Patents for G01B 11 - Measuring arrangements characterised by the use of optical means (73,862)
12/2000
12/20/2000EP1060139A1 Automatic melt stream positioning device
12/20/2000EP1021699A4 Method for analyzing a separation in a deformable structure
12/20/2000EP1018138A4 Scanning evanescent electro-magnetic microscope
12/20/2000CN2411464Y Micro-displacement measuring device
12/20/2000CN1277541A Bar-like specimen inspection device
12/20/2000CN1277385A Apparatus for determining image, method and medium
12/20/2000CN1277368A Method for measuring sequential file generation, measuring system and storage medium
12/20/2000CN1277349A Optical apparatus for testing material and coordinate inputting equipment using it
12/20/2000CN1276999A Method and apparatus for testing cigarette tip
12/20/2000CN1059743C Infrared sensing device and method of detecting human body therewith
12/20/2000CN1059740C Check result output device and placode checking system
12/19/2000US6163750 Route guiding device for vehicle
12/19/2000US6163640 Stereoscopic sensor
12/19/2000US6163519 Scanning near-field optical microscope using the probe and recording and/or reproducing apparatus using the probe
12/19/2000US6163374 Bending angle detection system
12/19/2000US6163371 Distance measuring apparatus
12/19/2000US6163369 Plane position detecting method and exposing method and exposure apparatus using same
12/19/2000US6163035 Method of, and apparatus for, measuring position of hole
12/19/2000US6162008 Wafer orientation sensor
12/19/2000US6161941 Light array system and method for illumination of objects imaged by imaging systems
12/19/2000US6161787 Method of placing wire windings onto a conveyor belt and device for carrying out the method
12/14/2000WO2000075969A1 Wafer orientation sensor
12/14/2000WO2000075858A1 Assembly for detecting the superficial structures of fingers and/or palms
12/14/2000WO2000075713A1 Method/system measuring object features with 2d and 3d imaging coordinated
12/14/2000WO2000075696A1 Method and apparatus improving performance of aperture monitoring system
12/14/2000WO2000075606A1 Method and device for determining the thickness and formation rate of a layer of ice
12/14/2000DE19927015A1 Verfahren und Vorrichtung zur Bestimmung der Dicke und Wachstumsgeschwindigkeit einer Eisschicht Method and apparatus for determining the thickness and growth rate of a layer of ice
12/14/2000DE19542554C2 Verfahren zur Prüfung von Schweißnähten A method for testing of welds
12/14/2000DE10026201A1 Device for determining the position of an object in an OXZ plane using an array of CCD cameras with a mask placed in front of them comprising an arrangement of sloping transparent and opaque bands
12/14/2000CA2375741A1 Method/system measuring object features with 2d and 3d imaging coordinated
12/14/2000CA2339164A1 Arrangement for the detection of surface structures of fingers and/or palms
12/14/2000CA2311050A1 Method and system for automatic non-contact measurements of optical properties of optical objects
12/13/2000EP1059609A2 Measurement procedure file creating method, measuring system and storage medium
12/13/2000EP1059608A2 Device using eigenspace method for recognizing hand shape and position
12/13/2000EP1059605A2 Optical unit for detecting object and coordinate input apparatus using the same
12/13/2000EP1059510A1 Wireless location
12/13/2000EP1058834A1 Scatterometer
12/13/2000EP1058812A1 Interferometric measuring device for determining the profile or the pitch of especially rough surfaces
12/13/2000EP1058591A1 Calibration and compensation of robot-based gauging system
12/13/2000CN2410620Y 光电编码器 Optical Encoder
12/13/2000CN1276869A NIR clinical opti-scan system
12/13/2000CN1276577A Pattern defect testing method
12/13/2000CN1276572A Hand shape and gesture identifying device, identifying method and medium for recording program contg. said method
12/12/2000US6160826 Method and apparatus for performing optical frequency domain reflectometry
12/12/2000US6160621 Method and apparatus for in-situ monitoring of plasma etch and deposition processes using a pulsed broadband light source
12/12/2000US6160620 Optical contact sensor
12/12/2000US6159073 Method and apparatus for measuring substrate layer thickness during chemical mechanical polishing
12/07/2000WO2000073738A1 Shape measuring device
12/07/2000WO2000073737A1 Three dimensional optical scanning
12/07/2000WO2000073736A1 Method for measuring thickness of films
12/07/2000WO2000073734A1 Method to remove and compensate station-induced error pattern from measured object characteristics
12/07/2000WO2000073028A1 Method for measuring a handling device
12/07/2000WO2000045125A8 Method of determining an illuminated surface
12/07/2000DE19962668C1 Optical measuring device for electrical apparatus such as generator or transformer
12/07/2000DE19926439C1 Coordinate system determination method for contactless 3-dimensional object measuring device calculates spacing of triangulation sensor from turntable centre by measuring parallel lines or edges on turntable
12/07/2000DE19922102A1 Fibre Bragg grating sensor device for detecting physical dimensions incorporates a light waveguide with fibre Bragg grating fastened under pre-tension between two locking elements
12/06/2000EP1058287A2 Magnetic energy filter
12/06/2000EP1058111A2 Optical inspection system and method
12/06/2000EP1058105A1 Measuring drive train backlash with a restraining member
12/06/2000EP1058087A1 Position recording of an edge with distributed sensors by determining the turning point
12/06/2000EP1057727A1 Method and apparatus for inspecting cigarette ends
12/06/2000EP1057545A2 Automatic inspecting apparatus by image processing
12/06/2000EP1057390A2 Automatic inspection system with stereovision
12/06/2000EP1057081A1 Linear conoscopic holography
12/06/2000EP1057009A2 Aperture coded camera for three-dimensional imaging
12/06/2000EP1056987A1 Laser scanner measurement system
12/06/2000EP1055163A4 High-speed precision positioning apparatus
12/06/2000EP0916071A4 Triangulation-based 3d imaging and processing method and system
12/06/2000CN1059271C Equipment and method for checking opened container
12/05/2000US6157452 Position detecting apparatus
12/05/2000US6157451 Sample CD measurement system
12/05/2000US6157450 Automated optical surface profile measurement system
12/05/2000US6157294 Vehicle obstacle detecting system
12/05/2000US6157040 Optoelectronic sensor
12/05/2000US6157032 Sample shape determination by measurement of surface slope with a scanning electron microscope
12/05/2000US6157024 Method and apparatus for improving the performance of an aperture monitoring system
12/05/2000US6154974 Photosensor scale
12/03/2000CA2294409A1 Core orientation
11/2000
11/30/2000WO2000072078A1 Method and array for detecting the position of a plane scanned with a laser scanner
11/30/2000WO2000072047A1 Apparatus and method for determining the angular orientation of an object
11/30/2000WO2000072042A1 Orientation dependent radiation source
11/30/2000WO2000072039A1 Optical motion detection for mri
11/30/2000WO2000071972A1 Measuring angles of wheels using transition points of reflected laser lines
11/30/2000WO2000071971A1 Optical techniques for measuring layer thicknesses
11/30/2000WO2000071970A1 Portable laser scanner
11/30/2000WO2000071969A2 Dust removal and anti-shock protection device for optical gauges
11/30/2000WO2000045196A3 Method and device for optically examining structured surfaces of objects
11/30/2000DE19951842A1 System for detecting and marking coating defects has image acquisition and marking devices arranged along production line along which painted vehicle body is moved
11/30/2000DE19922341A1 Determining spatial coordinates of object point by video tacheometry for geodesy by deriving coordinates from base points marked with reflectors, laser spots etc.
11/30/2000DE19921650A1 Demonstrating and/or analysing motion profile elements of tyre having coloured markings by detecting light reflected at contact between glass plate and tyre profile
11/30/2000DE19921374A1 Arrangement for three-dimensional optical investigation of object with illumination via hole plate has illumination raster, divider mirrors, etc. in compact unit displaced by control elements
11/30/2000DE19856761C1 Field calibration method for digital-metric camera compares image of defined light transparent structure provided by attached device with corresponding image obtained during laboratory calibration
11/30/2000DE10017380A1 Behälterprüfmaschine Behälterprüfmaschine
11/30/2000CA2371145A1 Optical motion detection for mri
11/29/2000EP1055982A1 Phase modulation in an interferometer
11/29/2000EP1055938A2 Light source means and light wave range finder
11/29/2000EP1055907A2 Rangefinder
11/29/2000EP1055906A2 Method for combining partially measured data
11/29/2000EP1055905A2 Method to determine the flatness of a web of material
11/29/2000EP1055904A2 Height measuring apparatus and method and testing apparatus using the height measuring apparatus