Patents for G01B 11 - Measuring arrangements characterised by the use of optical means (73,862)
04/2001
04/26/2001DE19950588A1 Device for quality control of lacquered or varnished surfaces; has illumination unit at fixed angle and several measurement units at different fixed angles to detect some of reflected light
04/26/2001DE19945717A1 Method for non-contact measurement of position or geometry of large components or assemblies or to position manipulation units or tool machines; involves using moving and fixed laser distance sensors
04/26/2001DE19916978C1 Verfahren zum Vermessen eines Körperbereichs A method of measuring a body portion
04/26/2001DE10045261A1 Conveyed material position detection method involves radiating linearly polarized light at specific angle towards edge of conveying material and detecting variation in intensity of reflected beam
04/26/2001DE10043467A1 Road white-line detection system detects linearity of right and left white-line in areas other than lowest area by detecting intersection of right and left lines on computed horizontal line
04/25/2001EP1093768A2 Method and device for imaging medical objects, in particular for dental models
04/25/2001EP1093574A1 Automatic defect classification with invariant core classes
04/25/2001EP1093567A1 Device and method for determining a relative position of two objects with regard to one another
04/25/2001EP1093562A1 Machine vision and semiconductor handling
04/25/2001EP0748455B1 Triangular position detection method and apparatus
04/25/2001CN2427793Y Laser non-contact type device for measuring surface roughness and displacement
04/25/2001CN1292878A Optical sensor system for detecting position of object
04/25/2001CN1065047C Curved surface shape measuring method
04/25/2001CN1065046C Film formation method and semiconductor laser fabrication method
04/24/2001US6223102 Method and device for aligning the shaft of a rotating machine
04/24/2001US6223066 Optical position sensors
04/24/2001US6222630 Measuring and compensating for warp in the inspection of printed circuit board assemblies
04/24/2001US6222629 Procedure and system for inspecting a component with leads to determine its fitness for assembly
04/24/2001US6222628 Surface characteristics measurement system and method
04/24/2001US6222625 Adjustable laser string square
04/24/2001US6222582 Image capture system
04/24/2001US6220769 Rotation detection mechanism and an apparatus provided with same
04/19/2001WO2001027702A1 Micropositioning system
04/19/2001WO2001027606A1 Method and apparatus for detecting ultrasonic surface displacements using post-collection optical amplification
04/19/2001WO2001027583A1 Interferometric residual-stress analysis
04/19/2001WO2001027558A1 Interferometric measuring device for form measurement
04/19/2001WO2001027557A1 Real-time interferometric deformation analysis
04/19/2001DE19929615C1 Vorrichtung und Verwendung der Vorrichtung zur Überwachung von absichtlichen oder unvermeidbaren Schichtabscheidungen A device and use of the device for monitoring of deliberate or unavoidable layer depositions
04/18/2001EP1093017A2 Method and apparatus for reticle inspection using aerial imaging
04/18/2001EP1092973A1 A system and method for detecting defects in a surface of a workpiece
04/18/2001EP1092963A2 Automatic device, fitted with perfected detector equipment, for checking filling level of open containers for sundry products, especially canned foods and the like
04/18/2001EP1092946A1 High precision mask holder for measuring thickness
04/18/2001EP1092945A2 Device and method for measurements of structures on substrates of various thicknesses
04/18/2001EP1092944A2 Device for the fine positioning of a component and coordinates measuring machine with a device for the fine positioning of a component
04/18/2001EP1092145A1 A system and method for analyzing topological features on a surface
04/18/2001EP1092125A1 Vector measurement for coordinate measuring machine
04/18/2001EP1092124A1 Method and apparatus for ultrasonic laser testing
04/18/2001EP1092123A1 Method and apparatus for detecting ultrasonic surface displacements using post-collection optical amplification
04/18/2001EP1092055A1 Method for determining the draft angle of a textile web and device for carrying out this method
04/18/2001CN1064757C Method and appratus for measuring thickness of birefringence layer
04/18/2001CN1064755C Installation and process for measuring rolling parameters by means of artificial vision on wheels of railway
04/17/2001US6219585 Three dimensional log scanning device for a log positioning and saw system
04/17/2001US6219462 Method and apparatus for performing global image alignment using any local match measure
04/17/2001US6219461 Determining a depth
04/17/2001US6219443 Method and apparatus for inspecting a display using a relatively low-resolution camera
04/17/2001US6219146 Laser reflector alignment
04/17/2001US6219145 Interferometric system for precision imaging of vibrating structures
04/17/2001US6219143 Method and apparatus for analyzing shearogram images by animation
04/17/2001US6219135 Device for optically recording, digitally, a parameter on a longitudinally moved thread-type material
04/17/2001US6219134 Rolling runout compensation for wheel alignment
04/17/2001US6219131 Method and device for measuring stresses of membranes in a transparent material using polarization
04/17/2001US6218660 Image forming apparatus
04/17/2001US6218313 Process for producing semiconductor device, apparatus for optimizing film thickness, and process for optimizing film thickness
04/17/2001US6218198 Method and apparatus for evaluating semiconductor film, and method for producing the semiconductor film
04/17/2001US6217410 Apparatus for cleaning workpiece surfaces and monitoring probes during workpiece processing
04/17/2001US6216518 Method of adjusting position in bar steel rolling mill and roll position adjusting guidance apparatus
04/12/2001WO2001025749A2 Optical method and system for measuring three-dimensional surface topography
04/12/2001WO2001025722A1 Method for detecting the spatial position of a tracking mirror and mirror arrangement for carrying out said method
04/12/2001WO2001025718A2 System and method for simultaneously measuring thin film layer thickness
04/12/2001WO2001025347A1 Coating with optical taggent
04/12/2001DE19948837A1 Continuous non-contact measurement of thickness of organic deposit improving textile or metallic sheet, evaluates near infra red returns at measurement- and reference wavelengths
04/12/2001DE19948620A1 Zahnmedizinische Einrichtung Dental equipment
04/12/2001DE19948190A1 Surface defect measurement unit for silicon processing has spatially modulated light source works at high incidence to see only surface
04/12/2001DE19947819A1 Optical surface reference measurement unit has two sensors compares differences with original calibration detects measurement errors and optics degradation
04/12/2001DE19944516A1 Three dimensional shape measurement system for computer tomography set up uses successive focussing of camera on set of planes
04/12/2001DE19944354A1 Verfahren und Vorrichtung zur Ermittlung der Form oder der Abbildungseigenschaften von spiegelnden oder transparenten Objekten Method and apparatus for determination of the shape or of the imaging properties of reflective or transparent objects
04/12/2001DE19944314A1 Optical test equipment for tires has positioning arrangement for tire to be tested, test device, especially laser test device, with several measurement heads, especially laser measurement heads
04/12/2001DE19943502A1 Vorrichtung zur Bestimmung der Achslage von Hohlzylindern Device for determining the axial position of hollow cylinders
04/12/2001DE10026523A1 Angle measurement device has spirit level with light sources and reception units aligned such that photo currents from reception units are of approximately equal size
04/12/2001CA2322721A1 A system and method for detecting defects in a surface of a workpiece
04/11/2001EP1091203A2 Process for measuring particles of a tobacco particle stream
04/11/2001EP1091187A1 Apparatus for measuring dimension of article and scale to be used in the same
04/11/2001EP1091186A2 Method and apparatus for calibrating a non-contact gauging sensor with respect to an external coordinate system
04/11/2001EP1090602A1 Dental device
04/11/2001EP1090420A1 Endpoint detection in the fabrication of electronic devices
04/11/2001EP1090268A1 Interferometer
04/11/2001EP1090267A1 Inspection system and method for leads of semiconductor devices
04/11/2001EP0715707B1 Automatic level and plumb tool
04/11/2001CN1291284A Improved method and apparatus for film-thickness measurements
04/11/2001CN1290850A Non-contact six-freedom motion measuring and analysing system
04/11/2001CN1290849A Photoelectric geometric parameter measurer and measuring method for cornea contacting lens
04/11/2001CN1290635A Inspection method and device for end product packing contour
04/10/2001US6215895 Apparatus and method for display panel inspection
04/10/2001US6215556 Process and device for measuring the thickness of a transparent material using a modulated frequency light source
04/10/2001US6215553 Width measurement of an image-bearing sheet
04/10/2001US6215552 Electrostatic process control based upon both the roughness and the thickness of a substrate
04/10/2001US6213605 Method of corneal analysis using a checkered placido apparatus
04/10/2001US6212751 Method and apparatus for examining position of board-support pin, and method and apparatus for positioning board-support pin
04/05/2001WO2001024235A2 Methods and apparatuses for trench depth detection and control
04/05/2001WO2001023908A1 Automated image scaling
04/05/2001WO2001023872A1 Method of measuring the geometry of grooves in an elongated element
04/05/2001WO2001023854A1 System and method for measuring stress in an optical fiber
04/05/2001WO2001023834A1 Method and apparatus for measuring vehicle wheel roll radius
04/05/2001WO2001023833A1 Topometrical detection of a reflective surface
04/05/2001WO2001023832A1 Measurement of objects (streamers, human foot) with an additional form
04/05/2001WO2001023831A2 Cable device for detecting and monitoring rock and soil displacement
04/05/2001WO2001023830A1 Method and apparatus for in-situ monitoring of plasma etch and deposition processes using a pulsed broadband light source
04/05/2001WO2001009665A8 Optical beam shaper
04/05/2001WO2000065310A3 Optical device for measuring position
04/05/2001WO1997001112B1 Telecentric 3d camera and method of rangefinding