of its manufacturing, and probe-type memory
02/04/1999WO1999005510A1 Method and apparatus for parameter difference imaging of a sample surface
02/04/1999WO1999005493A1 Transducer for measuring torque in a rotating shaft
02/04/1999WO1999005488A1 Measurement of waveplate retardation using a photoelastic modulator
02/04/1999WO1999005472A1 Device and method for measuring deformation of a mechanical test specimen
02/04/1999DE19828546A1 Image taking unit for measuring purposes with at least one optical system
02/04/1999DE19733194A1 Laser scanning microscope for defect detection in materials, especially structured silicon wafers
02/04/1999DE19727484A1 Method for measuring spray jet leaving spray nozzle
02/04/1999CA2297672A1 Measurement of waveplate retardation using a photoelastic modulator
02/04/1999CA2297152A1 Device and method for measuring deformation of a mechanical test specimen
02/03/1999EP0895096A2 Portable laser digitizing system for large parts
02/03/1999EP0895056A2 Method and device for regulating the attitude of a motor vehicle.
02/03/1999EP0894895A2 Process and apparatus for detecting and correcting changes in the transvers fibre orientation profile
02/03/1999EP0894567A2 Method and apparatus for measuring an eyeglass frame and eyeglass lens grinding apparatus using the same
02/03/1999EP0894241A1 Apparatus and method for characterizing fiber crimps