| Patents for G01B 11 - Measuring arrangements characterised by the use of optical means (73,862) |
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| 03/16/2000 | DE19828701C1 Object geometric structure measuring device, e.g. co-ordinate measuring system for miniature workpiece |
| 03/15/2000 | EP0985911A2 A sensor and a method for measuring distance to, and/or physical properties of, a medium |
| 03/15/2000 | EP0985904A2 Measuring the unroundness and diameter of railway wheels |
| 03/15/2000 | EP0985903A2 Three-dimensional measuring apparatus |
| 03/15/2000 | EP0985902A1 Interferometric device for picking up optical subsurface reflexion and/or transmission characteristics of an object |
| 03/15/2000 | EP0985615A2 Apparatus and method for measuring a dimension of an object |
| 03/15/2000 | EP0985541A2 Device for detecting a sheet stack height |
| 03/15/2000 | EP0985531A1 Automatic inspection of print quality by an elastic model |
| 03/15/2000 | EP0985141A1 Inspection system |
| 03/15/2000 | EP0850397A4 Methods for detecting striae |
| 03/15/2000 | EP0748435B1 Digitally measuring scopes using a high resolution encoder |
| 03/15/2000 | CN1247322A Tansmission metering raster and its making method |
| 03/15/2000 | CN1050422C Method of measuring sizes of mold and mold-associated components by laser measuring instrument |
| 03/15/2000 | CN1050399C Device for measuring distance between prack and fixed point |
| 03/15/2000 | CA2246115A1 An optical device for roughness measurement |
| 03/14/2000 | US6038074 Three-dimensional measuring apparatus and method, image pickup apparatus, and apparatus and method for inputting image |
| 03/14/2000 | US6038029 Method and apparatus for alignment of a wafer |
| 03/14/2000 | US6038028 High-speed non-contact measuring apparatus for gauging the thickness of moving sheet material |
| 03/14/2000 | US6038027 Method for measuring material thickness profiles |
| 03/14/2000 | US6038026 Apparatus and method for the determination of grain size in thin films |
| 03/14/2000 | US6038021 Optically based on-line fiber monitoring system with drift compensation |
| 03/14/2000 | US6038020 Mask pattern verification apparatus employing super-resolution technique, mask pattern verification method employing super-resolution technique, and medium with program thereof |
| 03/14/2000 | US6037581 Device for recording a change in position at a turbine configuration |
| 03/14/2000 | US6036209 System for managing safe mobile run by scanning lane |
| 03/14/2000 | CA2098153C Fiber optic curvature and displacement sensor |
| 03/14/2000 | CA2021781C Device for positioning of a drill bit |
| 03/09/2000 | WO2000012999A1 Apparatus and method for determining porosity |
| 03/09/2000 | WO2000012963A1 Method and apparatus for detecting edge angle |
| 03/09/2000 | WO2000012962A1 Method for strain deformation |
| 03/09/2000 | WO2000012961A1 Combination thin-film stress and thickness measurement device |
| 03/09/2000 | WO2000012960A1 Thin film strain sensors based on interferometric optical measurements |
| 03/09/2000 | WO2000012958A1 Methods and apparatus for measuring the thickness of a film, particularly of a photoresist film on a semiconductor substrate |
| 03/09/2000 | WO1999063304A9 Apparatus and methods for surface contour measurement |
| 03/09/2000 | DE19845566A1 Navigation interface for movement in virtual worlds including unit for control of the movement in six directions of freedom and interface is designed as cordless hand unit e.g. for presentation |
| 03/09/2000 | DE19840200A1 Klassiervorrichtung Classifier |
| 03/09/2000 | DE19837437A1 Vorrichtung und Verfahren zum Bestimmen von Abständen und ein zugehöriges Nanodosiersystem Apparatus and method for determining distances, and an associated Nanodosiersystem |
| 03/09/2000 | CA2341881A1 Method and apparatus for detecting edge angle |
| 03/09/2000 | CA2341403A1 Methods and apparatus for measuring the thickness of a film, particularly of a photoresist film on a semiconductor substrate |
| 03/09/2000 | CA2341166A1 Thin film strain sensors based on interferometric optical measurements |
| 03/08/2000 | EP0984391A1 Device for counting fish population passing through a fish pass |
| 03/08/2000 | EP0984245A2 Method of and apparatus for inspecting surface irregularities of transparent plate |
| 03/08/2000 | EP0984244A2 Measuring method and device |
| 03/08/2000 | EP0984243A1 Fibre optic strain sensor |
| 03/08/2000 | EP0983804A1 Classifying arrangement |
| 03/08/2000 | EP0983496A2 Process and device for determining the cell density of a honeycombed body, in particular for an exhaust fume catalytic converter |
| 03/08/2000 | EP0983486A1 Distributed sensing system |
| 03/08/2000 | EP0983483A1 Interferometric measuring device |
| 03/08/2000 | EP0983481A2 Two piece mirror arrangement for interferometrically controlled stage |
| 03/08/2000 | CN1246611A Method and equipment for detecting fibre core/cladding interface of optical waveguide semifinished product |
| 03/08/2000 | CN1050203C Inclination angle sensing apparatus for projector |
| 03/07/2000 | US6034779 Array element examination method and array element examination device |
| 03/07/2000 | US6034778 Method of measuring surface area variation rate of a polysilicon film having hemispherical grains, and capacitance measuring method and apparatus by the same |
| 03/07/2000 | US6034774 Method for determining the retardation of a material using non-coherent light interferometery |
| 03/07/2000 | US6034773 Length measuring machine and method using laser beams |
| 03/07/2000 | US6034772 Method for processing interferometric measurement data |
| 03/07/2000 | US6034765 Contactless position and displacement measuring device |
| 03/07/2000 | US6034763 Dual beam laser device for linear and planar alignment |
| 03/07/2000 | US6034761 Displacement information measuring apparatus |
| 03/07/2000 | US6032517 Device and process for measuring the rigidity of flat mail |
| 03/07/2000 | US6032377 Non-spherical surface shape measuring device |
| 03/02/2000 | WO2000011506A1 Variable coupler fiberoptic sensor and sensing apparatus using the sensor |
| 03/02/2000 | WO2000011432A1 Device and method for determining distances and a nano-dosing system belonging thereto |
| 03/02/2000 | WO2000011431A1 Device for measuring translation, rotation or velocity via light beam interference |
| 03/02/2000 | WO2000011430A1 Apparatus and method for the non-destructive testing of articles using optical metrology |
| 03/02/2000 | WO2000011400A1 Light array system and method for illumination of objects imaged by imaging systems |
| 03/02/2000 | WO2000010449A1 Device for determining the surface shape of biological tissue |
| 03/02/2000 | WO2000010448A1 Apparatus and method for measuring vision defects of a human eye |
| 03/02/2000 | DE19842190C1 Method to determine topography of curved surfaces: involves measuring angle difference of two measurement beams reflected from two separate measurement points |
| 03/02/2000 | DE19837551A1 Transparent object wall thickness measuring device; has cylindrical lenses for longitudinal divergence of laser light directed onto measured object and for transverse expansion of object image received by photosensor |
| 03/02/2000 | CA2345049A1 Device for determining the surface shape of biological tissue |
| 03/02/2000 | CA2341430A1 Variable coupler fiberoptic sensor and sensing apparatus using the sensor |
| 03/01/2000 | EP0982580A1 Ellipsometer |
| 03/01/2000 | EP0982565A2 Apparatus for examining the degree of stain of printed matter |
| 03/01/2000 | EP0982564A1 Rotation angle detector |
| 03/01/2000 | EP0981733A1 Grating based phase control optical delay line |
| 03/01/2000 | EP0981718A1 Method and apparatus for imaging an object by diffractive autofocus |
| 03/01/2000 | EP0943075A4 A system and method for performing selected optical measurements |
| 03/01/2000 | EP0696345B1 Self aligning in-situ ellipsometer and method of using for process monitoring |
| 02/29/2000 | US6031941 Three-dimensional model data forming apparatus |
| 02/29/2000 | US6031933 Method and apparatus for inspecting the outer appearance of a golf ball |
| 02/29/2000 | US6031928 Image processing apparatus and method of processing height data to obtain image data using gradient data calculated for a plurality of different points of a surface and adjusted in accordance with a selected angle of illumination |
| 02/29/2000 | US6031661 Confocal microscopic equipment |
| 02/29/2000 | US6031616 Laser pulley alignment system |
| 02/29/2000 | US6031615 System and method for simultaneously measuring lubricant thickness and degradation, thin film thickness and wear, and surface roughness |
| 02/29/2000 | US6031614 Measurement system and method for measuring critical dimensions using ellipsometry |
| 02/29/2000 | US6031612 Apparatus and methods for contour measurement using movable sources |
| 02/29/2000 | US6031611 Coherent gradient sensing method and system for measuring surface curvature |
| 02/29/2000 | US6031607 System and method for inspecting pattern defect |
| 02/29/2000 | US6031606 Process and device for rapid detection of the position of a target marking |
| 02/29/2000 | US6031225 System and method for selective scanning of an object or pattern including scan correction |
| 02/29/2000 | US6031200 In-process kerf measurement system |
| 02/29/2000 | US6029485 Roller levelling machine for levelling a rolled section |
| 02/29/2000 | CA2177748C Low cost laser range finder system architecture |
| 02/29/2000 | CA2101996C Validation of optical ranging of a target surface in a cluttered environment |
| 02/24/2000 | WO2000010115A1 System and method for image subtraction for ball and bumped grid array inspection |
| 02/24/2000 | WO2000010114A1 System and method for arithmetic operations for electronic package inspection |
| 02/24/2000 | WO2000009992A2 Device for measuring work pieces using an image processing system |
| 02/24/2000 | WO2000009275A1 Method and apparatus for measuring angle of bend, method of bending, and apparatus for controlling angle of bend |
| 02/24/2000 | WO2000000784B1 Vector measurement for coordinate measuring machine |
| 02/24/2000 | DE19938869A1 Optical displacement measurement system for e.g. semiconductor manufacturing apparatus, produces secondary pair of diffracted beams with constant optical axis |