| Patents for G01B 11 - Measuring arrangements characterised by the use of optical means (73,862) |
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| 08/20/2008 | CN101245985A Saddle seat type non-contact plastic wheel or tumbling cylinder diameter measuring apparatus and measuring system using the same |
| 08/20/2008 | CN101245984A Laser interfering contrast and calibration device |
| 08/20/2008 | CN101245983A Wall type large target surface bullet coordinate test system |
| 08/20/2008 | CN101245981A Cartesian coordinate system multifunctional on-the-spot scale |
| 08/20/2008 | CN101244767A IC full-automatic method for testing brede and full-automatic holding tray type machine for testing brede |
| 08/20/2008 | CN101244649A Automatic detection method for printed product four-color register partial difference |
| 08/20/2008 | CN101244523A Laser process testing method and special instrument |
| 08/20/2008 | CN100412504C Pattern inspection method and apparatus, and pattern alignment method |
| 08/20/2008 | CN100412503C Multi visual angle laser measuring head and its calibration method |
| 08/20/2008 | CN100412502C Extender high-light folding feedback displacement measuring system |
| 08/20/2008 | CN100412501C Image obtaining apparatus |
| 08/20/2008 | CN100412249C Equipment for noninductive measurement of structure attribute of moving yarn or yarn-like fabrics |
| 08/20/2008 | CN100411829C Device for correcting reference position for transfer mechanism, and correction method |
| 08/20/2008 | CA2604684A1 Method of estimating a visual evaluation value of beauty of a skin |
| 08/19/2008 | US7415151 3D color information acquisition method and 3D color information acquisition device |
| 08/19/2008 | US7415149 Pattern inspection apparatus |
| 08/19/2008 | US7414740 Method and apparatus for contactless optical measurement of the thickness of a hot glass body by optical dispersion |
| 08/19/2008 | US7414739 Calibration system for sawmill scanning systems |
| 08/19/2008 | US7414738 Measuring device for measuring the degree of transmission of a coating |
| 08/19/2008 | US7414737 Positioning device for positioning a user by using both eyes as position markers |
| 08/19/2008 | US7414736 Position measuring arrangement and method for controlling scanning signals of the position measuring arrangement |
| 08/19/2008 | US7414735 Displacement sensor equipped with automatic setting device for measurement region |
| 08/19/2008 | US7414734 Image position detecting device and image forming apparatus using the same |
| 08/19/2008 | US7414733 Azimuthal scanning of a structure formed on a semiconductor wafer |
| 08/19/2008 | US7414732 Method and device for determining the 3D profile of an object |
| 08/19/2008 | US7414731 Microscope and interferometer thereof |
| 08/19/2008 | US7414730 High precision interferometer apparatus employing a grating beamsplitter |
| 08/19/2008 | US7414722 Alignment measurement arrangement and alignment measurement method |
| 08/19/2008 | US7414713 Method of measuring focal point, instrument used therefor, and method of fabricating semiconductor device |
| 08/19/2008 | US7414223 Method and apparatus for monitoring safety glass production or controlling a treatment process |
| 08/19/2008 | US7413304 Ophthalmic apparatus |
| 08/19/2008 | US7412773 Method and device for controlling the geometry of the chassis of a chain or belt driven vehicle |
| 08/14/2008 | WO2008095733A1 Measuring instrument and method for determining geometric properties of profiled elements |
| 08/14/2008 | WO2008076601B1 Determining physical property of substrate |
| 08/14/2008 | WO2008046593A3 Method and sensor arrangement for analyzing glass panes, particularly a glass pane stack |
| 08/14/2008 | WO2007103566A3 Determination of lithography misalignment based on curvature and stress mapping data of substrates |
| 08/14/2008 | US20080195352 Apparatus and Method For Checking Position and/or Shape of Mechanical Pieces |
| 08/14/2008 | US20080195330 Concrete Structure Crack Inspection Device and Crack Inspection Method |
| 08/14/2008 | US20080193126 Spectral measurement apparatus and measurement method utilizing brillouin scattering |
| 08/14/2008 | US20080192264 Device for Determining the Position of at Least One Structure on an Object, Use of an Illumination Apparatus with the Device and Use of Protective Gas with the Device |
| 08/14/2008 | US20080192263 Method for Determining the Position of an Object in Space |
| 08/14/2008 | US20080192262 High Resolution Optical Microscopy Featuring Fluorescence Transient Measurement |
| 08/14/2008 | US20080192261 Apparatus and Method for Examining a Curved Suface |
| 08/14/2008 | US20080192253 Method and test-structure for determining an offset between lithographic masks |
| 08/14/2008 | US20080192242 Method of mobile radio positioning aided by single fan self-surveying laser transmitter |
| 08/14/2008 | US20080192239 Measurement Method of Non-Circularity of Core Optical Fiber Base Material and Apparatus Therefor |
| 08/14/2008 | US20080192234 Method of sensing motion of a sensing device relative to a surface |
| 08/14/2008 | DE4410078B4 Optische Positionserfassungseinheit und optische Koordinateneingabeeinheit Optical position detection unit and optical coordinate input unit |
| 08/14/2008 | DE202008007283U1 Vorrichtung zur Struktur-, Muster- und/oder Schussfadendetektion einer geförderten Warenbahn Apparatus for structural, design and / or weft detecting a subsidized goods train |
| 08/14/2008 | DE112006002529T5 Dreipunkt-Sicht-Ausrichtsystem mit einer einzigen Kamera für ein Vorrichtungs-Handhabungsgerät Three-point vision alignment system with a single camera for a device handling apparatus |
| 08/14/2008 | DE112006001713T5 Winkelmessvorrichtung und -verfahren Angle measuring apparatus and method |
| 08/14/2008 | DE102007007040A1 Messeinrichtung zur optischen und spektroskopischen Untersuchung einer Probe Measuring device for optical and spectroscopic investigation of a sample |
| 08/14/2008 | DE102007006032A1 Adjusting, measuring and tool clamping device, has contactless sensor unit including laser collimator and light projecting device for projecting directed light to object, and camera for detecting measured variables |
| 08/13/2008 | EP1956339A1 Plane position detecting apparatus, exposure apparatus and device manufacturing method |
| 08/13/2008 | EP1955013A1 Shape-acceleration measurement device and apparatus |
| 08/13/2008 | EP1955012A1 Method and apparatus for inspecting a container sidewall contour |
| 08/13/2008 | EP1649423B1 Method and sytem for the three-dimensional surface reconstruction of an object |
| 08/13/2008 | EP1402761B1 Method and system for predictive physiological gating |
| 08/13/2008 | EP1269115B1 Battery module transceiver for extending the range of an infrared remote controller |
| 08/13/2008 | CN101243535A Optical emission interferometry for PECVD using a gas injection hole |
| 08/13/2008 | CN101243329A Method for determining the layer thickness of a tbc coating of at least one blade of a non-positive-displacement machine, a corresponding tbc layer thickness measuring device for carrying out the meth |
| 08/13/2008 | CN101243313A Dual beam set-up for parousiameter |
| 08/13/2008 | CN101241870A Device for measuring the wafer film thickness |
| 08/13/2008 | CN101241370A Full-sun area guiding method and system |
| 08/13/2008 | CN101241309A Method for calibrating sub-nanometer critical dimension using pitch offset |
| 08/13/2008 | CN101241232A Great spherical aberration compensating glass capable of accomplishing aspherical generalized detection and its device |
| 08/13/2008 | CN101241071A Minisize tension meter for infrared spectrometer |
| 08/13/2008 | CN101241042A Strong laser system optical manufacture error and light beam quality relationship quantitative analysis method |
| 08/13/2008 | CN101241002A Method for observing laser boring brittle non-metal material hole section plane shape |
| 08/13/2008 | CN101241000A High steepness convex quadric aspherical aberration-free point Sub-Aperture Stitching measurement method |
| 08/13/2008 | CN101240999A Large-sized optical flat interferometry device and method |
| 08/13/2008 | CN101240998A Frequency range error distribution characteristic analytical method under deterministic optical manufacture condition |
| 08/13/2008 | CN101240997A Method for evaluating blast furnace gunite effect and method for measuring blast furnace furnace wall remaining thickness |
| 08/13/2008 | CN101240996A Method for making high-temperature micrometre size speckle |
| 08/13/2008 | CN101240995A Three-dimensional splicing matching point selecting method based on global calibration constraint |
| 08/13/2008 | CN101240520A Railway line parameter photoelectric testing device used for tamping vehicle and detection method thereof |
| 08/13/2008 | CN100410666C Velocimeter, displacement meter, vibrometer and electronic device |
| 08/13/2008 | CN100410642C Method for detecting verticality of optical axis and mounting baseplane in optical system |
| 08/13/2008 | CN100410625C Shedding profilogram measuring apparatus |
| 08/13/2008 | CN100410624C Single-light beam electronic speckle interference two-dimensional detecting method of symmetrical deformation field |
| 08/13/2008 | CN100410623C Moving gantry type optical coordinate measuring instrument |
| 08/13/2008 | CN100410622C Information processing method and apparatus for finding position and orientation of targeted object |
| 08/13/2008 | CN100409803C Optical biological information measuring apparatus, optical biological information measuring method, biological information decision apparatus |
| 08/12/2008 | US7412671 Apparatus and method for verifying an integrated circuit pattern |
| 08/12/2008 | US7412113 Captured image projection apparatus and captured image correction method |
| 08/12/2008 | US7411688 Method and system for laser intensity calibration in a three-dimensional multi-color laser scanning system |
| 08/12/2008 | US7411685 Spectrometric measuring instrument |
| 08/12/2008 | US7411684 Film thickness measuring method of member to be processed using emission spectroscopy and processing method of the member using the measuring method |
| 08/12/2008 | US7411678 Alignment apparatus, control method thereof, exposure apparatus and method of manufacturing semiconductor device by exposure apparatus controlled by the same control method |
| 08/12/2008 | US7411667 Method for correcting disturbances in a level sensor light path |
| 08/12/2008 | US7411189 Cantilever array, method for fabricating the same, scanning probe microscope, sliding apparatus of guiding and rotating mechanism, sensor, homodyne laser interferometer, laser doppler interferometer having optically exciting function for exciting sample, each using the same, and method for exciting cantilevers |
| 08/12/2008 | US7410508 Apparatus for crystallizing semiconductor with laser beams |
| 08/12/2008 | US7409914 Aligning components of a measuring system |
| 08/07/2008 | WO2008095158A1 Highlighting gaps in a surface |
| 08/07/2008 | WO2008093375A1 Process for detecting the three-dimensional structure of an object and apparatus for implementing the process |
| 08/07/2008 | WO2008093332A2 Systems and methods for producing clip-ons for a primary eyewear |
| 08/07/2008 | WO2008092820A1 Refractive production of a concentrically fanned structured bundle of light beams, optical measuring device with refractive deflection element |
| 08/07/2008 | WO2008092791A1 Apparatus and method for optical 3d measurement |
| 08/07/2008 | WO2008092461A2 Measuring of geometrical parameters for a wind turbine blade |
| 08/07/2008 | WO2008092359A1 An optical device for measuring the height of a person |