Patents
Sitemap › G01 - Measuring; Testing › G01B - Measuring length, thickness or similar linear dimensions; Measuring angles; Measuring areas; Measuring irregularities of surfaces or contours › G01B 11 - Measuring arrangements characterised by the use of optical means
Patents for G01B 11 - Measuring arrangements characterised by the use of optical means (73,862)
10/2000
10/17/2000US6134027 Method and device for determining scanning dimension
10/17/2000US6134013 Optical ball grid array inspection system
10/17/2000US6134012 Broadband spectroscopic rotating compensator ellipsometer
10/17/2000US6134011 Optical measurement system using polarized light
10/17/2000US6134007 Method for measuring orthogonality having a third interferometer which is not orthogonal
10/17/2000US6134003 Method and apparatus for performing optical measurements using a fiber optic imaging guidewire, catheter or endoscope
10/17/2000US6133999 Measuring sidewall thickness of glass containers
10/17/2000US6133988 Device for the measurement of distances or of the angle of incidence of a light beam
10/17/2000US6133948 Automatic identification of articles having contoured surfaces
10/17/2000US6133579 Method and apparatus for slanted attitude testing and/or for co-planarity testing of a contact for SMD components
10/17/2000US6133052 Bump inspection method
10/17/2000US6131435 Method of estimating remaining life of a power transmission belt
10/16/2000CA2305919A1 Wafer aligner system
10/13/2000CA2267519A1 Optical full human body 3d digitizer
10/12/2000WO2000060657A1 Endpoint detection in the fabrication of electronic devices
10/12/2000WO2000060542A1 Method of detecting displacement of a block of pixels from a first to a second image of a scene
10/12/2000WO2000060333A1 Illumination apparatus and method
10/12/2000WO2000060312A1 Bragg network extensometer and method for the production of said extensometer
10/12/2000WO2000060311A1 A method and apparatus for facilitating a determination of a linear dimension of an object from an image of the object
10/12/2000WO2000060310A1 Surface sensing device with optical sensor
10/12/2000WO2000060309A1 Method and device for automatically adjusting the axle geometry of a suspended vehicle in a production line
10/12/2000WO2000060308A1 Method for adjusting the axle geometry of a vehicle and adjusting device and production line for carrying out said method
10/12/2000WO2000060307A1 Measuring probe with diaphragms and modules
10/12/2000WO2000027131A3 Improved methods and apparatus for 3-d imaging
10/12/2000DE19913113A1 Deformation measuring device for anchor bars in mining has fibre grating sensors with fibre windings having twist angles based on compensation conditions for simultaneous linear extension and transversal contraction
10/12/2000CA2368973A1 A method and apparatus for facilitating a determination of a linear dimension of an object from an image of the object
10/11/2000EP1043578A2 Optical testing apparatus for tires
10/11/2000EP1043565A2 Method for controlling the inclination of a terrain
10/11/2000EP1043563A1 Film defect inspection method
10/11/2000EP1042727A1 Method of cancer cell detection
10/11/2000EP1042718A1 Method and apparatus for three-dimensional surface contouring using a digital video projection system
10/11/2000EP1042644A1 Device for determining the geometry of a wheel and/or axle in motor vehicles
10/11/2000EP1042643A1 Device for determining the wheel and/or axle geometry of motor vehicles
10/11/2000EP1042559A1 Road pavement deterioration inspection system
10/11/2000CN1269905A Method for regulating coating process
10/11/2000CN1269517A Three-dimensional profile measuring method and equipment with optical fiber panel and confocal microscope
10/11/2000CN1057387C Process and device for detecting impurities in textile test material
10/10/2000US6130750 Optical metrology tool and method of using same
10/10/2000US6130749 System and method for measuring thin film properties and analyzing two-dimensional histograms using a symmetry operation
10/10/2000US6130746 System and method for electronically evaluating predicted fabric qualities
10/10/2000US6130745 Optical autofocus for use with microtiter plates
10/10/2000US6130437 Sensor and detection system having wide diverging beam optics
10/10/2000US6129351 Overlap detection apparatus and method
10/05/2000WO2000059009A2 Processing chamber with optical window cleaned using process gas
10/05/2000WO2000058716A1 Optical endpoint detection system for rotational chemical mechanical polishing
10/05/2000WO2000058713A2 Device for rapidly measuring angle-dependent diffraction effects on finely structured surfaces
10/05/2000WO2000058690A1 Coordinate transforming method in position setting means of observation device and observation device equipped with coordinate transforming means
10/05/2000WO2000058689A1 Self tracking beam delivery system
10/05/2000WO2000033022A3 Optoelectronic component
10/05/2000DE19914889A1 Sensor to detect the thickness of sedimentary deposits in basins, lagoons, rivers or lakes without the application of external thrust from a pushrod
10/05/2000DE19914300A1 Fluchtungsmessanordnung für parallelachsig angeordnete Riemenscheiben o. dgl. Alignment measuring system for parallel axes arranged pulleys o. The like.
10/05/2000DE10015242A1 Optikteil-Antriebsgerät und optisches Interferometer Optics member driving device and optical interferometer
10/05/2000DE10010834A1 Device to align shafts, spindles, rollers, etc.; has prism at each shaft end, with planar light-detector fixed with respect to one prism to measure deviation of light beam reflected between shafts
10/05/2000DE10008240A1 Semiconductor light projector has several light emitting devices projecting light towards a projection surface
10/04/2000EP1041394A2 Optoelectronic device
10/04/2000EP1041393A2 Opto-electronic device
10/04/2000EP1041358A2 Alignment measuring device
10/04/2000EP1041357A1 Stage device and exposure apparatus
10/04/2000EP1040879A1 Method and system for bending
10/04/2000EP1040516A1 Apparatus and method for determining depth profile characteristics of a dopant material in a semiconductor device
10/04/2000EP1040449A1 Method and apparatus for calibrating a non-contact range sensor
10/04/2000EP1040393A1 Method for calibration of a robot inspection system
10/04/2000EP1040366A1 Method and device for recording three-dimensional distance-measuring images
10/04/2000EP1040341A1 Multiple beam scanner for an inspection system
10/04/2000EP1040331A1 Device for measuring a bending load
10/04/2000EP1040319A1 Device for detecting the positional change between two bodies moving in relation to one another
10/04/2000EP1040039A1 Adaptive absolute steering angle sensor
10/04/2000EP0724773B1 Grid array inspection system
10/04/2000EP0682771B1 Method for surface topography measurement by spatial-frequency analysis of interferograms
10/04/2000CN1269011A Method for dry-calibrating vortex flow sensors
10/03/2000US6128585 Method and apparatus for calibrating a noncontact gauging sensor with respect to an external coordinate system
10/03/2000US6128405 System for processing three-dimensional shape data
10/03/2000US6128086 Scanning arrangement and method
10/03/2000US6128085 Reflectance spectroscopic apparatus with toroidal mirrors
10/03/2000US6128083 Displacement measuring apparatus
10/03/2000US6128081 Method and system for measuring a physical parameter of at least one layer of a multilayer article without damaging the article and sensor head for use therein
10/03/2000US6128067 Correcting method and correcting system for mask pattern
10/03/2000US6127689 Method and apparatus for positioning a member relative to an object surface
10/03/2000US6127677 Optical encoder having optical conductor at the outer circumference of rotor
10/03/2000US6127674 Uneven-surface data detection apparatus
10/03/2000US6127672 Topological and motion measuring tool
10/03/2000CA2229935C High bandwith, dynamically rigid metrology system for the measurement and control of intelligent manufacturing processes
10/03/2000CA2063383C Laser-based wheel alignment system
09/2000
09/28/2000WO2000057352A1 Optical coupling assembly for image sensing operator input device
09/28/2000WO2000057228A2 Apparatus for producing and guiding a light beam
09/28/2000WO2000057159A1 Apparatus and method for determining the active dopant profile in a semiconductor wafer
09/28/2000WO2000057148A1 Strain sensing
09/28/2000WO2000057137A1 Device for detecting the position of a light incidence
09/28/2000WO2000057133A1 Calibration of optical transmitter for position measurement systems
09/28/2000WO2000057131A1 Method for establishing a coordinate system
09/28/2000WO2000057128A1 Improvements in and relating to imaging
09/28/2000WO2000057127A1 Method and apparatus for wafer metrology
09/28/2000WO2000056976A1 Method for measuring and regulating curl in a paper or board web and a paper or board machine line
09/28/2000DE19933592A1 Optical detection of edges of contrast colored markings or surfaces on measuring object by diffusing reflected and/or deflected light on limited cutout of measuring object and determining central light intensity of this cutout
09/28/2000DE19911277A1 Verfahren und Vorrichtung zur Erfassung der Spur eines Lichtpunktes Method and apparatus for detecting the trace of a light spot
09/28/2000DE10002768A1 Method for determining measurements and/or contours of rotary working chip-generating tool by directing visible and/or invisible light on neighborhood of surface and recording part of light reflected by area of another surface
09/28/2000CA2366730A1 Calibration of optical transmitter for position measurement systems
09/28/2000CA2366711A1 Method for establishing a coordinate system
09/28/2000CA2366557A1 Strain sensing
09/28/2000CA2366257A1 Method for measuring and regulating curl in a paper or board web and a paper or board machine line
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