| Patents for G01B 11 - Measuring arrangements characterised by the use of optical means (73,862) |
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| 06/28/2000 | EP1014042A2 Timing block or disc and method for its production |
| 06/28/2000 | EP1014036A2 Device and procedure to examine an object |
| 06/28/2000 | EP1014035A1 Method and device to measure the gap between variable-position elements |
| 06/28/2000 | EP1014034A2 Integrated optoelectronic sensor and method for its production |
| 06/28/2000 | EP1014030A1 Movable x/y stage for coordinate measurement |
| 06/28/2000 | EP1012838A1 Method for regulating a coating process |
| 06/28/2000 | EP1012635A2 Coatings, methods and apparatus for reducing reflection from optical substrates |
| 06/28/2000 | EP1012621A1 Distance measuring apparatus using pulse light |
| 06/28/2000 | EP1012571A1 An apparatus for analyzing multi-layer thin film stacks on semiconductors |
| 06/28/2000 | EP1012535A1 Background compensation for confocal interference microscopy |
| 06/28/2000 | EP1012534A1 Method and device for determining deformations and elongations in curved forms |
| 06/28/2000 | EP1011351A1 Cigarette making machine including band inspection |
| 06/28/2000 | CN2385310Y High precision measurer for measuring precision part thermal deformation |
| 06/28/2000 | CN1258055A Optical system for nonuniformly lighting compensation body |
| 06/28/2000 | CN1053963C System and method for electronically displaying yarn qualities |
| 06/28/2000 | CA2287051A1 Laser distance-measuring instrument for large measuring ranges |
| 06/27/2000 | US6081672 Measurement device |
| 06/27/2000 | US6081337 Method and apparatus for measuring liquid crystal cell properties |
| 06/27/2000 | US6081336 Microscope calibrator |
| 06/27/2000 | US6081335 Phase difference measuring device with visible light source for providing easy alignment of optical axes and method therefor |
| 06/27/2000 | US6081334 Endpoint detection for semiconductor processes |
| 06/27/2000 | US6081330 Method and device for measuring the thickness of opaque and transparent films |
| 06/27/2000 | US6081322 NIR clinical opti-scan system |
| 06/27/2000 | US6080990 Position measuring apparatus |
| 06/22/2000 | WO2000036377A1 Position sensor and circuit for optical encoder |
| 06/22/2000 | WO2000036372A1 Self gating photosurface |
| 06/22/2000 | WO2000036370A1 Body scanning equipment |
| 06/22/2000 | WO2000036369A1 Method for controlling perpendicularity of a cylindrical part, such as a nuclear fuel pellet |
| 06/22/2000 | WO2000036368A1 Latex coat thickness measuring and control apparatus |
| 06/22/2000 | WO2000036367A1 Tool path measurement |
| 06/22/2000 | WO2000036366A1 Image processor for observing optical fiber and optical fiber fusion-connecting device |
| 06/22/2000 | WO2000017724A9 High-speed precision positioning apparatus |
| 06/22/2000 | CA2354553A1 Body scanning equipment |
| 06/22/2000 | CA2320043A1 Image processor for observing optical fiber and optical fiber fusion-splicer |
| 06/21/2000 | EP1010965A2 Sensor for measuring degree of flatness |
| 06/21/2000 | EP1010658A2 Non-contact yarn monitoring method and device for a spinning or winding machine |
| 06/21/2000 | EP1010042A1 System and method for three-dimensional imaging |
| 06/21/2000 | EP1009984A1 Method and device for determining the phase- and/or amplitude data of an electromagnetic wave |
| 06/21/2000 | EP1009970A1 A deburring method |
| 06/21/2000 | EP1009969A1 Method and system for acquiring a three-dimensional shape description |
| 06/21/2000 | EP1009654A1 Ship provided with a distortion sensor and distortion sensor arrangement for measuring the distortion of a ship |
| 06/21/2000 | DE19960653A1 Method to detect edges of moving objects, especially thin sheets, e.g. of paper or transparent film; involves moving edge at angle to light beam in object plane and focusing light in at least one direction, to produce redundancy |
| 06/21/2000 | DE19960285A1 Monitor to register the increasing bobbin diameter during winding at a bobbin winder has a light transmitter and detector to register the gaps between the sensor and the bobbin and spindle surfaces |
| 06/21/2000 | DE19942856A1 Schlieren measuring process detects changes in turbulent atmospheric flow, aerodynamic, chemical processing and environmental pollution |
| 06/21/2000 | DE19858984A1 Method for out-of-plane deformation or vibration measurement using speckle-pattern interferometry |
| 06/21/2000 | DE19858287A1 Verfahren und Vorrichtung zur berührungslosen Garnüberwachung an einer Spinn- oder Spulmaschine Method and apparatus for contactless yarn monitoring on a spinning or winding machine |
| 06/21/2000 | DE19857929A1 Method and equipment for optical distance measurement between two planes employing transmission or reflection type etalons |
| 06/21/2000 | DE19856007A1 Anzeigevorrichtung mit Berührungssensor Display device with touch sensor |
| 06/21/2000 | DE19855478A1 Method and appliance for optical detection of surface contrast line employing laser scanner |
| 06/21/2000 | DE19518465C2 Verfahren und Vorrichtung zum Vermessen eines vieleckigen Körpers Method and apparatus for measuring a polygonal body |
| 06/21/2000 | CN2384196Y Wire diameter measurer |
| 06/21/2000 | CN1257582A Optical device for the contactless measurement of distance of a light source |
| 06/21/2000 | CN1257575A Bleaching compositions |
| 06/21/2000 | CN1257207A System for measuring speed, displacement and strain of moving surface or material conveying belt |
| 06/20/2000 | US6078846 Calibration and compensation of robot-based gauging system |
| 06/20/2000 | US6078397 Method and apparatus for mapping the wall thickness of tubes during production |
| 06/20/2000 | US6078396 Non-contact deformation measurement |
| 06/20/2000 | US6078391 Method and system for segmented scatter measurement |
| 06/20/2000 | US6077452 Optical techniques of measuring endpoint during the processing of material layers in an optically hostile environment |
| 06/15/2000 | WO2000034915A1 Indicating device with touch sensor |
| 06/15/2000 | WO2000034738A1 Rapid and accurate thin film measurement of individual layers in a multi-layered or patterned sample |
| 06/15/2000 | WO2000034735A1 Speckle shearing-interferometer for strain measurement |
| 06/15/2000 | WO2000033730A1 Detection probe for optical spectroscopy and spectrometry |
| 06/15/2000 | DE19955690A1 System for selection of volume regions in a graphics display based upon segmentation to allow specific features to be observed |
| 06/15/2000 | DE19953451A1 Machine shaft alignment device uses laser light source and optoelectronic reception device preceded by optical device acting as beam convergence or beam divergence element |
| 06/15/2000 | DE19854956A1 Optical scanning device, especially for monitoring wear of rounded tip welding electrodes of spot welding robot arms in the automobile industry, comprises a processing unit for evaluating signals from a reflected light detector |
| 06/15/2000 | DE19854942A1 Method to determine topography of macroscopic smooth surfaces of spherical or aspherical sample bodies; involves using narrow beam to scan surface and measure local curvature at each measuring point |
| 06/14/2000 | EP1009033A2 Piezoelectric luminous element, display device, and method for manufacturing same |
| 06/14/2000 | EP1008883A1 Light projecting method, surface inspection method, and apparatus used to implement these methods |
| 06/14/2000 | EP1008831A1 Outdoor range finder |
| 06/14/2000 | EP1008168A1 Wafer out-of-pocket detector and susceptor leveling tool |
| 06/14/2000 | EP1008110A4 System and method for modeling a three-dimensional object |
| 06/14/2000 | EP1008110A1 System and method for modeling a three-dimensional object |
| 06/14/2000 | EP1007944A1 Surface analysis using gaussian beam profiles |
| 06/14/2000 | EP1007942A4 Physical parameter measuring apparatus and method thereof |
| 06/14/2000 | EP1007942A1 Physical parameter measuring apparatus and method thereof |
| 06/14/2000 | EP1007905A1 Device and method for measuring the orientation of a surface |
| 06/14/2000 | EP1007904A1 Method and measuring device for measuring at an envelope surface |
| 06/14/2000 | CN1256755A Optical translation measurement |
| 06/14/2000 | CN1256414A Surface three-dimensional appearance testing method and equipment |
| 06/14/2000 | CN1256398A Grain size testing method and equipment for pre-painted photosensitive plate |
| 06/14/2000 | CN1256397A Tread shape testing instrument for subway train |
| 06/14/2000 | CN1256396A Offset measuring system and method for image sensing chip |
| 06/14/2000 | CN1053496C Light valve type displacement sensor with high performance |
| 06/13/2000 | US6075893 Computer controlled optical system for angular alignment of structures using moire patterns |
| 06/13/2000 | US6075880 Method for detection of defects in the inspection of structured surfaces |
| 06/13/2000 | US6075610 Method and apparatus for measuring internal property distribution |
| 06/13/2000 | US6075606 Endpoint detector and method for measuring a change in wafer thickness in chemical-mechanical polishing of semiconductor wafers and other microelectronic substrates |
| 06/13/2000 | US6075605 Shape measuring device |
| 06/13/2000 | US6075604 Apparatus for measuring curvature of magnetic read/write head sliders |
| 06/13/2000 | US6075602 Method and apparatus for measuring material properties using transient-grating spectroscopy |
| 06/13/2000 | US6075601 Optical probe calibration apparatus and method |
| 06/13/2000 | US6075590 Reflection infrared surface defect correction |
| 06/13/2000 | US6075589 Device for the geometric measurement and inspection of wheeled vehicles |
| 06/13/2000 | US6073437 Stable-combustion oxidizer for hybrid rockets |
| 06/08/2000 | WO2000033033A1 Three-dimensional measuring module |
| 06/08/2000 | WO2000033027A1 An apparatus and method to transport, inspect and measure objects and surface details at high speeds |
| 06/08/2000 | WO2000033026A1 Apparatus and method to measure three-dimensional data |
| 06/08/2000 | WO2000033025A1 Measuring instrument |
| 06/08/2000 | WO2000033024A1 Information reader |