| Patents for G01B 11 - Measuring arrangements characterised by the use of optical means (73,862) |
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| 06/08/2000 | WO2000033022A2 Optoelectronic component |
| 06/08/2000 | DE19856398A1 Method and appliance for determining strain and/or stress of tyre use Shearing interferometer with time or phase shift |
| 06/08/2000 | DE19855828A1 Dreidimensionales Meßmodul Three-dimensional measuring module |
| 06/08/2000 | DE19855358A1 Path-measuring device, especially for brake pedal movement in vehicle has at least one analog sensor and at least one incremental sensor to output analog and pulse train signals of path, respectively |
| 06/08/2000 | DE19855324A1 Method to project periodical intensity distribution; involves generating binary amplitude mark where each period can be decomposed into rectangles whose with corresponds to period |
| 06/07/2000 | EP1006484A2 Method for estimating volumetric distance maps from 2D depth images |
| 06/07/2000 | EP1006386A1 Range finder and camera |
| 06/07/2000 | EP1006348A1 Measurement system and method for measuring critical dimensions using ellipsometry |
| 06/07/2000 | EP1005626A1 Method and apparatus for detecting the endpoint in chemical-mechanical polishing of semiconductor wafers |
| 06/07/2000 | EP1005625A1 Large scale high speed multiplexed optical fiber sensor network |
| 06/07/2000 | EP0755530B1 Device for determining the position of a surgical microscope |
| 06/07/2000 | EP0588815B1 Road image sequence analysis device and method for obstacle detection |
| 06/07/2000 | CN2382001Y Instrument for measuring finish bearings |
| 06/07/2000 | CN1255626A Method and device for automatic in-line measurement of diameters |
| 06/07/2000 | CN1255625A Device and method for measuring critical measurement by ellipsometry |
| 06/07/2000 | CN1255624A Stereo observing system of automotive single pickup camera |
| 06/07/2000 | CN1255572A Measuring and control system of pavement smoothness (straightness) for paving machine |
| 06/07/2000 | CN1053274C Appts. for measuring coating thickness |
| 06/06/2000 | US6072915 Process for pattern searching and a device for positioning of a mask to a workpiece |
| 06/06/2000 | US6072903 Image processing apparatus and image processing method |
| 06/06/2000 | US6072899 Method and device of inspecting three-dimensional shape defect |
| 06/06/2000 | US6072898 Method and apparatus for three dimensional inspection of electronic components |
| 06/06/2000 | US6072892 Eye position detecting apparatus and method therefor |
| 06/06/2000 | US6072581 Geometrically-desensitized interferometer incorporating an optical assembly with high stray-beam management capability |
| 06/06/2000 | US6072569 Apparatus and a method for measurement of wedge in optical components |
| 06/06/2000 | US6072523 System and a method of three-dimensional imaging |
| 06/06/2000 | US6072174 Magneto-optically modulating system for monitoring relative relationship between an object and a magneto-optic effect element |
| 06/06/2000 | US6071829 Method of fabricating semiconductor components |
| 06/06/2000 | US6070635 Nonwoven sheet products made from plexifilamentary film fibril webs |
| 06/02/2000 | WO2000031500A1 Method for determining and designing optical elements |
| 06/02/2000 | WO2000031499A1 Silicone coat thickness measuring and control apparatus |
| 06/02/2000 | WO2000031498A1 Projection/reception unit and omnidirectional range finding device |
| 06/02/2000 | WO2000015016A3 Method and device for calibrating a displacement path and/or angular position of a holding device in a device for producing electrical assembly groups and calibration substrate |
| 05/31/2000 | EP1005234A2 Three-dimensional scope system for vehicles with a single camera |
| 05/31/2000 | EP1004855A2 Length measuring device |
| 05/31/2000 | EP1004847A1 Method and arrangement for the detection of edge structures |
| 05/31/2000 | EP1003978A1 Load indicating fastener systems method and apparatus |
| 05/31/2000 | EP0879395A4 Apparatus, system and method for laser measurement of an object shape |
| 05/31/2000 | EP0877914A4 Scanning phase measuring method and system for an object at a vision station |
| 05/31/2000 | EP0876584A4 System for measuring surface flatness using shadow moire technology |
| 05/31/2000 | EP0630504B1 Apparatus and method for biometric identification |
| 05/31/2000 | DE19854834A1 Method to determine circumference or radius of cylindrical body; involves using optical triangulation, non-contact measurement procedure and mathematical algorithm |
| 05/31/2000 | DE19854733A1 Abtasteinheit einer Positionsmeßeinrichtung Scanning of a position |
| 05/31/2000 | DE19854318A1 Längenmeßeinrichtung Length measuring |
| 05/31/2000 | DE19852323A1 Verfahren zum Bestimmen der Dicke von auf einem Substrat vorgesehenen Schichten A method for determining the thickness of layers provided on a substrate |
| 05/30/2000 | US6069966 Apparatus and method for tire condition assessment |
| 05/30/2000 | US6069703 Method and device for simultaneously measuring the thickness of multiple thin metal films in a multilayer structure |
| 05/30/2000 | US6069701 Method and apparatus for measuring the height of an object |
| 05/30/2000 | US6069700 Portable laser digitizing system for large parts |
| 05/25/2000 | WO2000029856A1 Displacement sensor in a system suitable for controlling movements and alarms |
| 05/25/2000 | WO2000029835A1 Non-contact topographical analysis apparatus and method thereof |
| 05/25/2000 | WO2000029809A1 Laser-based system for measuring cylindrical objects |
| 05/25/2000 | WO2000029808A1 Method for determining the thickness of a multi-thin-layer structure |
| 05/25/2000 | WO2000029807A2 Detection system for nanometer scale topographic measurements of reflective surfaces |
| 05/25/2000 | WO2000029806A2 Method for measuring the surfaces of a house roof |
| 05/25/2000 | WO2000029262A1 Device for detecting whether a vehicle seat is occupied by means of a stereoscopic image recording sensor |
| 05/25/2000 | WO2000029175A1 Method and device for improving the position exactness of effectors in mechanisms and for measuring objects in a work space |
| 05/25/2000 | WO2000028884A1 A method and an apparatus for the simultaneous determination of surface topometry and biometry of the eye |
| 05/25/2000 | DE19917509C1 Optoelectronic device for detecting objects in a monitored area; has dimensions of monitored areas stored in evaluation unit for activation by one of several switches connected to inputs |
| 05/25/2000 | DE19854011A1 Einrichtung und Verfahren zum Vermessen von Mechanismen und ihrer Stellung Apparatus and method for measuring mechanisms and their position |
| 05/25/2000 | DE19853302A1 Sensor for measuring distance or surface profiles of workpieces; includes optical branches monitoring two static characteristics to provide focusing corrections |
| 05/25/2000 | DE19852149A1 Vorrichtung zur Bestimmung der räumlichen Koordinaten von Gegenständen Device for determining the spatial coordinates of objects |
| 05/25/2000 | CA2350511A1 Method for determining the thickness of a multi-thin-layer structure |
| 05/24/2000 | EP1003225A2 Semiconductor dark image position sensitive device |
| 05/24/2000 | EP1003050A2 Light beam deflecting apparatus |
| 05/24/2000 | EP1003013A1 Determination of the position of the optical axis of a camera |
| 05/24/2000 | EP1003012A2 Optical position measuring arrangement |
| 05/24/2000 | EP1003011A1 Optical determination of the relative positions of objects in space |
| 05/24/2000 | EP1003010A2 Interferometer and measuring method using interferometer |
| 05/24/2000 | EP1003009A1 Three-dimensional coordinates measuring instrument |
| 05/24/2000 | EP1002219A1 Scanning unit for an optical position measuring device |
| 05/24/2000 | EP1002217A1 Method for determining the distance p of an edge of a structural element on a substrate |
| 05/24/2000 | CN1254088A Interferometer and measurement method adopting said interferometer |
| 05/23/2000 | US6067165 Position calibrating method for optical measuring apparatus |
| 05/23/2000 | US6067163 Automated substrate pattern recognition system |
| 05/23/2000 | US6067162 Process for measuring the roughness of a material surface |
| 05/23/2000 | US6067161 Apparatus for measuring material thickness profiles |
| 05/23/2000 | US6067159 System for determining condition of an article |
| 05/23/2000 | US6067152 Alignment range for multidirectional construction laser |
| 05/23/2000 | US6067024 Obstacle avoidance and crushing protection system for outriggers of a chassis |
| 05/23/2000 | US6066845 Laser scanning method and system |
| 05/23/2000 | US6066275 Method and apparatus for determining and controlling excess length of a communications element in a conduit |
| 05/23/2000 | US6065842 Heat maps for controlling deformations in optical components |
| 05/23/2000 | US6065217 Laser rotary double crossliner |
| 05/18/2000 | WO2000028371A1 Method and apparatus for determining optical distance |
| 05/18/2000 | WO2000028306A1 Probing of surface roughness |
| 05/18/2000 | WO2000028289A1 Method and device for the colorimetric measurement of a coloured surface |
| 05/18/2000 | WO2000028285A1 Optical sensor |
| 05/18/2000 | WO2000028284A1 Optical measuring device |
| 05/18/2000 | WO2000028278A1 Electronics assembly apparatus with height sensing sensor |
| 05/18/2000 | WO2000028275A1 Device and method for alignment |
| 05/18/2000 | DE19944721A1 Electronic component position adjustment apparatus used for mounting components on printed circuit board, includes photodetector that receives light from lens and detects side video of electronic component |
| 05/18/2000 | DE19852653A1 Vorrichtung zum Erfassen der Belegung eines Fahrzeugsitzes Device for detecting the occupancy of a vehicle seat |
| 05/18/2000 | DE19851411A1 Position measurement method for milling or drilling tool, using contactless measuring devices cooperating with rotary machining tool in its machining position |
| 05/18/2000 | CA2350640A1 Device and method for alignment |
| 05/18/2000 | CA2349850A1 Measurement device |
| 05/18/2000 | CA2348383A1 Method and device for the colorimetric measurement of a coloured surface |
| 05/17/2000 | EP1001460A1 Method and apparatus for detecting, monitoring and characterizing edge defects on semiconductor wafers |
| 05/17/2000 | EP1001258A1 Method and device for 3D measurements in a thermal chamber |
| 05/17/2000 | EP1001249A1 Surface inspecting device and surface inspecting method |