| Patents for G01B 11 - Measuring arrangements characterised by the use of optical means (73,862) |
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| 09/06/2000 | CN2395252Y Laser alignmeter device for reciprocating compressor cylinder-slide way |
| 09/06/2000 | CN2395251Y Pattern displacement sensor |
| 09/06/2000 | CN1265737A Ellipsometer measuring instrument |
| 09/05/2000 | US6115554 Distance measuring device for camera |
| 09/05/2000 | US6115153 Reflection-type hologram scale and optical displacement measuring apparatus therewith |
| 09/05/2000 | US6115128 Multi-dimensional position sensor using range detectors |
| 09/05/2000 | US6115114 Laser scanning system and applications |
| 09/05/2000 | US6115112 Electronic distance measuring instrument |
| 09/05/2000 | US6115052 System for reconstructing the 3-dimensional motions of a human figure from a monocularly-viewed image sequence |
| 09/05/2000 | US6113137 Passenger compartment state sensing apparatus |
| 09/05/2000 | US6112588 Method and apparatus for measuring the size of drops of a viscous material dispensed from a dispensing system |
| 08/31/2000 | WO2000050842A1 An apparatus for measuring distance |
| 08/31/2000 | WO2000050739A1 Apparatus for monitoring wet compression gas turbine power augmentation-related casing distortions |
| 08/31/2000 | DE19962078A1 Method for high resolution interferential measurement of the spacing to a reflector in which case a light receiver produces a signal which is evaluated by a signal processing unit, e.g. for digital scales |
| 08/31/2000 | DE19952553A1 Compact video test device with coupled Y,Z,X measurement axes has movable carriage with objective lens mechanism oriented towards workpiece on one end, video camera on other |
| 08/31/2000 | DE19907289C1 Molding test scanner for detecting surface moldings on test pieces includes a scanner unit, a testing device with a surface-molding scanner and a testing and calibrating head with a calibration-molding unit |
| 08/30/2000 | EP1032192A2 Reflection infrared surface defect correction |
| 08/30/2000 | EP1031942A2 Image edge detection method, inspection system, and recording medium |
| 08/30/2000 | EP1031812A2 Measurement apparatus |
| 08/30/2000 | EP1031057A1 Laser scanning method and system |
| 08/30/2000 | EP1031047A1 Three dimension imaging by dual wavelength triangulation |
| 08/30/2000 | EP1031027A1 Method and device for detecting viscous liquids on a solid, especially moving, undersurface |
| 08/30/2000 | EP1031026A1 Process and device for detecting the location of components and/or for checking the position of component connections and mounting head with a device for detecting the location of components and/or checking the position of component connections |
| 08/30/2000 | EP1031010A1 Monolithic optical assembly and associated retroreflector with beamsplitter assembly |
| 08/30/2000 | EP0979386A4 Method and system for measuring object features |
| 08/30/2000 | EP0842395B1 Process and device for the rapid detection of the position of a target marking |
| 08/30/2000 | EP0670997B1 Surface pit and mound detection and discrimination system and method |
| 08/30/2000 | CN2394194Y Multi-probe computer apparatus for measuring and controlling thickness of film |
| 08/30/2000 | CN1264824A Displacement sensor for measuring surface form |
| 08/30/2000 | CN1264823A Method and special microscopic device for measuring size of fibre |
| 08/29/2000 | US6112113 Image-guided surgery system |
| 08/29/2000 | US6111981 Method and apparatus for processing pattern image data by SEM |
| 08/29/2000 | US6111690 Confocal microscopic equipment |
| 08/29/2000 | US6111649 Thickness measuring apparatus using light from slit |
| 08/29/2000 | US6111645 Grating based phase control optical delay line |
| 08/29/2000 | US6111643 Apparatus, system and method for determining wear of an article |
| 08/29/2000 | US6111634 Method and apparatus for in-situ monitoring of thickness using a multi-wavelength spectrometer during chemical-mechanical polishing |
| 08/29/2000 | US6111602 Method and apparatus for inspecting solder joints |
| 08/29/2000 | US6111601 Non-contacting laser gauge for qualifying screw fasteners and the like |
| 08/29/2000 | US6111262 Method for measuring a diameter of a crystal |
| 08/29/2000 | US6110752 Optical techniques of measuring endpoint during the processing of material layers in an optically hostile environment |
| 08/29/2000 | US6110337 Sputtering method and apparatus with optical monitoring |
| 08/29/2000 | US6110123 Region-of-interest setting apparatus for respiration monitoring and a respiration monitoring system |
| 08/24/2000 | WO2000049378A1 Fibre optic grating sensor |
| 08/24/2000 | WO2000049365A1 Laser measuring method for determining the azimuth, elevation and offset of two tool spindles relative to a reference plane |
| 08/24/2000 | WO2000049364A1 Combining interference fringe patterns to a moire fringe pattern |
| 08/24/2000 | WO2000048800A1 Method and device for separating disc-shaped bodies from an original body |
| 08/24/2000 | WO2000048736A1 Sensor-measuring field for controlling functioning of a micropipette |
| 08/24/2000 | WO2000048700A1 3-d model providing device |
| 08/24/2000 | WO2000048699A1 Real 3-d model forming device |
| 08/24/2000 | WO2000048698A1 3-d model providing device |
| 08/24/2000 | WO1998022860A3 Computer aided inspection machine |
| 08/24/2000 | DE19907880A1 Laser measuring method for azimuth, elevation and offset of workpiece spindles in machine tool uses laser measurements for calculating relative angular positions of spindle axes relative to pre-defined reference plane |
| 08/24/2000 | DE19907644A1 Probe for measurement of work pieces in production technology has helical folds of bellows and coil spring accommodated in turns of bellows and integrated with them |
| 08/24/2000 | DE19906773A1 Device for measurement of returnable packaging e.g. bottles, boxes and in boxes with bottles on transportation devices has virtual illumination surface plane parallel to transportation device |
| 08/24/2000 | CA2362982A1 Fibre optic grating sensor |
| 08/23/2000 | EP1030173A1 Arrangement and method for inspection of surface quality |
| 08/23/2000 | EP1030161A1 Phase difference image with low pass filtering and gray scale shifting |
| 08/23/2000 | EP1030160A1 Optical position sensor |
| 08/23/2000 | EP1029605A2 Roll position adjustment |
| 08/23/2000 | EP1029220A1 Device for referencing a system of co-ordinates |
| 08/23/2000 | EP1029219A1 Optoelectronic apparatus for the dimension and/or shape checking of pieces with complex tridimensional shape |
| 08/23/2000 | EP0705445B1 An apparatus for measuring the dimensions of objects |
| 08/23/2000 | CN1055762C Speckle effect reducing method and device in laser three-dimensional sensor system |
| 08/22/2000 | US6108170 Slider row with segmented scribe lines for individual control curvature of sliders in the row |
| 08/22/2000 | US6108093 Automated inspection system for residual metal after chemical-mechanical polishing |
| 08/22/2000 | US6108092 Method and apparatus for detecting the endpoint in chemical-mechanical polishing of semiconductor wafers |
| 08/22/2000 | US6108091 Method and apparatus for in-situ monitoring of thickness during chemical-mechanical polishing |
| 08/22/2000 | US6108090 Three-dimensional shape measuring apparatus |
| 08/22/2000 | US6108089 Position detecting apparatus and method for projection exposure apparatus |
| 08/22/2000 | US6108071 Speed and position measurement system |
| 08/22/2000 | US6105446 Measuring device for saw blades |
| 08/22/2000 | US6105422 Brake tester and method of using same |
| 08/22/2000 | US6105264 Automobile frame dimensioning tool |
| 08/17/2000 | WO2000047966A1 Device for determining the bending stress of components |
| 08/17/2000 | WO2000047961A1 System for measuring polarimetric spectrum and other properties of a sample |
| 08/17/2000 | WO2000047947A1 System for measuring the position of an edge of a transparent article |
| 08/17/2000 | WO2000047439A1 Device for determining the pressure between a contact wire and a pantograph |
| 08/17/2000 | WO2000017605A9 Dynamic beam steering interferometer |
| 08/17/2000 | DE19906021A1 Method and device for slicing off discoid objects from an original object has a slicer, a forward feed device, an optical recognition device and a lamp. |
| 08/17/2000 | DE19905778A1 Verfahren und Vorrichtung zur Bestimmung wenigstens eines Parameters eines fadenförmigen Körpers Method and apparatus for determining at least one parameter of a filamentary body |
| 08/17/2000 | DE19902401A1 Verfahren und Vorrichtung zur Bestimmung der Geometrie von blattförmigem Gut oder Stapeln davon Method and apparatus for determining the geometry of sheet-like material or stacking them |
| 08/17/2000 | DE10003855A1 Koordinateneingabevorrichtung, Koordinateneingabeverfahren und Anzeigentafelsystem A coordinate input device, the coordinate input method and display board system |
| 08/17/2000 | CA2360331A1 Device for determining the pressure between a contact wire and a pantograph |
| 08/16/2000 | EP1028392A2 Inspection method and inspection system |
| 08/16/2000 | EP1028325A2 Method of surveying a train track |
| 08/16/2000 | EP1028309A1 Optical encoder |
| 08/16/2000 | EP1028305A2 Procedure and device to determine at least one parameter of a wirelike object |
| 08/16/2000 | EP1028304A1 Camera-based measuring system for length measurment |
| 08/16/2000 | EP1027590A1 Apparatus and method for viewing and inspecting a circumferential surface area of an object |
| 08/16/2000 | EP1027577A2 Computerized automotive service system |
| 08/16/2000 | EP1027576A1 Method and apparatus for modeling substrate reflectivity during chemical mechanical polishing |
| 08/16/2000 | CN2392164Y Device for measuring length of roll of cable or roll of electric wire |
| 08/16/2000 | CN1263270A Method for testing abnormality of electronic element and device on printed circuit board and its testing instrument |
| 08/16/2000 | CN1263019A Method for measuring guide track |
| 08/15/2000 | US6104879 Signal forming apparatus |
| 08/15/2000 | US6104486 Fabrication process of a semiconductor device using ellipsometry |
| 08/15/2000 | US6104482 Container finish check detection |
| 08/15/2000 | US6104030 Optical probe having tapered wave guide and scanning near-field optical microscope utilizing optical probe |
| 08/15/2000 | US6103991 Laser machining apparatus |